FR2296181A1 - Systeme de test de matrice a diodes - Google Patents
Systeme de test de matrice a diodesInfo
- Publication number
- FR2296181A1 FR2296181A1 FR7442981A FR7442981A FR2296181A1 FR 2296181 A1 FR2296181 A1 FR 2296181A1 FR 7442981 A FR7442981 A FR 7442981A FR 7442981 A FR7442981 A FR 7442981A FR 2296181 A1 FR2296181 A1 FR 2296181A1
- Authority
- FR
- France
- Prior art keywords
- horizontal
- resistance
- test
- resistances
- series
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Insulated Conductors (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7442981A FR2296181A1 (fr) | 1974-12-27 | 1974-12-27 | Systeme de test de matrice a diodes |
ES443796A ES443796A1 (es) | 1974-12-27 | 1975-12-23 | Un sistema para probar una matriz de diodos. |
ES75443795A ES443795A1 (es) | 1974-12-27 | 1975-12-23 | Mejoras en los cables de fibras opticas protegidos. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7442981A FR2296181A1 (fr) | 1974-12-27 | 1974-12-27 | Systeme de test de matrice a diodes |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2296181A1 true FR2296181A1 (fr) | 1976-07-23 |
FR2296181B1 FR2296181B1 (fr) | 1979-08-10 |
Family
ID=9146682
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7442981A Granted FR2296181A1 (fr) | 1974-12-27 | 1974-12-27 | Systeme de test de matrice a diodes |
Country Status (2)
Country | Link |
---|---|
ES (2) | ES443795A1 (fr) |
FR (1) | FR2296181A1 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2530055A1 (fr) * | 1982-07-07 | 1984-01-13 | Agence Centrale De Services | Dispositif d'interrogation et de lecture de l'etat de contacts electriques |
EP0146975A2 (fr) * | 1983-12-22 | 1985-07-03 | Advanced Micro Devices, Inc. | Détecteur de court-circuit pour proms |
EP0172593A2 (fr) * | 1984-07-30 | 1986-02-26 | Advanced Micro Devices, Inc. | Détecteur de courts-circuits pour matrice programmable à fusible |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3713019A (en) * | 1971-08-05 | 1973-01-23 | Gte Automatic Electric Lab Inc | Electronic scanpoint matrix having means for detecting electrical failures therein |
-
1974
- 1974-12-27 FR FR7442981A patent/FR2296181A1/fr active Granted
-
1975
- 1975-12-23 ES ES75443795A patent/ES443795A1/es not_active Expired
- 1975-12-23 ES ES443796A patent/ES443796A1/es not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3713019A (en) * | 1971-08-05 | 1973-01-23 | Gte Automatic Electric Lab Inc | Electronic scanpoint matrix having means for detecting electrical failures therein |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2530055A1 (fr) * | 1982-07-07 | 1984-01-13 | Agence Centrale De Services | Dispositif d'interrogation et de lecture de l'etat de contacts electriques |
EP0146975A2 (fr) * | 1983-12-22 | 1985-07-03 | Advanced Micro Devices, Inc. | Détecteur de court-circuit pour proms |
EP0146975A3 (fr) * | 1983-12-22 | 1988-04-20 | Advanced Micro Devices, Inc. | Détecteur de court-circuit pour proms |
EP0172593A2 (fr) * | 1984-07-30 | 1986-02-26 | Advanced Micro Devices, Inc. | Détecteur de courts-circuits pour matrice programmable à fusible |
EP0172593A3 (fr) * | 1984-07-30 | 1986-03-05 | Advanced Micro Devices, Inc. | Détecteur de courts-circuits pour matrice programmable à fusible |
Also Published As
Publication number | Publication date |
---|---|
FR2296181B1 (fr) | 1979-08-10 |
ES443795A1 (es) | 1977-04-16 |
ES443796A1 (es) | 1977-04-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property |