FR3042876B1 - Detection de perturbations d'une alimentation - Google Patents

Detection de perturbations d'une alimentation

Info

Publication number
FR3042876B1
FR3042876B1 FR1560259A FR1560259A FR3042876B1 FR 3042876 B1 FR3042876 B1 FR 3042876B1 FR 1560259 A FR1560259 A FR 1560259A FR 1560259 A FR1560259 A FR 1560259A FR 3042876 B1 FR3042876 B1 FR 3042876B1
Authority
FR
France
Prior art keywords
disturbances
detection
power supply
supply
power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1560259A
Other languages
English (en)
Other versions
FR3042876A1 (fr
Inventor
Bruno Leduc
Pascal Bernon
Stephane Clin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Alps SAS
Original Assignee
STMicroelectronics Alps SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Alps SAS filed Critical STMicroelectronics Alps SAS
Priority to FR1560259A priority Critical patent/FR3042876B1/fr
Priority to US15/076,955 priority patent/US10067200B2/en
Publication of FR3042876A1 publication Critical patent/FR3042876A1/fr
Application granted granted Critical
Publication of FR3042876B1 publication Critical patent/FR3042876B1/fr
Priority to US16/047,743 priority patent/US10670666B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electronic Switches (AREA)
FR1560259A 2015-10-27 2015-10-27 Detection de perturbations d'une alimentation Expired - Fee Related FR3042876B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR1560259A FR3042876B1 (fr) 2015-10-27 2015-10-27 Detection de perturbations d'une alimentation
US15/076,955 US10067200B2 (en) 2015-10-27 2016-03-22 Detection of disturbances of a power supply
US16/047,743 US10670666B2 (en) 2015-10-27 2018-07-27 Detection of disturbances of a power supply

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1560259A FR3042876B1 (fr) 2015-10-27 2015-10-27 Detection de perturbations d'une alimentation

Publications (2)

Publication Number Publication Date
FR3042876A1 FR3042876A1 (fr) 2017-04-28
FR3042876B1 true FR3042876B1 (fr) 2017-12-15

Family

ID=55451280

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1560259A Expired - Fee Related FR3042876B1 (fr) 2015-10-27 2015-10-27 Detection de perturbations d'une alimentation

Country Status (2)

Country Link
US (2) US10067200B2 (fr)
FR (1) FR3042876B1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11460515B2 (en) 2020-02-13 2022-10-04 Stmicroelectronics (Grenoble 2) Sas Compact supply voltage glitch sensor with adaptive amplitude sensitivity

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3071318A1 (fr) * 2017-09-21 2019-03-22 Stmicroelectronics (Rousset) Sas Detection de perturbations d'une tension continue
US11082202B2 (en) * 2018-06-01 2021-08-03 Arm Limited Fault injection attack detection in integrated circuits
CN112673263B (zh) * 2019-08-15 2023-05-12 深圳市汇顶科技股份有限公司 毛刺信号检测电路、安全芯片和电子设备

Family Cites Families (18)

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Publication number Priority date Publication date Assignee Title
US4163909A (en) * 1977-08-23 1979-08-07 International Business Machines Corporation Peak detecting circuitry and dual threshold circuitry therefor
US4463271A (en) * 1981-12-28 1984-07-31 Raytheon Company Transistor switching circuitry having hysteresis
JP2721151B2 (ja) * 1986-04-01 1998-03-04 株式会社東芝 半導体集積回路装置
FR2641083B1 (fr) * 1988-12-22 1991-05-10 Sgs Thomson Microelectronics
JP2693874B2 (ja) * 1991-03-18 1997-12-24 日本電気アイシーマイコンシステム株式会社 遅延パルス発生回路
US7113017B2 (en) * 2004-07-01 2006-09-26 Intersil Americas Inc. Floating gate analog voltage level shift circuit and method for producing a voltage reference that operates on a low supply voltage
GB2405701A (en) * 2003-09-03 2005-03-09 Seiko Epson Corp Differential current sensing circuit
EP1659690B1 (fr) * 2004-11-22 2013-11-06 Semiconductor Components Industries, LLC Comparateur pour tensions d'entrée plus élevées que la tension d'alimentation
EP1826766B1 (fr) * 2006-02-28 2009-09-30 STMicroelectronics S.r.l. Circuit et procédé pour produire du courant regulé et pour supprimer les perturbations subies
JP5168910B2 (ja) * 2007-01-18 2013-03-27 株式会社リコー 定電流回路及び定電流回路を使用した発光ダイオード駆動装置
KR20100098954A (ko) * 2009-03-02 2010-09-10 삼성전자주식회사 레벨 검출기 및 이를 구비하는 전압 발생기
KR101727964B1 (ko) * 2010-11-08 2017-04-19 삼성전자주식회사 전류 보상이 가능한 장치 및 메모리 장치
ITVI20110216A1 (it) * 2011-08-02 2013-02-03 St Microelectronics Srl Sistema elettronico comprendente una struttura di sensore ed un'interfaccia analogica collegata ad essa con un intervallo di esercizio indipendente dal sensore
US8988154B2 (en) * 2012-10-11 2015-03-24 Mediatek Singapore Pte. Ltd. Voltage-to-current converter and voltage controlled oscillator having voltage-to-current converter
US9274534B2 (en) * 2012-12-21 2016-03-01 Advanced Micro Devices, Inc. Feed-forward compensation for low-dropout voltage regulator
US8754673B1 (en) * 2013-02-19 2014-06-17 Integrated Device Technology Inc. Adaptive reference voltage generators that support high speed signal detection
JP6344956B2 (ja) * 2013-04-19 2018-06-20 ローム株式会社 電源回路
US9547324B2 (en) * 2014-04-03 2017-01-17 Qualcomm Incorporated Power-efficient, low-noise, and process/voltage/temperature (PVT)—insensitive regulator for a voltage-controlled oscillator (VCO)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11460515B2 (en) 2020-02-13 2022-10-04 Stmicroelectronics (Grenoble 2) Sas Compact supply voltage glitch sensor with adaptive amplitude sensitivity

Also Published As

Publication number Publication date
US20180335481A1 (en) 2018-11-22
US10067200B2 (en) 2018-09-04
US20170115359A1 (en) 2017-04-27
FR3042876A1 (fr) 2017-04-28
US10670666B2 (en) 2020-06-02

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