FR2459980B1 - - Google Patents
Info
- Publication number
- FR2459980B1 FR2459980B1 FR8013688A FR8013688A FR2459980B1 FR 2459980 B1 FR2459980 B1 FR 2459980B1 FR 8013688 A FR8013688 A FR 8013688A FR 8013688 A FR8013688 A FR 8013688A FR 2459980 B1 FR2459980 B1 FR 2459980B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/088—Aspects of digital computing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/315—Contactless testing by inductive methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Locating Faults (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB7921940 | 1979-06-23 | ||
GB7943989 | 1979-12-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2459980A1 FR2459980A1 (fr) | 1981-01-16 |
FR2459980B1 true FR2459980B1 (fr) | 1983-04-01 |
Family
ID=26271949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8013688A Granted FR2459980A1 (fr) | 1979-06-23 | 1980-06-20 | Procedes et appareils de localisation de defauts dans des circuits electroniques |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE3022279A1 (fr) |
FR (1) | FR2459980A1 (fr) |
GB (1) | GB2055478B (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3270882D1 (en) * | 1981-10-16 | 1986-06-05 | Fairchild Camera Instr Co | Current probe signal processing circuit |
US4857833A (en) * | 1987-08-27 | 1989-08-15 | Teradyne, Inc. | Diagnosis of faults on circuit board |
EP0527321A1 (fr) * | 1991-08-05 | 1993-02-17 | Siemens Aktiengesellschaft | Méthode de diagnostic automatique de défauts de circuits électriques |
DE69229389T2 (de) * | 1992-02-25 | 1999-10-07 | Hewlett-Packard Co., Palo Alto | Testsystem für Schaltkreise |
EP0729035A3 (fr) * | 1995-02-24 | 1997-05-07 | Langer Guenter | Source pour tester la compatibilité électromagnétique |
CN113777459B (zh) * | 2021-08-12 | 2024-05-28 | 中国南方电网有限责任公司超高压输电公司昆明局 | 换流器丢脉冲故障定位方法及装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2524361A1 (de) * | 1975-06-02 | 1976-12-09 | Tesla Np | Verfahren zum pruefen von integrierten digitalbausteinen |
US4074188A (en) * | 1975-08-01 | 1978-02-14 | Testline Instruments, Inc. | Low impedance fault detection system and method |
GB1537870A (en) * | 1975-09-05 | 1979-01-04 | Ericsson L M Pty Ltd | Printed circuit board testing method and apparatus |
US4186338A (en) * | 1976-12-16 | 1980-01-29 | Genrad, Inc. | Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems |
DD133598A1 (de) * | 1977-10-18 | 1979-01-10 | Franz Drescher | Verfahren und vorrichtung zur fehlerlokalisierung an defekten digitalen funktionseinheiten |
-
1980
- 1980-06-13 DE DE19803022279 patent/DE3022279A1/de active Granted
- 1980-06-18 GB GB8019954A patent/GB2055478B/en not_active Expired
- 1980-06-20 FR FR8013688A patent/FR2459980A1/fr active Granted
Also Published As
Publication number | Publication date |
---|---|
GB2055478B (en) | 1983-01-26 |
DE3022279C2 (fr) | 1992-08-13 |
GB2055478A (en) | 1981-03-04 |
DE3022279A1 (de) | 1981-01-08 |
FR2459980A1 (fr) | 1981-01-16 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |