GB0319460D0 - Calibration system - Google Patents
Calibration systemInfo
- Publication number
- GB0319460D0 GB0319460D0 GBGB0319460.2A GB0319460A GB0319460D0 GB 0319460 D0 GB0319460 D0 GB 0319460D0 GB 0319460 A GB0319460 A GB 0319460A GB 0319460 D0 GB0319460 D0 GB 0319460D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- calibration system
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/32—Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/62—Manufacturing, calibrating, or repairing devices used in investigations covered by the preceding subgroups
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q40/00—Calibration, e.g. of probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/005—Electromagnetic means
- G01N2203/0051—Piezoelectric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/0202—Control of the test
- G01N2203/021—Treatment of the signal; Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0286—Miniature specimen; Testing on microregions of a specimen
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0288—Springs
- G01N2203/029—Leaf spring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0288—Springs
- G01N2203/0292—Coil spring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/067—Parameter measured for estimating the property
- G01N2203/0676—Force, weight, load, energy, speed or acceleration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/067—Parameter measured for estimating the property
- G01N2203/0682—Spatial dimension, e.g. length, area, angle
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Manufacturing & Machinery (AREA)
- Engineering & Computer Science (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/557,275 US20060267596A1 (en) | 2003-05-21 | 2004-05-18 | Spring constant calibration device |
EP04733589A EP1625349A2 (en) | 2003-05-21 | 2004-05-18 | Spring constant calibration device |
PCT/GB2004/002134 WO2004104516A2 (en) | 2003-05-21 | 2004-05-18 | Spring constant calibration device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0311693.6A GB0311693D0 (en) | 2003-05-21 | 2003-05-21 | Calibration device |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0319460D0 true GB0319460D0 (en) | 2003-09-17 |
GB2401945A GB2401945A (en) | 2004-11-24 |
GB2401945B GB2401945B (en) | 2007-01-03 |
Family
ID=9958510
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB0311693.6A Ceased GB0311693D0 (en) | 2003-05-21 | 2003-05-21 | Calibration device |
GB0319460A Expired - Fee Related GB2401945B (en) | 2003-05-21 | 2003-08-19 | Calibration Device |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB0311693.6A Ceased GB0311693D0 (en) | 2003-05-21 | 2003-05-21 | Calibration device |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB0311693D0 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0423780D0 (en) * | 2004-10-26 | 2004-12-01 | Trade & Industry Sec Dep For | Lateral calibration device |
CN104793019B (en) * | 2014-01-18 | 2017-09-29 | 天津大学 | The source tracing method of micro-cantilever elastic constant is demarcated on AFM |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6337479B1 (en) * | 1994-07-28 | 2002-01-08 | Victor B. Kley | Object inspection and/or modification system and method |
JP3713695B2 (en) * | 1997-04-01 | 2005-11-09 | 株式会社島津製作所 | Scanning probe microscope |
DE19919030A1 (en) * | 1999-04-27 | 2000-11-16 | Bosch Gmbh Robert | Determination of material properties, such as Young's Modulus, of micro-structures with dimensions less than around 2 mm by deflection of a test element and measurement of a representative value before and during deflection |
US7066005B2 (en) * | 2001-02-28 | 2006-06-27 | Asylum Research Corporation | Noncontact sensitivity and compliance calibration method for cantilever-based insturments |
US6545495B2 (en) * | 2001-04-17 | 2003-04-08 | Ut-Battelle, Llc | Method and apparatus for self-calibration of capacitive sensors |
US6690179B2 (en) * | 2001-08-24 | 2004-02-10 | Symyx Technologies, Inc. | High throughput mechanical property testing of materials libraries using capacitance |
-
2003
- 2003-05-21 GB GBGB0311693.6A patent/GB0311693D0/en not_active Ceased
- 2003-08-19 GB GB0319460A patent/GB2401945B/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
GB0311693D0 (en) | 2003-06-25 |
GB2401945B (en) | 2007-01-03 |
GB2401945A (en) | 2004-11-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20090819 |