FR2974183B1 - Dispositif de perturbation du fonctionnement d'un circuit integre. - Google Patents

Dispositif de perturbation du fonctionnement d'un circuit integre.

Info

Publication number
FR2974183B1
FR2974183B1 FR1101133A FR1101133A FR2974183B1 FR 2974183 B1 FR2974183 B1 FR 2974183B1 FR 1101133 A FR1101133 A FR 1101133A FR 1101133 A FR1101133 A FR 1101133A FR 2974183 B1 FR2974183 B1 FR 2974183B1
Authority
FR
France
Prior art keywords
integrated circuit
disturbing
beams
optical system
support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1101133A
Other languages
English (en)
Other versions
FR2974183A1 (fr
Inventor
Thierry Huque
Jean Louis Modave
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Proton World International NV
Original Assignee
Proton World International NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Proton World International NV filed Critical Proton World International NV
Priority to FR1101133A priority Critical patent/FR2974183B1/fr
Priority to US13/444,349 priority patent/US8946658B2/en
Publication of FR2974183A1 publication Critical patent/FR2974183A1/fr
Application granted granted Critical
Publication of FR2974183B1 publication Critical patent/FR2974183B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31719—Security aspects, e.g. preventing unauthorised access during test

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Electromagnetism (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR1101133A 2011-04-13 2011-04-13 Dispositif de perturbation du fonctionnement d'un circuit integre. Expired - Fee Related FR2974183B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1101133A FR2974183B1 (fr) 2011-04-13 2011-04-13 Dispositif de perturbation du fonctionnement d'un circuit integre.
US13/444,349 US8946658B2 (en) 2011-04-13 2012-04-11 Device for disturbing the operation of an integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1101133A FR2974183B1 (fr) 2011-04-13 2011-04-13 Dispositif de perturbation du fonctionnement d'un circuit integre.

Publications (2)

Publication Number Publication Date
FR2974183A1 FR2974183A1 (fr) 2012-10-19
FR2974183B1 true FR2974183B1 (fr) 2013-12-13

Family

ID=45463633

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1101133A Expired - Fee Related FR2974183B1 (fr) 2011-04-13 2011-04-13 Dispositif de perturbation du fonctionnement d'un circuit integre.

Country Status (2)

Country Link
US (1) US8946658B2 (fr)
FR (1) FR2974183B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108508351B (zh) * 2018-03-30 2020-05-05 西北核技术研究所 一种基于双-双指数电流源的单粒子故障注入仿真方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4795260A (en) * 1987-05-15 1989-01-03 Therma-Wave, Inc. Apparatus for locating and testing areas of interest on a workpiece
DD273695A1 (de) * 1988-07-04 1989-11-22 Univ Schiller Jena Verfahren zur erfassung schnell ablaufender prozesse in integrierten schaltkreisen unter verwendung eines laser-raster-mikroskopes mit obic-stufe
US6859031B2 (en) * 2002-02-01 2005-02-22 Credence Systems Corporation Apparatus and method for dynamic diagnostic testing of integrated circuits
JP4118935B2 (ja) * 2005-02-28 2008-07-16 株式会社テクニカル 被処理物体多方向電磁波照射系、レーザー加工装置および紫外線硬化型樹脂接着加工装置
US7450245B2 (en) * 2005-06-29 2008-11-11 Dcg Systems, Inc. Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
US7616312B2 (en) * 2005-06-29 2009-11-10 Dcg Systems, Inc. Apparatus and method for probing integrated circuits using laser illumination
US20070245956A1 (en) * 2006-02-23 2007-10-25 Picodeon Ltd Oy Surface treatment technique and surface treatment apparatus associated with ablation technology
EP2032500A1 (fr) * 2006-06-07 2009-03-11 Mycrolab Diagnostics Pty Ltd Production de dispositifs microfluidiques utilisant des ondes de choc induites par un laser
US20090046757A1 (en) * 2007-08-16 2009-02-19 Semiconductor Energy Laboratory Co., Ltd. Laser irradiation apparatus, laser irradiation method, and manufacturing method of semiconductor device
US8278959B2 (en) * 2008-12-18 2012-10-02 Semicaps Pte Ltd Method and system for measuring laser induced phenomena changes in a semiconductor device
EP2526592B1 (fr) * 2010-01-22 2021-06-23 Newport Corporation Oscillateur paramétrique optique largement accordable

Also Published As

Publication number Publication date
US8946658B2 (en) 2015-02-03
FR2974183A1 (fr) 2012-10-19
US20120261594A1 (en) 2012-10-18

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