FR2613079B1 - APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME - Google Patents

APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME

Info

Publication number
FR2613079B1
FR2613079B1 FR888800498A FR8800498A FR2613079B1 FR 2613079 B1 FR2613079 B1 FR 2613079B1 FR 888800498 A FR888800498 A FR 888800498A FR 8800498 A FR8800498 A FR 8800498A FR 2613079 B1 FR2613079 B1 FR 2613079B1
Authority
FR
France
Prior art keywords
electronic circuits
measuring time
automatically testing
testing electronic
automatically
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR888800498A
Other languages
French (fr)
Other versions
FR2613079A1 (en
Inventor
William Joseph Bowhers
Michael Rodney Ferland
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/003,951 external-priority patent/US4792932A/en
Priority claimed from US07/003,945 external-priority patent/US4755765A/en
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of FR2613079A1 publication Critical patent/FR2613079A1/en
Application granted granted Critical
Publication of FR2613079B1 publication Critical patent/FR2613079B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
FR888800498A 1987-01-16 1988-01-18 APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME Expired - Lifetime FR2613079B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/003,951 US4792932A (en) 1987-01-16 1987-01-16 Time measurement in automatic test equipment
US07/003,945 US4755765A (en) 1987-01-16 1987-01-16 Differential input selector

Publications (2)

Publication Number Publication Date
FR2613079A1 FR2613079A1 (en) 1988-09-30
FR2613079B1 true FR2613079B1 (en) 1992-08-07

Family

ID=26672399

Family Applications (1)

Application Number Title Priority Date Filing Date
FR888800498A Expired - Lifetime FR2613079B1 (en) 1987-01-16 1988-01-18 APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME

Country Status (4)

Country Link
JP (1) JPH0799381B2 (en)
DE (1) DE3801223C2 (en)
FR (1) FR2613079B1 (en)
GB (1) GB2200465B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3910507A1 (en) * 1989-04-01 1990-10-04 Asea Brown Boveri Method and device for testing the time response of digital (switching) circuits
GB9008544D0 (en) * 1990-04-17 1990-06-13 Smiths Industries Plc Electrical assemblies
CA2127192C (en) * 1993-07-01 1999-09-07 Alan Brent Hussey Shaping ate bursts, particularly in gallium arsenide
KR100305678B1 (en) * 1998-12-08 2001-11-30 윤종용 Tester of Semiconductor Device
US7085668B2 (en) * 2004-08-20 2006-08-01 Teradyne, Inc. Time measurement method using quadrature sine waves

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3676777A (en) * 1970-08-10 1972-07-11 Tektronix Inc Apparatus for automatically testing integrated circuit devices
US4058767A (en) * 1975-04-29 1977-11-15 International Business Machines Corporation Apparatus and process for testing AC performance of LSI components
US4591740A (en) * 1983-02-28 1986-05-27 Burr-Brown Corporation Multiple input port circuit having temperature zero voltage offset bias means
GB2157922B (en) * 1984-03-14 1988-01-13 Teradyne Inc Relay multiplexing for circuit testers
JPS61274276A (en) * 1985-05-30 1986-12-04 Toshiba Corp Signal time difference measuring apparatus

Also Published As

Publication number Publication date
GB2200465B (en) 1991-10-02
JPH0799381B2 (en) 1995-10-25
DE3801223C2 (en) 1994-07-21
JPS63222277A (en) 1988-09-16
FR2613079A1 (en) 1988-09-30
DE3801223A1 (en) 1988-07-28
GB2200465A (en) 1988-08-03
GB8800917D0 (en) 1988-02-17

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20070930