FI100366B - Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta - Google Patents
Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnastaInfo
- Publication number
- FI100366B FI100366B FI944023A FI944023A FI100366B FI 100366 B FI100366 B FI 100366B FI 944023 A FI944023 A FI 944023A FI 944023 A FI944023 A FI 944023A FI 100366 B FI100366 B FI 100366B
- Authority
- FI
- Finland
- Prior art keywords
- examined
- procedure
- identifying deviations
- deviations
- identifying
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20021—Dividing image into blocks, subimages or windows
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Textile Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Image Analysis (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI944023A FI100366B (fi) | 1994-09-01 | 1994-09-01 | Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta |
PCT/FI1995/000469 WO1996007158A2 (en) | 1994-09-01 | 1995-09-01 | Method for detecting imperfections on a surface inspected |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI944023A FI100366B (fi) | 1994-09-01 | 1994-09-01 | Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta |
Publications (3)
Publication Number | Publication Date |
---|---|
FI944023A0 FI944023A0 (fi) | 1994-09-01 |
FI944023A FI944023A (fi) | 1996-03-02 |
FI100366B true FI100366B (fi) | 1997-11-14 |
Family
ID=8541287
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI944023A FI100366B (fi) | 1994-09-01 | 1994-09-01 | Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta |
Country Status (2)
Country | Link |
---|---|
FI (1) | FI100366B (fi) |
WO (1) | WO1996007158A2 (fi) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI20070085L (fi) * | 2007-02-01 | 2008-08-02 | Piitek Oy | Lajittelumenetelmä |
AT511399B1 (de) * | 2011-05-13 | 2013-09-15 | Polymer Competence Ct Leoben Gmbh | Verfahren zur automatisierten klassifikation von einschlüssen |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IL63781A (en) * | 1980-09-19 | 1985-03-31 | Trw Inc | System for defect analysis in manufactured parts such as turbine blades |
US4519041A (en) * | 1982-05-03 | 1985-05-21 | Honeywell Inc. | Real time automated inspection |
JP3118725B2 (ja) * | 1991-09-11 | 2000-12-18 | 株式会社日立製作所 | 自動分類方法 |
US5274713A (en) * | 1991-09-23 | 1993-12-28 | Industrial Technology Research Institute | Real-time apparatus for detecting surface defects on objects |
GB2270227A (en) * | 1992-08-28 | 1994-03-02 | Surface Inspection Ltd | Linescan visual monitoring system |
-
1994
- 1994-09-01 FI FI944023A patent/FI100366B/fi active
-
1995
- 1995-09-01 WO PCT/FI1995/000469 patent/WO1996007158A2/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
FI944023A0 (fi) | 1994-09-01 |
FI944023A (fi) | 1996-03-02 |
WO1996007158A2 (en) | 1996-03-07 |
WO1996007158A3 (en) | 1996-03-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GB | Transfer or assigment of application |
Owner name: SPECTRA-PHYSICS VISIONTECH OY |