GB0126303D0 - X-ray inspection apparatus - Google Patents

X-ray inspection apparatus

Info

Publication number
GB0126303D0
GB0126303D0 GB0126303A GB0126303A GB0126303D0 GB 0126303 D0 GB0126303 D0 GB 0126303D0 GB 0126303 A GB0126303 A GB 0126303A GB 0126303 A GB0126303 A GB 0126303A GB 0126303 D0 GB0126303 D0 GB 0126303D0
Authority
GB
United Kingdom
Prior art keywords
inspection apparatus
ray inspection
ray
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB0126303A
Other versions
GB2374267B (en
GB2374267A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ishida Co Ltd
Original Assignee
Ishida Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ishida Co Ltd filed Critical Ishida Co Ltd
Publication of GB0126303D0 publication Critical patent/GB0126303D0/en
Publication of GB2374267A publication Critical patent/GB2374267A/en
Application granted granted Critical
Publication of GB2374267B publication Critical patent/GB2374267B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB0126303A 2000-11-07 2001-11-01 X-ray inspection apparatus Expired - Fee Related GB2374267B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000338824A JP2002148211A (en) 2000-11-07 2000-11-07 X-ray inspecting apparatus

Publications (3)

Publication Number Publication Date
GB0126303D0 true GB0126303D0 (en) 2002-01-02
GB2374267A GB2374267A (en) 2002-10-09
GB2374267B GB2374267B (en) 2004-06-16

Family

ID=18813977

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0126303A Expired - Fee Related GB2374267B (en) 2000-11-07 2001-11-01 X-ray inspection apparatus

Country Status (4)

Country Link
JP (1) JP2002148211A (en)
KR (1) KR100830378B1 (en)
CN (2) CN101105464B (en)
GB (1) GB2374267B (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4530523B2 (en) * 2000-11-28 2010-08-25 アンリツ産機システム株式会社 X-ray foreign object detection device
JP4590915B2 (en) * 2004-04-23 2010-12-01 株式会社島津製作所 Radiation foreign matter inspection equipment
JP4669250B2 (en) * 2004-09-01 2011-04-13 株式会社イシダ X-ray inspection equipment
JP2006098195A (en) * 2004-09-29 2006-04-13 Ishida Co Ltd X-ray inspection device
JP4728148B2 (en) * 2006-03-09 2011-07-20 名古屋電機工業株式会社 X-ray detector diagnostic apparatus and X-ray detector diagnostic method
DE102006048608A1 (en) * 2006-10-13 2008-04-17 Siemens Ag Method for controlling a power state of an X-ray source and / or an X-ray detector and system for carrying out the method
JP5231922B2 (en) * 2008-09-30 2013-07-10 アンリツ産機システム株式会社 X-ray inspection equipment
JP5192997B2 (en) * 2008-11-25 2013-05-08 パナソニック株式会社 X-ray inspection equipment
JP5536575B2 (en) * 2010-07-15 2014-07-02 株式会社日立メディコ X-ray diagnostic imaging equipment
JP5901973B2 (en) * 2011-01-11 2016-04-13 株式会社東芝 X-ray diagnostic equipment
JP5860710B2 (en) * 2012-02-02 2016-02-16 アンリツインフィビス株式会社 X-ray inspection equipment
NL2015144B1 (en) * 2015-07-10 2017-02-01 Amiris B V Device and method for testing for microorganisms in foodstuffs kept in packages.
JP6923905B2 (en) * 2017-03-31 2021-08-25 松定プレシジョン株式会社 X-ray inspection equipment and X-ray inspection method
JP7001252B2 (en) * 2017-07-05 2022-01-19 株式会社イシダ X-ray inspection equipment
JP6965728B2 (en) * 2017-12-21 2021-11-10 株式会社島津製作所 Method for determining replacement time of X-ray analyzer and X-ray detector
KR102176101B1 (en) * 2018-05-11 2020-11-10 테크밸리 주식회사 Monitoring system for radiation dose
CN110165323A (en) * 2019-05-29 2019-08-23 上海精测半导体技术有限公司 Lithium battery recovery method and equipment
BR112022001264A2 (en) 2019-08-22 2022-03-15 John Bean Technologies Corp X-ray unit technology modules and automated application training

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3955119A (en) * 1973-01-29 1976-05-04 Varian Associates Apparatus for predicting incipient failure of an X-ray generator tube
JPS52128190A (en) * 1976-04-21 1977-10-27 Nec Corp Inspection device for x ray fluoroscopic adhering layer
JPS62132106A (en) * 1985-12-04 1987-06-15 Seiko Instr & Electronics Ltd Apparatus for measuring thickness of magnetic sheet
JPS6456036A (en) * 1987-08-26 1989-03-02 Hitachi Medical Corp X-ray ct apparatus
US4918714A (en) * 1988-08-19 1990-04-17 Varian Associates, Inc. X-ray tube exposure monitor
US5736930A (en) * 1995-07-21 1998-04-07 Apple Computer, Inc. Apparatus and method for radiation source failure prediction
US5668850A (en) * 1996-05-23 1997-09-16 General Electric Company Systems and methods of determining x-ray tube life
US6212256B1 (en) * 1998-11-25 2001-04-03 Ge Medical Global Technology Company, Llc X-ray tube replacement management system

Also Published As

Publication number Publication date
KR20020036705A (en) 2002-05-16
KR100830378B1 (en) 2008-05-20
GB2374267B (en) 2004-06-16
CN101105464A (en) 2008-01-16
JP2002148211A (en) 2002-05-22
GB2374267A (en) 2002-10-09
CN1356539A (en) 2002-07-03
CN101105464B (en) 2011-08-24

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20181101