FR3042876B1 - Detection de perturbations d'une alimentation - Google Patents
Detection de perturbations d'une alimentationInfo
- Publication number
- FR3042876B1 FR3042876B1 FR1560259A FR1560259A FR3042876B1 FR 3042876 B1 FR3042876 B1 FR 3042876B1 FR 1560259 A FR1560259 A FR 1560259A FR 1560259 A FR1560259 A FR 1560259A FR 3042876 B1 FR3042876 B1 FR 3042876B1
- Authority
- FR
- France
- Prior art keywords
- disturbances
- detection
- power supply
- supply
- power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electronic Switches (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1560259A FR3042876B1 (fr) | 2015-10-27 | 2015-10-27 | Detection de perturbations d'une alimentation |
US15/076,955 US10067200B2 (en) | 2015-10-27 | 2016-03-22 | Detection of disturbances of a power supply |
US16/047,743 US10670666B2 (en) | 2015-10-27 | 2018-07-27 | Detection of disturbances of a power supply |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1560259A FR3042876B1 (fr) | 2015-10-27 | 2015-10-27 | Detection de perturbations d'une alimentation |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3042876A1 FR3042876A1 (fr) | 2017-04-28 |
FR3042876B1 true FR3042876B1 (fr) | 2017-12-15 |
Family
ID=55451280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1560259A Expired - Fee Related FR3042876B1 (fr) | 2015-10-27 | 2015-10-27 | Detection de perturbations d'une alimentation |
Country Status (2)
Country | Link |
---|---|
US (2) | US10067200B2 (fr) |
FR (1) | FR3042876B1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11460515B2 (en) | 2020-02-13 | 2022-10-04 | Stmicroelectronics (Grenoble 2) Sas | Compact supply voltage glitch sensor with adaptive amplitude sensitivity |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3071318A1 (fr) * | 2017-09-21 | 2019-03-22 | Stmicroelectronics (Rousset) Sas | Detection de perturbations d'une tension continue |
US11082202B2 (en) * | 2018-06-01 | 2021-08-03 | Arm Limited | Fault injection attack detection in integrated circuits |
CN112673263B (zh) * | 2019-08-15 | 2023-05-12 | 深圳市汇顶科技股份有限公司 | 毛刺信号检测电路、安全芯片和电子设备 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4163909A (en) * | 1977-08-23 | 1979-08-07 | International Business Machines Corporation | Peak detecting circuitry and dual threshold circuitry therefor |
US4463271A (en) * | 1981-12-28 | 1984-07-31 | Raytheon Company | Transistor switching circuitry having hysteresis |
JP2721151B2 (ja) * | 1986-04-01 | 1998-03-04 | 株式会社東芝 | 半導体集積回路装置 |
FR2641083B1 (fr) * | 1988-12-22 | 1991-05-10 | Sgs Thomson Microelectronics | |
JP2693874B2 (ja) * | 1991-03-18 | 1997-12-24 | 日本電気アイシーマイコンシステム株式会社 | 遅延パルス発生回路 |
US7113017B2 (en) * | 2004-07-01 | 2006-09-26 | Intersil Americas Inc. | Floating gate analog voltage level shift circuit and method for producing a voltage reference that operates on a low supply voltage |
GB2405701A (en) * | 2003-09-03 | 2005-03-09 | Seiko Epson Corp | Differential current sensing circuit |
EP1659690B1 (fr) * | 2004-11-22 | 2013-11-06 | Semiconductor Components Industries, LLC | Comparateur pour tensions d'entrée plus élevées que la tension d'alimentation |
EP1826766B1 (fr) * | 2006-02-28 | 2009-09-30 | STMicroelectronics S.r.l. | Circuit et procédé pour produire du courant regulé et pour supprimer les perturbations subies |
JP5168910B2 (ja) * | 2007-01-18 | 2013-03-27 | 株式会社リコー | 定電流回路及び定電流回路を使用した発光ダイオード駆動装置 |
KR20100098954A (ko) * | 2009-03-02 | 2010-09-10 | 삼성전자주식회사 | 레벨 검출기 및 이를 구비하는 전압 발생기 |
KR101727964B1 (ko) * | 2010-11-08 | 2017-04-19 | 삼성전자주식회사 | 전류 보상이 가능한 장치 및 메모리 장치 |
ITVI20110216A1 (it) * | 2011-08-02 | 2013-02-03 | St Microelectronics Srl | Sistema elettronico comprendente una struttura di sensore ed un'interfaccia analogica collegata ad essa con un intervallo di esercizio indipendente dal sensore |
US8988154B2 (en) * | 2012-10-11 | 2015-03-24 | Mediatek Singapore Pte. Ltd. | Voltage-to-current converter and voltage controlled oscillator having voltage-to-current converter |
US9274534B2 (en) * | 2012-12-21 | 2016-03-01 | Advanced Micro Devices, Inc. | Feed-forward compensation for low-dropout voltage regulator |
US8754673B1 (en) * | 2013-02-19 | 2014-06-17 | Integrated Device Technology Inc. | Adaptive reference voltage generators that support high speed signal detection |
JP6344956B2 (ja) * | 2013-04-19 | 2018-06-20 | ローム株式会社 | 電源回路 |
US9547324B2 (en) * | 2014-04-03 | 2017-01-17 | Qualcomm Incorporated | Power-efficient, low-noise, and process/voltage/temperature (PVT)—insensitive regulator for a voltage-controlled oscillator (VCO) |
-
2015
- 2015-10-27 FR FR1560259A patent/FR3042876B1/fr not_active Expired - Fee Related
-
2016
- 2016-03-22 US US15/076,955 patent/US10067200B2/en active Active
-
2018
- 2018-07-27 US US16/047,743 patent/US10670666B2/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11460515B2 (en) | 2020-02-13 | 2022-10-04 | Stmicroelectronics (Grenoble 2) Sas | Compact supply voltage glitch sensor with adaptive amplitude sensitivity |
Also Published As
Publication number | Publication date |
---|---|
US20180335481A1 (en) | 2018-11-22 |
US10067200B2 (en) | 2018-09-04 |
US20170115359A1 (en) | 2017-04-27 |
FR3042876A1 (fr) | 2017-04-28 |
US10670666B2 (en) | 2020-06-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 2 |
|
PLSC | Publication of the preliminary search report |
Effective date: 20170428 |
|
PLFP | Fee payment |
Year of fee payment: 3 |
|
PLFP | Fee payment |
Year of fee payment: 4 |
|
PLFP | Fee payment |
Year of fee payment: 5 |
|
ST | Notification of lapse |
Effective date: 20210605 |