FR2666902B1 - INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER. - Google Patents

INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER.

Info

Publication number
FR2666902B1
FR2666902B1 FR9011491A FR9011491A FR2666902B1 FR 2666902 B1 FR2666902 B1 FR 2666902B1 FR 9011491 A FR9011491 A FR 9011491A FR 9011491 A FR9011491 A FR 9011491A FR 2666902 B1 FR2666902 B1 FR 2666902B1
Authority
FR
France
Prior art keywords
integrated circuit
test register
peripheral test
peripheral
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9011491A
Other languages
French (fr)
Other versions
FR2666902A1 (en
Inventor
Lestrat Patrick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thomson Composants Militaires et Spatiaux
Original Assignee
Thomson Composants Militaires et Spatiaux
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Composants Militaires et Spatiaux filed Critical Thomson Composants Militaires et Spatiaux
Priority to FR9011491A priority Critical patent/FR2666902B1/en
Publication of FR2666902A1 publication Critical patent/FR2666902A1/en
Application granted granted Critical
Publication of FR2666902B1 publication Critical patent/FR2666902B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR9011491A 1990-09-18 1990-09-18 INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER. Expired - Fee Related FR2666902B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9011491A FR2666902B1 (en) 1990-09-18 1990-09-18 INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9011491A FR2666902B1 (en) 1990-09-18 1990-09-18 INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER.

Publications (2)

Publication Number Publication Date
FR2666902A1 FR2666902A1 (en) 1992-03-20
FR2666902B1 true FR2666902B1 (en) 1993-01-22

Family

ID=9400404

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9011491A Expired - Fee Related FR2666902B1 (en) 1990-09-18 1990-09-18 INTEGRATED CIRCUIT WITH PERIPHERAL TEST REGISTER.

Country Status (1)

Country Link
FR (1) FR2666902B1 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2210171B (en) * 1987-09-28 1991-06-26 Plessey Co Plc Test circuit
DE68921269T2 (en) * 1988-09-07 1995-06-22 Texas Instruments Inc Integrated test circuit.

Also Published As

Publication number Publication date
FR2666902A1 (en) 1992-03-20

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070531