FI20095811A0 - BROADBAND REFERENCE PLAN INVARIANT - PROCEDURE AND ALGORITHM FOR MEASURING ELECTROMAGNETIC PARAMETERS OF MATERIALS - Google Patents

BROADBAND REFERENCE PLAN INVARIANT - PROCEDURE AND ALGORITHM FOR MEASURING ELECTROMAGNETIC PARAMETERS OF MATERIALS

Info

Publication number
FI20095811A0
FI20095811A0 FI20095811A FI20095811A FI20095811A0 FI 20095811 A0 FI20095811 A0 FI 20095811A0 FI 20095811 A FI20095811 A FI 20095811A FI 20095811 A FI20095811 A FI 20095811A FI 20095811 A0 FI20095811 A0 FI 20095811A0
Authority
FI
Finland
Prior art keywords
invariant
algorithm
procedure
materials
measuring electromagnetic
Prior art date
Application number
FI20095811A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI122901B (en
FI20095811A (en
Inventor
Gheorge Sorin Paraoanu
Kari Sarvala
Khattiya Chalapat
Original Assignee
Teknillinen Korkeakoulu
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teknillinen Korkeakoulu filed Critical Teknillinen Korkeakoulu
Priority to FI20095811A priority Critical patent/FI122901B/en
Publication of FI20095811A0 publication Critical patent/FI20095811A0/en
Priority to PCT/FI2010/050591 priority patent/WO2011012767A1/en
Publication of FI20095811A publication Critical patent/FI20095811A/en
Application granted granted Critical
Publication of FI122901B publication Critical patent/FI122901B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1215—Measuring magnetisation; Particular magnetometers therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1223—Measuring permeability, i.e. permeameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G01R27/2647—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells of coaxial or concentric type, e.g. with the sample in a coaxial line

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electromagnetism (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measuring Magnetic Variables (AREA)
FI20095811A 2009-07-27 2009-07-27 Method, measurement apparatus and computer program product for measuring the electromagnetic properties of materials FI122901B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20095811A FI122901B (en) 2009-07-27 2009-07-27 Method, measurement apparatus and computer program product for measuring the electromagnetic properties of materials
PCT/FI2010/050591 WO2011012767A1 (en) 2009-07-27 2010-07-09 Broadband reference-plane invariant method and algorithm for measuring electromagnetic parameters of materials

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20095811 2009-07-27
FI20095811A FI122901B (en) 2009-07-27 2009-07-27 Method, measurement apparatus and computer program product for measuring the electromagnetic properties of materials

Publications (3)

Publication Number Publication Date
FI20095811A0 true FI20095811A0 (en) 2009-07-27
FI20095811A FI20095811A (en) 2011-01-28
FI122901B FI122901B (en) 2012-08-31

Family

ID=40935888

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20095811A FI122901B (en) 2009-07-27 2009-07-27 Method, measurement apparatus and computer program product for measuring the electromagnetic properties of materials

Country Status (2)

Country Link
FI (1) FI122901B (en)
WO (1) WO2011012767A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104111378A (en) * 2013-04-19 2014-10-22 电子科技大学 Microwave material electromagnetic parameter and shielding performance slab line test method
CN104330643A (en) * 2014-11-18 2015-02-04 上海市计量测试技术研究院 Improved transmission/reflection method for measuring electromagnetic parameters of material
CN106841821A (en) * 2017-04-11 2017-06-13 南京信息工程大学 A kind of film covers sea effective dielectric constant computational methods
CN109164304B (en) * 2018-09-19 2020-10-23 天津大学 Method for testing and extracting terahertz complex dielectric constant of biological macromolecular material
FR3087269B1 (en) * 2018-10-10 2020-10-09 Commissariat Energie Atomique METHOD AND DEVICE FOR CHARACTERIZING THE SURFACE OF AN OBJECT
CN110534166A (en) * 2019-08-30 2019-12-03 哈尔滨工业大学 The method for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter
CN111060539A (en) * 2019-12-25 2020-04-24 浙江大学 Device and method for testing electromagnetic wave reflectivity of flat plate material in freeze-thaw cycle
WO2022085441A1 (en) * 2020-10-23 2022-04-28 国立大学法人東北大学 Measurement device and measurement method for measuring magnetic permeability and dielectric constant
RU2758390C1 (en) * 2020-12-29 2021-10-28 Федеральное государственное казенное военное образовательное учреждение высшего образования "Военный учебно-научный центр Военно-воздушных сил "Военно-воздушная академия имени профессора Н.Е. Жуковского и Ю.А. Гагарина" (г. Воронеж) Министерства обороны Российской Федерации Method for determining the electrophysical parameters of dielectric and magnetodielectric coatings with frequency dispersion in the microwave range
CN114487618B (en) * 2022-01-27 2022-08-23 北京航空航天大学 Composite material low-frequency electromagnetic parameter equivalent extraction device and method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0221837A (en) * 1988-07-12 1990-01-24 Olympus Optical Co Ltd Flexible tube for endoscope

Also Published As

Publication number Publication date
WO2011012767A1 (en) 2011-02-03
FI122901B (en) 2012-08-31
FI20095811A (en) 2011-01-28

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