FR2962225B1 - Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs - Google Patents

Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs

Info

Publication number
FR2962225B1
FR2962225B1 FR1055292A FR1055292A FR2962225B1 FR 2962225 B1 FR2962225 B1 FR 2962225B1 FR 1055292 A FR1055292 A FR 1055292A FR 1055292 A FR1055292 A FR 1055292A FR 2962225 B1 FR2962225 B1 FR 2962225B1
Authority
FR
France
Prior art keywords
characterizing
sensitivity
electronic components
destructive mechanisms
destructive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1055292A
Other languages
English (en)
Other versions
FR2962225A1 (fr
Inventor
Florent Miller
Sebastien Morand
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Group SAS
Original Assignee
European Aeronautic Defence and Space Company EADS France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR1055292A priority Critical patent/FR2962225B1/fr
Application filed by European Aeronautic Defence and Space Company EADS France filed Critical European Aeronautic Defence and Space Company EADS France
Priority to CA2803054A priority patent/CA2803054A1/fr
Priority to JP2013517303A priority patent/JP6023050B2/ja
Priority to CN201180033072.0A priority patent/CN102959416B/zh
Priority to BR112012033461A priority patent/BR112012033461A2/pt
Priority to PCT/EP2011/061034 priority patent/WO2012001119A1/fr
Priority to EP11733613.1A priority patent/EP2588874A1/fr
Priority to US13/807,889 priority patent/US9506970B2/en
Publication of FR2962225A1 publication Critical patent/FR2962225A1/fr
Application granted granted Critical
Publication of FR2962225B1 publication Critical patent/FR2962225B1/fr
Priority to IL223823A priority patent/IL223823A/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G01R31/2848—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms using simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B1/00—Measuring instruments characterised by the selection of material therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31816—Soft error testing; Soft error rate evaluation; Single event testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
FR1055292A 2010-07-01 2010-07-01 Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs Active FR2962225B1 (fr)

Priority Applications (9)

Application Number Priority Date Filing Date Title
FR1055292A FR2962225B1 (fr) 2010-07-01 2010-07-01 Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs
JP2013517303A JP6023050B2 (ja) 2010-07-01 2011-06-30 破壊メカニズムに対する電子コンポーネントの感受性を特性化するための方法
CN201180033072.0A CN102959416B (zh) 2010-07-01 2011-06-30 表征电子元件对损毁机制的敏感度的方法
BR112012033461A BR112012033461A2 (pt) 2010-07-01 2011-06-30 processo de caracterização da sensibilidade de componentes eletrônicos em relação a mecanismos destrutivos
CA2803054A CA2803054A1 (fr) 2010-07-01 2011-06-30 Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs
PCT/EP2011/061034 WO2012001119A1 (fr) 2010-07-01 2011-06-30 Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs
EP11733613.1A EP2588874A1 (fr) 2010-07-01 2011-06-30 Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs
US13/807,889 US9506970B2 (en) 2010-07-01 2011-06-30 Method for characterizing the sensitivity of electronic components to destructive mechanisms
IL223823A IL223823A (en) 2010-07-01 2012-12-24 A method for characterizing the sensitivity of electronic components to destructive mechanisms

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1055292A FR2962225B1 (fr) 2010-07-01 2010-07-01 Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs

Publications (2)

Publication Number Publication Date
FR2962225A1 FR2962225A1 (fr) 2012-01-06
FR2962225B1 true FR2962225B1 (fr) 2012-08-17

Family

ID=43598246

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1055292A Active FR2962225B1 (fr) 2010-07-01 2010-07-01 Procede de caracterisation de la sensibilite de composants electroniques vis-a-vis de mecanismes destructifs

Country Status (9)

Country Link
US (1) US9506970B2 (fr)
EP (1) EP2588874A1 (fr)
JP (1) JP6023050B2 (fr)
CN (1) CN102959416B (fr)
BR (1) BR112012033461A2 (fr)
CA (1) CA2803054A1 (fr)
FR (1) FR2962225B1 (fr)
IL (1) IL223823A (fr)
WO (1) WO2012001119A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9904750B2 (en) * 2014-03-07 2018-02-27 The Boeing Company System and method to predict whether a protection circuit is likely to prevent a latent failure within a monitored circuit
WO2018148377A1 (fr) 2017-02-08 2018-08-16 Vanderbilt University Déclenchement parasite efficace d'événement isolé induit par laser et procédés de fonctionnement
WO2019038836A1 (fr) * 2017-08-22 2019-02-28 富士通株式会社 Procédé d'inspection d'erreur logique, dispositif d'inspection d'erreur logique et système d'inspection d'erreur logique
JP7145826B2 (ja) * 2019-08-27 2022-10-03 三菱電機株式会社 Ｓｅｂ耐性評価方法およびｓｅｂ耐性評価装置
CN111737934A (zh) * 2020-06-30 2020-10-02 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） 功率器件的敏感区域检测方法、计算机设备及存储介质
CN114676571B (zh) * 2022-03-25 2024-03-22 扬州大学 一种功率器件的单粒子硬错误鉴别方法
JP2024039422A (ja) * 2022-09-09 2024-03-22 株式会社デンソー 特性予測システム

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4572954A (en) * 1984-06-11 1986-02-25 The United States Of America As Represented By The Secretary Of The Air Force Radiation measuring system using transister flux sensors
US4786865A (en) * 1986-03-03 1988-11-22 The Boeing Company Method and apparatus for testing integrated circuit susceptibility to cosmic rays
US6800852B2 (en) * 2002-12-27 2004-10-05 Revera Incorporated Nondestructive characterization of thin films using measured basis spectra
US7019311B1 (en) * 2004-03-25 2006-03-28 Sandia Corporation Laser-based irradiation apparatus and methods for monitoring the dose-rate response of semiconductor devices
US7787779B2 (en) * 2005-05-06 2010-08-31 Purdue Research Foundation Photonic time-domain electromagnetic signal generator and system using the same
US20080142899A1 (en) * 2006-08-04 2008-06-19 Silicon Space Technology Corporation Radiation immunity of integrated circuits using backside die contact and electrically conductive layers
US8299767B1 (en) * 2006-08-18 2012-10-30 Picor Corporation Dynamic safe operating area control
US7499308B2 (en) * 2007-03-21 2009-03-03 International Business Machines Corporation Programmable heavy-ion sensing device for accelerated DRAM soft error detection
US8024163B2 (en) * 2007-07-23 2011-09-20 International Business Machines Corporation Method and apparatus for executing multiple simulations on a supercomputer
FR2920882B1 (fr) * 2007-09-06 2010-02-26 Eads Europ Aeronautic Defence Procede de caracterisation des conditions d'utilisation d'un composant electronique permettant de limiter sa sensibilite aux interactions energetiques
US8886779B2 (en) * 2007-10-19 2014-11-11 Oracle America, Inc. Performance modeling for SOA security appliance
FR2923021B1 (fr) * 2007-10-26 2010-02-19 Eads Europ Aeronautic Defence Procede de determination de la sensibilite des composants electroniques vis-a-vis des particules.
CN100538378C (zh) * 2007-11-22 2009-09-09 北京圣涛平试验工程技术研究院有限责任公司 获取单粒子现象截面与重离子线性能量转移关系的方法

Also Published As

Publication number Publication date
JP2013531797A (ja) 2013-08-08
BR112012033461A2 (pt) 2016-11-22
CA2803054A1 (fr) 2012-01-05
WO2012001119A1 (fr) 2012-01-05
CN102959416A (zh) 2013-03-06
IL223823A (en) 2017-04-30
FR2962225A1 (fr) 2012-01-06
CN102959416B (zh) 2016-02-03
US9506970B2 (en) 2016-11-29
EP2588874A1 (fr) 2013-05-08
JP6023050B2 (ja) 2016-11-09
US20130099774A1 (en) 2013-04-25

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