FR2976096B1 - Système d'analyse de données de test de semi-conducteurs - Google Patents
Système d'analyse de données de test de semi-conducteursInfo
- Publication number
- FR2976096B1 FR2976096B1 FR1154877A FR1154877A FR2976096B1 FR 2976096 B1 FR2976096 B1 FR 2976096B1 FR 1154877 A FR1154877 A FR 1154877A FR 1154877 A FR1154877 A FR 1154877A FR 2976096 B1 FR2976096 B1 FR 2976096B1
- Authority
- FR
- France
- Prior art keywords
- data analysis
- analysis system
- testing data
- semiconductor testing
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
- G01R31/318511—Wafer Test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1154877A FR2976096B1 (fr) | 2011-06-06 | 2011-06-06 | Système d'analyse de données de test de semi-conducteurs |
EP12165093.1A EP2533063B1 (fr) | 2011-06-06 | 2012-04-23 | Système d'analyse de données de test de semiconducteurs |
US13/488,758 US20120316803A1 (en) | 2011-06-06 | 2012-06-05 | Semiconductor test data analysis system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1154877A FR2976096B1 (fr) | 2011-06-06 | 2011-06-06 | Système d'analyse de données de test de semi-conducteurs |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2976096A1 FR2976096A1 (fr) | 2012-12-07 |
FR2976096B1 true FR2976096B1 (fr) | 2013-06-21 |
Family
ID=45954538
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1154877A Expired - Fee Related FR2976096B1 (fr) | 2011-06-06 | 2011-06-06 | Système d'analyse de données de test de semi-conducteurs |
Country Status (3)
Country | Link |
---|---|
US (1) | US20120316803A1 (fr) |
EP (1) | EP2533063B1 (fr) |
FR (1) | FR2976096B1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8187897B2 (en) * | 2008-08-19 | 2012-05-29 | International Business Machines Corporation | Fabricating product chips and die with a feature pattern that contains information relating to the product chip |
CN103521463B (zh) * | 2013-10-29 | 2016-05-11 | 高佳太阳能股份有限公司 | 一种基于光致发光的太阳能硅片分选***及方法 |
US10318438B1 (en) * | 2017-12-07 | 2019-06-11 | Nuvoton Technology Corporation | Secure memory access using memory read restriction |
CN113049935A (zh) * | 2021-03-04 | 2021-06-29 | 长鑫存储技术有限公司 | 半导体智能检测***、智能检测方法及存储介质 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6445206B1 (en) * | 2000-05-31 | 2002-09-03 | Agere Systems Guardian Corp. | Method and apparatus for determining yield impacting tests at wafer level package level for semiconductor devices |
US20110178967A1 (en) * | 2001-05-24 | 2011-07-21 | Test Advantage, Inc. | Methods and apparatus for data analysis |
KR100909474B1 (ko) * | 2005-08-10 | 2009-07-28 | 삼성전자주식회사 | 웨이퍼 결함지수를 사용하여 국부성 불량 모드를 갖는결함성 반도체 웨이퍼의 검출 방법들 및 이에 사용되는장비들 |
KR100809340B1 (ko) * | 2007-01-15 | 2008-03-07 | 삼성전자주식회사 | 반도체 집적 회로 장치의 불량 분석 방법 및 시스템 |
-
2011
- 2011-06-06 FR FR1154877A patent/FR2976096B1/fr not_active Expired - Fee Related
-
2012
- 2012-04-23 EP EP12165093.1A patent/EP2533063B1/fr active Active
- 2012-06-05 US US13/488,758 patent/US20120316803A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
FR2976096A1 (fr) | 2012-12-07 |
EP2533063A1 (fr) | 2012-12-12 |
EP2533063B1 (fr) | 2014-10-08 |
US20120316803A1 (en) | 2012-12-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 5 |
|
ST | Notification of lapse |
Effective date: 20170228 |