FI935180A0 - Konstruktion hos ett kalibreringsstycke, foerfarande foer utforming av den samma och kalibreringsfoerfarande - Google Patents
Konstruktion hos ett kalibreringsstycke, foerfarande foer utforming av den samma och kalibreringsfoerfarandeInfo
- Publication number
- FI935180A0 FI935180A0 FI935180A FI935180A FI935180A0 FI 935180 A0 FI935180 A0 FI 935180A0 FI 935180 A FI935180 A FI 935180A FI 935180 A FI935180 A FI 935180A FI 935180 A0 FI935180 A0 FI 935180A0
- Authority
- FI
- Finland
- Prior art keywords
- devices
- construction
- calibrating
- calibration
- calibration devices
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI935180A FI935180A0 (fi) | 1993-11-22 | 1993-11-22 | Konstruktion hos ett kalibreringsstycke, foerfarande foer utforming av den samma och kalibreringsfoerfarande |
US08/345,427 US5612782A (en) | 1993-11-22 | 1994-11-21 | Calibration method and calibration unit for calibrating a spectrometric device based upon two calibration samples |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI935180A FI935180A0 (fi) | 1993-11-22 | 1993-11-22 | Konstruktion hos ett kalibreringsstycke, foerfarande foer utforming av den samma och kalibreringsfoerfarande |
Publications (1)
Publication Number | Publication Date |
---|---|
FI935180A0 true FI935180A0 (fi) | 1993-11-22 |
Family
ID=8538993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI935180A FI935180A0 (fi) | 1993-11-22 | 1993-11-22 | Konstruktion hos ett kalibreringsstycke, foerfarande foer utforming av den samma och kalibreringsfoerfarande |
Country Status (2)
Country | Link |
---|---|
US (1) | US5612782A (fi) |
FI (1) | FI935180A0 (fi) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002501425A (ja) * | 1996-10-28 | 2002-01-15 | ロバート・ハープスト | 薄い膜を形成する方法及び装置 |
US6278519B1 (en) | 1998-01-29 | 2001-08-21 | Therma-Wave, Inc. | Apparatus for analyzing multi-layer thin film stacks on semiconductors |
US5798837A (en) | 1997-07-11 | 1998-08-25 | Therma-Wave, Inc. | Thin film optical measurement system and method with calibrating ellipsometer |
DE10103174B4 (de) * | 2001-01-25 | 2004-07-22 | Thyssenkrupp Stahl Ag | Verwendung eines aus Metallpartikeln und nichtmetallischen Feststoffpartikeln hergestellten Probekörpers als Standardprobe zum Kalibrieren einer spektrometrischen Analyseeinrichtung |
US20060255446A1 (en) * | 2001-10-26 | 2006-11-16 | Staktek Group, L.P. | Stacked modules and method |
EP1380810A1 (en) * | 2002-07-10 | 2004-01-14 | Crown Cork & Seal Technologies Corporation | Gauge calibration method |
US6956649B2 (en) * | 2002-11-26 | 2005-10-18 | Sensys Medical, Inc. | Spectroscopic system and method using a ceramic optical reference |
US6859119B2 (en) * | 2002-12-26 | 2005-02-22 | Motorola, Inc. | Meso-microelectromechanical system package |
DE102007002106B3 (de) * | 2007-01-09 | 2008-07-03 | Wolfgang Weinhold | Verfahren und Vorrichtung zur Untersuchung eines Gegenstandes |
WO2008106391A1 (en) * | 2007-02-28 | 2008-09-04 | University Of South Carolina | Design of multivariate optical elements for nonlinear calibration |
EP3074753A1 (en) * | 2014-02-19 | 2016-10-05 | Halliburton Energy Services, Inc. | Integrated computational element designed for multi-characteristic detection |
DE102017001484A1 (de) * | 2017-02-16 | 2018-08-16 | Fresenius Medical Care Deutschland Gmbh | Verfahren und Anordnung zum Kalibrieren von Vorrichtungen zur Erkennung von Blut oder Blutbestandteilen in einer Flüssigkeit |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3832070A (en) * | 1973-04-27 | 1974-08-27 | Cosar Corp | Calibration system for reflection densitometers |
US4029419A (en) * | 1975-10-10 | 1977-06-14 | International Business Machines Corporation | Textile color analyzer calibration |
GB2122768A (en) * | 1982-06-18 | 1984-01-18 | Infrared Eng | Calibration standard for infrared absorption gauge |
US4566798A (en) * | 1983-11-10 | 1986-01-28 | Eastman Kodak Company | Method for calibrating a reflectometer containing black and white references displaced from the sample position |
LU86194A1 (fr) * | 1985-12-05 | 1987-07-24 | Centre Rech Metallurgique | Procede de mesure en continu de la rugosite de la surface d'un produit lamine a froid |
US4729657A (en) * | 1986-06-23 | 1988-03-08 | Miles Laboratories, Inc. | Method of calibrating reflectance measuring devices |
JPH0510262A (ja) * | 1991-07-03 | 1993-01-19 | Matsushita Refrig Co Ltd | 密閉型電動圧縮機 |
JPH0526625A (ja) * | 1991-07-18 | 1993-02-02 | Kawasaki Steel Corp | 塗油量測定方法および装置 |
-
1993
- 1993-11-22 FI FI935180A patent/FI935180A0/fi not_active Application Discontinuation
-
1994
- 1994-11-21 US US08/345,427 patent/US5612782A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5612782A (en) | 1997-03-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FD | Application lapsed |