GB0007747D0 - Methods and apparatus for atomic force microscopy - Google Patents

Methods and apparatus for atomic force microscopy

Info

Publication number: GB0007747D0
Authority: GB; United Kingdom
Prior art keywords: methods; atomic force; force microscopy; microscopy; atomic
Prior art date: 2000-03-30
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Ceased

Application number

GBGB0007747.9A

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

University of Bristol

Original Assignee

University of Bristol

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2000-03-30

Filing date

2000-03-30

Publication date

2000-05-17

2000-03-30 Application filed by University of Bristol filed Critical University of Bristol

2000-03-30 Priority to GBGB0007747.9A priority Critical patent/GB0007747D0/en

2000-05-17 Publication of GB0007747D0 publication Critical patent/GB0007747D0/en

2001-03-30 Priority to AU2001244350A priority patent/AU2001244350A1/en

2001-03-30 Priority to JP2001572856A priority patent/JP2003529761A/en

2001-03-30 Priority to CA002404604A priority patent/CA2404604A1/en

2001-03-30 Priority to US10/240,259 priority patent/US20030160170A1/en

2001-03-30 Priority to KR1020027012839A priority patent/KR20030015220A/en

2001-03-30 Priority to PCT/GB2001/001470 priority patent/WO2001075427A1/en

2001-03-30 Priority to EP01917266A priority patent/EP1269168A1/en

Status Ceased legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q20/00—Monitoring the movement or position of the probe
- G01Q20/02—Monitoring the movement or position of the probe by optical means

GBGB0007747.9A 2000-03-30 2000-03-30 Methods and apparatus for atomic force microscopy Ceased GB0007747D0 (en)

Priority Applications (8)

Application Number	Priority Date	Filing Date	Title
GBGB0007747.9A GB0007747D0 (en)	2000-03-30	2000-03-30	Methods and apparatus for atomic force microscopy
AU2001244350A AU2001244350A1 (en)	2000-03-30	2001-03-30	Methods and apparatus for atomic force microscopy
JP2001572856A JP2003529761A (en)	2000-03-30	2001-03-30	Apparatus and method for an atomic force microscope
CA002404604A CA2404604A1 (en)	2000-03-30	2001-03-30	Methods and apparatus for atomic force microscopy
US10/240,259 US20030160170A1 (en)	2000-03-30	2001-03-30	Methods and apparatus for atomic force microscopy
KR1020027012839A KR20030015220A (en)	2000-03-30	2001-03-30	Methods and apparatus for atomic force microscopy
PCT/GB2001/001470 WO2001075427A1 (en)	2000-03-30	2001-03-30	Methods and apparatus for atomic force microscopy
EP01917266A EP1269168A1 (en)	2000-03-30	2001-03-30	Methods and apparatus for atomic force microscopy

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
GBGB0007747.9A GB0007747D0 (en)	2000-03-30	2000-03-30	Methods and apparatus for atomic force microscopy

Publications (1)

Publication Number	Publication Date
GB0007747D0 true GB0007747D0 (en)	2000-05-17

Family

ID=9888772

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
GBGB0007747.9A Ceased GB0007747D0 (en)	2000-03-30	2000-03-30	Methods and apparatus for atomic force microscopy

Country Status (7)

Country	Link
EP (1)	EP1269168A1 (en)
JP (1)	JP2003529761A (en)
KR (1)	KR20030015220A (en)
AU (1)	AU2001244350A1 (en)
CA (1)	CA2404604A1 (en)
GB (1)	GB0007747D0 (en)
WO (1)	WO2001075427A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
KR100626222B1 (en) *	2004-12-22	2006-09-21	한양대학교 산학협력단	Functional disk of Scanning Probe Microscope and method for measuring voltage/current between the tip and the sample using functional disk of Scanning Probe Microscope
DE102007031112A1 (en)	2007-06-27	2009-01-02	Technische Universität Ilmenau	Apparatus and method for investigating surface properties of various materials
US20110138506A1 (en) *	2008-06-06	2011-06-09	Infinitesima Ltd	Method of probe alignment
KR101607606B1 (en)	2015-08-17	2016-03-31	한국표준과학연구원	Measuring method for atomic force microscope
JP6936964B2 (en) *	2016-08-26	2021-09-22	大日本印刷株式会社	Scanning probe microscope
CN111077347B (en) *	2019-12-25	2022-05-03	北京航空航天大学	Atomic force microscopy probe clamping device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5206702A (en) *	1989-10-09	1993-04-27	Olympus Optical Co., Ltd.	Technique for canceling the effect of external vibration on an atomic force microscope
US5291775A (en) *	1992-03-04	1994-03-08	Topometrix	Scanning force microscope with integrated optics and cantilever mount
JPH05256641A (en) *	1992-03-11	1993-10-05	Olympus Optical Co Ltd	Cantilever displacement detector
US5408094A (en) *	1992-05-07	1995-04-18	Olympus Optical Co., Ltd.	Atomic force microscope with light beam emission at predetermined angle
US5509300A (en) *	1994-05-12	1996-04-23	Arizona Board Of Regents Acting For Arizona State University	Non-contact force microscope having a coaxial cantilever-tip configuration
US5982009A (en) *	1997-03-01	1999-11-09	Korea Advanced Institute Of Science & Technology	Integrated device of cantilever and light source

2000
- 2000-03-30 GB GBGB0007747.9A patent/GB0007747D0/en not_active Ceased
2001
- 2001-03-30 CA CA002404604A patent/CA2404604A1/en not_active Abandoned
- 2001-03-30 EP EP01917266A patent/EP1269168A1/en not_active Withdrawn
- 2001-03-30 AU AU2001244350A patent/AU2001244350A1/en not_active Abandoned
- 2001-03-30 WO PCT/GB2001/001470 patent/WO2001075427A1/en not_active Application Discontinuation
- 2001-03-30 KR KR1020027012839A patent/KR20030015220A/en not_active Application Discontinuation
- 2001-03-30 JP JP2001572856A patent/JP2003529761A/en active Pending

Also Published As

Publication number	Publication date
WO2001075427A1 (en)	2001-10-11
CA2404604A1 (en)	2001-10-11
JP2003529761A (en)	2003-10-07
AU2001244350A1 (en)	2001-10-15
KR20030015220A (en)	2003-02-20
EP1269168A1 (en)	2003-01-02

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Legal Events

Date	Code	Title	Description
2001-07-11	AT	Applications terminated before publication under section 16(1)