FR2908513B1 - Systeme d'echantillonnage en temps equivalent - Google Patents

Systeme d'echantillonnage en temps equivalent

Info

Publication number
FR2908513B1
FR2908513B1 FR0756485A FR0756485A FR2908513B1 FR 2908513 B1 FR2908513 B1 FR 2908513B1 FR 0756485 A FR0756485 A FR 0756485A FR 0756485 A FR0756485 A FR 0756485A FR 2908513 B1 FR2908513 B1 FR 2908513B1
Authority
FR
France
Prior art keywords
sampling system
time sampling
equivalent time
equivalent
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR0756485A
Other languages
English (en)
Other versions
FR2908513A1 (fr
Inventor
Jeffrey S Bottman
William K Gessaman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of FR2908513A1 publication Critical patent/FR2908513A1/fr
Application granted granted Critical
Publication of FR2908513B1 publication Critical patent/FR2908513B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
FR0756485A 2006-07-16 2007-07-13 Systeme d'echantillonnage en temps equivalent Active FR2908513B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US80749806P 2006-07-16 2006-07-16
US11/462,996 US7403274B2 (en) 2006-07-16 2006-08-07 Equivalent time sampling system

Publications (2)

Publication Number Publication Date
FR2908513A1 FR2908513A1 (fr) 2008-05-16
FR2908513B1 true FR2908513B1 (fr) 2016-01-01

Family

ID=38948926

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0756485A Active FR2908513B1 (fr) 2006-07-16 2007-07-13 Systeme d'echantillonnage en temps equivalent

Country Status (2)

Country Link
US (1) US7403274B2 (fr)
FR (1) FR2908513B1 (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130315579A1 (en) * 2012-05-25 2013-11-28 Verizon Patent And Licensing Inc. Method and system for providing a shared demarcation point to monitor network performance
CN102868401B (zh) * 2012-09-14 2016-02-03 南京协力电子科技集团有限公司 一种tdr中高速模数变换的方法及其电路装置
US9752955B2 (en) 2014-07-31 2017-09-05 Ii-Vi Incorporated Edge propagating optical time domain reflectometer and method of using the same
CN105490734B (zh) * 2014-09-25 2019-09-03 华为技术有限公司 一种光纤长度测量方法及装置
JP6386426B2 (ja) * 2015-08-17 2018-09-05 株式会社タムラ製作所 移動体の検出装置、検出装置のプログラム
CN106961069B (zh) * 2017-04-25 2019-02-01 电子科技大学 基于反馈结构的高消光比周期脉冲信号产生***及方法
JP6861906B2 (ja) * 2018-11-02 2021-04-21 三菱電機株式会社 レーダ装置及び信号処理方法
CN110736877B (zh) * 2019-09-26 2021-09-28 山东信通电子股份有限公司 一种时域反射信号的高速采集方法及装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7173443B1 (en) * 1998-11-24 2007-02-06 Advantest Corp. Semiconductor test system
DE60032726T2 (de) * 1999-09-10 2007-10-04 Anritsu Corp., Atsugi OPTISCHES ZEITBEREICHSREFLEkTOMETER
US7697912B2 (en) * 2005-09-22 2010-04-13 Freescale Semiconductor, Inc. Method to adjustably convert a first data signal having a first time domain to a second data signal having a second time domain

Also Published As

Publication number Publication date
US7403274B2 (en) 2008-07-22
FR2908513A1 (fr) 2008-05-16
US20080013079A1 (en) 2008-01-17

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