EP4006210A1 - Distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate - Google Patents

Distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate Download PDF

Info

Publication number
EP4006210A1
EP4006210A1 EP20210367.7A EP20210367A EP4006210A1 EP 4006210 A1 EP4006210 A1 EP 4006210A1 EP 20210367 A EP20210367 A EP 20210367A EP 4006210 A1 EP4006210 A1 EP 4006210A1
Authority
EP
European Patent Office
Prior art keywords
cathode
substrate
distribution
pixels
electric current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP20210367.7A
Other languages
German (de)
French (fr)
Other versions
EP4006210B1 (en
Inventor
Andreas Gleissner
Herbert Ötzlinger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semsysco GmbH
Original Assignee
Semsysco GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semsysco GmbH filed Critical Semsysco GmbH
Priority to EP20210367.7A priority Critical patent/EP4006210B1/en
Priority to CN202180078257.7A priority patent/CN116472367A/en
Priority to KR1020237021387A priority patent/KR20230113352A/en
Priority to PCT/EP2021/081410 priority patent/WO2022112015A1/en
Priority to US18/038,495 priority patent/US20240011180A1/en
Priority to TW110143936A priority patent/TW202235691A/en
Publication of EP4006210A1 publication Critical patent/EP4006210A1/en
Application granted granted Critical
Publication of EP4006210B1 publication Critical patent/EP4006210B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/001Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/10Electrodes, e.g. composition, counter electrode
    • C25D17/12Shape or form
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/007Current directing devices
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D21/00Processes for servicing or operating cells for electrolytic coating
    • C25D21/10Agitating of electrolytes; Moving of racks
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D21/00Processes for servicing or operating cells for electrolytic coating
    • C25D21/12Process control or regulation
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/08Electroplating with moving electrolyte e.g. jet electroplating

Definitions

  • the disclosure relates to a distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate, a distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate and a distribution method for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate.
  • Electroplating e.g. of copper
  • electroplating is a frequently used technology in many different industries, especially in the semiconductor related industries. Due to the simplicity and scalability of the process, electroplating is used to metallize surfaces or parts of surfaces of various types of substrates having various sizes.
  • terminal effect The main challenge associated with the seed-layer and the uniformity of the electrical current distribution over the surface area is called "terminal effect".
  • the terminal effect describes a potential drop across a surface area, which can occur due to a relatively high resistivity of such a seed-layer, which is usually required for the electroplating process of a substrate.
  • a potential drop of several volts is likely to occur.
  • Such potential drop from the substrate edge to the area to be plated results in a highly non-uniform current density distribution leading to an extremely non-uniform plating thickness distribution, primarily characterized by a thicker plating at the substrate edges.
  • Additional challenges associated with the current distribution that need to be faced, especially with increasingly smaller structures, may be the equilibration of the current distribution between substrate areas with a very high-density of tiny structures and areas with a low density of rather larger structures to be electroplated.
  • a distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate comprises a distribution body, a primary cathode, and a secondary cathode.
  • the distribution body comprises several openings for the process fluid and the electric current, wherein the several openings are arranged at a front face of the distribution body, the front face being directed to the primary cathode.
  • the primary cathode and the secondary cathode are arranged to attract the electric current and to guide the electric current to the substrate, preferably to predefined areas of the substrate to be treated.
  • the secondary cathode comprises several cathode pixels, wherein the several cathode pixels are distributed in an array to be aligned with at least an area of the substrate to be treated. Additionally, the several cathode pixels are individually controllable for adjusting a distribution of the electric current at the substrate.
  • the secondary cathode may be spaced apart from the primary cathode and may comprise several cathode pixels being distributed in an array to be aligned with an area of the substrate to be treated. This arrangement may enable a localized control and tuning of the current density distribution, particularly with a tuning resolution down to the sub- ⁇ m range.
  • the individually controllable cathode pixels may enable a very localized adjustment and tuning of the current density distribution all over a surface of the substrate to be treated, not only at the edge areas of the substrate. Therefore, the distribution system may allow effecting the edge-to-center/center-to-edge as well as the current density distribution within the substrate to be plated. Furthermore, the distribution system according to the disclosure may enable the plating of non-rotating substrates as well as of rotating substrates.
  • the secondary cathode may be made from an electrically conducting material, preferably inert to the chemical environment of the electrolyte, e.g. inert metals, such as palladium, palladium-coated materials, platinum and/or platinized materials like tantalum, tungsten, and/or titanium, or may be made from the same material as a plating material to be used for the surface treatment of the substrate.
  • inert metals such as palladium, palladium-coated materials, platinum and/or platinized materials like tantalum, tungsten, and/or titanium
  • a Cu-comprising secondary cathode may be used when Cu is plated.
  • the secondary cathode may have a circular, square, rectangular, C-shaped, wire-shaped and/or partially electrically insulated shape.
  • the secondary cathode may work as a thief cathode mitigating the terminal effect by increasing the plating-uniformity. Additionally, or alternatively, the secondary cathode may be formed by several pixels, wherein the pixels may be separate from each other, wherein each pixel may be individually controllable. Therefore, the secondary cathode may be referred as pixelated cathode. Further, the secondary cathode may be directed towards the primary cathode.
  • the distribution system may further comprise at least a power source configured to apply individual voltage potentials to the cathode pixels to individually control the cathode pixels.
  • at least some of the cathode pixels may be each connected to a single power source.
  • the cathode pixels may be each connected to the at least one power source by electrical connecting lines transmitting a potential from the at least one power source to the cathode pixels. Additionally or alternatively, the cathode pixels their selves can be at least partially formed as a wire. At least some of the cathode pixels may be together connected to a single power source. To sum it up, the cathode pixels may be each connected to the same power source, or the cathode pixels may be each connected to individual power sources, resulting in that the number of power sources corresponds to the number of cathode pixels. Alternatively, the power source may comprise several power outlets, each pixel being connected to an individual power outlet of the one power source. Additionally, or alternatively, the cathode pixels may be divided into several groups of pixels, wherein the pixels of each group may be connected to the same power source, but each group of pixels is connected to a separate power source.
  • At least some cathode pixels being controlled by a single power source may have individual potentials.
  • the cathode pixels may be configured to display a variety of different pixel potentials by providing variable resistances between the power source and the individual cathode pixel.
  • the distribution system may further comprise at least a processing unit configured to control the at least one power source to apply the individual voltage potentials to the cathode pixels for individual durations.
  • each cathode pixel may be fabricated in a way to permit individual controllability of the applied potential and/or the duration of the applied potential. At least some of the cathode pixels may be grouped to arrays and each array is connected to one of several power sources for being applied with the same potential and same duration.
  • the power source(s) may have a cathodic potential or an anodic potential.
  • the anodic potential may be used for achieving an improved pixelated reverse pulse plating or for cleaning the pixels from potentially deposited metal layers or particles.
  • the cathode pixels may be arranged at a rear face of the distribution body, wherein the rear face is opposite to the front face of the distribution body.
  • the control for adjusting the distribution of the electric current at the substrate may be a physical arrangement of cathode pixels.
  • the pixels may be arranged according to a predefined pattern, e.g. a photolithographic mask, which is used to create the pattern distribution on the substrate to be treated.
  • the cathode pixels can be electrically tuned according to the substrate pattern densities and substrate irregularities.
  • the cathode pixels may be arranged at the distribution body.
  • the cathode pixels may be arranged in or on a surface of the distribution body.
  • the cathode pixels may be arranged at the front face of the distribution body directed to the first cathode.
  • the cathode pixels may be mainly arranged around the openings at the front face.
  • the cathode pixels may be integrated into the distribution body surface through common processes used in the semiconductor and/or flat panel industry, like one or more photolithographic process sequences.
  • at least some of the cathode pixels and electrical connecting lines may be manufactured on the surface via printing. The electrical connecting lines may be fabricated in a similar way as the (individual) cathode pixels.
  • the openings at the front face may be configured at least partially as jet holes directing the process fluid and/or the electric current towards the substrate to be treated and/or at least partially as connecting passages draining off the process fluid from the substrate to be treated.
  • the front face and the rear face of the distribution body may be connected by the connecting passages through the distribution body, wherein the cathode pixels are arranged at least partially around the connecting passages.
  • the connecting passages may be configured to permit a backflow and with this a circulation of the process fluid through the distribution body. Arranging the cathode pixels around the connecting passaged can be an easy way to integrate the cathode pixels into the distribution body.
  • the secondary cathode may be separate to the distribution body and positioned adjacent to the distribution body in a direction towards the substrate.
  • the secondary cathode may be implemented as a stand-alone system.
  • the secondary cathode may correspond to a mostly electrically isolated wire with an electrically non-isolated tip.
  • multiple cathode pixels may be physically connected together in a predefined specific geometric constellation, preferably defined by and aligned with the requirements of an "open area density" distribution on the substrate.
  • This stand-alone system can be placed between the distribution body and the primary cathode to enable the tuning of the current density distribution all over the substrate to be treated, and in particular to enable the tuning of the current density distribution for individual areas and/or individual device structures of the substrate to be treated.
  • the "open area density” may define the density degree of open areas and/or the size of those open areas in a predefined area of the substrate.
  • the open areas may be configured to be the areas of the substrate to be treated or plated.
  • the current distribution particularly the distribution of electrons, may depend on the density degree and/or the size of the open areas, wherein the distribution of the electrons may affect the current density and thereby the amount of the plating material being deposited in this area.
  • Different current densities in different areas of the substrate may lead to different amount of deposited plating material in the different areas resulting in a non-uniform distribution of the plating material.
  • providing the pixels with different potentials may allow controlling the current density distribution to achieve a uniform current density distribution and thus, a uniform distribution of the plating material.
  • the cathode pixels may not be electrically connected with each other, but individually controllable through being individually electrically connected to individual power supplies, as described above, or to one power supply having adequate multiple power outlets.
  • the cathode pixels may also be grouped as to enable electrical power control on various groups of cathode pixels.
  • the secondary cathode may preferably be placed in a first predefined distance to the distribution body and in a second predefined distance to the substrate.
  • the first predefined distance may be equal to the second predefined distance.
  • the first predefined distance may be different to the second predefined distance.
  • the predefined first and second distances may be dependent on the plating material and/or the size of the substrate and/or the process fluid and/or the open area density distribution of the device structures on the substrate to be plated.
  • the first and the second predefined distances may be constant or correspond to a predefined range, within the distances may be adaptable during the treatment of the substrate. Adapting the distances of the secondary cathode, particularly the second distance to the substrate may influence the current density distribution. The smaller the second distance, the more accurately controllable the influence on the current density distribution.
  • the secondary cathode may be aligned substantially parallel to the distribution body and/or may be configured to be aligned with the substrate in-line, flush and not outside the substrate.
  • the secondary cathode may be configured to be aligned to a main area of substrate, e.g. a center of substrate, covering at least part of the substrate.
  • the surface of the secondary cathode may preferably be substantially parallel or angled to the surface of the substrate to be treated, but not perpendicular.
  • the secondary cathode may have approximately the same dimensions as the substrate, or the dimensions of the secondary cathode can be dynamically adjusted to the substrate dimensions through turning on and off predefined pixels.
  • the secondary cathode may be arranged on an inert plate shield.
  • the inert plate shield may be composed of a chemically inert material.
  • a chemically inert material may be defined as not chemically reactive in the electrolyte. Therefore, the inert plate shield may not interfere with the chemical process for plating the surface of a substrate.
  • the cathode pixels can also be integrated with the plate shield placed in-between the primary cathode and the distribution body and can be rotated in cooperation and/or coordinated with a substrate rotation.
  • the plate shield may work as a carrier plate for the cathode pixels allowing a more flexible arrangement of the cathode pixels.
  • the inert plate shield may be attachable to the substrate holder and movable with the substrate.
  • this can enable the secondary cathode to be movable with the substrate, e.g. during loading and unloading into and from a plating chamber and/or during agitation movements, such as agitation movements with high as well as with low frequencies, introduced to the substrate.
  • agitation movements such as agitation movements with high as well as with low frequencies
  • the distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate comprises a distribution body as described above, and a substrate holder.
  • the substrate holder is configured to hold at least one substrate relative to the distribution body.
  • This arrangement may enable a localized control and tuning of the current density distribution, particularly with a tuning resolution down to the sub- ⁇ m range.
  • the individually controllable cathode pixels may enable a very localized adjustment and tuning of the current density distribution all over a surface of the substrate to be treated, not only at the edge areas of the substrate. Furthermore, this arrangement may enable the plating of non-rotating substrates as well as of rotating substrates.
  • the distribution method comprises the following steps, not necessarily in this order:
  • This distribution method may enable a localized control and tuning of the current density distribution, particularly with a tuning resolution down to the sub- ⁇ m range.
  • the individually controllable cathode pixels may enable a very localized adjustment and tuning of the current density distribution all over a surface of the substrate to be treated, not only at the edge areas of the substrate.
  • the distribution method according to the disclosure may enable the plating of non-rotating substrates as well as of rotating substrates.
  • Figure 1 shows schematically and exemplarily an embodiment of a distribution system 1 comprising a distribution body 2, a primary cathode 30 (see Figure 3 ) and a secondary cathode 3.
  • the distribution body 2 contains several openings 4, some of which being formed as jet holes 5 and other being formed as connecting passages 6.
  • the jet holes 5 are smaller than the connecting passages 6 and are configured to direct flow 7 of a process fluid 18 towards a surface 8 of a substrate 9 to be treated.
  • the connecting passages 6 are configured to direct a process fluid 18 (see Figure 3 ) between a front face 10 of the distribution body 2 and the substrate 9 to flow towards a rear face 11 of the distribution body 2, illustrated by arrows 12.
  • the front face 10 faces the surface 8 of the substrate 9 to be treated.
  • the primary cathode 30 may be coupled to the substrate 9 as shown in Figure 3 , such that the substrate 9 serves as the primary cathode 30 during a treatment process.
  • Figure 1 shows a vertical mount of the distribution system 1 and the substrate 9, while a horizontal arrangement would be also possible.
  • the secondary cathode 3 comprises several cathode pixels 13, the cathode pixels 13 being arranged on the front face 10 of the distribution body 2 between adjacent openings 4.
  • the cathode pixels 13 are integrated into the front face 10.
  • the integration of the cathode pixels 13 into the front face 10 of the distribution body 2 is made by common processes used in the semiconductor and/or flat-panel industry, e.g. photolithography, or printing.
  • cathode pixels 13 The illustration of the cathode pixels 13 is simplified for visibility reasons and electrical contacts of the cathode pixels 13 as well as electrical connecting lines connecting the cathode pixels 13 to a power source (not illustrated) are not illustrated.
  • the cathode pixels 13 are only illustrated as arranged at the front face 10 of the distribution body 2, the cathode pixels 13 can be arranged additionally or alternatively on the rear face 11 of the distribution body 2.
  • Each cathode pixel 13 is configured to permit an individual controllability of an electric potential applied by the power source.
  • a cathodic potential is usually applied, but also the application of an anodic potential is possible, preferably for achieving an improved pixelated reverse pulse plating or for cleaning the cathode pixels 13 from potentially deposited metal layers or particles.
  • the distribution system 1 in combination with a substrate holder 17 (see Figure 3 ) holding the substrate 9 is referred as a distribution module 14.
  • Figure 2 shows schematically and exemplarily another embodiment of the distribution system 1 comprising the distribution body 2, the primary cathode 30 being coupled to the substrate 9 and/or the substrate holder 17, and the secondary cathode 3.
  • the distribution body 2 corresponds to the distribution body 2 in Figure 1 .
  • the secondary cathode 3 is separate from the distribution body 2 and arranged on a plate 15.
  • the plate 15 is positioned between the distribution body 2 and the substrate 9 in a predefined distance D to the distribution body 2 and in a predefined distance d to the substrate 9.
  • the plate 15 is preferably formed as an inert shield plate 16.
  • the cathode pixels 13 are arranged on the plate 15 in a predefined geometric constellation, which is defined by and aligned with the requirements of an "open area density" distribution on the substrate.
  • the plate 15 comprising the cathode pixels 13 in a predefined constellation is placed between the distribution body 2 and the substrate 9 to enable the tuning of the current density distribution over the whole structured substrate 9.
  • cathode pixels 13 are also simplified for visibility reasons and electrical contacts of the cathode pixels 13 as well as electrical connecting lines connecting the cathode pixels 13 to a power source (not illustrated) are not illustrated.
  • FIG 3 schematically and exemplarily shows a cross-sectional view of the distribution system 1 and the distribution module 14 in a processing bath 50.
  • the distribution body 2 and the substrate 9 being held by the substrate holder 17 are immersed in the process fluid 18 contained in the processing bath 50.
  • the substrate holder 17 is coupled to the primary cathode 30 and the primary cathode 30 is coupled with an additional electrode being an anode 40, wherein the anode 40 is also immersed in the processing fluid 18 and arranged facing the rear face 11 of the distribution body 2.
  • the processing fluid 18 is an electrolyte.
  • FIG. 4 schematically and exemplarily shows a flow diagram of an embodiment of a distribution method 100 for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of the substrate 9.
  • the distribution method 100 comprises a step S1 of providing the distribution body 2 comprising the several openings 4 for the process fluid and the electric current, wherein the several openings 4 are arranged at the front face 10 of the distribution body 2.
  • the primary cathode and the secondary cathode 3 are arranged to attract and guide the electric current to the substrate 9 to be treated, wherein the primary cathode is directed to the front face 10 of the distribution body 2 and wherein the secondary cathode 3 comprises the several cathode pixels 13 distributed in an array aligned with at least an area of the substrate 9 to be treated.
  • the cathode pixels 13 are individually controlled for adjusting a distribution of the electric current at the substrate 9.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Automation & Control Theory (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Electroplating Methods And Accessories (AREA)

Abstract

The disclosure relates to a distribution system (1) for a process fluid (18) and an electric current for a chemical and/or electrolytic surface treatment of a substrate (9), comprising a distribution body (2), a primary cathode (30), and a secondary cathode (3), wherein the distribution body (2) comprises several openings (4) for the process fluid (18) and the electric current, wherein the several openings (4) are arranged at a front face (10) of the distribution body (2), wherein the front face (10) is directed to the primary cathode (30), wherein the primary cathode (30) and the secondary cathode (3) are arranged to attract the electric current and to guide the electric current to the substrate (9) to be treated, wherein the secondary cathode (3) comprises several cathode pixels (13), wherein the several cathode pixels (13) are distributed in an array to be aligned with at least an area of the substrate (9) to be treated, and wherein the several cathode pixels (13) are individually controllable for adjusting a distribution of the electric current at the substrate (9). The disclosure further relates to a distribution module (14) and a distribution method (100).

Description

    Technical Field
  • The disclosure relates to a distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate, a distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate and a distribution method for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate.
  • Technical Background
  • Electroplating, e.g. of copper, is a frequently used technology in many different industries, especially in the semiconductor related industries. Due to the simplicity and scalability of the process, electroplating is used to metallize surfaces or parts of surfaces of various types of substrates having various sizes.
  • In order to achieve adequate film quality and uniformity during the electroplating process, it is necessary to guarantee a very well balanced electrical current distribution over the surface area as well as a uniform and adequate metal-ion supply through an electrolyte to the surface to be plated. As the substrate is covered with extremely small and sensitive device structures, no direct electrical contact can be made within the substrate area, except within narrow regions at substrate edges. Therefore, an electrically conductive seed-layer is required to distribute the current from the contacts of the substrate edges throughout the surface.
  • The main challenge associated with the seed-layer and the uniformity of the electrical current distribution over the surface area is called "terminal effect". The terminal effect describes a potential drop across a surface area, which can occur due to a relatively high resistivity of such a seed-layer, which is usually required for the electroplating process of a substrate. Depending on the seed-layer material, its thickness and the distance between the plating area and the electrical contact at the edge of the substrate, a potential drop of several volts is likely to occur. Such potential drop from the substrate edge to the area to be plated results in a highly non-uniform current density distribution leading to an extremely non-uniform plating thickness distribution, primarily characterized by a thicker plating at the substrate edges.
  • Additional challenges associated with the current distribution that need to be faced, especially with increasingly smaller structures, may be the equilibration of the current distribution between substrate areas with a very high-density of tiny structures and areas with a low density of rather larger structures to be electroplated.
  • In the prior art, several technologies address the mitigation of the macroscopic terminal effect, which addresses the "center-to-edge" potential drop, by adding a thief cathode. However, the thief cathode as used in the prior art has only provided limited success. Therefore, the overall non-uniformity problem is not yet fundamentally solved.
  • Summary disclosure
  • Hence, there may be a need to provide an improved distribution system for a process fluid and an electric current for chemical and/or electrolytic surface treatment of a substrate, which allows increasing the plating uniformity, particularly for applications in high performance devices, particularly with very small, device structures.
  • This problem is solved by the subject-matters of the independent claims, wherein further embodiments are incorporated in the dependent claims. It should be noted that the aspects of the disclosure described in the following apply also to a distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate, a distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate, and a distribution method for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate.
  • According to the present disclosure, a distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate is presented. The distribution system comprises a distribution body, a primary cathode, and a secondary cathode. The distribution body comprises several openings for the process fluid and the electric current, wherein the several openings are arranged at a front face of the distribution body, the front face being directed to the primary cathode. The primary cathode and the secondary cathode are arranged to attract the electric current and to guide the electric current to the substrate, preferably to predefined areas of the substrate to be treated. The secondary cathode comprises several cathode pixels, wherein the several cathode pixels are distributed in an array to be aligned with at least an area of the substrate to be treated. Additionally, the several cathode pixels are individually controllable for adjusting a distribution of the electric current at the substrate.
  • The secondary cathode may be spaced apart from the primary cathode and may comprise several cathode pixels being distributed in an array to be aligned with an area of the substrate to be treated. This arrangement may enable a localized control and tuning of the current density distribution, particularly with a tuning resolution down to the sub-µm range. The individually controllable cathode pixels may enable a very localized adjustment and tuning of the current density distribution all over a surface of the substrate to be treated, not only at the edge areas of the substrate. Therefore, the distribution system may allow effecting the edge-to-center/center-to-edge as well as the current density distribution within the substrate to be plated. Furthermore, the distribution system according to the disclosure may enable the plating of non-rotating substrates as well as of rotating substrates.
  • The secondary cathode may be made from an electrically conducting material, preferably inert to the chemical environment of the electrolyte, e.g. inert metals, such as palladium, palladium-coated materials, platinum and/or platinized materials like tantalum, tungsten, and/or titanium, or may be made from the same material as a plating material to be used for the surface treatment of the substrate. For example, a Cu-comprising secondary cathode may be used when Cu is plated. Further, the secondary cathode may have a circular, square, rectangular, C-shaped, wire-shaped and/or partially electrically insulated shape. The secondary cathode may work as a thief cathode mitigating the terminal effect by increasing the plating-uniformity. Additionally, or alternatively, the secondary cathode may be formed by several pixels, wherein the pixels may be separate from each other, wherein each pixel may be individually controllable. Therefore, the secondary cathode may be referred as pixelated cathode. Further, the secondary cathode may be directed towards the primary cathode.
  • In an embodiment, the distribution system may further comprise at least a power source configured to apply individual voltage potentials to the cathode pixels to individually control the cathode pixels. In an embodiment, at least some of the cathode pixels may be each connected to a single power source.
  • The cathode pixels may be each connected to the at least one power source by electrical connecting lines transmitting a potential from the at least one power source to the cathode pixels. Additionally or alternatively, the cathode pixels their selves can be at least partially formed as a wire. At least some of the cathode pixels may be together connected to a single power source. To sum it up, the cathode pixels may be each connected to the same power source, or the cathode pixels may be each connected to individual power sources, resulting in that the number of power sources corresponds to the number of cathode pixels. Alternatively, the power source may comprise several power outlets, each pixel being connected to an individual power outlet of the one power source. Additionally, or alternatively, the cathode pixels may be divided into several groups of pixels, wherein the pixels of each group may be connected to the same power source, but each group of pixels is connected to a separate power source.
  • In an embodiment, at least some cathode pixels being controlled by a single power source may have individual potentials. In this case, the cathode pixels may be configured to display a variety of different pixel potentials by providing variable resistances between the power source and the individual cathode pixel.
  • In an embodiment, the distribution system may further comprise at least a processing unit configured to control the at least one power source to apply the individual voltage potentials to the cathode pixels for individual durations.
  • In principle, each cathode pixel may be fabricated in a way to permit individual controllability of the applied potential and/or the duration of the applied potential. At least some of the cathode pixels may be grouped to arrays and each array is connected to one of several power sources for being applied with the same potential and same duration.
  • The power source(s) may have a cathodic potential or an anodic potential. In particular, the anodic potential may be used for achieving an improved pixelated reverse pulse plating or for cleaning the pixels from potentially deposited metal layers or particles. Additionally, or alternatively, the cathode pixels may be arranged at a rear face of the distribution body, wherein the rear face is opposite to the front face of the distribution body.
  • In an embodiment, the control for adjusting the distribution of the electric current at the substrate may be a physical arrangement of cathode pixels. Thus, the pixels may be arranged according to a predefined pattern, e.g. a photolithographic mask, which is used to create the pattern distribution on the substrate to be treated. Additionally, or alternatively, the cathode pixels can be electrically tuned according to the substrate pattern densities and substrate irregularities.
  • In an embodiment, the cathode pixels may be arranged at the distribution body. The cathode pixels may be arranged in or on a surface of the distribution body. In an embodiment, the cathode pixels may be arranged at the front face of the distribution body directed to the first cathode. For example, the cathode pixels may be mainly arranged around the openings at the front face. Thereby, the cathode pixels may be integrated into the distribution body surface through common processes used in the semiconductor and/or flat panel industry, like one or more photolithographic process sequences. Alternatively, at least some of the cathode pixels and electrical connecting lines may be manufactured on the surface via printing. The electrical connecting lines may be fabricated in a similar way as the (individual) cathode pixels.
  • The openings at the front face may be configured at least partially as jet holes directing the process fluid and/or the electric current towards the substrate to be treated and/or at least partially as connecting passages draining off the process fluid from the substrate to be treated. In an embodiment, the front face and the rear face of the distribution body may be connected by the connecting passages through the distribution body, wherein the cathode pixels are arranged at least partially around the connecting passages. The connecting passages may be configured to permit a backflow and with this a circulation of the process fluid through the distribution body. Arranging the cathode pixels around the connecting passaged can be an easy way to integrate the cathode pixels into the distribution body.
  • In an embodiment, the secondary cathode may be separate to the distribution body and positioned adjacent to the distribution body in a direction towards the substrate.
  • Thus, the secondary cathode may be implemented as a stand-alone system. As the simplest example of such a stand-alone system, the secondary cathode may correspond to a mostly electrically isolated wire with an electrically non-isolated tip. In a more typical example, multiple cathode pixels may be physically connected together in a predefined specific geometric constellation, preferably defined by and aligned with the requirements of an "open area density" distribution on the substrate. This stand-alone system can be placed between the distribution body and the primary cathode to enable the tuning of the current density distribution all over the substrate to be treated, and in particular to enable the tuning of the current density distribution for individual areas and/or individual device structures of the substrate to be treated.
  • The "open area density" may define the density degree of open areas and/or the size of those open areas in a predefined area of the substrate. The open areas may be configured to be the areas of the substrate to be treated or plated. When a constant potential may be applied on the whole substrate, the current distribution, particularly the distribution of electrons, may depend on the density degree and/or the size of the open areas, wherein the distribution of the electrons may affect the current density and thereby the amount of the plating material being deposited in this area. Different current densities in different areas of the substrate may lead to different amount of deposited plating material in the different areas resulting in a non-uniform distribution of the plating material. Thus, providing the pixels with different potentials may allow controlling the current density distribution to achieve a uniform current density distribution and thus, a uniform distribution of the plating material.
  • In an electrical sense, the cathode pixels may not be electrically connected with each other, but individually controllable through being individually electrically connected to individual power supplies, as described above, or to one power supply having adequate multiple power outlets. In specific cases, the cathode pixels may also be grouped as to enable electrical power control on various groups of cathode pixels.
  • Furthermore, the secondary cathode may preferably be placed in a first predefined distance to the distribution body and in a second predefined distance to the substrate. The first predefined distance may be equal to the second predefined distance. Alternatively, the first predefined distance may be different to the second predefined distance. The predefined first and second distances may be dependent on the plating material and/or the size of the substrate and/or the process fluid and/or the open area density distribution of the device structures on the substrate to be plated. Further, the first and the second predefined distances may be constant or correspond to a predefined range, within the distances may be adaptable during the treatment of the substrate. Adapting the distances of the secondary cathode, particularly the second distance to the substrate may influence the current density distribution. The smaller the second distance, the more accurately controllable the influence on the current density distribution. The secondary cathode may be aligned substantially parallel to the distribution body and/or may be configured to be aligned with the substrate in-line, flush and not outside the substrate.
  • Preferably, the secondary cathode may be configured to be aligned to a main area of substrate, e.g. a center of substrate, covering at least part of the substrate. The surface of the secondary cathode may preferably be substantially parallel or angled to the surface of the substrate to be treated, but not perpendicular.
  • The secondary cathode may have approximately the same dimensions as the substrate, or the dimensions of the secondary cathode can be dynamically adjusted to the substrate dimensions through turning on and off predefined pixels.
  • In a further embodiment, the secondary cathode may be arranged on an inert plate shield. The inert plate shield may be composed of a chemically inert material. A chemically inert material may be defined as not chemically reactive in the electrolyte. Therefore, the inert plate shield may not interfere with the chemical process for plating the surface of a substrate. When the secondary cathode is arranged on the inert plate shield, the cathode pixels can also be integrated with the plate shield placed in-between the primary cathode and the distribution body and can be rotated in cooperation and/or coordinated with a substrate rotation. Thus, the plate shield may work as a carrier plate for the cathode pixels allowing a more flexible arrangement of the cathode pixels.
  • In an embodiment, the inert plate shield may be attachable to the substrate holder and movable with the substrate. In particular, this can enable the secondary cathode to be movable with the substrate, e.g. during loading and unloading into and from a plating chamber and/or during agitation movements, such as agitation movements with high as well as with low frequencies, introduced to the substrate. In cases where the pixels are arranged on or within plate shields, specific arrangements have to be made for warranting electrical connections to the individual pixels.
  • According to the present disclosure, also a distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate is presented. The distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate comprises a distribution body as described above, and a substrate holder. The substrate holder is configured to hold at least one substrate relative to the distribution body.
  • This arrangement may enable a localized control and tuning of the current density distribution, particularly with a tuning resolution down to the sub-µm range. The individually controllable cathode pixels may enable a very localized adjustment and tuning of the current density distribution all over a surface of the substrate to be treated, not only at the edge areas of the substrate. Furthermore, this arrangement may enable the plating of non-rotating substrates as well as of rotating substrates.
  • According to the present disclosure, also a distribution method for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate is presented. The distribution method comprises the following steps, not necessarily in this order:
    • providing a distribution body comprising several openings for the process fluid and the electric current, wherein the several openings are arranged at a front face of the distribution body,
    • arranging a primary cathode and a secondary cathode to attract and guide the electric current to the substrate to be treated, wherein the primary cathode is directed to the front face of the distribution body and wherein the secondary cathode comprises several cathode pixels distributed in an array aligned with at least an area of the substrate to be treated, and
    • individually controlling the cathode pixels for adjusting a distribution of the electric current at the substrate.
  • This distribution method may enable a localized control and tuning of the current density distribution, particularly with a tuning resolution down to the sub-µm range. The individually controllable cathode pixels may enable a very localized adjustment and tuning of the current density distribution all over a surface of the substrate to be treated, not only at the edge areas of the substrate. Thus, the distribution method according to the disclosure may enable the plating of non-rotating substrates as well as of rotating substrates.
  • Brief description of the drawings
  • Exemplary embodiments of the disclosure will be described in the following with reference to the accompanying drawings:
  • Figure 1
    shows schematically and exemplarily a cross-sectional view of a distribution system and a distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate, and a substrate according to an exemplary embodiment.
    Figure 2
    shows schematically and exemplarily a cross-sectional view of a distribution system and a distribution module for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate, and a substrate according to another exemplary embodiment.
    Figure 3
    shows schematically and exemplarily a cross-sectional view of a distribution system and a distribution module in a processing bath.
    Figure 4
    shows schematically and exemplarily a flow diagram of a distribution method according to an exemplary embodiment.
    Detailed description of embodiments
  • Figure 1 shows schematically and exemplarily an embodiment of a distribution system 1 comprising a distribution body 2, a primary cathode 30 (see Figure 3) and a secondary cathode 3. The distribution body 2 contains several openings 4, some of which being formed as jet holes 5 and other being formed as connecting passages 6. The jet holes 5 are smaller than the connecting passages 6 and are configured to direct flow 7 of a process fluid 18 towards a surface 8 of a substrate 9 to be treated.
  • The connecting passages 6 are configured to direct a process fluid 18 (see Figure 3) between a front face 10 of the distribution body 2 and the substrate 9 to flow towards a rear face 11 of the distribution body 2, illustrated by arrows 12. Thus, the front face 10 faces the surface 8 of the substrate 9 to be treated. The primary cathode 30 may be coupled to the substrate 9 as shown in Figure 3, such that the substrate 9 serves as the primary cathode 30 during a treatment process. Figure 1 shows a vertical mount of the distribution system 1 and the substrate 9, while a horizontal arrangement would be also possible.
  • The secondary cathode 3 comprises several cathode pixels 13, the cathode pixels 13 being arranged on the front face 10 of the distribution body 2 between adjacent openings 4. The cathode pixels 13 are integrated into the front face 10. The integration of the cathode pixels 13 into the front face 10 of the distribution body 2 is made by common processes used in the semiconductor and/or flat-panel industry, e.g. photolithography, or printing.
  • The illustration of the cathode pixels 13 is simplified for visibility reasons and electrical contacts of the cathode pixels 13 as well as electrical connecting lines connecting the cathode pixels 13 to a power source (not illustrated) are not illustrated.
  • Although, the cathode pixels 13 are only illustrated as arranged at the front face 10 of the distribution body 2, the cathode pixels 13 can be arranged additionally or alternatively on the rear face 11 of the distribution body 2.
  • Each cathode pixel 13 is configured to permit an individual controllability of an electric potential applied by the power source. During the plating process, a cathodic potential is usually applied, but also the application of an anodic potential is possible, preferably for achieving an improved pixelated reverse pulse plating or for cleaning the cathode pixels 13 from potentially deposited metal layers or particles.
  • The distribution system 1 in combination with a substrate holder 17 (see Figure 3) holding the substrate 9 is referred as a distribution module 14.
  • Figure 2 shows schematically and exemplarily another embodiment of the distribution system 1 comprising the distribution body 2, the primary cathode 30 being coupled to the substrate 9 and/or the substrate holder 17, and the secondary cathode 3. The distribution body 2 corresponds to the distribution body 2 in Figure 1. The secondary cathode 3 is separate from the distribution body 2 and arranged on a plate 15. The plate 15 is positioned between the distribution body 2 and the substrate 9 in a predefined distance D to the distribution body 2 and in a predefined distance d to the substrate 9. The plate 15 is preferably formed as an inert shield plate 16.
  • The cathode pixels 13 are arranged on the plate 15 in a predefined geometric constellation, which is defined by and aligned with the requirements of an "open area density" distribution on the substrate. The plate 15 comprising the cathode pixels 13 in a predefined constellation is placed between the distribution body 2 and the substrate 9 to enable the tuning of the current density distribution over the whole structured substrate 9.
  • The illustration of the cathode pixels 13 is also simplified for visibility reasons and electrical contacts of the cathode pixels 13 as well as electrical connecting lines connecting the cathode pixels 13 to a power source (not illustrated) are not illustrated.
  • Figure 3 schematically and exemplarily shows a cross-sectional view of the distribution system 1 and the distribution module 14 in a processing bath 50. The distribution body 2 and the substrate 9 being held by the substrate holder 17 are immersed in the process fluid 18 contained in the processing bath 50. The substrate holder 17 is coupled to the primary cathode 30 and the primary cathode 30 is coupled with an additional electrode being an anode 40, wherein the anode 40 is also immersed in the processing fluid 18 and arranged facing the rear face 11 of the distribution body 2. The processing fluid 18 is an electrolyte.
  • Figure 4 schematically and exemplarily shows a flow diagram of an embodiment of a distribution method 100 for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of the substrate 9. The distribution method 100 comprises a step S1 of providing the distribution body 2 comprising the several openings 4 for the process fluid and the electric current, wherein the several openings 4 are arranged at the front face 10 of the distribution body 2. In a step S2, the primary cathode and the secondary cathode 3 are arranged to attract and guide the electric current to the substrate 9 to be treated, wherein the primary cathode is directed to the front face 10 of the distribution body 2 and wherein the secondary cathode 3 comprises the several cathode pixels 13 distributed in an array aligned with at least an area of the substrate 9 to be treated. In a step S3, the cathode pixels 13 are individually controlled for adjusting a distribution of the electric current at the substrate 9.
  • It has to be noted that embodiments of the invention are described with reference to different subject matters. In particular, some embodiments are described with reference to method type claims whereas other embodiments are described with reference to the device type claims. However, a person skilled in the art will gather from the above and the following description that, unless otherwise notified, in addition to any combination of features belonging to one type of subject matter also any combination between features relating to different subject matters is considered to be disclosed with this application. However, all features can be combined providing synergetic effects that are more than the simple summation of the features.
  • While the invention has been illustrated and described in detail in the drawings and foregoing description, such illustration and description are to be considered illustrative or exemplary and not restrictive. The invention is not limited to the disclosed embodiments. Other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing a claimed invention, from a study of the drawings, the disclosure, and the dependent claims.
  • In the claims, the word "comprising" does not exclude other elements or steps, and the indefinite article "a" or "an" does not exclude a plurality. A single unit may fulfil the functions of several items re-cited in the claims. The mere fact that certain measures are re-cited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage. Any reference signs in the claims should not be construed as limiting the scope.

Claims (15)

  1. A distribution system (1) for a process fluid (18) and an electric current for a chemical and/or electrolytic surface treatment of a substrate (9), comprising:
    - a distribution body (2),
    - a primary cathode (30), and
    - a secondary cathode (3),
    wherein the distribution body (2) comprises several openings (4) for the process fluid (18) and the electric current, wherein the several openings (4) are arranged at a front face (10) of the distribution body (2), wherein the front face (10) is directed to the primary cathode (30),
    wherein the primary cathode (30) and the secondary cathode (3) are arranged to attract the electric current and to guide the electric current to the substrate (9) to be treated, wherein the secondary cathode (3) comprises several cathode pixels (13), wherein the several cathode pixels (13) are distributed in an array to be aligned with at least an area of the substrate (9) to be treated, and
    wherein the several cathode pixels (13) are individually controllable for adjusting a distribution of the electric current at the substrate (9).
  2. The distribution system (1) according to claim 1, further comprising at least a power source configured to apply individual voltage potentials to the cathode pixels (13) to individually control the cathode pixels (13).
  3. The distribution system (1) according to claim 1 or 2, wherein at least some of the cathode pixels (13) are each connected to a single power source.
  4. The distribution system (1) according to claim 3, wherein at least some cathode pixels (13) being controlled by the single power source.
  5. The distribution system (1) according to any of the claims 2 to 4, further comprising at least a processing unit configured to control the at least one power source to apply the individual voltage potentials to the cathode pixels (13) for individual durations.
  6. The distribution system (1) according to any of the preceding claims, wherein the control for adjusting the distribution of the electric current at the substrate (9) is a physical arrangement of cathode pixels (13).
  7. The distribution system (1) according to any of the preceding claims, wherein the cathode pixels (13) are arranged at the distribution body (2).
  8. The distribution system (1) according to any of the claims 1 to 7, wherein the cathode pixels (13) are arranged at the front face (10) of the distribution body (1) directed to the primary cathode (30).
  9. The distribution system (1) according to any of the claims 1 to 7, wherein the cathode pixels (13) are arranged at a rear face (11) of the distribution body (1), wherein the rear face (11) is opposite to the front face (10) of the distribution body (1).
  10. The distribution system (1) according to claim 9, wherein the front face (10) and the rear face (11) of the distribution body (1) are connected by connecting passages (6) through the distribution body (1), and wherein the cathode pixels (13) are arranged at least partially around the connecting passages (6).
  11. The distribution system (1) according to any of claims 1 to 6, wherein the secondary cathode (3) is separate to the distribution body (1) and positioned adjacent to the distribution body (1) in a direction towards the substrate (9).
  12. The distribution system (1) according to any of claims 1 to 6 and 11, wherein the secondary cathode (3) is arranged on an inert plate shield (16).
  13. The distribution system (1) according to the preceding claim, wherein the inert plate shield (16) is attachable to a substrate holder (17) and movable with the substrate (9).
  14. A distribution module (14) for a process fluid (18) and an electric current for a chemical and/or electrolytic surface treatment of a substrate (9), comprising:
    - a distribution system (1) according to one of the preceding claims, and
    - a substrate holder (17),
    wherein the substrate holder (17) is configured to hold at least one substrate (9) relative to the distribution body (2).
  15. A distribution method (100) for a process fluid (18) and an electric current for a chemical and/or electrolytic surface treatment of a substrate (9), comprising:
    - providing a distribution body (2) comprising several openings (4) for the process fluid (18) and the electric current, wherein the several openings (4) are arranged at a front face (10) of the distribution body (2),
    - arranging a primary cathode (30) and a secondary cathode (3) to attract and guide the electric current to the substrate (9) to be treated, wherein the primary cathode (30) is directed to the front face (10) of the distribution body (2), and wherein the secondary cathode (3) comprises several cathode pixels (13) distributed in an array aligned with at least an area of the substrate (9) to be treated, and
    - individually controlling the cathode pixels (13) for adjusting a distribution of the electric current at the substrate (9).
EP20210367.7A 2020-11-27 2020-11-27 Distribution system for a process fluid and an electric current for electrolytic surface treatment of a substrate Active EP4006210B1 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
EP20210367.7A EP4006210B1 (en) 2020-11-27 2020-11-27 Distribution system for a process fluid and an electric current for electrolytic surface treatment of a substrate
CN202180078257.7A CN116472367A (en) 2020-11-27 2021-11-11 Distribution system for process fluids and currents for electrolytic surface treatment of substrates
KR1020237021387A KR20230113352A (en) 2020-11-27 2021-11-11 Distribution system for process fluid and current for electrolytic surface treatment of substrates
PCT/EP2021/081410 WO2022112015A1 (en) 2020-11-27 2021-11-11 Distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate
US18/038,495 US20240011180A1 (en) 2020-11-27 2021-11-11 Distribution system for a process fluid and an electric current for a chemical and/or electrolytic surface treatment of a substrate
TW110143936A TW202235691A (en) 2020-11-27 2021-11-25 Distribution system for a process fluid and an electric current for an electrolytic surface treatment of a substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP20210367.7A EP4006210B1 (en) 2020-11-27 2020-11-27 Distribution system for a process fluid and an electric current for electrolytic surface treatment of a substrate

Publications (2)

Publication Number Publication Date
EP4006210A1 true EP4006210A1 (en) 2022-06-01
EP4006210B1 EP4006210B1 (en) 2023-07-12

Family

ID=73642703

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20210367.7A Active EP4006210B1 (en) 2020-11-27 2020-11-27 Distribution system for a process fluid and an electric current for electrolytic surface treatment of a substrate

Country Status (6)

Country Link
US (1) US20240011180A1 (en)
EP (1) EP4006210B1 (en)
KR (1) KR20230113352A (en)
CN (1) CN116472367A (en)
TW (1) TW202235691A (en)
WO (1) WO2022112015A1 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10140393A (en) * 1996-11-08 1998-05-26 Hitachi Cable Ltd Electroplating device
US6001235A (en) * 1997-06-23 1999-12-14 International Business Machines Corporation Rotary plater with radially distributed plating solution
US20030168340A1 (en) * 2000-10-30 2003-09-11 Suryanarayana Kaja Process and apparatus for electroplating microscopic features uniformly across a large substrate
US20130186852A1 (en) * 2010-07-29 2013-07-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Device and method for producing targeted flow and current density patterns in a chemical and/or electrolytic surface treatment
FR3048704A1 (en) * 2016-03-09 2017-09-15 Snecma IMPROVED GALVANOPLASTY METAL DEPOSITION DEVICE AND METHOD FOR THE TREATMENT OF AIRCRAFT TURBOMACHINE PARTS

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10140393A (en) * 1996-11-08 1998-05-26 Hitachi Cable Ltd Electroplating device
US6001235A (en) * 1997-06-23 1999-12-14 International Business Machines Corporation Rotary plater with radially distributed plating solution
US20030168340A1 (en) * 2000-10-30 2003-09-11 Suryanarayana Kaja Process and apparatus for electroplating microscopic features uniformly across a large substrate
US20130186852A1 (en) * 2010-07-29 2013-07-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Device and method for producing targeted flow and current density patterns in a chemical and/or electrolytic surface treatment
FR3048704A1 (en) * 2016-03-09 2017-09-15 Snecma IMPROVED GALVANOPLASTY METAL DEPOSITION DEVICE AND METHOD FOR THE TREATMENT OF AIRCRAFT TURBOMACHINE PARTS

Also Published As

Publication number Publication date
US20240011180A1 (en) 2024-01-11
EP4006210B1 (en) 2023-07-12
TW202235691A (en) 2022-09-16
KR20230113352A (en) 2023-07-28
CN116472367A (en) 2023-07-21
WO2022112015A1 (en) 2022-06-02

Similar Documents

Publication Publication Date Title
US7935240B2 (en) Electroplating apparatus and method based on an array of anodes
US6773571B1 (en) Method and apparatus for uniform electroplating of thin metal seeded wafers using multiple segmented virtual anode sources
US6270646B1 (en) Electroplating apparatus and method using a compressible contact
US6179983B1 (en) Method and apparatus for treating surface including virtual anode
US20030168340A1 (en) Process and apparatus for electroplating microscopic features uniformly across a large substrate
US7967969B2 (en) Method of electroplating using a high resistance ionic current source
CN108265319A (en) For the electroplating device of the uniform distribution of customization
US20040231994A1 (en) Method and apparatus for controlling thickness uniformity of electroplated layers
KR19980087024A (en) Process and plating system for depositing material layer on substrate
US9708724B2 (en) Anode unit and plating apparatus having such anode unit
US20230075605A1 (en) Distribution system for a process fluid and electric current for chemical and/or electrolytic surface treatment of a substrate
US11105014B2 (en) Distribution system for chemical and/or electrolytic surface treatment
EP4006210B1 (en) Distribution system for a process fluid and an electric current for electrolytic surface treatment of a substrate
US6077405A (en) Method and apparatus for making electrical contact to a substrate during electroplating
JP4908380B2 (en) Electroplating anode and electroplating equipment
WO2015050593A1 (en) An insoluble anode with a plurality of switchable conductive elements
EP4379096A1 (en) Distribution system for chemical and/or electrolytic surface treatment of simultaneously at least two substrates
US20040099534A1 (en) Method and apparatus for electroplating a semiconductor wafer
KR20100077447A (en) Wafer plating apparatus
WO2024115192A1 (en) Distribution system for the simultaneous chemical and/or electrolytic surface treatment of at least two substrates
GB2564949A (en) Distribution system for chemical and/or electrolytic surface treatment
RU2156835C1 (en) Gear for electrolytic deposition of coats on flat articles with holes
KR20070059351A (en) Electro-plating apparatus

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE

17P Request for examination filed

Effective date: 20211109

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: EXAMINATION IS IN PROGRESS

17Q First examination report despatched

Effective date: 20220720

REG Reference to a national code

Ref country code: HK

Ref legal event code: DE

Ref document number: 40073627

Country of ref document: HK

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: GRANT OF PATENT IS INTENDED

INTG Intention to grant announced

Effective date: 20230123

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE PATENT HAS BEEN GRANTED

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

REG Reference to a national code

Ref country code: CH

Ref legal event code: EP

REG Reference to a national code

Ref country code: IE

Ref legal event code: FG4D

REG Reference to a national code

Ref country code: DE

Ref legal event code: R096

Ref document number: 602020013615

Country of ref document: DE

REG Reference to a national code

Ref country code: LT

Ref legal event code: MG9D

REG Reference to a national code

Ref country code: NL

Ref legal event code: MP

Effective date: 20230712

P01 Opt-out of the competence of the unified patent court (upc) registered

Effective date: 20231021

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20231013

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20231112

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: RS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: PT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20231113

Ref country code: NO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20231012

Ref country code: LV

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: LT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: IS

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20231112

Ref country code: HR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: GR

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20231013

Ref country code: FI

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: ES

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20231127

Year of fee payment: 4

Ref country code: DE

Payment date: 20231129

Year of fee payment: 4

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: PL

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SM

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: RO

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: EE

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: DK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: CZ

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

Ref country code: SK

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

Effective date: 20230712

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT