GB1090912A - Method and apparatus for testing hollow articles - Google Patents

Method and apparatus for testing hollow articles

Info

Publication number
GB1090912A
GB1090912A GB5021064A GB5021064A GB1090912A GB 1090912 A GB1090912 A GB 1090912A GB 5021064 A GB5021064 A GB 5021064A GB 5021064 A GB5021064 A GB 5021064A GB 1090912 A GB1090912 A GB 1090912A
Authority
GB
United Kingdom
Prior art keywords
transistor
pulses
diode
fed
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5021064A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ball Aerospace and Technologies Corp
Original Assignee
Ball Brothers Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ball Brothers Research Corp filed Critical Ball Brothers Research Corp
Publication of GB1090912A publication Critical patent/GB1090912A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G01B15/045Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1,090,912. Transistor amplifier circuits; transistor pulse circuits. BALL BROS. RESEARCH CORPORATION. Dec. 9, 1964 [Jan. 23, 1964], No. 50210/64. Heading H3T. [Also in Division G1] Pulses from a photo-multiplier 28 (Fig. 3) are amplified by a linear preamplifier having negative feedback through a resistor 40. A fraction of the signal output of transistor 39, adjusted by a resistor 49, is fed back to the amplifier input via capacitor 46 and earth. Diode 47 provides temperature compensation for the transistor 30. Pulses from the preamplifier are fed through coupling capacitors 53, 54, to a pulse height discriminator. which generates pulses of constant amplitude when the voltage input exceeds a predetermined threshold. Pulses from the transistor 39 sufficient to increase the current in tunnel diode 55 to the peak point current or beyond, result in its switching rapidly to its high voltage state and in the transistor 59 switching on to give pulses of an amplitude limited by its saturation voltage. An inductor 58 acting as an R.F. choke allows a fixed delay before causing the diode 55 to switch back to its lower voltage state, when the pulses output is limited by a temperature compensated Zener diode 62. The pulses pass through emitter follower transistors 64, 65 and are converted into an analogue signal proportional to their frequency by a rate meter. This signal is fed to the base of a unijunction transistor 80 and when it reaches the peak point voltage of the transistor 80, capacitor 67 discharges into the gate of the S.C.R. 81 to activate a relay 82. The circuit is used in apparatus for measuring the thickness of the wall of a hollow container, (3 particles transmitted through the container wall being detected by the photomultiplier in connection with a scintillator and the ouput analysed to determine whether the walls are of the required thickness (see Division G1).
GB5021064A 1964-01-23 1964-12-09 Method and apparatus for testing hollow articles Expired GB1090912A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US33978764A 1964-01-23 1964-01-23

Publications (1)

Publication Number Publication Date
GB1090912A true GB1090912A (en) 1967-11-15

Family

ID=23330588

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5021064A Expired GB1090912A (en) 1964-01-23 1964-12-09 Method and apparatus for testing hollow articles

Country Status (6)

Country Link
BE (1) BE658778A (en)
DE (1) DE1473770B2 (en)
FR (1) FR1424611A (en)
GB (1) GB1090912A (en)
NL (1) NL6500789A (en)
SE (1) SE317822B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2141300A (en) * 1983-05-31 1984-12-12 Rca Corp Feedback kinescope driver
WO2007060481A1 (en) 2005-11-22 2007-05-31 Johnson Matthey Plc Suspension system and scanning method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2513372B1 (en) * 1981-09-23 1985-11-08 Commissariat Energie Atomique METHOD AND DEVICE FOR DIMENSIONAL AND NON-DESTRUCTIVE TESTING OF A HOLLOW PART
GB0306066D0 (en) * 2003-03-17 2003-04-23 Matrix Seating Ltd Shapeable matrix and a clamp for use therein
CN117990020B (en) * 2024-04-03 2024-06-11 青岛理工大学 Structural crack sensor based on combined meandering transmission line, monitoring system and method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2141300A (en) * 1983-05-31 1984-12-12 Rca Corp Feedback kinescope driver
US4547799A (en) * 1983-05-31 1985-10-15 Rca Corporation Feedback kinescope driver
WO2007060481A1 (en) 2005-11-22 2007-05-31 Johnson Matthey Plc Suspension system and scanning method
US7800061B2 (en) 2005-11-22 2010-09-21 Johnson Matthey Plc Suspension system and scanning method

Also Published As

Publication number Publication date
FR1424611A (en) 1966-01-14
BE658778A (en) 1965-05-17
DE1473770A1 (en) 1969-02-13
DE1473770B2 (en) 1970-11-12
NL6500789A (en) 1965-07-26
SE317822B (en) 1969-11-24

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