FR2751083B1 - METHOD AND DEVICE FOR QUANTIFYING THE IMPACT OF COSMIC RADIATION ON ELECTRONIC MEMORY EQUIPMENT - Google Patents

METHOD AND DEVICE FOR QUANTIFYING THE IMPACT OF COSMIC RADIATION ON ELECTRONIC MEMORY EQUIPMENT

Info

Publication number
FR2751083B1
FR2751083B1 FR9608737A FR9608737A FR2751083B1 FR 2751083 B1 FR2751083 B1 FR 2751083B1 FR 9608737 A FR9608737 A FR 9608737A FR 9608737 A FR9608737 A FR 9608737A FR 2751083 B1 FR2751083 B1 FR 2751083B1
Authority
FR
France
Prior art keywords
memory
cosmic radiation
quantifying
impact
breakdown
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9608737A
Other languages
French (fr)
Other versions
FR2751083A1 (en
Inventor
Christian Pitot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales Avionics SAS
Original Assignee
Thales Avionics SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thales Avionics SAS filed Critical Thales Avionics SAS
Priority to FR9608737A priority Critical patent/FR2751083B1/en
Priority to PCT/FR1997/001284 priority patent/WO1998002887A1/en
Publication of FR2751083A1 publication Critical patent/FR2751083A1/en
Application granted granted Critical
Publication of FR2751083B1 publication Critical patent/FR2751083B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1024—Identification of the type of error
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention concerns a method for quantifying the impact of cosmic radiation on an electronic equipment with memory, characterised in that it consists: in writing and verification testing of a volatile (MSN) memory, with capacity memory and sensitivity close to electronic equipment; in case of a bit upset, in determining if the upset is attributable to cosmic radiation or to a memory breakdown; in transmitting a message attributing the breakdown to cosmic radiation or the memory breakdown acceding to the results of the determining step. The invention is applicable to electronic equipment with memory loaded on aerodynes.
FR9608737A 1996-07-12 1996-07-12 METHOD AND DEVICE FOR QUANTIFYING THE IMPACT OF COSMIC RADIATION ON ELECTRONIC MEMORY EQUIPMENT Expired - Fee Related FR2751083B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9608737A FR2751083B1 (en) 1996-07-12 1996-07-12 METHOD AND DEVICE FOR QUANTIFYING THE IMPACT OF COSMIC RADIATION ON ELECTRONIC MEMORY EQUIPMENT
PCT/FR1997/001284 WO1998002887A1 (en) 1996-07-12 1997-07-11 Method and device for quantifying the impact of cosmic radiation on an electronic equipement with memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9608737A FR2751083B1 (en) 1996-07-12 1996-07-12 METHOD AND DEVICE FOR QUANTIFYING THE IMPACT OF COSMIC RADIATION ON ELECTRONIC MEMORY EQUIPMENT

Publications (2)

Publication Number Publication Date
FR2751083A1 FR2751083A1 (en) 1998-01-16
FR2751083B1 true FR2751083B1 (en) 1998-10-30

Family

ID=9493992

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9608737A Expired - Fee Related FR2751083B1 (en) 1996-07-12 1996-07-12 METHOD AND DEVICE FOR QUANTIFYING THE IMPACT OF COSMIC RADIATION ON ELECTRONIC MEMORY EQUIPMENT

Country Status (2)

Country Link
FR (1) FR2751083B1 (en)
WO (1) WO1998002887A1 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4506362A (en) * 1978-12-22 1985-03-19 Gould Inc. Systematic memory error detection and correction apparatus and method
US4255808A (en) * 1979-04-19 1981-03-10 Sperry Corporation Hard or soft cell failure differentiator
JPS6051749B2 (en) * 1979-08-31 1985-11-15 富士通株式会社 Error correction method
JPS61264599A (en) * 1985-05-16 1986-11-22 Fujitsu Ltd Semiconductor memory device
US4964130A (en) * 1988-12-21 1990-10-16 Bull Hn Information Systems Inc. System for determining status of errors in a memory subsystem

Also Published As

Publication number Publication date
FR2751083A1 (en) 1998-01-16
WO1998002887A1 (en) 1998-01-22

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Legal Events

Date Code Title Description
ST Notification of lapse