FR3107119B1 - Système d’analyse d’une surface par projection d’une image lumineuse - Google Patents

Système d’analyse d’une surface par projection d’une image lumineuse Download PDF

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Publication number
FR3107119B1
FR3107119B1 FR2001232A FR2001232A FR3107119B1 FR 3107119 B1 FR3107119 B1 FR 3107119B1 FR 2001232 A FR2001232 A FR 2001232A FR 2001232 A FR2001232 A FR 2001232A FR 3107119 B1 FR3107119 B1 FR 3107119B1
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France
Prior art keywords
light image
analyzed
analyzing
projection
projected
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Active
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FR2001232A
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English (en)
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FR3107119A1 (fr
Inventor
Arnaud Jehl
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V Optics SAS
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V Optics SAS
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Publication date
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Priority to FR2001232A priority Critical patent/FR3107119B1/fr
Publication of FR3107119A1 publication Critical patent/FR3107119A1/fr
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Publication of FR3107119B1 publication Critical patent/FR3107119B1/fr
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Système d’analyse d’une surface par projection d’une image lumineuse L’invention a pour objet un système (1) d’analyse d’une surface (2) caractérisé en ce que le système (1) comprend : - un dispositif de projection (3), tel qu’un écran ou un afficheur, d’au moins une image lumineuse sur une surface (2) à analyser, l’image lumineuse projetée (11) comportant un schéma défini, - un dispositif d’acquisition (4) d’au moins une partie de l’image lumineuse réfléchie (12) par la surface (2) à analyser et issue de l’image lumineuse projetée (11), - une unité de calcul configurée pour caractériser le relief de la surface (2) à analyser par rapport à une surface de forme supposée parfaite prise comme référence, - un dispositif de réflexion (5) positionné sur l’axe du chemin optique de l’image lumineuse projetée (11) et configuré pour orienter au moins une partie de l’image lumineuse projetée (11) par le dispositif de projection (3) sur au moins une portion de la surface (2) à analyser selon une incidence rasante par rapport à la surface (2) à analyser. Figure à publier avec l’abrégé : Fig.1
FR2001232A 2020-02-07 2020-02-07 Système d’analyse d’une surface par projection d’une image lumineuse Active FR3107119B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR2001232A FR3107119B1 (fr) 2020-02-07 2020-02-07 Système d’analyse d’une surface par projection d’une image lumineuse

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2001232 2020-02-07
FR2001232A FR3107119B1 (fr) 2020-02-07 2020-02-07 Système d’analyse d’une surface par projection d’une image lumineuse

Publications (2)

Publication Number Publication Date
FR3107119A1 FR3107119A1 (fr) 2021-08-13
FR3107119B1 true FR3107119B1 (fr) 2022-04-22

Family

ID=70295401

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2001232A Active FR3107119B1 (fr) 2020-02-07 2020-02-07 Système d’analyse d’une surface par projection d’une image lumineuse

Country Status (1)

Country Link
FR (1) FR3107119B1 (fr)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4255055A (en) * 1979-05-11 1981-03-10 Libbey-Owens-Ford Company Surface inspection system for detecting flatness of planar sheet materials
JP4730836B2 (ja) * 2005-09-15 2011-07-20 Ｊｆｅスチール株式会社 面歪の測定装置及び方法
KR100870930B1 (ko) * 2007-05-08 2008-11-28 주식회사 고영테크놀러지 다방향 영사식 모아레 간섭계 및 이를 이용한 검사방법
FR2930030B1 (fr) * 2008-04-11 2012-12-28 Visuol Technologies Dispositif de controle de la qualite d'une surface
JP4685971B2 (ja) * 2009-09-24 2011-05-18 株式会社ケー・デー・イー 検査システム及び検査方法
FR2951544A1 (fr) * 2009-10-21 2011-04-22 Saint Gobain Procede d'analyse de la qualite d'un vitrage
US10036631B2 (en) * 2012-05-01 2018-07-31 Texas Department Of Transportation System and method for measuring three-dimensional surface features

Also Published As

Publication number Publication date
FR3107119A1 (fr) 2021-08-13

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