FR2565354B3 - Procede et dispositif de test de circuits integres sur tranches - Google Patents
Procede et dispositif de test de circuits integres sur tranchesInfo
- Publication number
- FR2565354B3 FR2565354B3 FR8408499A FR8408499A FR2565354B3 FR 2565354 B3 FR2565354 B3 FR 2565354B3 FR 8408499 A FR8408499 A FR 8408499A FR 8408499 A FR8408499 A FR 8408499A FR 2565354 B3 FR2565354 B3 FR 2565354B3
- Authority
- FR
- France
- Prior art keywords
- wafers
- integrated circuits
- testing integrated
- testing
- circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 235000012431 wafers Nutrition 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8408499A FR2565354B3 (fr) | 1984-05-30 | 1984-05-30 | Procede et dispositif de test de circuits integres sur tranches |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8408499A FR2565354B3 (fr) | 1984-05-30 | 1984-05-30 | Procede et dispositif de test de circuits integres sur tranches |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2565354A1 FR2565354A1 (fr) | 1985-12-06 |
FR2565354B3 true FR2565354B3 (fr) | 1986-10-24 |
Family
ID=9304550
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8408499A Expired FR2565354B3 (fr) | 1984-05-30 | 1984-05-30 | Procede et dispositif de test de circuits integres sur tranches |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2565354B3 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW528874B (en) * | 2000-10-26 | 2003-04-21 | Nec Electronics Corp | Non-destructive inspection method |
-
1984
- 1984-05-30 FR FR8408499A patent/FR2565354B3/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR2565354A1 (fr) | 1985-12-06 |
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