FR2639433A1 - Procede pour la mesure de la puissance d'un rayonnement et montage pour l'application de ce procede - Google Patents

Procede pour la mesure de la puissance d'un rayonnement et montage pour l'application de ce procede Download PDF

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Publication number
FR2639433A1
FR2639433A1 FR8915328A FR8915328A FR2639433A1 FR 2639433 A1 FR2639433 A1 FR 2639433A1 FR 8915328 A FR8915328 A FR 8915328A FR 8915328 A FR8915328 A FR 8915328A FR 2639433 A1 FR2639433 A1 FR 2639433A1
Authority
FR
France
Prior art keywords
radiation
wavelength
power
wavelengths
detection devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
FR8915328A
Other languages
English (en)
French (fr)
Inventor
Stephan Damp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institut Franco Allemand de Recherches de Saint Louis ISL
Original Assignee
Institut Franco Allemand de Recherches de Saint Louis ISL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institut Franco Allemand de Recherches de Saint Louis ISL filed Critical Institut Franco Allemand de Recherches de Saint Louis ISL
Publication of FR2639433A1 publication Critical patent/FR2639433A1/fr
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/0014Measuring characteristics or properties thereof

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
FR8915328A 1988-11-23 1989-11-22 Procede pour la mesure de la puissance d'un rayonnement et montage pour l'application de ce procede Pending FR2639433A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19883839537 DE3839537A1 (de) 1988-11-23 1988-11-23 Verfahren zur leistungsmessung einer strahlung und anordnung zur durchfuehrung dieses verfahrens

Publications (1)

Publication Number Publication Date
FR2639433A1 true FR2639433A1 (fr) 1990-05-25

Family

ID=6367716

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8915328A Pending FR2639433A1 (fr) 1988-11-23 1989-11-22 Procede pour la mesure de la puissance d'un rayonnement et montage pour l'application de ce procede

Country Status (2)

Country Link
DE (1) DE3839537A1 (de)
FR (1) FR2639433A1 (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2666180A1 (fr) * 1990-08-22 1992-02-28 British Nuclear Fuels Plc Procede et appareil d'evaluation de la temperature d'un laser.
FR2699672A1 (fr) * 1992-12-22 1994-06-24 Decupper Jean Procédé et dispositif de contrôle d'appareils d'émission de radiations électromagnétiques.

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6350988B1 (en) * 1999-02-08 2002-02-26 General Electric Company Optical spectrometer and method for combustion flame temperature determination
US6646265B2 (en) 1999-02-08 2003-11-11 General Electric Company Optical spectrometer and method for combustion flame temperature determination

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55142220A (en) * 1979-04-24 1980-11-06 Nippon Telegr & Teleph Corp <Ntt> Device for measuring wavelength
DE3108239A1 (de) * 1981-03-05 1982-09-16 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt "anordnung und verfahren zur messung optischer wellenlaengen"
JPS6222132A (ja) * 1985-07-22 1987-01-30 Casio Comput Co Ltd 入力装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55142220A (en) * 1979-04-24 1980-11-06 Nippon Telegr & Teleph Corp <Ntt> Device for measuring wavelength
DE3108239A1 (de) * 1981-03-05 1982-09-16 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt "anordnung und verfahren zur messung optischer wellenlaengen"
JPS6222132A (ja) * 1985-07-22 1987-01-30 Casio Comput Co Ltd 入力装置

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
ELECTRONICS LETTERS. vol. 16, no. 19, Septembre 1980, ENAGE GB pages 744 - 746; D.J.MALYON ET AL.: 'wavelength sensed mode control of semiconductor lasers' *
PATENT ABSTRACTS OF JAPAN vol. 12, no. 88 (P-678)(2935) 23 Mars 1988 & JP-A-62 022 132 ( MATSUSHITA ELECTRIC INC CO LTD ) 30 Septembre 1987 *
PATENT ABSTRACTS OF JAPAN vol. 5, no. 13 (P-46)(685) 27 Janvier 1981 & JP-A-55 142 220 ( NIPPON DENSHIN DENWA KOSHA ) 6 Novembre 1980 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2666180A1 (fr) * 1990-08-22 1992-02-28 British Nuclear Fuels Plc Procede et appareil d'evaluation de la temperature d'un laser.
FR2699672A1 (fr) * 1992-12-22 1994-06-24 Decupper Jean Procédé et dispositif de contrôle d'appareils d'émission de radiations électromagnétiques.
EP0606026A1 (de) * 1992-12-22 1994-07-13 Jean Decupper Verfahren und Vorrichtung zum Überwachen von elektromagnetische Strahlung emittierenden Gegenständen
US5434419A (en) * 1992-12-22 1995-07-18 Decupper; Jean Process and device for monitoring apparatus for emission of electro-magnetic radiations

Also Published As

Publication number Publication date
DE3839537A1 (de) 1990-05-31

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