GB1056652A - Flaw detection apparatus - Google Patents

Flaw detection apparatus

Info

Publication number
GB1056652A
GB1056652A GB1523965D GB1523965D GB1056652A GB 1056652 A GB1056652 A GB 1056652A GB 1523965 D GB1523965 D GB 1523965D GB 1523965 D GB1523965 D GB 1523965D GB 1056652 A GB1056652 A GB 1056652A
Authority
GB
United Kingdom
Prior art keywords
scanning
areas
article
generator
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1523965D
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Standard Electric Corp
Original Assignee
International Standard Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Standard Electric Corp filed Critical International Standard Electric Corp
Publication of GB1056652A publication Critical patent/GB1056652A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • GPHYSICS
    • G08SIGNALLING
    • G08BSIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B17/00Fire alarms; Alarms responsive to explosion
    • G08B17/06Electric actuation of the alarm, e.g. using a thermally-operated switch

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Business, Economics & Management (AREA)
  • Emergency Management (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

1,056,652. Detecting flaws photo-electrically INTERNATIONAL STANDARD ELECTRIC CORPORATION. April 9, 1965 [April 14, 1964], No. 15239/65. Heading G1A. In an arrangement for illuminating an article and detecting flaws by means of a parameter of a time based video signal produced by scanning, the video signals from predetermined areas are blanked by the signal developed by scanning, in a manner identical and in synchronism with the scanning of the article, an illuminated mask having contrasting areas thereon corresponding to the areas which are, or are not, required to be investigated. Light may be transmitted through the article if transparent, or may be reflected from its surface and the rate of scan may differ over different areas. Additionally the video signals may be compared with a threshold voltage which is different for different areas of the article in order that the arrangement may respond only to flows of a size predetermined according to their location. A glass article over which the investigation is made by a circular scan is described with reference to Fig. 7 ( not shown), and an apertured mask for blanking the signals from areas of surface ornamentation 26, 27, is described with reference to Fig. 8 (not shown). The illuminated object is investigated by an image dissector 24, Fig. 2, under the control of a scan generator 37, and the beam from a flying spot scanner 34, also controlled by generator 37, develops a signal in a photo-multiplier 35 to operate a blanking gate 43 when the beam is outside of the areas defined by the mask. The different rates of scanning i.e. the spacing of scanning lines are determined by a deflection amplitude generator 55, under the control of monostable multivibrators 57-59 and a bistable multivibrator 60, the output signal 62 being amplitude modulated on the sinusoidal output of a generator 66 to energize the scanning coils 74-77. A wanted flaw signal from the image dissector, after passing the blanking gate is amplified and applied to a unit 89 which permits the passage of signals above a predetermined level, these being amplified and inverted, and added to a step function voltage 100 in network 102. The steps are also positioned by the outputs from the multivibrators 57-60, and the superimposed signals exceeding a predetermined threshold are detected in 104 and applied with the differentiated trailing edge of pulse T4 from multivibrator 60 to produce a reject pulse of fixed length at a particular time relative to the scanning cycle. Conventional transistors circuitry is described and component values are exemplified.
GB1523965D 1964-04-14 1965-04-09 Flaw detection apparatus Expired GB1056652A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US35972264A 1964-04-14 1964-04-14

Publications (1)

Publication Number Publication Date
GB1056652A true GB1056652A (en) 1967-01-25

Family

ID=23415000

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1523965D Expired GB1056652A (en) 1964-04-14 1965-04-09 Flaw detection apparatus

Country Status (3)

Country Link
BE (1) BE669077A (en)
GB (1) GB1056652A (en)
NL (1) NL6504818A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2487981A1 (en) * 1980-07-30 1982-02-05 Kronseder Maschf Krones INSPECTION METHOD AND APPARATUS FOR INSPECTING AN OBJECT ESPECIALLY A BOTTLE
CN112236671A (en) * 2018-06-12 2021-01-15 Fk光学研究所股份有限公司 Foreign matter inspection device and foreign matter inspection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2487981A1 (en) * 1980-07-30 1982-02-05 Kronseder Maschf Krones INSPECTION METHOD AND APPARATUS FOR INSPECTING AN OBJECT ESPECIALLY A BOTTLE
CN112236671A (en) * 2018-06-12 2021-01-15 Fk光学研究所股份有限公司 Foreign matter inspection device and foreign matter inspection method

Also Published As

Publication number Publication date
BE669077A (en) 1966-03-02
NL6504818A (en) 1965-10-15

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