FR2434397A1 - X=Ray scanner stored charge measurement system - uses multiplexed ionisation cell discharge and current pulse integration to construct tomograph - Google Patents

X=Ray scanner stored charge measurement system - uses multiplexed ionisation cell discharge and current pulse integration to construct tomograph

Info

Publication number
FR2434397A1
FR2434397A1 FR7820308A FR7820308A FR2434397A1 FR 2434397 A1 FR2434397 A1 FR 2434397A1 FR 7820308 A FR7820308 A FR 7820308A FR 7820308 A FR7820308 A FR 7820308A FR 2434397 A1 FR2434397 A1 FR 2434397A1
Authority
FR
France
Prior art keywords
pulse
tomograph
ionisation
construct
measurement system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7820308A
Other languages
French (fr)
Other versions
FR2434397B1 (en
Inventor
Jean-Paul Bonnefoy-Claudet
Andre Mouttet
Edmond Tournier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR7820308A priority Critical patent/FR2434397A1/en
Publication of FR2434397A1 publication Critical patent/FR2434397A1/en
Application granted granted Critical
Publication of FR2434397B1 publication Critical patent/FR2434397B1/fr
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24Arrangements for measuring quantities of charge
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03Computed tomography [CT]
    • A61B6/032Transmission computed tomography [CT]

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pulmonology (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The charge stored in each of the large number of ionisation cells due to ionisation by X-rays or gamma rays is measured in turn by an integration method. Spurious output signals due to switching interference are eliminated by the choice of command pulse timing with inter-pulse intervals smaller than pulse length. Electronic pulse controlled F.E.T. switches allow charges to flow into and out of storage and integration capacitors. Calculator logic coordinates the switching pulse sweep with the X-ray source rotation and a clock generator governs the multiplex strobing of switches. The integrator output voltages (Vs) (which are proportional to X-ray intensity and hence tissue absorption) are produced from successively selected cells and are co-ordinated to produce a visual tomograph display.
FR7820308A 1978-07-07 1978-07-07 X=Ray scanner stored charge measurement system - uses multiplexed ionisation cell discharge and current pulse integration to construct tomograph Granted FR2434397A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7820308A FR2434397A1 (en) 1978-07-07 1978-07-07 X=Ray scanner stored charge measurement system - uses multiplexed ionisation cell discharge and current pulse integration to construct tomograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7820308A FR2434397A1 (en) 1978-07-07 1978-07-07 X=Ray scanner stored charge measurement system - uses multiplexed ionisation cell discharge and current pulse integration to construct tomograph

Publications (2)

Publication Number Publication Date
FR2434397A1 true FR2434397A1 (en) 1980-03-21
FR2434397B1 FR2434397B1 (en) 1981-10-02

Family

ID=9210460

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7820308A Granted FR2434397A1 (en) 1978-07-07 1978-07-07 X=Ray scanner stored charge measurement system - uses multiplexed ionisation cell discharge and current pulse integration to construct tomograph

Country Status (1)

Country Link
FR (1) FR2434397A1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0077471A1 (en) * 1981-10-06 1983-04-27 Kabushiki Kaisha Toshiba Computerized tomography apparatus
FR2536176A1 (en) * 1982-11-15 1984-05-18 Inst Nat Rech Inf Automat METHOD AND APPARATUS FOR MEASURING IMPULSE CHARGES
FR2542091A1 (en) * 1983-03-02 1984-09-07 Inst Nerudnykh Str Apparatus for metering dispersed powder constituents
FR2573213A1 (en) * 1984-11-12 1986-05-16 Sgs Microelettronica Spa BUFFER CIRCUIT WITH DIFFERENTIAL STRUCTURE FOR MEASURING CAPACITIVE LOADS

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2314699A1 (en) * 1975-06-19 1977-01-14 Commissariat Energie Atomique ANALYSIS DEVICE FOR X-RAY TOMOGRAPHY BY TRANSMISSION
US4022990A (en) * 1975-10-28 1977-05-10 Wiltron Company Technique and apparatus for measuring the value of a capacitance in an electrical circuit such as a telephone communication line

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2314699A1 (en) * 1975-06-19 1977-01-14 Commissariat Energie Atomique ANALYSIS DEVICE FOR X-RAY TOMOGRAPHY BY TRANSMISSION
US4022990A (en) * 1975-10-28 1977-05-10 Wiltron Company Technique and apparatus for measuring the value of a capacitance in an electrical circuit such as a telephone communication line

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
NV8164/76 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0077471A1 (en) * 1981-10-06 1983-04-27 Kabushiki Kaisha Toshiba Computerized tomography apparatus
FR2536176A1 (en) * 1982-11-15 1984-05-18 Inst Nat Rech Inf Automat METHOD AND APPARATUS FOR MEASURING IMPULSE CHARGES
EP0109316A1 (en) * 1982-11-15 1984-05-23 Inria Institut National De Recherche En Informatique Et En Automatique Amplification and measurement circuit of electrical charges by impulses
US4570183A (en) * 1982-11-15 1986-02-11 Inria Institut National De Recherche En Informatique Et Automatique Method and apparatus for measuring pulses of charge
FR2542091A1 (en) * 1983-03-02 1984-09-07 Inst Nerudnykh Str Apparatus for metering dispersed powder constituents
FR2573213A1 (en) * 1984-11-12 1986-05-16 Sgs Microelettronica Spa BUFFER CIRCUIT WITH DIFFERENTIAL STRUCTURE FOR MEASURING CAPACITIVE LOADS

Also Published As

Publication number Publication date
FR2434397B1 (en) 1981-10-02

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Legal Events

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TP Transmission of property
AM Act modifying the rights related to an application or a patent
ST Notification of lapse