FR2531229B1 - Systeme de mesure a fiabilite amelioree - Google Patents
Systeme de mesure a fiabilite amelioreeInfo
- Publication number
- FR2531229B1 FR2531229B1 FR8312666A FR8312666A FR2531229B1 FR 2531229 B1 FR2531229 B1 FR 2531229B1 FR 8312666 A FR8312666 A FR 8312666A FR 8312666 A FR8312666 A FR 8312666A FR 2531229 B1 FR2531229 B1 FR 2531229B1
- Authority
- FR
- France
- Prior art keywords
- measurement system
- improved reliability
- reliability
- improved
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/245—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect
- G01R15/246—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect based on the Faraday, i.e. linear magneto-optic, effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/247—Details of the circuitry or construction of devices covered by G01R15/241 - G01R15/246
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13553682A JPS5927301A (ja) | 1982-08-02 | 1982-08-02 | アナログ信号インタフエ−スに対する付加型の耐障害化方式 |
JP1697183A JPS59161797A (ja) | 1983-02-04 | 1983-02-04 | 計測システムの耐障害化方式 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2531229A1 FR2531229A1 (fr) | 1984-02-03 |
FR2531229B1 true FR2531229B1 (fr) | 1986-12-12 |
Family
ID=26353428
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8312666A Expired FR2531229B1 (fr) | 1982-08-02 | 1983-08-01 | Systeme de mesure a fiabilite amelioree |
Country Status (5)
Country | Link |
---|---|
US (1) | US4580234A (fr) |
CA (1) | CA1205196A (fr) |
DE (1) | DE3327263A1 (fr) |
FR (1) | FR2531229B1 (fr) |
GB (1) | GB2125545B (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3929404A1 (de) * | 1989-09-05 | 1991-03-07 | Bodenseewerk Geraetetech | Verfahren und vorrichtung zum erkennen und identifizieren von fehlern an sensoren |
US5151866A (en) * | 1990-03-30 | 1992-09-29 | The Dow Chemical Company | High speed power analyzer |
EP0720004B1 (fr) * | 1994-12-27 | 2000-02-16 | LITEF GmbH | Procédé FDIC pour minimiser les erreurs de mesure dans un dispositif de mesure à capteurs redondants |
DE19506388C1 (de) * | 1995-02-23 | 1996-08-22 | Buero Fuer Ca Technik Dipl Ing | Verfahren zum Erkennen von systematischen Fehlern, insbesondere zur automatischen Störungserkennung bei Qualitätskontrollen, mittels mit Meßsensoren ausgestatteten Meßgeräten |
FR2740899B1 (fr) * | 1995-11-06 | 1997-12-05 | Gec Alsthom T D Balteau | Transformateur de mesure non conventionnel |
US7805245B2 (en) * | 2007-04-18 | 2010-09-28 | Honeywell International Inc. | Inertial measurement unit fault detection isolation reconfiguration using parity logic |
EP2796835B1 (fr) * | 2012-02-03 | 2018-09-12 | Asahi Kasei Kabushiki Kaisha | Dispositif de traitement de signal |
EP3123138A1 (fr) * | 2014-03-24 | 2017-02-01 | Prysmian S.p.A. | Procédé de mesure de la distribution de courant dans câbles à haute et moyenne tension |
US10318904B2 (en) | 2016-05-06 | 2019-06-11 | General Electric Company | Computing system to control the use of physical state attainment of assets to meet temporal performance criteria |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1352126A (en) * | 1970-07-28 | 1974-05-08 | Atomic Energy Authority Uk | Monitoring systems |
US4039933A (en) * | 1976-03-25 | 1977-08-02 | Instrumentation Laboratory, Inc. | Continuous calibration system and method for analytical instruments |
US4000643A (en) * | 1976-03-29 | 1977-01-04 | Honeywell Inc. | Apparatus for producing a compensating voltage |
CH601874A5 (fr) * | 1976-07-07 | 1978-07-14 | Bbc Brown Boveri & Cie | |
CH619779A5 (fr) * | 1977-09-20 | 1980-10-15 | Mettler Instrumente Ag | |
FR2425665A1 (fr) * | 1978-05-10 | 1979-12-07 | Boeing Co | Appareil de controle-selection de signaux a possibilites de selection ponderee |
EP0023935B1 (fr) * | 1979-08-08 | 1982-11-24 | Hasler AG | Dispositif pour le contrôle permanent du fonctionnement d'un instrument d'affichage ou d'enregistrement, procédé pour le faire fonctionner et application du procédé |
FR2485204A1 (fr) * | 1980-06-19 | 1981-12-24 | Commissariat Energie Atomique | Amperemetre a effet faraday |
DE3123180A1 (de) * | 1981-06-11 | 1983-01-05 | Siemens AG, 1000 Berlin und 8000 München | Korrekturverfahren und -einrichtung fuer eine magnetfeldsonde |
-
1983
- 1983-07-20 US US06/515,911 patent/US4580234A/en not_active Expired - Fee Related
- 1983-07-27 GB GB08320232A patent/GB2125545B/en not_active Expired
- 1983-07-27 CA CA000433291A patent/CA1205196A/fr not_active Expired
- 1983-07-28 DE DE19833327263 patent/DE3327263A1/de active Granted
- 1983-08-01 FR FR8312666A patent/FR2531229B1/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
US4580234A (en) | 1986-04-01 |
GB2125545B (en) | 1986-02-26 |
DE3327263A1 (de) | 1984-02-02 |
CA1205196A (fr) | 1986-05-27 |
GB8320232D0 (en) | 1983-09-01 |
DE3327263C2 (fr) | 1990-08-30 |
GB2125545A (en) | 1984-03-07 |
FR2531229A1 (fr) | 1984-02-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |