ES2056847T3 - Procedimiento para ensayar redes de lineas. - Google Patents
Procedimiento para ensayar redes de lineas.Info
- Publication number
- ES2056847T3 ES2056847T3 ES88104509T ES88104509T ES2056847T3 ES 2056847 T3 ES2056847 T3 ES 2056847T3 ES 88104509 T ES88104509 T ES 88104509T ES 88104509 T ES88104509 T ES 88104509T ES 2056847 T3 ES2056847 T3 ES 2056847T3
- Authority
- ES
- Spain
- Prior art keywords
- network
- procedure
- conductor
- line networks
- testing line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/305—Contactless testing using electron beams
- G01R31/306—Contactless testing using electron beams of printed or hybrid circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Data Exchanges In Wide-Area Networks (AREA)
- Two-Way Televisions, Distribution Of Moving Picture Or The Like (AREA)
- Maintenance And Management Of Digital Transmission (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
PROCEDIMIENTO CONOCIDO PARA LA PRUEBA DE ESTRUCTURAS DE CONDUCTORES ESTAN UTILIZABLE SIN ERROR SOLO CUANDO LA CARGA PRODUCIDA CON ASISTENCIA DE UN HAZ DE ELECTRONES QUEDA ACUMULADO EN LA ESTRUCTURA DURANTE EL PROCEDIMIENTO DE MEDICION COMPLETO. PORQUE NO TODAS LAS PLACAS DE CIRCUITO IMPRESO Y MODULOS DE CABLEADO MUESTRAN RESISTENCIAS DEL AISLAMIENTO SUFICIENTES / ALTOS, SE PUEDEN DESCARGAR PARTES DE LA ESTRUCTURA A TRAVES DE CORRIENTES DE FUGA HASTA QUE UNA SEÑAL DE ELECTRONES SECUNDARIOS MEDIDO EN LOS CAMPOS EN RESPECTO, ENGAÑAR UNA INTERRUPCION QUE NO EXISTE EN EFECTIVO. PARA LA COMPENSACION DE LA PERDIDA DE CARGA SE PROPONE CONFORME AL INVENTO, QUE SE EXPLORE LA ESTRUCTURA DE CONDUCTOR CON UN SEGUNDO HAZ DE ELECTRONES CON UNA SUPERFICIE GRANDE DURANTE LA MEDICION.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3712176 | 1987-04-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2056847T3 true ES2056847T3 (es) | 1994-10-16 |
Family
ID=6325322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES88104509T Expired - Lifetime ES2056847T3 (es) | 1987-04-10 | 1988-03-21 | Procedimiento para ensayar redes de lineas. |
Country Status (7)
Country | Link |
---|---|
US (1) | US4841242A (es) |
EP (1) | EP0285896B1 (es) |
JP (1) | JPS63262573A (es) |
AT (1) | ATE109570T1 (es) |
CA (1) | CA1277773C (es) |
DE (1) | DE3850900D1 (es) |
ES (1) | ES2056847T3 (es) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4943769A (en) * | 1989-03-21 | 1990-07-24 | International Business Machines Corporation | Apparatus and method for opens/shorts testing of capacitively coupled networks in substrates using electron beams |
US5159752A (en) * | 1989-03-22 | 1992-11-03 | Texas Instruments Incorporated | Scanning electron microscope based parametric testing method and apparatus |
US4978908A (en) * | 1989-03-22 | 1990-12-18 | Texas Instruments Incorporated | Scanning electron microscope based parametric testing method and apparatus |
EP0402499A1 (de) * | 1989-06-13 | 1990-12-19 | Siemens Aktiengesellschaft | Verfahren zur Prüfung einer Leiterplatte mit einer Teilchensonde |
DE68910322T2 (de) * | 1989-11-28 | 1994-05-05 | Ibm | Verfahren zur Inspektion von Durchkontakt-Stiften in integrierten Schaltungspackungen mittels Photoemission. |
US5039938A (en) * | 1990-06-21 | 1991-08-13 | Hughes Aircraft Company | Phosphor glow testing of hybrid substrates |
EP0490154A3 (en) * | 1990-12-07 | 1992-09-30 | Siemens Aktiengesellschaft | Method for determining the charge of a sample region |
US5258706A (en) * | 1991-10-16 | 1993-11-02 | Siemens Aktiengesellschaft | Method for the recognition of testing errors in the test of microwirings |
US5301012A (en) * | 1992-10-30 | 1994-04-05 | International Business Machines Corporation | Optical technique for rapid inspection of via underetch and contamination |
DE4305672A1 (de) * | 1993-02-24 | 1994-08-25 | Integrated Circuit Testing | Verfahren und Vorrichtung zum Testen von Netzwerken auf Kurzschlüsse und/oder Unterbrechungen |
US8921406B2 (en) | 2005-08-21 | 2014-12-30 | AbbVie Deutschland GmbH & Co. KG | 5-ring heteroaromatic compounds and their use as binding partners for 5-HT5 receptors |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5618424A (en) * | 1979-07-23 | 1981-02-21 | Nippon Telegr & Teleph Corp <Ntt> | Apparatus for electron beam lithography |
US4417203A (en) * | 1981-05-26 | 1983-11-22 | International Business Machines Corporation | System for contactless electrical property testing of multi-layer ceramics |
JPS60741A (ja) * | 1983-06-16 | 1985-01-05 | Toshiba Mach Co Ltd | 電子線露光方法 |
JPS60130121A (ja) * | 1983-12-16 | 1985-07-11 | Toshiba Mach Co Ltd | 電子ビ−ム露光方法 |
JPS60173834A (ja) * | 1984-02-14 | 1985-09-07 | Nippon Telegr & Teleph Corp <Ntt> | マルチ荷電ビ−ム露光装置 |
DE3579380D1 (de) * | 1984-06-01 | 1990-10-04 | Siemens Ag | Verfahren zur elektrischen pruefung von mikroverdrahtungen mit hilfe von korpuskularsonden. |
US4985681A (en) * | 1985-01-18 | 1991-01-15 | Siemens Aktiengesellschaft | Particle beam measuring method for non-contact testing of interconnect networks |
US4707609A (en) * | 1985-01-31 | 1987-11-17 | Canon Kabushiki Kaisha | Exposure apparatus and method |
US4755748A (en) * | 1985-06-05 | 1988-07-05 | Bell Communications Research, Inc. | Method and apparatus for analyzing semiconductor devices using charge-sensitive electron-beam-injected-carrier microscopy |
US4733174A (en) * | 1986-03-10 | 1988-03-22 | Textronix, Inc. | Circuit testing method and apparatus |
-
1988
- 1988-02-29 US US07/161,758 patent/US4841242A/en not_active Expired - Lifetime
- 1988-03-21 DE DE3850900T patent/DE3850900D1/de not_active Expired - Lifetime
- 1988-03-21 EP EP88104509A patent/EP0285896B1/de not_active Expired - Lifetime
- 1988-03-21 ES ES88104509T patent/ES2056847T3/es not_active Expired - Lifetime
- 1988-03-21 AT AT88104509T patent/ATE109570T1/de active
- 1988-04-08 JP JP63085554A patent/JPS63262573A/ja active Pending
- 1988-04-11 CA CA000563770A patent/CA1277773C/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE3850900D1 (de) | 1994-09-08 |
EP0285896A2 (de) | 1988-10-12 |
CA1277773C (en) | 1990-12-11 |
ATE109570T1 (de) | 1994-08-15 |
JPS63262573A (ja) | 1988-10-28 |
US4841242A (en) | 1989-06-20 |
EP0285896A3 (en) | 1990-08-29 |
EP0285896B1 (de) | 1994-08-03 |
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