EP3671189A2 - Component pour essais non destructifs - Google Patents

Component pour essais non destructifs Download PDF

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Publication number
EP3671189A2
EP3671189A2 EP19209898.6A EP19209898A EP3671189A2 EP 3671189 A2 EP3671189 A2 EP 3671189A2 EP 19209898 A EP19209898 A EP 19209898A EP 3671189 A2 EP3671189 A2 EP 3671189A2
Authority
EP
European Patent Office
Prior art keywords
test specimen
component
ndt
test
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP19209898.6A
Other languages
German (de)
English (en)
Other versions
EP3671189A3 (fr
Inventor
Venkatasubramanian Narayanan
Andrew Bond-Thorley
James Eden
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Operations Ltd
Original Assignee
Airbus Operations Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Airbus Operations Ltd filed Critical Airbus Operations Ltd
Publication of EP3671189A2 publication Critical patent/EP3671189A2/fr
Publication of EP3671189A3 publication Critical patent/EP3671189A3/fr
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B33—ADDITIVE MANUFACTURING TECHNOLOGY
    • B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
    • B33Y40/00—Auxiliary operations or equipment, e.g. for material handling
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B33—ADDITIVE MANUFACTURING TECHNOLOGY
    • B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
    • B33Y80/00—Products made by additive manufacturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B33—ADDITIVE MANUFACTURING TECHNOLOGY
    • B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
    • B33Y10/00—Processes of additive manufacturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/615—Specific applications or type of materials composite materials, multilayer laminates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G01N2223/6462—Specific applications or type of materials flaws, defects microdefects

Definitions

  • the present invention relates to non-destructive testing (NDT) of components and in particular to the validation of an NDT technique for additive manufactured components.
  • additive manufacturing presents a challenge for existing NDT methods. This new process and material characteristics together with tight defect acceptance criteria, in particular when used for the manufacture of aerospace components, all require detailed evaluation and validation of suitable NDT techniques.
  • the AM process can produce a wide range of defect indication types including cracks, distributed porosity, single pores, inclusions, solid inclusions and lack of fusion.
  • defect indication types including cracks, distributed porosity, single pores, inclusions, solid inclusions and lack of fusion.
  • the effect on material performance of these indication types is not yet well understood and therefore the accurate detection of such defects is vital.
  • CT X-ray and microfocus X-ray computer tomography
  • a method of manufacturing a test component for NDT including the steps of forming the component with an aperture shaped to receive a test specimen formed with least one defect and inserting a said test specimen into the said aperture.
  • test specimens positioned within the actual component are used, rather than separate conventional Probability of Detection specimens or the Reference Standard approach.
  • the use of such test components, whether for simple non-destructive testing or for validating an NDT process, will prove that the testing procedure is able to correctly identify defects in the test component itself, not just in a test specimen. This fact will provide greater confidence in a validation process for the NDT method.
  • test specimen or the component may be formed by an AM process.
  • the aperture may be formed in the component whereby the at least one defect in the test specimen, when inserted, will be positioned within the component at a location likely to be subject to defects of said component or likely to be more challenging to inspect, in production manufacturing.
  • a series of test specimens may be inserted into respective apertures in the component at locations likely to be subject to defects.
  • test specimen may be inserted into the aperture as an interference fit, a sliding fit or if desired a loose fit.
  • One of the test specimen and the component may be formed with a relief whereby to allow escape of gas as the test specimen is inserted into the component.
  • a relief may take any suitable form, for example a V-shaped groove, a semi-circular groove or any other suitable shape.
  • the test specimen may be formed as a generally cylindrical plug.
  • the test specimen may be formed with at least one defect selected from the group: crack, distributed porosity, single pore, inclusion and lack of fusion.
  • a method of validating an NDT process for a component manufactured by an AM process including the steps of, forming by an AM process a first test specimen containing at least one defect of a specified type and size, measuring by a first NDT step the type and size of the at least one defect in the first test specimen, manufacturing a test component for NDT according to the method of any preceding claim, said test component having a second said test specimen inserted therein, said second test specimen containing at least one defect of the same type and size as that of the first test specimen, arranging the performance of a second NDT step on the test component for defects, and comparing the results of the first and second NDT steps to validate the method.
  • An NDT step may be performed on the second test specimen before insertion into the component.
  • the entity which is validating the NDT process carried out on the test component may perform its own NDT on the second test specimen as well as the first test specimen, in order to ensure that the second test specimen not only nominally contains the same defects as the first test specimen but has been measured, before insertion into the test component, as doing so.
  • the first and second NDT steps preferably comprise CT scanning to give the required level of accuracy of defect detection.
  • the first NDT step preferably includes micro CT scanning with higher resolution to give an enhanced level of confidence in the accuracy of the first NDT step.
  • the first test specimen may additionally be destructively tested to measure the type and size of the at least one defect. This additional step will identify beyond any doubt the type and size of defect present in the test specimen and so lead to the greatest possible level of confidence in a validation process for NDT testing.
  • a method of testing a test component manufactured according to the method of the first aspect including the performance of an NDT step on the test component for defects in the test specimen.
  • a manufacturer may be a supplier of components to a manufacturer of assemblies containing those components, for example an aircraft manufacturer.
  • the assembly manufacturer will have to depend on the NDT techniques used by the component supplier. Such techniques need to be validated to qualify the supplier's NDT facility against the relevant acceptance criteria for the component.
  • one acceptance criterion may be that the supplier is able reliably to detect a defect within the component such as gas porosity/less dense inclusions down to 500 ⁇ m or less and solid inclusions/lack of fusion down to 150 ⁇ m diameter or less.
  • AM of a test specimen formed with voids or inclusions of a known size and shape can be used to ascertain whether the supplier's test methods are able reliably to detect such a defect.
  • the precise size and shape of the known defects can be checked by the assembly manufacturer by high resolution micro CT testing and/or destructive testing.
  • Well known destructive testing methods such as micrographic inspection after dissection of the test specimen, may be carried out by the assembly manufacturer. Following the destructive testing, a further test specimen would be manufactured by AM to a specification identical to that of the test specimen destructively tested. That further test specimen would then be inspected by high resolution CT scanning and inserted into the test component for testing by the supplier or NDT service provider. Comparison of the supplier's test results and the assembly manufacturer's test results would then enable validation of the supplier's test methods and their NDT capabilities.
  • a failsafe bracket 1 for structural analysis is manufactured by an AM electron beam powder bed process out of Ti6A14V material.
  • the component 1 has a cylindrical aperture 2 formed through a lower surface 3 thereof.
  • the aperture 2 is formed as the component 1 is being manufactured but could be drilled instead.
  • a cylindrical test specimen 4 is formed of the same material by the same AM process and is shaped to be inserted as an interference fit into the aperture 2, in the direction of the arrow. Alternatively, a close sliding fit may be adequate in certain circumstances.
  • the test specimen 4 may be surface finished by any suitable process if necessary, in order to form a smooth cylindrical surface for insertion into the aperture 2 of the bracket 1.
  • the component may be formed with as many apertures as are required to accommodate test specimens.
  • the manufacturing process may tend to form defects at locations in the region of a thickening of the structure, such as at the location of the aperture 2, shown in Figure 1 .
  • apertures may be formed and test specimens inserted at all or a representative sample of such locations in the structure.
  • the test specimen 4 has a V-shaped groove 5 formed along its length to act as an air escape channel as the test specimen is pressed into the aperture 2 of the bracket 1.
  • test specimen 4 has been deliberately formed with a variety of defects 6, 7, 8, 9, during the AM process and these defects are discussed below in relation to Figures 4, 5 and 6 and cylinders 1, 2 and 3, respectively. All defects are centrally positioned within the test specimen 4.
  • Table 1 relating to Cylinder 1 as illustrated in Figure 4 , shows the diameter of four spherical defects intentionally formed during the AM manufacturing process of the test specimen 4.
  • Table 2 relating to Cylinder 2 as illustrated in Figure 5 , shows the diameter of four further spherical defects intentionally formed during the AM manufacturing process of the test specimen 4.
  • Table 3 relating to Cylinder 3 as illustrated in Figure 6 , shows the dimensions of four linear defects intentionally formed during the AM manufacturing process of the test specimen 4.
  • the linear defects are all 500 ⁇ m in length but their orientation within the test specimen differs as do their widths and thicknesses.
  • test specimens 4 may be inserted into separate apertures in a single component 1 or, in sequence, into a single aperture in a component 1. All the test specimens may not be required, however, if it is determined that not all of the defects listed above are likely to occur in the component concerned. Thus, for example, a single test specimen may contain two spherical defects of differing diameter and two linear defects of differing length. The type and size of defect created in the test specimen and the number of test specimens used will always depend upon a specific need for the supplier or other entity whose NDT capabilities are being tested to identify defects of a specific type and size for a particular component of a given size and geometry.

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  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Acoustics & Sound (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Sampling And Sample Adjustment (AREA)
EP19209898.6A 2018-11-30 2019-11-19 Component pour essais non destructifs Withdrawn EP3671189A3 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1819508.1A GB2579392A (en) 2018-11-30 2018-11-30 Non-destructive testing

Publications (2)

Publication Number Publication Date
EP3671189A2 true EP3671189A2 (fr) 2020-06-24
EP3671189A3 EP3671189A3 (fr) 2020-09-09

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Family Applications (1)

Application Number Title Priority Date Filing Date
EP19209898.6A Withdrawn EP3671189A3 (fr) 2018-11-30 2019-11-19 Component pour essais non destructifs

Country Status (3)

Country Link
US (1) US20200173937A1 (fr)
EP (1) EP3671189A3 (fr)
GB (1) GB2579392A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112683933A (zh) * 2020-11-30 2021-04-20 北京星航机电装备有限公司 一种增材制造多层结构检测射线灵敏度的测定方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113959798A (zh) * 2021-08-26 2022-01-21 南昌航空大学 一种激光选区熔化增材制造内部流道缺陷射线检测对比试样设计与加工方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2423781A1 (fr) * 1978-04-19 1979-11-16 Framatome Sa Piece de reference, notamment pour les examens non destructifs par ultrasons, et procede pour sa realisation
DE3502454A1 (de) * 1985-01-25 1986-07-31 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Probekoerper fuer ultraschallpruefung
SE507590C2 (sv) * 1996-10-30 1998-06-22 Uddcomb Engineering Ab Sätt för framställning av ett testelement för kvalificering av personal, procedur och utrustning vid oförstörande provning jämte ett testelement
EP1129354B1 (fr) * 1998-11-13 2008-08-06 Pepscan Systems B.V. Methode de determination d'une sequence de mimotope
AU2014204284B2 (en) * 2013-01-07 2017-06-29 Bae Systems Plc Object production using an additive manufacturing process and quality assessment of the object
WO2017015115A1 (fr) * 2015-07-21 2017-01-26 Lockheed Martin Corporation Analyse en temps réel et commande de procédé de production de faisceau d'électrons par tomographie aux rayons x assistée par ordinateur
US10919285B2 (en) * 2016-11-07 2021-02-16 General Electric Company Method and system for x-ray backscatter inspection of additive manufactured parts
CN108195856A (zh) * 2017-12-07 2018-06-22 北京星航机电装备有限公司 一种增材制造材料工业ct检测灵敏度测试方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112683933A (zh) * 2020-11-30 2021-04-20 北京星航机电装备有限公司 一种增材制造多层结构检测射线灵敏度的测定方法

Also Published As

Publication number Publication date
EP3671189A3 (fr) 2020-09-09
GB201819508D0 (en) 2019-01-16
US20200173937A1 (en) 2020-06-04
GB2579392A (en) 2020-06-24

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