ES2402722B1 - Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. - Google Patents
Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. Download PDFInfo
- Publication number
- ES2402722B1 ES2402722B1 ES201131750A ES201131750A ES2402722B1 ES 2402722 B1 ES2402722 B1 ES 2402722B1 ES 201131750 A ES201131750 A ES 201131750A ES 201131750 A ES201131750 A ES 201131750A ES 2402722 B1 ES2402722 B1 ES 2402722B1
- Authority
- ES
- Spain
- Prior art keywords
- array probe
- sensors
- mux
- array
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9013—Arrangements for scanning
Abstract
Se proporciona una sonda array que comprende al menos un array de sensores (2), con un conjunto de sensores individuales (S) formados en capas (Ci) de un substrato de capas múltiples (SCn) y dispuestos alineados en al menos dos filas (3, 4), estando adaptados estos sensores para conmutar entre un estado emisor y un estado receptor mediante un respectivo bloque multiplexor transmisor/receptor (MUX TX, MUX RX) gobernados por medio de un circuito de control (CTRL). La sonda comprende una primera parte flexible (5), esencialmente laminar, portante del array de sensores (2) y una primera parte rígida (6), también esencialmente laminar, que integra los bloques multiplexores, el circuito de control y un dispositivo amplificador (AMP) para elevar el nivel de señal procedente del bloque multiplexor receptor (MUX RX); y estando dicha parte flexible y dicha rígida unidas formando un solo conjunto de circuito de tipo rigiflex.An array probe is provided comprising at least one array of sensors (2), with a set of individual sensors (S) formed in layers (Ci) of a multilayer substrate (SCn) and arranged aligned in at least two rows ( 3, 4), these sensors being adapted to switch between a sending state and a receiving state by means of a respective transmitter / receiver multiplexer block (MUX TX, MUX RX) governed by means of a control circuit (CTRL). The probe comprises a first flexible part (5), essentially laminar, bearing the array of sensors (2) and a first rigid part (6), also essentially laminar, which integrates the multiplexer blocks, the control circuit and an amplifying device ( AMP) to raise the signal level from the receiver multiplexer block (MUX RX); and said flexible part and said rigid being joined together forming a single circuit assembly of the rigiflex type.
Description
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES201131750A ES2402722B1 (en) | 2011-10-31 | 2011-10-31 | Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ES201131750A ES2402722B1 (en) | 2011-10-31 | 2011-10-31 | Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. |
Publications (3)
Publication Number | Publication Date |
---|---|
ES2402722A2 ES2402722A2 (en) | 2013-05-08 |
ES2402722R1 ES2402722R1 (en) | 2013-09-26 |
ES2402722B1 true ES2402722B1 (en) | 2014-07-18 |
Family
ID=48128649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES201131750A Expired - Fee Related ES2402722B1 (en) | 2011-10-31 | 2011-10-31 | Integrated array probe for inspection of component defects by induced currents and method for operation of said array probe. |
Country Status (1)
Country | Link |
---|---|
ES (1) | ES2402722B1 (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6344739B1 (en) * | 1999-02-12 | 2002-02-05 | R/D Tech Inc. | Eddy current probe with multi-use coils and compact configuration |
US6812697B2 (en) * | 2002-09-24 | 2004-11-02 | General Electric Company | Molded eddy current array probe |
EP1952135A4 (en) * | 2005-11-03 | 2011-12-14 | Coastal Res Corp | Comformable eddy current array |
-
2011
- 2011-10-31 ES ES201131750A patent/ES2402722B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
ES2402722R1 (en) | 2013-09-26 |
ES2402722A2 (en) | 2013-05-08 |
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