FR2592486A1 - Apparatus for automatically counting and sizing impurities on a material - Google Patents

Apparatus for automatically counting and sizing impurities on a material

Info

Publication number
FR2592486A1
FR2592486A1 FR8519527A FR8519527A FR2592486A1 FR 2592486 A1 FR2592486 A1 FR 2592486A1 FR 8519527 A FR8519527 A FR 8519527A FR 8519527 A FR8519527 A FR 8519527A FR 2592486 A1 FR2592486 A1 FR 2592486A1
Authority
FR
France
Prior art keywords
impurities
sizing
array
allowing
threshold level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8519527A
Other languages
French (fr)
Other versions
FR2592486B1 (en
Inventor
Jacques Sabater
Pierre Lafaverges
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CENTRE TECH IND PAPIER
Original Assignee
CENTRE TECH IND PAPIER
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CENTRE TECH IND PAPIER filed Critical CENTRE TECH IND PAPIER
Priority to FR8519527A priority Critical patent/FR2592486B1/en
Publication of FR2592486A1 publication Critical patent/FR2592486A1/en
Application granted granted Critical
Publication of FR2592486B1 publication Critical patent/FR2592486B1/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/94Investigating contamination, e.g. dust

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Paper (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Device allowing the counting and sizing of contrast impurities 9 present on a flat surface 1 of a material, characterised in that it comprises: - a light source 2, - an optical system 4, - a means allowing relative displacement of the material with respect to the linear photodiode array 3; - means 5 allowing: calculation of the mean value of the signal of the array; determination of a reference threshold level in relation to the calculated mean value; comparison of the value of each element of the array 3 with this threshold level; storage for each line of the rows of pixels corresponding to the presence of impurities 9; digital processing and display means 7, 8. Envisaged application: paper or cardboard.
FR8519527A 1985-12-27 1985-12-27 APPARATUS FOR AUTOMATIC COUNTING AND DIMENSIONING OF IMPURITIES ON A MATERIAL. Expired FR2592486B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8519527A FR2592486B1 (en) 1985-12-27 1985-12-27 APPARATUS FOR AUTOMATIC COUNTING AND DIMENSIONING OF IMPURITIES ON A MATERIAL.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8519527A FR2592486B1 (en) 1985-12-27 1985-12-27 APPARATUS FOR AUTOMATIC COUNTING AND DIMENSIONING OF IMPURITIES ON A MATERIAL.

Publications (2)

Publication Number Publication Date
FR2592486A1 true FR2592486A1 (en) 1987-07-03
FR2592486B1 FR2592486B1 (en) 1988-06-03

Family

ID=9326390

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8519527A Expired FR2592486B1 (en) 1985-12-27 1985-12-27 APPARATUS FOR AUTOMATIC COUNTING AND DIMENSIONING OF IMPURITIES ON A MATERIAL.

Country Status (1)

Country Link
FR (1) FR2592486B1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991005997A1 (en) * 1989-10-11 1991-05-02 Valtion Teknillinen Tutkimuskeskus Method and apparatus for analyzing paper quality
EP0492503A1 (en) * 1990-12-21 1992-07-01 Dayco PTI S.p.A. Process and machine for spotting superficial defects on layers and/or sleeves in elastomeric material
EP0604336A2 (en) * 1992-12-23 1994-06-29 Eastman Kodak Company Apparatus and method for measuring particle contamination
FR2939866A1 (en) * 2008-12-16 2010-06-18 Jacques Sabater LIGHT EMITTING DEVICE LIGHTING DEVICE

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3825765A (en) * 1972-09-14 1974-07-23 Sick Optik Elektronik Erwin Photoelectric surface scanning device
GB2087071A (en) * 1980-03-20 1982-05-19 Nash Paul Inspection system for the on-line measurement of dirt in pulp
GB2103356A (en) * 1981-08-05 1983-02-16 Europ Electronic Syst Ltd Image analysis
DE3215067A1 (en) * 1982-04-05 1983-10-06 Showa Electric Wire & Cable Co Automatic test device for detecting foreign bodies
JPS5912342A (en) * 1982-07-13 1984-01-23 Hitachi Ltd Device for detecting foreign matter
US4454541A (en) * 1982-06-14 1984-06-12 Rca Corporation Charge coupled device based blemish detection system and method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3825765A (en) * 1972-09-14 1974-07-23 Sick Optik Elektronik Erwin Photoelectric surface scanning device
GB2087071A (en) * 1980-03-20 1982-05-19 Nash Paul Inspection system for the on-line measurement of dirt in pulp
GB2103356A (en) * 1981-08-05 1983-02-16 Europ Electronic Syst Ltd Image analysis
DE3215067A1 (en) * 1982-04-05 1983-10-06 Showa Electric Wire & Cable Co Automatic test device for detecting foreign bodies
US4454541A (en) * 1982-06-14 1984-06-12 Rca Corporation Charge coupled device based blemish detection system and method
JPS5912342A (en) * 1982-07-13 1984-01-23 Hitachi Ltd Device for detecting foreign matter

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
PATENTS ABSTRACTS OF JAPAN, vol. 6, no. 46 (P-107)[924], 24 mars 1982; JP-A-56 162 037 (NIPPON DENKI K.K.) 12-12-1981 *
PATENTS ABSTRACTS OF JAPAN, vol. 8, no. 101 (P-273)[1538], 12 mai 1984; & JP-A-59 12 342 (HITACHI SEISAKUSHO K.K.) 23-01-1984 *
PATENTS ABSTRACTS OF JAPAN, vol. 9, no. 151 (P-367)[1874], 26 juin 1985; JP-A-60 27 845 (NIHON ITA GLASS K.K.) 12-02-1985 *

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991005997A1 (en) * 1989-10-11 1991-05-02 Valtion Teknillinen Tutkimuskeskus Method and apparatus for analyzing paper quality
EP0492503A1 (en) * 1990-12-21 1992-07-01 Dayco PTI S.p.A. Process and machine for spotting superficial defects on layers and/or sleeves in elastomeric material
US5239184A (en) * 1990-12-21 1993-08-24 Pirelli Produtti Diversificati S.P.A. Process and machine for spotting superficial defects on layers and/or sleeves of elastomeric material
EP0604336A2 (en) * 1992-12-23 1994-06-29 Eastman Kodak Company Apparatus and method for measuring particle contamination
EP0604336A3 (en) * 1992-12-23 1995-12-13 Eastman Kodak Co Apparatus and method for measuring particle contamination.
FR2939866A1 (en) * 2008-12-16 2010-06-18 Jacques Sabater LIGHT EMITTING DEVICE LIGHTING DEVICE
EP2208988A1 (en) * 2008-12-16 2010-07-21 Effilux Light-emitting diode lighting device

Also Published As

Publication number Publication date
FR2592486B1 (en) 1988-06-03

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Legal Events

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