FR3001564B1 - Systeme de determination d'une image tridimensionnelle d'un circuit electronique - Google Patents
Systeme de determination d'une image tridimensionnelle d'un circuit electroniqueInfo
- Publication number
- FR3001564B1 FR3001564B1 FR1350813A FR1350813A FR3001564B1 FR 3001564 B1 FR3001564 B1 FR 3001564B1 FR 1350813 A FR1350813 A FR 1350813A FR 1350813 A FR1350813 A FR 1350813A FR 3001564 B1 FR3001564 B1 FR 3001564B1
- Authority
- FR
- France
- Prior art keywords
- determining
- electronic circuit
- dimensional image
- dimensional
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
- H04N13/239—Image signal generators using stereoscopic image cameras using two 2D image sensors having a relative position equal to or related to the interocular distance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/20—Analysis of motion
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N2013/0074—Stereoscopic image analysis
- H04N2013/0081—Depth or disparity estimation from stereoscopic image signals
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Theoretical Computer Science (AREA)
- Signal Processing (AREA)
- Quality & Reliability (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1350813A FR3001564B1 (fr) | 2013-01-31 | 2013-01-31 | Systeme de determination d'une image tridimensionnelle d'un circuit electronique |
KR1020157021069A KR20150111944A (ko) | 2013-01-31 | 2014-01-30 | 전기 회로의 3차원 이미지를 결정하기 위한 시스템 |
CN201480006571.4A CN105283732A (zh) | 2013-01-31 | 2014-01-30 | 用于确定电子电路的三维图像的*** |
PCT/FR2014/050168 WO2014118469A1 (fr) | 2013-01-31 | 2014-01-30 | Systeme de determination d'une image tridimensionnelle d'un circuit electronique |
EP14705849.9A EP2951526A1 (fr) | 2013-01-31 | 2014-01-30 | Systeme de determination d'une image tridimensionnelle d'un circuit electronique |
US14/763,865 US20150365651A1 (en) | 2013-01-31 | 2014-01-30 | System for determining a three-dimensional image of an electronic circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1350813A FR3001564B1 (fr) | 2013-01-31 | 2013-01-31 | Systeme de determination d'une image tridimensionnelle d'un circuit electronique |
Publications (2)
Publication Number | Publication Date |
---|---|
FR3001564A1 FR3001564A1 (fr) | 2014-08-01 |
FR3001564B1 true FR3001564B1 (fr) | 2016-05-27 |
Family
ID=48521153
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1350813A Active FR3001564B1 (fr) | 2013-01-31 | 2013-01-31 | Systeme de determination d'une image tridimensionnelle d'un circuit electronique |
Country Status (6)
Country | Link |
---|---|
US (1) | US20150365651A1 (fr) |
EP (1) | EP2951526A1 (fr) |
KR (1) | KR20150111944A (fr) |
CN (1) | CN105283732A (fr) |
FR (1) | FR3001564B1 (fr) |
WO (1) | WO2014118469A1 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102017129737A1 (de) * | 2017-12-13 | 2019-06-13 | Hauni Maschinenbau Gmbh | Vorrichtung zur berührungslosen, optischen 3D-Erfassung einer Stirnfläche eines sich queraxial bewegenden, stabförmigen Artikels der tabakverarbeitenden Industrie |
FR3096126B1 (fr) * | 2019-05-15 | 2021-04-23 | Vit | Procede d'inspection optique d'un objet |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5956134A (en) * | 1997-07-11 | 1999-09-21 | Semiconductor Technologies & Instruments, Inc. | Inspection system and method for leads of semiconductor devices |
US6661523B1 (en) * | 1998-11-23 | 2003-12-09 | Inray Ltd. | Method for determining and designing optical elements |
US6449048B1 (en) * | 2000-05-11 | 2002-09-10 | Veeco Instruments, Inc. | Lateral-scanning interferometer with tilted optical axis |
US6795200B1 (en) * | 2000-11-13 | 2004-09-21 | Point Grey Research Inc. | Method and system for dimensioning boxes or other cuboid objects |
JP3878023B2 (ja) * | 2002-02-01 | 2007-02-07 | シーケーディ株式会社 | 三次元計測装置 |
US8224064B1 (en) * | 2003-05-21 | 2012-07-17 | University Of Kentucky Research Foundation, Inc. | System and method for 3D imaging using structured light illumination |
CA2435935A1 (fr) * | 2003-07-24 | 2005-01-24 | Guylain Lemelin | Numeriseur tridimensionnel optique a zone de non-ambiguite elargie |
WO2005083352A1 (fr) * | 2004-02-11 | 2005-09-09 | Filmetrics, Inc. | Procede et appareil de cartographie d'epaisseur a grande vitesse pour couches minces configurees |
FR2868156B1 (fr) * | 2004-03-25 | 2006-11-10 | Airbus France Sas | Procede et dispositif de controle non destructif de structure et de caracterisation des endommagements de structure par le principe de moire d'ombre |
US20060003111A1 (en) * | 2004-07-01 | 2006-01-05 | Tan Tseng | System and method for creating a 3D figurine using 2D and 3D image capture |
JP2006300676A (ja) * | 2005-04-19 | 2006-11-02 | Nikon Corp | 平坦度異常検出方法及び露光装置 |
JP4230525B2 (ja) * | 2005-05-12 | 2009-02-25 | 有限会社テクノドリーム二十一 | 3次元形状計測方法およびその装置 |
US7545512B2 (en) * | 2006-01-26 | 2009-06-09 | Koh Young Technology Inc. | Method for automated measurement of three-dimensional shape of circuit boards |
DE102009043823A1 (de) * | 2008-08-28 | 2010-07-29 | Werth Messtechnik Gmbh | Verfahren und Anordnung zum Bestimmen von Strukturen oder Geometrien eines Messobjektes |
GB2464453B8 (en) * | 2008-10-10 | 2016-09-14 | Toshiba Res Europ Ltd | An imaging system and method |
GB0900705D0 (en) * | 2009-01-16 | 2009-03-04 | Univ Huddersfield | Surface measurement system |
BR112012000189B1 (pt) * | 2009-06-17 | 2020-01-21 | 3Shape As | aparelho de varredura com foco. |
WO2011072175A2 (fr) * | 2009-12-09 | 2011-06-16 | Applied Precision, Inc. | Procédé et système pour réalisation d'image de microscopie à éclairage structuré en trois dimensions rapide |
TWI407075B (zh) * | 2010-03-16 | 2013-09-01 | Test Research Inc | 量測立體物件之系統 |
-
2013
- 2013-01-31 FR FR1350813A patent/FR3001564B1/fr active Active
-
2014
- 2014-01-30 WO PCT/FR2014/050168 patent/WO2014118469A1/fr active Application Filing
- 2014-01-30 US US14/763,865 patent/US20150365651A1/en not_active Abandoned
- 2014-01-30 EP EP14705849.9A patent/EP2951526A1/fr not_active Withdrawn
- 2014-01-30 CN CN201480006571.4A patent/CN105283732A/zh active Pending
- 2014-01-30 KR KR1020157021069A patent/KR20150111944A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
FR3001564A1 (fr) | 2014-08-01 |
EP2951526A1 (fr) | 2015-12-09 |
CN105283732A (zh) | 2016-01-27 |
WO2014118469A1 (fr) | 2014-08-07 |
KR20150111944A (ko) | 2015-10-06 |
US20150365651A1 (en) | 2015-12-17 |
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