FR2684209B1 - FAST TIME BASE GENERATOR. - Google Patents

FAST TIME BASE GENERATOR.

Info

Publication number
FR2684209B1
FR2684209B1 FR9210364A FR9210364A FR2684209B1 FR 2684209 B1 FR2684209 B1 FR 2684209B1 FR 9210364 A FR9210364 A FR 9210364A FR 9210364 A FR9210364 A FR 9210364A FR 2684209 B1 FR2684209 B1 FR 2684209B1
Authority
FR
France
Prior art keywords
time base
base generator
fast time
fast
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9210364A
Other languages
French (fr)
Other versions
FR2684209A1 (en
Inventor
Addison Reichert Peter
Joseph Brown Benjamin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/605,977 external-priority patent/US5321700A/en
Application filed by Teradyne Inc filed Critical Teradyne Inc
Priority to FR9210364A priority Critical patent/FR2684209B1/en
Publication of FR2684209A1 publication Critical patent/FR2684209A1/en
Application granted granted Critical
Publication of FR2684209B1 publication Critical patent/FR2684209B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/17—Function evaluation by approximation methods, e.g. inter- or extrapolation, smoothing, least mean square method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/04—Arrangements for selecting an address in a digital store using a sequential addressing device, e.g. shift register, counter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Algebra (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9210364A 1990-10-30 1992-08-28 FAST TIME BASE GENERATOR. Expired - Fee Related FR2684209B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9210364A FR2684209B1 (en) 1990-10-30 1992-08-28 FAST TIME BASE GENERATOR.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/605,977 US5321700A (en) 1989-10-11 1990-10-30 High speed timing generator
FR9210364A FR2684209B1 (en) 1990-10-30 1992-08-28 FAST TIME BASE GENERATOR.

Publications (2)

Publication Number Publication Date
FR2684209A1 FR2684209A1 (en) 1993-05-28
FR2684209B1 true FR2684209B1 (en) 1995-03-10

Family

ID=26229684

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9210364A Expired - Fee Related FR2684209B1 (en) 1990-10-30 1992-08-28 FAST TIME BASE GENERATOR.

Country Status (1)

Country Link
FR (1) FR2684209B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1281385C (en) * 1987-02-09 1991-03-12 George William Conner Timing generator
US4928278A (en) * 1987-08-10 1990-05-22 Nippon Telegraph And Telephone Corporation IC test system
US4829236A (en) * 1987-10-30 1989-05-09 Teradyne, Inc. Digital-to-analog calibration system

Also Published As

Publication number Publication date
FR2684209A1 (en) 1993-05-28

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070629