FR2730862B1 - Connecteur a coins ameliore pour circuits integres - Google Patents

Connecteur a coins ameliore pour circuits integres

Info

Publication number
FR2730862B1
FR2730862B1 FR9601861A FR9601861A FR2730862B1 FR 2730862 B1 FR2730862 B1 FR 2730862B1 FR 9601861 A FR9601861 A FR 9601861A FR 9601861 A FR9601861 A FR 9601861A FR 2730862 B1 FR2730862 B1 FR 2730862B1
Authority
FR
France
Prior art keywords
integrated circuits
corner connector
improved corner
improved
connector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9601861A
Other languages
English (en)
Other versions
FR2730862A1 (fr
Inventor
Robert H Wardell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of FR2730862A1 publication Critical patent/FR2730862A1/fr
Application granted granted Critical
Publication of FR2730862B1 publication Critical patent/FR2730862B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R31/00—Coupling parts supported only by co-operation with counterpart
    • H01R31/06—Intermediate parts for linking two coupling parts, e.g. adapter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R4/00—Electrically-conductive connections between two or more conductive members in direct contact, i.e. touching one another; Means for effecting or maintaining such contact; Electrically-conductive connections having two or more spaced connecting locations for conductors and using contact members penetrating insulation
    • H01R4/28—Clamped connections, spring connections
    • H01R4/50—Clamped connections, spring connections utilising a cam, wedge, cone or ball also combined with a screw
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/912—Electrical connectors with testing means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Connecting Device With Holders (AREA)
FR9601861A 1995-02-17 1996-02-15 Connecteur a coins ameliore pour circuits integres Expired - Fee Related FR2730862B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/390,194 US5507652A (en) 1995-02-17 1995-02-17 Wedge connector for integrated circuits

Publications (2)

Publication Number Publication Date
FR2730862A1 FR2730862A1 (fr) 1996-08-23
FR2730862B1 true FR2730862B1 (fr) 1999-01-29

Family

ID=23541490

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9601861A Expired - Fee Related FR2730862B1 (fr) 1995-02-17 1996-02-15 Connecteur a coins ameliore pour circuits integres

Country Status (5)

Country Link
US (1) US5507652A (fr)
JP (1) JP3907731B2 (fr)
DE (1) DE19605630C2 (fr)
FR (1) FR2730862B1 (fr)
NL (1) NL1002280C2 (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5923177A (en) * 1997-03-27 1999-07-13 Hewlett-Packard Company Portable wedge probe for perusing signals on the pins of an IC
US6411112B1 (en) * 1998-02-19 2002-06-25 International Business Machines Corporation Off-axis contact tip and dense packing design for a fine pitch probe
US6518780B1 (en) * 2000-07-31 2003-02-11 Lecroy Corporation Electrical test probe wedge tip
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech Inc Wafersonde
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
WO2005065258A2 (fr) 2003-12-24 2005-07-21 Cascade Microtech, Inc. Sonde de tranche a semi-conducteur possedant un circuit actif
WO2006031646A2 (fr) 2004-09-13 2006-03-23 Cascade Microtech, Inc. Structures pour sonder deux cotes d'un dispositif
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
JP5584032B2 (ja) * 2010-07-12 2014-09-03 株式会社エンプラス 電気部品用ソケット
US9244099B2 (en) 2011-05-09 2016-01-26 Cascade Microtech, Inc. Probe head assemblies, components thereof, test systems including the same, and methods of operating the same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1244572A (en) * 1969-05-23 1971-09-02 M E L Equipment Co Ltd Electrical probe
US5015946A (en) * 1990-02-26 1991-05-14 Tektronix, Inc. High density probe
US5314342A (en) * 1992-09-09 1994-05-24 Hewlett-Packard Company Universal probe adapter
US5345364A (en) * 1993-08-18 1994-09-06 Minnesota Mining And Manufacturing Company Edge-connecting printed circuit board
US5701086A (en) * 1993-10-26 1997-12-23 Hewlett-Packard Company Connecting test equipment to adjacent legs of an IC or the like by interdigitating conductive wedges with the legs
US5463324A (en) * 1993-10-26 1995-10-31 Hewlett-Packard Company Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like
US5391082A (en) * 1993-10-26 1995-02-21 Airhart; Durwood Conductive wedges for interdigitating with adjacent legs of an IC or the like

Also Published As

Publication number Publication date
FR2730862A1 (fr) 1996-08-23
NL1002280A1 (nl) 1996-08-22
JPH08292232A (ja) 1996-11-05
DE19605630A1 (de) 1996-08-29
NL1002280C2 (nl) 1998-04-22
DE19605630C2 (de) 2000-03-09
US5507652A (en) 1996-04-16
JP3907731B2 (ja) 2007-04-18

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Legal Events

Date Code Title Description
TP Transmission of property
TP Transmission of property
ST Notification of lapse