GB1090912A - Method and apparatus for testing hollow articles - Google Patents
Method and apparatus for testing hollow articlesInfo
- Publication number
- GB1090912A GB1090912A GB5021064A GB5021064A GB1090912A GB 1090912 A GB1090912 A GB 1090912A GB 5021064 A GB5021064 A GB 5021064A GB 5021064 A GB5021064 A GB 5021064A GB 1090912 A GB1090912 A GB 1090912A
- Authority
- GB
- United Kingdom
- Prior art keywords
- transistor
- pulses
- diode
- fed
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
- G01B15/045—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1,090,912. Transistor amplifier circuits; transistor pulse circuits. BALL BROS. RESEARCH CORPORATION. Dec. 9, 1964 [Jan. 23, 1964], No. 50210/64. Heading H3T. [Also in Division G1] Pulses from a photo-multiplier 28 (Fig. 3) are amplified by a linear preamplifier having negative feedback through a resistor 40. A fraction of the signal output of transistor 39, adjusted by a resistor 49, is fed back to the amplifier input via capacitor 46 and earth. Diode 47 provides temperature compensation for the transistor 30. Pulses from the preamplifier are fed through coupling capacitors 53, 54, to a pulse height discriminator. which generates pulses of constant amplitude when the voltage input exceeds a predetermined threshold. Pulses from the transistor 39 sufficient to increase the current in tunnel diode 55 to the peak point current or beyond, result in its switching rapidly to its high voltage state and in the transistor 59 switching on to give pulses of an amplitude limited by its saturation voltage. An inductor 58 acting as an R.F. choke allows a fixed delay before causing the diode 55 to switch back to its lower voltage state, when the pulses output is limited by a temperature compensated Zener diode 62. The pulses pass through emitter follower transistors 64, 65 and are converted into an analogue signal proportional to their frequency by a rate meter. This signal is fed to the base of a unijunction transistor 80 and when it reaches the peak point voltage of the transistor 80, capacitor 67 discharges into the gate of the S.C.R. 81 to activate a relay 82. The circuit is used in apparatus for measuring the thickness of the wall of a hollow container, (3 particles transmitted through the container wall being detected by the photomultiplier in connection with a scintillator and the ouput analysed to determine whether the walls are of the required thickness (see Division G1).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US33978764A | 1964-01-23 | 1964-01-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1090912A true GB1090912A (en) | 1967-11-15 |
Family
ID=23330588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB5021064A Expired GB1090912A (en) | 1964-01-23 | 1964-12-09 | Method and apparatus for testing hollow articles |
Country Status (6)
Country | Link |
---|---|
BE (1) | BE658778A (en) |
DE (1) | DE1473770B2 (en) |
FR (1) | FR1424611A (en) |
GB (1) | GB1090912A (en) |
NL (1) | NL6500789A (en) |
SE (1) | SE317822B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2141300A (en) * | 1983-05-31 | 1984-12-12 | Rca Corp | Feedback kinescope driver |
WO2007060481A1 (en) | 2005-11-22 | 2007-05-31 | Johnson Matthey Plc | Suspension system and scanning method |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2513372B1 (en) * | 1981-09-23 | 1985-11-08 | Commissariat Energie Atomique | METHOD AND DEVICE FOR DIMENSIONAL AND NON-DESTRUCTIVE TESTING OF A HOLLOW PART |
GB0306066D0 (en) * | 2003-03-17 | 2003-04-23 | Matrix Seating Ltd | Shapeable matrix and a clamp for use therein |
CN117990020B (en) * | 2024-04-03 | 2024-06-11 | 青岛理工大学 | Structural crack sensor based on combined meandering transmission line, monitoring system and method |
-
1964
- 1964-12-09 GB GB5021064A patent/GB1090912A/en not_active Expired
- 1964-12-30 FR FR480A patent/FR1424611A/en not_active Expired
-
1965
- 1965-01-12 DE DE19651473770 patent/DE1473770B2/en active Pending
- 1965-01-21 NL NL6500789A patent/NL6500789A/xx unknown
- 1965-01-22 SE SE83065A patent/SE317822B/xx unknown
- 1965-01-25 BE BE658778D patent/BE658778A/xx unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2141300A (en) * | 1983-05-31 | 1984-12-12 | Rca Corp | Feedback kinescope driver |
US4547799A (en) * | 1983-05-31 | 1985-10-15 | Rca Corporation | Feedback kinescope driver |
WO2007060481A1 (en) | 2005-11-22 | 2007-05-31 | Johnson Matthey Plc | Suspension system and scanning method |
US7800061B2 (en) | 2005-11-22 | 2010-09-21 | Johnson Matthey Plc | Suspension system and scanning method |
Also Published As
Publication number | Publication date |
---|---|
FR1424611A (en) | 1966-01-14 |
BE658778A (en) | 1965-05-17 |
DE1473770A1 (en) | 1969-02-13 |
DE1473770B2 (en) | 1970-11-12 |
NL6500789A (en) | 1965-07-26 |
SE317822B (en) | 1969-11-24 |
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