FR2666902B1 - INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER. - Google Patents
INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER.Info
- Publication number
- FR2666902B1 FR2666902B1 FR9011491A FR9011491A FR2666902B1 FR 2666902 B1 FR2666902 B1 FR 2666902B1 FR 9011491 A FR9011491 A FR 9011491A FR 9011491 A FR9011491 A FR 9011491A FR 2666902 B1 FR2666902 B1 FR 2666902B1
- Authority
- FR
- France
- Prior art keywords
- integrated circuit
- test register
- peripheral test
- peripheral
- register
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318541—Scan latches or cell details
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9011491A FR2666902B1 (en) | 1990-09-18 | 1990-09-18 | INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9011491A FR2666902B1 (en) | 1990-09-18 | 1990-09-18 | INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER. |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2666902A1 FR2666902A1 (en) | 1992-03-20 |
FR2666902B1 true FR2666902B1 (en) | 1993-01-22 |
Family
ID=9400404
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9011491A Expired - Fee Related FR2666902B1 (en) | 1990-09-18 | 1990-09-18 | INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER. |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2666902B1 (en) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2210171B (en) * | 1987-09-28 | 1991-06-26 | Plessey Co Plc | Test circuit |
DE68921269T2 (en) * | 1988-09-07 | 1995-06-22 | Texas Instruments Inc | Integrated test circuit. |
-
1990
- 1990-09-18 FR FR9011491A patent/FR2666902B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
FR2666902A1 (en) | 1992-03-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20070531 |