FR2049906A5 - - Google Patents

Info

Publication number
FR2049906A5
FR2049906A5 FR7020499A FR7020499A FR2049906A5 FR 2049906 A5 FR2049906 A5 FR 2049906A5 FR 7020499 A FR7020499 A FR 7020499A FR 7020499 A FR7020499 A FR 7020499A FR 2049906 A5 FR2049906 A5 FR 2049906A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7020499A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Femalon SPRL
Original Assignee
INST METALLURG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INST METALLURG filed Critical INST METALLURG
Application granted granted Critical
Publication of FR2049906A5 publication Critical patent/FR2049906A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7020499A 1969-06-09 1970-06-04 Expired FR2049906A5 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU1328355A SU430313A2 (ru) 1969-06-09 1969-06-09 Рентгеновский микроанализатор

Publications (1)

Publication Number Publication Date
FR2049906A5 true FR2049906A5 (fr) 1971-03-26

Family

ID=20445671

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7020499A Expired FR2049906A5 (fr) 1969-06-09 1970-06-04

Country Status (4)

Country Link
US (1) US3775611A (fr)
FR (1) FR2049906A5 (fr)
GB (1) GB1273912A (fr)
SU (1) SU430313A2 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101539534B (zh) * 2008-02-22 2012-10-03 精工电子纳米科技有限公司 X线分析装置及x线分析方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000031523A2 (fr) * 1998-11-25 2000-06-02 Koninklijke Philips Electronics N.V. Appareil d'analyse a rayons x comprenant un miroir a rayons x parabolique et un monochromateur a cristal
US7481544B2 (en) * 2004-03-05 2009-01-27 Optical Research Associates Grazing incidence relays

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2653249A (en) * 1950-11-30 1953-09-22 Gen Electric System and apparatus for the formation of optical images
US2945953A (en) * 1957-03-19 1960-07-19 Parsons & Co Sir Howard G Grating spectrometers
US3160749A (en) * 1962-10-19 1964-12-08 Philips Corp Spectrometer with novel plural crystal arrangement
US3471694A (en) * 1965-03-01 1969-10-07 Philips Electronics & Pharm In Charge particle barrier consisting of magnetic means for removing electrons from an x-ray beam

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101539534B (zh) * 2008-02-22 2012-10-03 精工电子纳米科技有限公司 X线分析装置及x线分析方法

Also Published As

Publication number Publication date
GB1273912A (en) 1972-05-10
US3775611A (en) 1973-11-27
SU430313A2 (ru) 1974-05-30

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Legal Events

Date Code Title Description
ST Notification of lapse
TP Transmission of property

Owner name: FEMALON S.A., BE

Effective date: 20120125