FR2296181A1 - Systeme de test de matrice a diodes - Google Patents

Systeme de test de matrice a diodes

Info

Publication number
FR2296181A1
FR2296181A1 FR7442981A FR7442981A FR2296181A1 FR 2296181 A1 FR2296181 A1 FR 2296181A1 FR 7442981 A FR7442981 A FR 7442981A FR 7442981 A FR7442981 A FR 7442981A FR 2296181 A1 FR2296181 A1 FR 2296181A1
Authority
FR
France
Prior art keywords
horizontal
resistance
test
resistances
series
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7442981A
Other languages
English (en)
Other versions
FR2296181B1 (fr
Inventor
Roger Meliani
Daniel Servant
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Constr Telephoniques
Original Assignee
Constr Telephoniques
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Constr Telephoniques filed Critical Constr Telephoniques
Priority to FR7442981A priority Critical patent/FR2296181A1/fr
Priority to ES443796A priority patent/ES443796A1/es
Priority to ES75443795A priority patent/ES443795A1/es
Publication of FR2296181A1 publication Critical patent/FR2296181A1/fr
Application granted granted Critical
Publication of FR2296181B1 publication Critical patent/FR2296181B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Insulated Conductors (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
FR7442981A 1974-12-27 1974-12-27 Systeme de test de matrice a diodes Granted FR2296181A1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR7442981A FR2296181A1 (fr) 1974-12-27 1974-12-27 Systeme de test de matrice a diodes
ES443796A ES443796A1 (es) 1974-12-27 1975-12-23 Un sistema para probar una matriz de diodos.
ES75443795A ES443795A1 (es) 1974-12-27 1975-12-23 Mejoras en los cables de fibras opticas protegidos.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7442981A FR2296181A1 (fr) 1974-12-27 1974-12-27 Systeme de test de matrice a diodes

Publications (2)

Publication Number Publication Date
FR2296181A1 true FR2296181A1 (fr) 1976-07-23
FR2296181B1 FR2296181B1 (fr) 1979-08-10

Family

ID=9146682

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7442981A Granted FR2296181A1 (fr) 1974-12-27 1974-12-27 Systeme de test de matrice a diodes

Country Status (2)

Country Link
ES (2) ES443795A1 (fr)
FR (1) FR2296181A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2530055A1 (fr) * 1982-07-07 1984-01-13 Agence Centrale De Services Dispositif d'interrogation et de lecture de l'etat de contacts electriques
EP0146975A2 (fr) * 1983-12-22 1985-07-03 Advanced Micro Devices, Inc. Détecteur de court-circuit pour proms
EP0172593A2 (fr) * 1984-07-30 1986-02-26 Advanced Micro Devices, Inc. Détecteur de courts-circuits pour matrice programmable à fusible

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3713019A (en) * 1971-08-05 1973-01-23 Gte Automatic Electric Lab Inc Electronic scanpoint matrix having means for detecting electrical failures therein

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3713019A (en) * 1971-08-05 1973-01-23 Gte Automatic Electric Lab Inc Electronic scanpoint matrix having means for detecting electrical failures therein

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2530055A1 (fr) * 1982-07-07 1984-01-13 Agence Centrale De Services Dispositif d'interrogation et de lecture de l'etat de contacts electriques
EP0146975A2 (fr) * 1983-12-22 1985-07-03 Advanced Micro Devices, Inc. Détecteur de court-circuit pour proms
EP0146975A3 (fr) * 1983-12-22 1988-04-20 Advanced Micro Devices, Inc. Détecteur de court-circuit pour proms
EP0172593A2 (fr) * 1984-07-30 1986-02-26 Advanced Micro Devices, Inc. Détecteur de courts-circuits pour matrice programmable à fusible
EP0172593A3 (fr) * 1984-07-30 1986-03-05 Advanced Micro Devices, Inc. Détecteur de courts-circuits pour matrice programmable à fusible

Also Published As

Publication number Publication date
FR2296181B1 (fr) 1979-08-10
ES443795A1 (es) 1977-04-16
ES443796A1 (es) 1977-04-16

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Legal Events

Date Code Title Description
TP Transmission of property