GB0419868D0 - Testing of a system-on-chip integrated circuit - Google Patents

Testing of a system-on-chip integrated circuit

Info

Publication number: GB0419868D0
Authority: GB; United Kingdom
Prior art keywords: testing; integrated circuit; chip integrated; chip; circuit
Prior art date: 2004-09-08
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Ceased

Application number

GB0419868A

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Koninklijke Philips NV

Original Assignee

Koninklijke Philips Electronics NV

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2004-09-08

Filing date

2004-09-08

Publication date

2004-10-13

2004-09-08 Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV

2004-09-08 Priority to GB0419868A priority Critical patent/GB0419868D0/en

2004-10-13 Publication of GB0419868D0 publication Critical patent/GB0419868D0/en

2005-09-05 Priority to TW094130241A priority patent/TW200622586A/en

2005-09-06 Priority to PCT/IB2005/052900 priority patent/WO2006027740A1/en

Status Ceased legal-status Critical Current

Links

GB0419868A 2004-09-08 2004-09-08 Testing of a system-on-chip integrated circuit Ceased GB0419868D0 (en)

Priority Applications (3)

Application Number	Priority Date	Filing Date	Title
GB0419868A GB0419868D0 (en)	2004-09-08	2004-09-08	Testing of a system-on-chip integrated circuit
TW094130241A TW200622586A (en)	2004-09-08	2005-09-05	Testing of a system-on-chip integrated circuit
PCT/IB2005/052900 WO2006027740A1 (en)	2004-09-08	2005-09-06	Testing of a system-on-chip integrated circuit

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
GB0419868A GB0419868D0 (en)	2004-09-08	2004-09-08	Testing of a system-on-chip integrated circuit

Publications (1)

Publication Number	Publication Date
GB0419868D0 true GB0419868D0 (en)	2004-10-13

Family

ID=33186619

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
GB0419868A Ceased GB0419868D0 (en)	2004-09-08	2004-09-08	Testing of a system-on-chip integrated circuit

Country Status (3)

Country	Link
GB (1)	GB0419868D0 (en)
TW (1)	TW200622586A (en)
WO (1)	WO2006027740A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US7928762B1 (en) *	2010-05-14	2011-04-19	Raytheon Company	Systems and methods for digitally decoding integrated circuit blocks
CN112924850A (en) *	2021-01-27	2021-06-08	胜达克半导体科技(上海)有限公司	Parallel test switching method applied to SOC chip of automatic tester

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5513188A (en) *	1991-09-10	1996-04-30	Hewlett-Packard Company	Enhanced interconnect testing through utilization of board topology data
US6505317B1 (en) *	2000-03-24	2003-01-07	Sun Microsystems, Inc.	System and method for testing signal interconnections using built-in self test
US6735543B2 (en) *	2001-11-29	2004-05-11	International Business Machines Corporation	Method and apparatus for testing, characterizing and tuning a chip interface

2004
- 2004-09-08 GB GB0419868A patent/GB0419868D0/en not_active Ceased
2005
- 2005-09-05 TW TW094130241A patent/TW200622586A/en unknown
- 2005-09-06 WO PCT/IB2005/052900 patent/WO2006027740A1/en active Application Filing

Also Published As

Publication number	Publication date
WO2006027740A1 (en)	2006-03-16
TW200622586A (en)	2006-07-01

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Legal Events

Date	Code	Title	Description
2005-12-28	AT	Applications terminated before publication under section 16(1)