FR2613079B1 - APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME - Google Patents
APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIMEInfo
- Publication number
- FR2613079B1 FR2613079B1 FR888800498A FR8800498A FR2613079B1 FR 2613079 B1 FR2613079 B1 FR 2613079B1 FR 888800498 A FR888800498 A FR 888800498A FR 8800498 A FR8800498 A FR 8800498A FR 2613079 B1 FR2613079 B1 FR 2613079B1
- Authority
- FR
- France
- Prior art keywords
- electronic circuits
- measuring time
- automatically testing
- testing electronic
- automatically
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/003,951 US4792932A (en) | 1987-01-16 | 1987-01-16 | Time measurement in automatic test equipment |
US07/003,945 US4755765A (en) | 1987-01-16 | 1987-01-16 | Differential input selector |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2613079A1 FR2613079A1 (en) | 1988-09-30 |
FR2613079B1 true FR2613079B1 (en) | 1992-08-07 |
Family
ID=26672399
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR888800498A Expired - Lifetime FR2613079B1 (en) | 1987-01-16 | 1988-01-18 | APPARATUS FOR AUTOMATICALLY TESTING ELECTRONIC CIRCUITS AND MEASURING TIME |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPH0799381B2 (en) |
DE (1) | DE3801223C2 (en) |
FR (1) | FR2613079B1 (en) |
GB (1) | GB2200465B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3910507A1 (en) * | 1989-04-01 | 1990-10-04 | Asea Brown Boveri | Method and device for testing the time response of digital (switching) circuits |
GB9008544D0 (en) * | 1990-04-17 | 1990-06-13 | Smiths Industries Plc | Electrical assemblies |
CA2127192C (en) * | 1993-07-01 | 1999-09-07 | Alan Brent Hussey | Shaping ate bursts, particularly in gallium arsenide |
KR100305678B1 (en) * | 1998-12-08 | 2001-11-30 | 윤종용 | Tester of Semiconductor Device |
US7085668B2 (en) * | 2004-08-20 | 2006-08-01 | Teradyne, Inc. | Time measurement method using quadrature sine waves |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3676777A (en) * | 1970-08-10 | 1972-07-11 | Tektronix Inc | Apparatus for automatically testing integrated circuit devices |
US4058767A (en) * | 1975-04-29 | 1977-11-15 | International Business Machines Corporation | Apparatus and process for testing AC performance of LSI components |
US4591740A (en) * | 1983-02-28 | 1986-05-27 | Burr-Brown Corporation | Multiple input port circuit having temperature zero voltage offset bias means |
GB2157922B (en) * | 1984-03-14 | 1988-01-13 | Teradyne Inc | Relay multiplexing for circuit testers |
JPS61274276A (en) * | 1985-05-30 | 1986-12-04 | Toshiba Corp | Signal time difference measuring apparatus |
-
1988
- 1988-01-15 GB GB8800917A patent/GB2200465B/en not_active Expired - Lifetime
- 1988-01-16 JP JP63007377A patent/JPH0799381B2/en not_active Expired - Lifetime
- 1988-01-18 DE DE19883801223 patent/DE3801223C2/en not_active Expired - Fee Related
- 1988-01-18 FR FR888800498A patent/FR2613079B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB2200465B (en) | 1991-10-02 |
JPH0799381B2 (en) | 1995-10-25 |
DE3801223C2 (en) | 1994-07-21 |
JPS63222277A (en) | 1988-09-16 |
FR2613079A1 (en) | 1988-09-30 |
DE3801223A1 (en) | 1988-07-28 |
GB2200465A (en) | 1988-08-03 |
GB8800917D0 (en) | 1988-02-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20070930 |