GB0316106D0 - Test structures and methods - Google Patents

Test structures and methods

Info

Publication number
GB0316106D0
GB0316106D0 GBGB0316106.4A GB0316106A GB0316106D0 GB 0316106 D0 GB0316106 D0 GB 0316106D0 GB 0316106 A GB0316106 A GB 0316106A GB 0316106 D0 GB0316106 D0 GB 0316106D0
Authority
GB
United Kingdom
Prior art keywords
methods
test structures
structures
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0316106.4A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cambridge Display Technology Ltd
Original Assignee
Cambridge Display Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cambridge Display Technology Ltd filed Critical Cambridge Display Technology Ltd
Priority to GBGB0316106.4A priority Critical patent/GB0316106D0/en
Publication of GB0316106D0 publication Critical patent/GB0316106D0/en
Priority to GB0526009A priority patent/GB2421852B/en
Priority to PCT/GB2004/002927 priority patent/WO2005006458A2/en
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H10K59/173—Passive-matrix OLED displays comprising banks or shadow masks
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H10K59/179—Interconnections, e.g. wiring lines or terminals
    • H10K59/1795—Interconnections, e.g. wiring lines or terminals comprising structures specially adapted for lowering the resistance
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80—Constructional details
    • H10K59/88—Dummy elements, i.e. elements having non-functional features

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
GBGB0316106.4A 2003-07-09 2003-07-09 Test structures and methods Ceased GB0316106D0 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GBGB0316106.4A GB0316106D0 (en) 2003-07-09 2003-07-09 Test structures and methods
GB0526009A GB2421852B (en) 2003-07-09 2004-07-07 Test Structures and Methods
PCT/GB2004/002927 WO2005006458A2 (en) 2003-07-09 2004-07-07 Test structures and methods

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0316106.4A GB0316106D0 (en) 2003-07-09 2003-07-09 Test structures and methods

Publications (1)

Publication Number Publication Date
GB0316106D0 true GB0316106D0 (en) 2003-08-13

Family

ID=27741888

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0316106.4A Ceased GB0316106D0 (en) 2003-07-09 2003-07-09 Test structures and methods
GB0526009A Expired - Fee Related GB2421852B (en) 2003-07-09 2004-07-07 Test Structures and Methods

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB0526009A Expired - Fee Related GB2421852B (en) 2003-07-09 2004-07-07 Test Structures and Methods

Country Status (2)

Country Link
GB (2) GB0316106D0 (en)
WO (1) WO2005006458A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7048602B2 (en) * 2003-08-25 2006-05-23 Eastman Kodak Company Correcting potential defects in an OLED device
US7214554B2 (en) * 2004-03-18 2007-05-08 Eastman Kodak Company Monitoring the deposition properties of an OLED
US9171497B2 (en) * 2013-05-06 2015-10-27 Shenzhen China Star Optoelectronics Technology Co., Ltd Method for inspecting packaging effectiveness of OLED panel
TWI636267B (en) * 2018-02-12 2018-09-21 友達光電股份有限公司 Method of testing light emitting diode

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6274978B1 (en) * 1999-02-23 2001-08-14 Sarnoff Corporation Fiber-based flat panel display
AU2001241497A1 (en) * 2000-02-14 2001-08-27 Sarnoff Corporation Light-emitting fiber, and method for making and testing same
KR100477100B1 (en) * 2000-08-17 2005-03-17 삼성에스디아이 주식회사 Method for fabricating organic electroluminescent display device
JP4051190B2 (en) * 2000-10-31 2008-02-20 シャープ株式会社 Display device manufacturing method, display device substrate, and measurement system
US6850080B2 (en) * 2001-03-19 2005-02-01 Semiconductor Energy Laboratory Co., Ltd. Inspection method and inspection apparatus
JP4209194B2 (en) * 2001-03-29 2009-01-14 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Permeability measurement and inspection method and measurement and inspection apparatus
CN1249446C (en) * 2001-05-15 2006-04-05 皇家菲利浦电子有限公司 Display device comprising plurality of LEDS

Also Published As

Publication number Publication date
GB2421852B (en) 2007-01-03
WO2005006458A3 (en) 2005-06-30
GB2421852A (en) 2006-07-05
WO2005006458A2 (en) 2005-01-20
GB0526009D0 (en) 2006-02-01

Similar Documents

Publication Publication Date Title
AU2003272477A8 (en) Stress test devices and methods
EP1610135A4 (en) Test device and test method
IL173585A0 (en) Sample preparation methods and devices
ZA200603882B (en) Substituted benzimidazole-, benztriazole-, and benzimidazolone-O-glucosides
EP1679966A4 (en) Substituted benzimidazole-, benztriazole-, and benzimidazolone-o-glucosides
EP1669733A4 (en) Chip using method and test chip
EP1638977A4 (en) Salinosporamides and methods for use thereof
EP1643907A4 (en) Lumen-measuring devices and method
EP1591875A4 (en) Handwriting-input device and method
HK1088837A1 (en) Clk-peptide and slk-peptide
EP1737565A4 (en) Cos-claus configurations and methods
IL172704A0 (en) Salinosporamides and methods for use thereof
EP1679739A4 (en) Sheet-peeling device and method
GB0318417D0 (en) Method and device
GB0313032D0 (en) Device and method
EP1612572A4 (en) Test device and setting method
GB2421852B (en) Test Structures and Methods
GB0300764D0 (en) Device and method
GB0324144D0 (en) Apparatus and methods
GB0305904D0 (en) Test
GB0307483D0 (en) Device and method
GB0224559D0 (en) Test
GB0306127D0 (en) Method and device
GB0320728D0 (en) Test
GB0320332D0 (en) Test procedure

Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)