FI20031764A - Method and arrangement for opening and closing the test chamber door - Google Patents

Method and arrangement for opening and closing the test chamber door Download PDF

Info

Publication number
FI20031764A
FI20031764A FI20031764A FI20031764A FI20031764A FI 20031764 A FI20031764 A FI 20031764A FI 20031764 A FI20031764 A FI 20031764A FI 20031764 A FI20031764 A FI 20031764A FI 20031764 A FI20031764 A FI 20031764A
Authority
FI
Finland
Prior art keywords
closing
arrangement
opening
chamber door
test chamber
Prior art date
Application number
FI20031764A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20031764A0 (en
Inventor
Toomas Tiismaa
Sten Lindvest
Original Assignee
Elektrobit Testing Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elektrobit Testing Oy filed Critical Elektrobit Testing Oy
Priority to FI20031764A priority Critical patent/FI20031764A/en
Publication of FI20031764A0 publication Critical patent/FI20031764A0/en
Priority to PCT/FI2004/000732 priority patent/WO2005054881A1/en
Publication of FI20031764A publication Critical patent/FI20031764A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FI20031764A 2003-12-03 2003-12-03 Method and arrangement for opening and closing the test chamber door FI20031764A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20031764A FI20031764A (en) 2003-12-03 2003-12-03 Method and arrangement for opening and closing the test chamber door
PCT/FI2004/000732 WO2005054881A1 (en) 2003-12-03 2004-12-02 Method and arrangement for opening and closing a test chamber door

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20031764A FI20031764A (en) 2003-12-03 2003-12-03 Method and arrangement for opening and closing the test chamber door

Publications (2)

Publication Number Publication Date
FI20031764A0 FI20031764A0 (en) 2003-12-03
FI20031764A true FI20031764A (en) 2005-06-04

Family

ID=29763463

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20031764A FI20031764A (en) 2003-12-03 2003-12-03 Method and arrangement for opening and closing the test chamber door

Country Status (2)

Country Link
FI (1) FI20031764A (en)
WO (1) WO2005054881A1 (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0683455B2 (en) * 1984-11-13 1994-10-19 ソニー株式会社 Hue adjustment circuit
DE9111721U1 (en) * 1991-09-19 1992-10-22 Siemens AG, 8000 München Threshold-free cover, especially electromagnetically shielded sliding gate
GB2292361B (en) * 1994-08-16 1998-03-18 Phisilog Res Ltd Final production and testing of radio units
JP2000013073A (en) * 1998-06-17 2000-01-14 Ando Electric Co Ltd Shield box for performance test of electronic device

Also Published As

Publication number Publication date
FI20031764A0 (en) 2003-12-03
WO2005054881A1 (en) 2005-06-16

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Legal Events

Date Code Title Description
FD Application lapsed