FI20041344A - Anturi ja menetelmä komponenttiin kohdistuvan suureen mittaamiseksi - Google Patents

Anturi ja menetelmä komponenttiin kohdistuvan suureen mittaamiseksi Download PDF

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Publication number
FI20041344A
FI20041344A FI20041344A FI20041344A FI20041344A FI 20041344 A FI20041344 A FI 20041344A FI 20041344 A FI20041344 A FI 20041344A FI 20041344 A FI20041344 A FI 20041344A FI 20041344 A FI20041344 A FI 20041344A
Authority
FI
Finland
Prior art keywords
measuring
sensor
component
quantity applied
Prior art date
Application number
FI20041344A
Other languages
English (en)
Swedish (sv)
Other versions
FI20041344A0 (fi
Inventor
Heikki Seppae
Hannu Sipola
Original Assignee
Valtion Teknillinen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valtion Teknillinen filed Critical Valtion Teknillinen
Priority to FI20041344A priority Critical patent/FI20041344A/fi
Publication of FI20041344A0 publication Critical patent/FI20041344A0/fi
Priority to US11/665,386 priority patent/US20080106275A1/en
Priority to PCT/FI2005/000448 priority patent/WO2006040403A1/en
Publication of FI20041344A publication Critical patent/FI20041344A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/12—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in capacitance, i.e. electric circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G01R17/06—Automatic balancing arrangements
    • G01R17/08—Automatic balancing arrangements in which a force or torque representing the measured value is balanced by a force or torque representing the reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Fluid Pressure (AREA)
FI20041344A 2004-10-15 2004-10-15 Anturi ja menetelmä komponenttiin kohdistuvan suureen mittaamiseksi FI20041344A (fi)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20041344A FI20041344A (fi) 2004-10-15 2004-10-15 Anturi ja menetelmä komponenttiin kohdistuvan suureen mittaamiseksi
US11/665,386 US20080106275A1 (en) 2004-10-15 2005-10-14 Sensor and Method for Measuring a Variable Affecting a Capacitive Component
PCT/FI2005/000448 WO2006040403A1 (en) 2004-10-15 2005-10-14 Sensor and method for measuring a variable affecting a capacitive component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20041344A FI20041344A (fi) 2004-10-15 2004-10-15 Anturi ja menetelmä komponenttiin kohdistuvan suureen mittaamiseksi

Publications (2)

Publication Number Publication Date
FI20041344A0 FI20041344A0 (fi) 2004-10-15
FI20041344A true FI20041344A (fi) 2006-04-16

Family

ID=33306037

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20041344A FI20041344A (fi) 2004-10-15 2004-10-15 Anturi ja menetelmä komponenttiin kohdistuvan suureen mittaamiseksi

Country Status (3)

Country Link
US (1) US20080106275A1 (fi)
FI (1) FI20041344A (fi)
WO (1) WO2006040403A1 (fi)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4373994B2 (ja) * 2006-05-31 2009-11-25 株式会社東芝 可変容量装置および携帯電話
US20080246491A1 (en) * 2007-04-06 2008-10-09 Texas Instruments Incorporated Scalable method for identifying cracks and fractures under wired or ball bonded bond pads
FI125783B (fi) * 2011-10-05 2016-02-15 Teknologian Tutkimuskeskus Vtt Oy Menetelmä ja laite johtimessa kulkevan sähkötehon mittaamiseksi
EP2653845B1 (en) 2012-04-18 2015-07-15 Nxp B.V. Sensor circuit and calibration method
US9055207B2 (en) 2012-12-31 2015-06-09 Digitaloptics Corporation Auto-focus camera module with MEMS distance measurement
US9097748B2 (en) * 2013-03-14 2015-08-04 DigitalOptics Corporation MEMS Continuous capacitance measurement for MEMS-actuated movement of an optical component within an auto-focus camera module
FI20165896A (fi) * 2016-11-24 2018-05-25 Teknologian Tutkimuskeskus Vtt Oy Anturi
US9813831B1 (en) 2016-11-29 2017-11-07 Cirrus Logic, Inc. Microelectromechanical systems microphone with electrostatic force feedback to measure sound pressure
US9900707B1 (en) * 2016-11-29 2018-02-20 Cirrus Logic, Inc. Biasing of electromechanical systems microphone with alternating-current voltage waveform

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54307U (fi) * 1977-06-04 1979-01-05
FR2495328B1 (fr) * 1980-11-28 1986-04-11 Onera (Off Nat Aerospatiale) Perfectionnements aux accelerometres electrostatiques
US4584885A (en) * 1984-01-20 1986-04-29 Harry E. Aine Capacitive detector for transducers
US4860232A (en) * 1987-04-22 1989-08-22 Massachusetts Institute Of Technology Digital technique for precise measurement of variable capacitance
US4795965A (en) * 1987-10-14 1989-01-03 Pratt & Whitney Canada Inc. Capacitance to voltage conversion circuit including a capacitive bridge and a capacitive offset
EP0543901B1 (en) * 1990-08-17 1995-10-04 Analog Devices, Inc. Monolithic accelerometer
US5491604A (en) * 1992-12-11 1996-02-13 The Regents Of The University Of California Q-controlled microresonators and tunable electronic filters using such resonators
US5992233A (en) * 1996-05-31 1999-11-30 The Regents Of The University Of California Micromachined Z-axis vibratory rate gyroscope
FI981457A0 (fi) * 1998-06-24 1998-06-24 Valtion Teknillinen Mikromekaaninen vaihto- ja tasajännitereferenssilaitteisto
US6611168B1 (en) * 2001-12-19 2003-08-26 Analog Devices, Inc. Differential parametric amplifier with physically-coupled electrically-isolated micromachined structures
JP4166528B2 (ja) * 2002-08-07 2008-10-15 株式会社デンソー 容量式力学量センサ

Also Published As

Publication number Publication date
US20080106275A1 (en) 2008-05-08
FI20041344A0 (fi) 2004-10-15
WO2006040403A1 (en) 2006-04-20

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