FR3107983B1 - Dispositif de surveillance d'un circuit digital - Google Patents
Dispositif de surveillance d'un circuit digital Download PDFInfo
- Publication number
- FR3107983B1 FR3107983B1 FR2002212A FR2002212A FR3107983B1 FR 3107983 B1 FR3107983 B1 FR 3107983B1 FR 2002212 A FR2002212 A FR 2002212A FR 2002212 A FR2002212 A FR 2002212A FR 3107983 B1 FR3107983 B1 FR 3107983B1
- Authority
- FR
- France
- Prior art keywords
- circuit
- monitoring
- digital circuit
- component
- chain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012544 monitoring process Methods 0.000 title abstract 2
- 230000007704 transition Effects 0.000 abstract 3
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/023—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in clock generator or timing circuitry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31702—Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nanofabrics, mems, chips with magnetic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
- G01R31/31726—Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3177—Testing of logic operation, e.g. by logic analysers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/03—Astable circuits
- H03K3/0315—Ring oscillators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0409—Online test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Dispositif de surveillance d'un circuit digital La présente description concerne un dispositif (1) comprenant : un oscillateur en anneau (3) comprenant une chaine de composants logiques (C1, C2, C3, C4, C5) ; un ensemble d'éléments de mémorisation (M1, M2, M2, M4, M5) chacun associé à un composant logique différent et configuré pour mémoriser un état d'une sortie (O1, O2, O3, O4 O5) dudit composant auquel ledit élément de mémorisation est associé ; un premier circuit (7) configuré pour compter des transitions d'états d'une sortie (O4 ; O1) d'un composant logique donné (C1 ; C4) de ladite chaîne ; un deuxième circuit (5) configuré pour synchroniser chaque mémorisation avec un signal d'horloge (clk) ; et un troisième circuit (9) configuré pour déterminer un nombre de composants logiques traversés par une transition d'états entre deux fronts du signal d'horloge, à partir du nombre compté de transitions d'états et des états mémorisés desdites sorties. Figure pour l'abrégé : Fig. 1
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR2002212A FR3107983B1 (fr) | 2020-03-05 | 2020-03-05 | Dispositif de surveillance d'un circuit digital |
US17/189,984 US20210278461A1 (en) | 2020-03-05 | 2021-03-02 | Digital circuit monitoring device |
CN202110239520.8A CN113359015A (zh) | 2020-03-05 | 2021-03-04 | 数字电路监测设备 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR2002212 | 2020-03-05 | ||
FR2002212A FR3107983B1 (fr) | 2020-03-05 | 2020-03-05 | Dispositif de surveillance d'un circuit digital |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3107983A1 FR3107983A1 (fr) | 2021-09-10 |
FR3107983B1 true FR3107983B1 (fr) | 2022-05-27 |
Family
ID=70456995
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR2002212A Active FR3107983B1 (fr) | 2020-03-05 | 2020-03-05 | Dispositif de surveillance d'un circuit digital |
Country Status (3)
Country | Link |
---|---|
US (1) | US20210278461A1 (fr) |
CN (1) | CN113359015A (fr) |
FR (1) | FR3107983B1 (fr) |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6396896B1 (en) * | 2000-04-28 | 2002-05-28 | 3G.Com Inc. | Implementation of functions of multiple successive bits of a shift register |
US6850123B1 (en) * | 2003-05-27 | 2005-02-01 | Xilinx, Inc. | Circuits and methods for characterizing the speed performance of multi-input combinatorial logic |
DE102005024648B4 (de) * | 2005-05-25 | 2020-08-06 | Infineon Technologies Ag | Elektrische Schaltung zum Messen von Zeiten und Verfahren zum Messen von Zeiten |
US7495519B2 (en) * | 2007-04-30 | 2009-02-24 | International Business Machines Corporation | System and method for monitoring reliability of a digital system |
US7548823B2 (en) * | 2007-05-18 | 2009-06-16 | International Business Machines Corporation | Correction of delay-based metric measurements using delay circuits having differing metric sensitivities |
JP2013088394A (ja) * | 2011-10-21 | 2013-05-13 | Renesas Electronics Corp | 半導体装置 |
US9077322B2 (en) * | 2012-08-20 | 2015-07-07 | Tektronix, Inc. | Ring oscillator timer circuit |
US8786347B1 (en) * | 2013-05-14 | 2014-07-22 | Texas Instruments Incorporated | Delay circuits for simulating delays based on a single cycle of a clock signal |
US20150277393A1 (en) * | 2014-04-01 | 2015-10-01 | Qualcomm Incorporated | Integrated circuit dynamic de-aging |
US9652430B2 (en) * | 2015-02-10 | 2017-05-16 | Nxp Usa, Inc. | Configurable serial and pulse width modulation interface |
US9983262B1 (en) * | 2016-06-30 | 2018-05-29 | Amazon Technologies, Inc. | Built-in self test controller for a random number generator core |
US20180034452A1 (en) * | 2016-07-26 | 2018-02-01 | Qualcomm Incorporated | Circuit technique to track cmos device threshold variation |
EP3339985B1 (fr) * | 2016-12-22 | 2019-05-08 | ams AG | Convertisseur temps-numérique et procédé de conversion |
US20180350412A1 (en) * | 2017-06-06 | 2018-12-06 | Sandisk Technologies Llc | Systems and methods for adaptive parallel-serial conversion operations |
KR102413192B1 (ko) * | 2017-11-03 | 2022-06-24 | 삼성전자주식회사 | Nbti 또는 pbit를 모니터링하는 테스트 회로 |
-
2020
- 2020-03-05 FR FR2002212A patent/FR3107983B1/fr active Active
-
2021
- 2021-03-02 US US17/189,984 patent/US20210278461A1/en not_active Abandoned
- 2021-03-04 CN CN202110239520.8A patent/CN113359015A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
US20210278461A1 (en) | 2021-09-09 |
FR3107983A1 (fr) | 2021-09-10 |
CN113359015A (zh) | 2021-09-07 |
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Year of fee payment: 2 |
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PLSC | Publication of the preliminary search report |
Effective date: 20210910 |
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