ES2177473T1 - RESONANCE DETECTION OF SUPPLY PLASMON WITH HIGH ANGLE RESOLUTION AND QUICK RESPONSE TIME. - Google Patents

RESONANCE DETECTION OF SUPPLY PLASMON WITH HIGH ANGLE RESOLUTION AND QUICK RESPONSE TIME.

Info

Publication number
ES2177473T1
ES2177473T1 ES00935960T ES00935960T ES2177473T1 ES 2177473 T1 ES2177473 T1 ES 2177473T1 ES 00935960 T ES00935960 T ES 00935960T ES 00935960 T ES00935960 T ES 00935960T ES 2177473 T1 ES2177473 T1 ES 2177473T1
Authority
ES
Spain
Prior art keywords
intensity
difference
positions
photodetector device
plasmon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
ES00935960T
Other languages
Spanish (es)
Inventor
Nongjian Tao
Salah Boussaad
Wenlue Huang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Florida International University FIU
Original Assignee
Florida International University FIU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Florida International University FIU filed Critical Florida International University FIU
Publication of ES2177473T1 publication Critical patent/ES2177473T1/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Un método para detectar resonancia de plasmón de superficie que comprende las etapas de: (a) enfocar un haz de radiación electromagnéticas sobre una capa de material metálico, sobre la cual se encuentra opcionalmente un material de muestra; (b) detectar dicho haz de radiación electromagnética reflejado desde dicha capa de material metálico con un dispositivo fotodetector sensible a la intensidadoa la diferenciadeposiciones; (c) anotar la intensidad de la primera señal A de intensidad o posición y la intensidad de la primera señal B de intensidad o posición producidas por dicho dispositivo fotodetector sensible a la intensidad o a la diferencia de posiciones; (d) posicionar dicho dispositivo fotodetector sensible a la intensidad o a la diferencia de posiciones de tal modo que la intensidad mínima de resonancia de plasmón de superficie esté próxima al centro del dispositivo fotodetector sensible a la intensidad o a la diferencia de posiciones de tal manera que la diferencia en dicha señal Ade intensidad o posición y dicha señal B de intensidad o posición esté cerca de cero; y (e) detectar cambios subsiguientes en la distribución de intensidad debidos al desplazamiento angular de la resonancia de plasmón de superficie. troquímica.A method for detecting surface plasmon resonance comprising the steps of: (a) focusing a beam of electromagnetic radiation on a layer of metallic material, on which an example material is optionally located; (b) detecting said beam of electromagnetic radiation reflected from said layer of metallic material with a photodetector device sensitive to the intensified difference in positions; (c) record the intensity of the first intensity or position signal A and the intensity of the first intensity or position signal B produced by said photodetector device sensitive to the intensity or the difference in positions; (d) positioning said photodetector device sensitive to the intensity or to the difference in positions such that the minimum surface plasmon resonance intensity is close to the center of the photodetector device sensitive to the intensity or the difference in positions such that the difference in said signal Ade intensity or position and said signal B of intensity or position is near zero; and (e) detect subsequent changes in intensity distribution due to angular displacement of surface plasmon resonance. trochemistry

ES00935960T 1999-05-17 2000-05-16 RESONANCE DETECTION OF SUPPLY PLASMON WITH HIGH ANGLE RESOLUTION AND QUICK RESPONSE TIME. Pending ES2177473T1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13448299P 1999-05-17 1999-05-17

Publications (1)

Publication Number Publication Date
ES2177473T1 true ES2177473T1 (en) 2002-12-16

Family

ID=22463595

Family Applications (1)

Application Number Title Priority Date Filing Date
ES00935960T Pending ES2177473T1 (en) 1999-05-17 2000-05-16 RESONANCE DETECTION OF SUPPLY PLASMON WITH HIGH ANGLE RESOLUTION AND QUICK RESPONSE TIME.

Country Status (11)

Country Link
EP (1) EP1194763A4 (en)
JP (1) JP2002544516A (en)
CN (1) CN1216282C (en)
AU (1) AU5134100A (en)
CA (1) CA2373343A1 (en)
DE (1) DE1194763T1 (en)
ES (1) ES2177473T1 (en)
HK (1) HK1044041A1 (en)
IL (1) IL146207A (en)
RU (1) RU2226684C2 (en)
WO (1) WO2000070328A1 (en)

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FR2817962B1 (en) * 2000-12-13 2004-08-06 Inst Optique Theorique Et Appl SURFACE CHARACTERIZATION METHOD, APPLICATION AND DEVICE IMPLEMENTING THE METHOD
EP1342071A1 (en) 2000-12-13 2003-09-10 Institut d'Optique Theorique et appliquee Method for characterising a surface, and device therefor
KR20040012384A (en) * 2002-08-03 2004-02-11 이종협 high resolution surface plasmon resonance spectroscopy and measuring method of adsorption and selectivity of heavy metal ions using the same
CN1894576B (en) * 2003-11-19 2010-04-28 比恩诺尔股份公司 Method and apparatus for actuating surface plasma resonance measuring
ES2261009B1 (en) * 2004-06-11 2007-11-16 Consejo Superior De Investigaciones Cientificas. DEVICE AND METHOD FOR DETECTING CHANGES IN THE REFRACTION INDEX OF A DIELECTRIC ENVIRONMENT.
WO2006031198A1 (en) * 2004-09-15 2006-03-23 Agency For Science, Technology And Research Surface plasmon resonance and quartz crystal microbalance sensor
US7317519B2 (en) 2004-10-29 2008-01-08 Agilent Technologies, Inc. Swept-angle SPR measurement system
EP1891414A4 (en) * 2005-06-14 2010-04-21 Fujifilm Corp Sensor, multichannel sensor, sensing apparatus, and sensing method
JP4481967B2 (en) * 2005-09-05 2010-06-16 キヤノン株式会社 Sensor device
CN100412528C (en) * 2005-10-20 2008-08-20 汪胜前 Gas and liquid concentration testing sensor and testing system
JP4663590B2 (en) * 2006-06-14 2011-04-06 日本電信電話株式会社 Peak position variation measuring apparatus, measuring method and program thereof
WO2008009165A1 (en) * 2006-07-03 2008-01-24 He Jian Technology(Suzhou)Co.Ltd. AN OPTICAL INSPECTING METHOD OF A PLASMA PROCESSING DEGREE OF A SiON FILM
CN100489500C (en) * 2007-01-23 2009-05-20 中国科学院长春应用化学研究所 Electrochemistry original position time surface differentiated plasma resonance measuring instrument
KR100876608B1 (en) * 2007-08-20 2008-12-31 한국생명공학연구원 Surface plasmon resonance sensor using rotating mirror
JP5344828B2 (en) 2008-02-28 2013-11-20 富士フイルム株式会社 Sensing device
WO2011066667A1 (en) * 2009-12-01 2011-06-09 国家纳米科学中心 Surface plasmon resonance(spr) sensor based on measurement of resonance angle and measurement method thereof
CN103675053B (en) * 2013-09-27 2016-05-11 中国科学院电子学研究所 A kind of local electrochemistry imaging test system based on surface plasma resonance
WO2015121704A2 (en) * 2013-11-01 2015-08-20 Miller Marvin J Pathogen detection
JP6346040B2 (en) * 2014-09-10 2018-06-20 日本電信電話株式会社 Refractive index measuring device
CN105699335B (en) * 2016-04-12 2019-01-04 岭南师范学院 A kind of multi-functional SPR detector
CN109490279A (en) * 2018-09-10 2019-03-19 桂林电子科技大学 The rotary SPR sensorgram chip of D-shaped microtrabeculae mirror
CN110133066A (en) * 2019-05-24 2019-08-16 暨南大学 Electrochemistry pdp optical fiber heavy metal detection system and method
CN110823835B (en) * 2019-12-16 2022-02-25 长沙学院 Waveguide coupling long-range surface plasma resonance sensor and measuring method thereof
RU2770648C1 (en) * 2021-03-09 2022-04-19 Общество С Ограниченной Ответственностью "Микросенсор" Optical sensor based on plasmon-induced transparency and fano resonances
RU2758779C1 (en) * 2021-03-17 2021-11-01 Федеральное государственное бюджетное образовательное учреждение высшего образования «Сибирский государственный университет геосистем и технологий» Surface plasmon resonance sensor

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NL8700851A (en) * 1987-04-10 1988-11-01 Tno METHOD AND APPARATUS FOR DETECTING VERY LOW CONCENTRATIONS OF A MEASURING MEDIA CHEMICAL COMPONENT USING SURFACE-PLASMON RESONANCE AND ELECTROCHEMICALLY STIMULATED ADSORPTION
GB9107796D0 (en) * 1991-04-12 1991-05-29 Nat Res Dev Methods of and apparatus for measurement using acousto-optic devices
GB9212416D0 (en) * 1992-06-11 1992-07-22 Medical Res Council Reversible binding substances
US5351127A (en) * 1992-06-17 1994-09-27 Hewlett-Packard Company Surface plasmon resonance measuring instruments
GB9414599D0 (en) * 1994-07-20 1994-09-07 Scient Generics Ltd Biosensor
JPH09292334A (en) * 1996-04-30 1997-11-11 Fuji Photo Film Co Ltd Surface plasmon sensor
JPH10267841A (en) * 1997-03-24 1998-10-09 Kokuritsu Shintai Shogaisha Rehabilitation Center Souchiyou Surface plasmon resonance-sensing device
US5986762A (en) * 1998-06-15 1999-11-16 Imation Corp. Optical sensor having optimized surface profile

Also Published As

Publication number Publication date
CN1364233A (en) 2002-08-14
CN1216282C (en) 2005-08-24
WO2000070328A1 (en) 2000-11-23
IL146207A0 (en) 2002-07-25
CA2373343A1 (en) 2000-11-23
IL146207A (en) 2005-05-17
DE1194763T1 (en) 2002-10-17
JP2002544516A (en) 2002-12-24
AU5134100A (en) 2000-12-05
HK1044041A1 (en) 2002-10-04
RU2226684C2 (en) 2004-04-10
EP1194763A4 (en) 2006-01-11
EP1194763A1 (en) 2002-04-10

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