FI20085881A - Testiadapterikonfiguraatio - Google Patents

Testiadapterikonfiguraatio Download PDF

Info

Publication number
FI20085881A
FI20085881A FI20085881A FI20085881A FI20085881A FI 20085881 A FI20085881 A FI 20085881A FI 20085881 A FI20085881 A FI 20085881A FI 20085881 A FI20085881 A FI 20085881A FI 20085881 A FI20085881 A FI 20085881A
Authority
FI
Finland
Prior art keywords
test adapter
adapter configuration
configuration
test
adapter
Prior art date
Application number
FI20085881A
Other languages
English (en)
Swedish (sv)
Other versions
FI20085881A0 (fi
FI122041B (fi
Inventor
Loit Leino
Priidel Eiko
Madis Kerner
Original Assignee
Jot Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jot Automation Oy filed Critical Jot Automation Oy
Publication of FI20085881A0 publication Critical patent/FI20085881A0/fi
Priority to FI20085881A priority Critical patent/FI122041B/fi
Priority to PCT/FI2009/050746 priority patent/WO2010031904A1/en
Priority to US13/062,993 priority patent/US8860453B2/en
Priority to PL09814143T priority patent/PL2335084T3/pl
Priority to KR1020117008241A priority patent/KR20110082521A/ko
Priority to EP09814143.5A priority patent/EP2335084B1/en
Priority to CN2009801365931A priority patent/CN102159959A/zh
Priority to MX2011002744A priority patent/MX2011002744A/es
Priority to BRPI0918048-6A priority patent/BRPI0918048B1/pt
Priority to ES09814143T priority patent/ES2713056T3/es
Publication of FI20085881A publication Critical patent/FI20085881A/fi
Priority to MA33711A priority patent/MA32643B1/fr
Application granted granted Critical
Publication of FI122041B publication Critical patent/FI122041B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M1/00—Substation equipment, e.g. for use by subscribers
    • H04M1/24—Arrangements for testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
FI20085881A 2008-09-18 2008-09-18 Testiadapterikonfiguraatio FI122041B (fi)

Priority Applications (11)

Application Number Priority Date Filing Date Title
FI20085881A FI122041B (fi) 2008-09-18 2008-09-18 Testiadapterikonfiguraatio
CN2009801365931A CN102159959A (zh) 2008-09-18 2009-09-17 测试适配器配置
US13/062,993 US8860453B2 (en) 2008-09-18 2009-09-17 Test adapter configuration for testing a communication device
PL09814143T PL2335084T3 (pl) 2008-09-18 2009-09-17 Konfiguracja adaptera testowego
KR1020117008241A KR20110082521A (ko) 2008-09-18 2009-09-17 검사 어댑터 구조
EP09814143.5A EP2335084B1 (en) 2008-09-18 2009-09-17 Test adapter configuration
PCT/FI2009/050746 WO2010031904A1 (en) 2008-09-18 2009-09-17 Test adapter configuration
MX2011002744A MX2011002744A (es) 2008-09-18 2009-09-17 Configuracion de adaptador de ensayos.
BRPI0918048-6A BRPI0918048B1 (pt) 2008-09-18 2009-09-17 Placa de base para um dispositivo adaptado para testes, dispositivo adaptado para testes, plataforma de ensaio para testar um dispositivo e linha de produção de um dispositivo
ES09814143T ES2713056T3 (es) 2008-09-18 2009-09-17 Configuración de adaptador de ensayo
MA33711A MA32643B1 (fr) 2008-09-18 2011-03-18 Configuration d'adaptateur de test

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20085881 2008-09-18
FI20085881A FI122041B (fi) 2008-09-18 2008-09-18 Testiadapterikonfiguraatio

Publications (3)

Publication Number Publication Date
FI20085881A0 FI20085881A0 (fi) 2008-09-18
FI20085881A true FI20085881A (fi) 2010-03-19
FI122041B FI122041B (fi) 2011-07-29

Family

ID=39852271

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20085881A FI122041B (fi) 2008-09-18 2008-09-18 Testiadapterikonfiguraatio

Country Status (11)

Country Link
US (1) US8860453B2 (fi)
EP (1) EP2335084B1 (fi)
KR (1) KR20110082521A (fi)
CN (1) CN102159959A (fi)
BR (1) BRPI0918048B1 (fi)
ES (1) ES2713056T3 (fi)
FI (1) FI122041B (fi)
MA (1) MA32643B1 (fi)
MX (1) MX2011002744A (fi)
PL (1) PL2335084T3 (fi)
WO (1) WO2010031904A1 (fi)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201245738A (en) * 2011-05-12 2012-11-16 Askey Computer Corp Inspection apparatus using touch probe for signal transmission
US20130200915A1 (en) * 2012-02-06 2013-08-08 Peter G. Panagas Test System with Test Trays and Automated Test Tray Handling
US10557889B2 (en) * 2012-05-07 2020-02-11 Flextronics Ap, Llc Universal device multi-function test apparatus
KR101888983B1 (ko) * 2012-06-08 2018-08-16 삼성전자주식회사 피시험 단말기에 대한 자동화 테스트 장치 및 방법
CN103913603B (zh) * 2013-01-04 2017-02-22 航天科工防御技术研究试验中心 电连接器测试适配器
WO2015059508A1 (en) * 2013-10-24 2015-04-30 Teleplan Technology B.V. Method and apparatus for testing cell phones
US9485038B2 (en) * 2014-03-06 2016-11-01 Litepoint Corporation System and method for enabling automated testing of wireless data packet signal transceivers
CN105592190A (zh) * 2016-03-08 2016-05-18 深圳市佳斯捷科技有限公司 一种手机自动检测设备
CN105635374B (zh) * 2016-03-11 2019-02-01 深圳市佳斯捷科技有限公司 一种手机自动检测设备的支架
CN105847481A (zh) * 2016-05-27 2016-08-10 深圳天珑无线科技有限公司 一种移动终端接地结构和移动终端
KR102478111B1 (ko) * 2016-07-27 2022-12-14 삼성전자주식회사 테스트 장치
KR102231941B1 (ko) * 2020-04-10 2021-03-25 위드시스템 주식회사 단자 얼라인장치

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4922191A (en) * 1988-11-30 1990-05-01 General Dynamics Corporation, Electronics Division Electronic testing equipment interconnection assembly
CA2049616C (en) * 1991-01-22 2000-04-04 Jacob Soiferman Contactless test method and system for testing printed circuit boards
US5349640A (en) * 1993-06-24 1994-09-20 Rolm Company Option bus adapter
JPH09297162A (ja) * 1996-04-30 1997-11-18 Nittetsu Semiconductor Kk バーンインボード
DE19732639C1 (de) * 1997-07-29 1999-01-28 Wavetek Gmbh Antennenkoppler zum Testen von Mobiltelefonen
US6119255A (en) * 1998-01-21 2000-09-12 Micron Technology, Inc. Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit
US6170329B1 (en) * 1999-06-14 2001-01-09 Agilent Technologies, Inc. Test fixture customization adapter enclosure
DE10057457A1 (de) 2000-11-20 2002-05-23 Test Plus Electronic Gmbh Testadapter zum Testen einer Leiterplatine
US6891384B2 (en) * 2002-06-25 2005-05-10 Xilinx, Inc. Multi-socket board for open/short tester
FI117578B (fi) 2003-12-03 2006-11-30 Elektrobit Testing Oy Menetelmä ja järjestely elektronisen laitteen testauksen suorittamiseksi
CN100360948C (zh) 2004-09-28 2008-01-09 华硕电脑股份有限公司 电路板测试治具
FI119529B (fi) 2004-11-09 2008-12-15 Jot Automation Oy Elektronisen laitteen testaus
CN2881652Y (zh) * 2005-11-21 2007-03-21 洛阳卓航测控设备有限责任公司 一种通用测试接口设备及其通用测试***
US7737715B2 (en) * 2006-07-31 2010-06-15 Marvell Israel (M.I.S.L) Ltd. Compensation for voltage drop in automatic test equipment

Also Published As

Publication number Publication date
WO2010031904A1 (en) 2010-03-25
FI20085881A0 (fi) 2008-09-18
BRPI0918048B1 (pt) 2019-07-30
CN102159959A (zh) 2011-08-17
US8860453B2 (en) 2014-10-14
KR20110082521A (ko) 2011-07-19
EP2335084A1 (en) 2011-06-22
MX2011002744A (es) 2011-04-07
PL2335084T3 (pl) 2019-08-30
US20110227597A1 (en) 2011-09-22
MA32643B1 (fr) 2011-09-01
EP2335084B1 (en) 2018-12-05
EP2335084A4 (en) 2014-07-02
FI122041B (fi) 2011-07-29
BRPI0918048A2 (pt) 2015-12-01
ES2713056T3 (es) 2019-05-17

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