FR2500925B1 - - Google Patents
Info
- Publication number
- FR2500925B1 FR2500925B1 FR8104128A FR8104128A FR2500925B1 FR 2500925 B1 FR2500925 B1 FR 2500925B1 FR 8104128 A FR8104128 A FR 8104128A FR 8104128 A FR8104128 A FR 8104128A FR 2500925 B1 FR2500925 B1 FR 2500925B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0008—Apparatus or processes for manufacturing printed circuits for aligning or positioning of tools relative to the circuit board
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0548—Masks
- H05K2203/056—Using an artwork, i.e. a photomask for exposing photosensitive layers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0044—Mechanical working of the substrate, e.g. drilling or punching
- H05K3/0047—Drilling of holes
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Operations Research (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Geophysics And Detection Of Objects (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8104128A FR2500925A1 (fr) | 1981-03-02 | 1981-03-02 | Procede pour controler des percages pratiques dans une piece, notamment une carte a circuits imprimes, et appareil pour la mise en oeuvre de ce procede |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8104128A FR2500925A1 (fr) | 1981-03-02 | 1981-03-02 | Procede pour controler des percages pratiques dans une piece, notamment une carte a circuits imprimes, et appareil pour la mise en oeuvre de ce procede |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2500925A1 FR2500925A1 (fr) | 1982-09-03 |
FR2500925B1 true FR2500925B1 (ro) | 1985-05-17 |
Family
ID=9255773
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8104128A Granted FR2500925A1 (fr) | 1981-03-02 | 1981-03-02 | Procede pour controler des percages pratiques dans une piece, notamment une carte a circuits imprimes, et appareil pour la mise en oeuvre de ce procede |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2500925A1 (ro) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992009883A1 (en) * | 1990-11-30 | 1992-06-11 | International Business Machines Corporation | Method and system for verifying substrate machining |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2549676A1 (fr) * | 1983-07-19 | 1985-01-25 | Basset Frederic | Procede et dispositif de determination assistee des coordonnees de percage de plans de circuits imprimes |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4040748A (en) * | 1975-06-30 | 1977-08-09 | International Business Machines Corporation | Inspection tool |
FR2321229A1 (fr) * | 1975-08-13 | 1977-03-11 | Cit Alcatel | Procede et appareillage pour controle automatique de graphisme |
FR2430017A1 (fr) * | 1978-06-30 | 1980-01-25 | Maurel Roger | Appareillage pour le controle automatique de la conduction electrique des parois metallisees des trous des circuits imprimes |
US4240750A (en) * | 1978-10-02 | 1980-12-23 | Hurd William A | Automatic circuit board tester |
DE2929846A1 (de) * | 1979-07-23 | 1981-03-12 | Siemens AG, 1000 Berlin und 8000 München | Opto-elektronisches pruefsystem zur automatischen beschaffenheitspruefung von leiterplatten, deren zwischenprodukte und druckwerkzeuge |
-
1981
- 1981-03-02 FR FR8104128A patent/FR2500925A1/fr active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992009883A1 (en) * | 1990-11-30 | 1992-06-11 | International Business Machines Corporation | Method and system for verifying substrate machining |
Also Published As
Publication number | Publication date |
---|---|
FR2500925A1 (fr) | 1982-09-03 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |