EP2689258B1 - Systeme und verfahren zur herstellung von mindestens einem lösbaren elektrischen kontakt mit mindestens einer fotovoltaischen vorrichtung - Google Patents

Systeme und verfahren zur herstellung von mindestens einem lösbaren elektrischen kontakt mit mindestens einer fotovoltaischen vorrichtung

Info

Publication number
EP2689258B1
EP2689258B1 EP12715727.9A EP12715727A EP2689258B1 EP 2689258 B1 EP2689258 B1 EP 2689258B1 EP 12715727 A EP12715727 A EP 12715727A EP 2689258 B1 EP2689258 B1 EP 2689258B1
Authority
EP
European Patent Office
Prior art keywords
atleast
systems
making
methods
electrical contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn - After Issue
Application number
EP12715727.9A
Other languages
English (en)
French (fr)
Other versions
EP2689258A1 (de
Inventor
Jonas Hiller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pasan SA
Original Assignee
Pasan SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pasan SA filed Critical Pasan SA
Publication of EP2689258A1 publication Critical patent/EP2689258A1/de
Application granted granted Critical
Publication of EP2689258B1 publication Critical patent/EP2689258B1/de
Withdrawn - After Issue legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06727—Cantilever beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
EP12715727.9A 2011-03-23 2012-03-19 Systeme und verfahren zur herstellung von mindestens einem lösbaren elektrischen kontakt mit mindestens einer fotovoltaischen vorrichtung Withdrawn - After Issue EP2689258B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IN804DE2011 2011-03-23
PCT/IB2012/051316 WO2012127411A1 (en) 2011-03-23 2012-03-19 Systems and methods for making atleast a detachable electrical contact with atleast a photovoltaic device

Publications (2)

Publication Number Publication Date
EP2689258A1 EP2689258A1 (de) 2014-01-29
EP2689258B1 true EP2689258B1 (de) 2015-07-22

Family

ID=45992570

Family Applications (1)

Application Number Title Priority Date Filing Date
EP12715727.9A Withdrawn - After Issue EP2689258B1 (de) 2011-03-23 2012-03-19 Systeme und verfahren zur herstellung von mindestens einem lösbaren elektrischen kontakt mit mindestens einer fotovoltaischen vorrichtung

Country Status (6)

Country Link
EP (1) EP2689258B1 (de)
JP (1) JP2014509088A (de)
KR (1) KR20140019804A (de)
CN (1) CN103597739B (de)
TW (1) TW201244117A (de)
WO (1) WO2012127411A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104718696B (zh) * 2012-07-20 2018-11-09 帕山股份公司 测试设备
JP5912156B2 (ja) * 2014-07-28 2016-04-27 株式会社エヌ・ピー・シー 発電出力測定用治具
DE102015105975B4 (de) 2015-04-20 2019-07-11 h.a.l.m. elektronik GmbH Kontaktierungsvorrichtung sowie Verfahren zum Messen einer Kenngröße einer Solarzelle
DE102017125626A1 (de) 2017-11-02 2019-05-02 Hanwha Q Cells Gmbh Kontaktierungselement und Vorrichtung zum temporären Kontaktieren einer Solarzelle
JP2019140705A (ja) * 2018-02-06 2019-08-22 三菱電機株式会社 太陽電池測定方法および太陽電池モジュール製造方法
DE102018102840A1 (de) * 2018-02-08 2019-08-08 Wavelabs Solar Metrology Systems Gmbh Vorrichtung zur elektrischen Kontaktierung einer Solarzelle bei der Messung elektrischer Kenndaten der Solarzelle und Verfahren zur Messung elektrischer Kenndaten einer Solarzelle
CN109347437A (zh) * 2018-09-17 2019-02-15 江西展宇新能源股份有限公司 一种多主栅太阳电池测试装置
KR102347628B1 (ko) * 2019-10-15 2022-01-06 (주)티에스이 쏠라셀 검사 장치
DE102020117760A1 (de) * 2020-07-06 2022-01-13 Wavelabs Solar Metrology Systems Gmbh Kontaktiervorrichtung, Solarzellentestvorrichtung und Lichtquelle

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58158977A (ja) * 1982-02-25 1983-09-21 ユニバ−シテイ・オブ・デラウエア 薄膜太陽電池を製造する方法及び装置
US4640002A (en) * 1982-02-25 1987-02-03 The University Of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
ATE545036T1 (de) * 2007-04-19 2012-02-15 Oerlikon Solar Ag Testausrüstung für automatisierte qualitätskontrolle von dünnschicht-soalrmodulen
EP2243168A2 (de) * 2008-01-25 2010-10-27 Applied Materials, Inc. Automatisierte elektrische solarzellen-verbindungvorrichtung
DE102008038186A1 (de) * 2008-08-19 2010-02-25 Suss Microtec Test Systems Gmbh Sonde zur temporären elektrischen Kontaktierung einer Solarzelle
DE102008038184A1 (de) * 2008-08-19 2010-02-25 Suss Microtec Test Systems Gmbh Verfahren und Vorrichtung zur temporären elektrischen Kontaktierung einer Solarzelle
CN201359613Y (zh) * 2009-01-19 2009-12-09 李毅 非晶硅太阳能电池的测试电极夹具
CN101793945B (zh) * 2010-03-12 2013-04-17 中国电子科技集团公司第四十五研究所 一种太阳能电池片的测试装置
CN101975917A (zh) * 2010-10-09 2011-02-16 中国电子科技集团公司第四十八研究所 一种用于测试晶体硅太阳能电池的电动测试台

Also Published As

Publication number Publication date
KR20140019804A (ko) 2014-02-17
TW201244117A (en) 2012-11-01
WO2012127411A1 (en) 2012-09-27
CN103597739B (zh) 2016-12-14
CN103597739A (zh) 2014-02-19
EP2689258A1 (de) 2014-01-29
JP2014509088A (ja) 2014-04-10

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