EP1629440B1 - Device for checking banknotes - Google Patents
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- EP1629440B1 EP1629440B1 EP04734246A EP04734246A EP1629440B1 EP 1629440 B1 EP1629440 B1 EP 1629440B1 EP 04734246 A EP04734246 A EP 04734246A EP 04734246 A EP04734246 A EP 04734246A EP 1629440 B1 EP1629440 B1 EP 1629440B1
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- 239000004065 semiconductor Substances 0.000 claims abstract description 52
- 238000003491 array Methods 0.000 claims abstract description 35
- 230000035945 sensitivity Effects 0.000 claims abstract description 13
- 238000001228 spectrum Methods 0.000 claims description 16
- 238000011156 evaluation Methods 0.000 claims description 8
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- 239000000758 substrate Substances 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 2
- 230000003595 spectral effect Effects 0.000 abstract description 5
- 230000008901 benefit Effects 0.000 description 4
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- 238000012937 correction Methods 0.000 description 2
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- 238000004519 manufacturing process Methods 0.000 description 2
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- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000000976 ink Substances 0.000 description 1
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- 238000010200 validation analysis Methods 0.000 description 1
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- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D7/00—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency
- G07D7/06—Testing specially adapted to determine the identity or genuineness of valuable papers or for segregating those which are unacceptable, e.g. banknotes that are alien to a currency using wave or particle radiation
- G07D7/12—Visible light, infrared or ultraviolet radiation
- G07D7/1205—Testing spectral properties
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
- H04N23/11—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
Definitions
- the invention relates to a device for checking banknotes, which scans the banknotes to be tested by means of a semiconductor array.
- Such a device is for example from the DE 19517194 A1 known.
- a CCD array is provided, which is formed by four individual, parallel, line-shaped CCD arrays, which are arranged at a constant distance from each other.
- Each of the CCD arrays has a filter having a specific filter characteristic, such that a CCD array is the area of blue light, a CCD array is the area of green light, a CCD array is the area of red light, and a CCD array detects the range of infrared light. If the banknotes to be checked move past the sensor, pixels of the respective banknote are detected by the line-shaped CCD arrays and stored for further processing.
- an image of the respective banknote can be generated in line form from the stored pixels.
- the CCD arrays for the blue, green and red regions of the light a colored image of the banknotes can be generated; by means of the CCD array for the infrared region of the light, an image of normally invisible properties of the banknotes, e.g. B. of their printing inks are generated.
- the known device has the disadvantage that the CCD array used is expensive, since a plurality of filters must be used so that the individual line-shaped CCD arrays can detect the desired color ranges.
- problems in the composition of the color image of the respective banknote from the pixels can of the blue, green and red CCD arrays since their spaced array may cause parallax errors if the geometric magnification and line rate are not adjusted accordingly. Especially at light-dark transitions, this can lead to moire effects.
- a color image sensor which is formed by a semiconductor array having three successive layers, wherein each of the three layers is sensitive to a certain amount of light.
- the known property of silicon is exploited that the penetration depth of the light is dependent on the wavelength of the light. Light with a longer wavelength penetrates deeper into the silicon before it is absorbed.
- a first very thin layer mainly detecting blue light
- a second thicker layer primarily detecting green light
- a third layer detecting red and infrared light. Since the layers sensitive to the different light regions, or the respective pixels, lie one behind the other, they always form the same pixel of the banknote to be tested. Problems with parallax errors between the three signals can thus no longer arise.
- a suitable (usually linear) combination of the three signals of each pixel its blue, green and red signals are obtained.
- the known color sensor has the disadvantage that only three wavelength ranges can be detected, which are in the sensitivity range of silicon from about 380 to about 1100 nm.
- the sensor is provided with an infrared block filter, which cuts off wavelengths above about 680 nm.
- important wavelength ranges that are in the non-visible (infrared) range of light then can not be detected.
- the invention is based on a device for checking banknotes, which scans the banknotes to be tested by means of a semiconductor array, wherein the semiconductor array of at least two parallel spaced, row-shaped semiconductor arrays is formed and the banknotes for the test on the Semiconductor array moved past and illuminated by a light source in which the line-shaped semiconductor arrays are formed of at least three layers that are sensitive to light of different wavelengths, wherein a first line-shaped semiconductor array banknotes in a defined spectral range of light scans within the spectral sensitivity of the semiconductor and a second line-shaped semiconductor array scans the banknotes in a different area, including at least the second row-shaped semiconductor array having a filter that a control and evaluation device is present, which signals the Ha conductor arrays processed and evaluated to generate from the signals of the layers of the two line-shaped semiconductor arrays, a color image and an image in the region of the invisible light for each banknote to be checked.
- the first semiconductor array has no filter, the second a filter that allows only non-visible light to pass.
- the first semiconductor array has no filter, the second a filter that blocks non-visible light.
- the first semiconductor array has a filter that blocks non-visible light, the second a filter that allows only non-visible light to pass through.
- the non-visible light transmitted by the filter in addition to the infrared, also includes the ultraviolet portion of the spectrum below about 390 nm. This will only contribute to the signal of the uppermost layer of the array because of the extremely short penetration depth of the ultraviolet light into the semiconductor of the array.
- the infra-red signal of the uppermost layer upon blocking the visible portion of the spectrum (between about 390 and 700 nm), can be derived from the signal of the two underlying layers and with appropriate weight defined by the sensitivity and illumination spectra to correct the Signals of the first layer are used, so that the signal in the ultraviolet range can be obtained in addition to the fifth.
- the device according to the invention has the advantage that it can be implemented simply and inexpensively with existing technology and provides good test results because of the reduction of image aberrations, which can be caused for example by parallax errors.
- the manufacture of the filter is greatly simplified; In some cases, they can even be formed as organic plastic filters and, for example, applied directly to the substrate of the detector arrays by so-called spin coating.
- the first array delivers signals from the entire spectrum, the second only from the invisible area.
- the three signals of the second array can be simply summed. You then deliver the image in the invisible area. This is used with appropriate weights to correct the color signals in the visible region of the spectrum.
- the first array delivers signals from the entire spectrum, the second only signals from the visible range. These can be used directly without further correction.
- the image in the invisible region is obtained from the signals of the first array by reducing its signals by the corresponding signals of the second array and then summed.
- both arrays are provided with filters whose passbands are mutually exclusive, so that the first array delivers the colored image, the second array the summed image.
- the device according to the invention has the particular advantage that the lower sensitivity of semiconductor arrays in the invisible range is improved by summing the signals of the three layers, whereby better test results can be achieved.
- Banknote validation apparatus 1 shown comprises a semiconductor array 4, 5 with which the banknotes BN to be checked are scanned when it is moved past the semiconductor array 4, 5 in the transporting direction T by a transport device, not shown.
- the semiconductor array 4, 5 consists of two parallel, line-shaped arrays 4 and 5, which have three successive layers b, g, r, which are sensitive to light of different wavelengths.
- the line-shaped arrays 4, 5 may be separate components, but they may also be arranged on a single component, in particular on a single Semiconductor substrate.
- the semiconductor arrays 4, 5 can z. B. made of silicon and be constructed in CMOS technology.
- the sensitivity of the layers b, g, r is in FIG. 3 shown.
- the uppermost layer b is for blue light
- the middle layer g is for green light
- the lowermost layer r is most sensitive to red light.
- the exact relationships of such layered CMOS arrays may be, for example, those mentioned in the introduction US 5,965,875 be removed.
- the layer thicknesses have different thicknesses, so that an approximately equal sensitivity for the three views b, g, r results in accordance with the wavelength-dependent absorption of the silicon.
- a light source 2 illuminates the banknote BN to be checked.
- the light of the light source 2 comprises wavelength ranges which are required for the examination of the banknote BN, in particular thus the range of the visible light as well as the range of the infrared or ultraviolet light.
- the intensity of the light source 2 over the entire relevant wavelength range is equal or the spectral shape of the intensity of the light source 2 is adapted to the course of the overall sensitivity of the CMOS array, as z. B. in the not previously published German patent application 10239225.0 the applicant is described.
- the banknote BN With the line-shaped CMOS arrays 4, 5, the banknote BN becomes over its entire width, as in FIG. 2 represented, sampled pixel by pixel. If the scan is synchronized with the transport speed of the banknote BN, a complete color and infrared image of the banknote BN can be generated. With regard to the necessary procedure, in particular for synchronization with the transport speed of the banknotes BN, is referred to the above-mentioned DE 19517194 Al directed.
- the colored image of the banknote BN is generated by a control and evaluation device 7 in the preferred arrangement.
- the signals of the blue layer b, the green layer g and the red layer r of the respective pixels of the CMOS array 4 are applied to the control and evaluation device 7 in order to generate a component color image (eg RGB).
- a filter can be attached, which blocks the light of longer (infrared) wavelengths. Then no correction with the signals of the array 2 is required. This only has to be done if the filter is missing and the array 4 is also sensitive in the non-visible area.
- the infrared image of the banknote BN is generated by the control and evaluation device 7.
- a filter 6 is provided in front of the CMOS array 5, which only the infrared region of the light, z. B. with a wavelength greater than 850 nm, happen.
- the signals of the blue layer b, the green layer g and the red layer r of the respective pixels of the CMOS array 5 are applied to the control and evaluation device 7, which evaluates the signals and composes them to form the infrared image. It is particularly advantageous for the signals of the blue, green and red layers b, g, and r of the CMOS array 5 to be summed by the control and evaluation device 7.
- This approach has the advantage that the lower sensitivity of CMOS arrays in the infrared region (see FIG. 3 ), z. B. in a wavelength range greater than 850 nm, by summing the signals of the three layers b, g, r is improved. However, due to the lower layer thicknesses of layers b and g, layer r contributes the majority to the infrared signal.
- the distance between the two CMOS arrays 4 and 5 is selected as small as possible. It can thereby be achieved that the color image originating from the CMOS array 4 and the infrared image originating from the CMOS array 5 can be generated with almost no parallax error.
- the CMOS array used in the device 1 can be constructed from individual line-shaped CMOS arrays, but it is also possible to use a CMOS array which provides the required lines on a common substrate.
- a diaphragm or optics is also provided in front of the CMOS array 4, 5 in order to realize certain imaging properties.
- the filter 6 z. B. is replaced by a filter that only or additionally short-wave light, z. B. UV light, happen.
- third CMOS array can be used.
- the device 1 can also be designed such that instead of this or additionally light reflected from the banknotes BN is evaluated, for which purpose the CMOS Array 4, 5 and the light source 2 are arranged on one side of the banknote BN.
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Abstract
Description
Die Erfindung betrifft eine Vorrichtung zur Prüfung von Banknoten, welche die zu prüfenden Banknoten mittels eines Halbleiter-Arrays abtastet.The invention relates to a device for checking banknotes, which scans the banknotes to be tested by means of a semiconductor array.
Eine derartige Vorrichtung ist beispielsweise aus der
Die bekannte Vorrichtung weist jedoch den Nachteil auf, dass das verwendete CCD-Array aufwendig ist, da eine Vielzahl von Filtern verwendet werden muß, damit die einzelnen zeilenförmigen CCD-Arrays die gewünschten Farbbereiche detektieren können. Zudem können sich Probleme bei der Zusammensetzung des farbigen Abbilds der jeweiligen Banknote aus den Bildpunkten des blauen, grünen und roten CCD-Arrays ergeben, da deren beabstandete Anordnung Parallaxenfehler hervorrufen kann, wenn der geometrische Abbildungsmaßstab und die Zeilenfrequenz nicht entsprechend angepasst sind. Insbesondere an Hell-Dunkelübergängen kann dies zu so genannten Moire-Effekten führen.However, the known device has the disadvantage that the CCD array used is expensive, since a plurality of filters must be used so that the individual line-shaped CCD arrays can detect the desired color ranges. In addition, problems in the composition of the color image of the respective banknote from the pixels can of the blue, green and red CCD arrays since their spaced array may cause parallax errors if the geometric magnification and line rate are not adjusted accordingly. Especially at light-dark transitions, this can lead to moire effects.
Aus der
Der bekannte Farbsensor weist jedoch den Nachteil auf, dass nur drei Wellenlängenbereiche detektiert werden können, die im Empfindlichkeitsbereich des Siliziums von ca. 380 bis ca.1100 nm liegen. Für Anwendungen in der Photographie wird der Sensor mit einem Infrarot-Blockfilter versehen, welches Wellenlängen über ca. 680 nm abschneidet. Insbesondere für die Prüfung von Banknoten wichtige Wellenlängenbereiche, die im nicht sichtbaren (infraroten) Bereich des Lichts liegen, können dann nicht detektiert werden.However, the known color sensor has the disadvantage that only three wavelength ranges can be detected, which are in the sensitivity range of silicon from about 380 to about 1100 nm. For applications in photography, the sensor is provided with an infrared block filter, which cuts off wavelengths above about 680 nm. In particular, for the examination of banknotes important wavelength ranges that are in the non-visible (infrared) range of light, then can not be detected.
Eine Erweiterung des bekannten Farbsensors um mindestens eine weitere Schicht, die beispielsweise der Detektion des infraroten Bereichs dient, ist prinzipiell vorstellbar und möglich, jedoch sind derartige Sensoren nicht frei verfügbar und müßten daher in ihrer Struktur erst entwickelt und als Sonderanfertigung produziert werden. Bei dem bekannten Aufwand im Bereich der Herstellung von Halbleiterprodukten sind derartige Sonderanfertigungen jedoch sehr aufwändig.An extension of the known color sensor by at least one further layer, which serves, for example, the detection of the infrared range, is in principle conceivable and possible, however, such sensors are not freely available and would therefore have to be developed in their structure and produced as a special order. However, in the case of the known expenditure in the field of the production of semiconductor products, such custom-made products are very complicated.
Es ist daher die Aufgabe der vorliegenden Erfindung, eine Vorrichtung zur Prüfung von Banknoten anzugeben, welche die zu prüfenden Banknoten mittels eines derartigen Halbleiter-Arrays abtastet und die bei minimalem Aufwand alle erforderlichen Prüfungsergebnisse liefert.It is therefore the object of the present invention to specify a device for checking banknotes, which scans the banknotes to be tested by means of such a semiconductor array and which supplies all required test results with minimal effort.
Diese Aufgabe wird durch eine Vorrichtung mit den in Anspruch 1 angegebenen Merkmale gelöst.This object is achieved by a device having the features specified in claim 1.
Die Erfindung geht dabei aus von einer Vorrichtung zur Prüfung von Banknoten, welche die zu prüfenden Banknoten mittels eines Halbleiter-Arrays abtastet, wobei das Halbleiter-Array von wenigstens zwei parallel beabstandeten, zeilenförmigen Halbleiter-Arrays gebildet wird und die Banknoten für die Prüfung an dem Halbleiter-Array vorbei bewegt und von einer Lichtquelle beleuchtet werden, bei der die zeilenförmigen Halbleiter-Arrays von mindestens drei Schichten gebildet werden, die für Licht unterschiedlicher Wellenlänge empfindlich sind, wobei ein erstes zeilenförmiges Halbleiter-Array die Banknoten in einem definierten spektralen Bereich des Lichts innerhalb der spektralen Empfindlichkeit des Halbleiters abtastet und ein zweites zeilenförmiges Halbleiter-Array die Banknoten in einem davon verschiedenen Bereich abtastet, wozu mindestens das zweite zeilenförmige Halbleiter-Array ein Filter aufweist, dass eine Steuer- und Auswerteeinrichtung vorhanden ist, welche Signale des Halbleiter-Arrays verarbeitet und auswertet, um aus den Signalen der Schichten der beiden zeilenförmigen Halbleiter-Arrays ein farbiges Abbild und ein Abbild im Bereich des nicht sichtbaren Lichts für jede zu überprüfende Banknote zu erzeugen.The invention is based on a device for checking banknotes, which scans the banknotes to be tested by means of a semiconductor array, wherein the semiconductor array of at least two parallel spaced, row-shaped semiconductor arrays is formed and the banknotes for the test on the Semiconductor array moved past and illuminated by a light source in which the line-shaped semiconductor arrays are formed of at least three layers that are sensitive to light of different wavelengths, wherein a first line-shaped semiconductor array banknotes in a defined spectral range of light scans within the spectral sensitivity of the semiconductor and a second line-shaped semiconductor array scans the banknotes in a different area, including at least the second row-shaped semiconductor array having a filter that a control and evaluation device is present, which signals the Ha conductor arrays processed and evaluated to generate from the signals of the layers of the two line-shaped semiconductor arrays, a color image and an image in the region of the invisible light for each banknote to be checked.
Als Ausgestaltungen sind dabei drei Fälle unterscheidbar. Im ersten Fall weist das erste Halbleiter-Array kein Filter auf, das zweite ein Filter, das ausschließlich nicht sichtbares Licht passieren läßt. Im zweiten Fall weist das erste Halbleiter-Array kein Filter auf, das zweite ein Filter, das nicht sichtbares Licht blockiert. Im dritten Fall weist das erste Halbleiter-Array einFilter auf, das nicht sichtbares Licht blockiert, das zweite ein Filter, welches ausschließlich nicht sichtbares Licht passieren lässt.As embodiments, three cases are distinguishable. In the first case, the first semiconductor array has no filter, the second a filter that allows only non-visible light to pass. In the second case, the first semiconductor array has no filter, the second a filter that blocks non-visible light. In the third case, the first semiconductor array has a filter that blocks non-visible light, the second a filter that allows only non-visible light to pass through.
In allen drei Fällen ist es möglich, durch eine geeignete, im einfachsten Fall lineare Kombination der sechs Signale der beiden Halbleiter-Arrays die vier erforderlichen Signale, das heißt drei Farbsignale und ein Signal für den nicht sichtbaren Bereich, zu gewinnen.In all three cases it is possible, by means of a suitable, in the simplest case linear combination of the six signals of the two semiconductor arrays, to obtain the four required signals, that is to say three color signals and one signal for the non-visible region.
Für den ersten und dritten Fall ist es als Erweiterung denkbar, dass das vom Filter durchgelassene nicht sichtbare Licht neben dem infraroten auch den ultravioletten Anteil des Spektrums unterhalb ca. 390 nm umfasst. Dieser wird wegen der extrem kurzen Eindringtiefe des ultravioletten Lichts in den Halbleiter des Arrays ausschließlich zum Signal der obersten Schicht des Arrays beitragen. Das Infrarot-Signal der obersten Schicht kann bei Blockierung des sichtbaren Anteils des Spektrums (zwischen etwa 390 und 700 nm) aus dem Signal der beiden darunter liegenden Schichten abgeleitet werden und mit geeignetem, durch das Empfindlichkeits- und das Beleuchtungsspektrum definierten, Gewicht zur Korrektur des Signals der ersten Schicht herangezogen werden, so dass das Signal im ultravioletten Bereich zusätzlich als fünftes gewonnen werden kann.For the first and third case, it is conceivable as an extension that the non-visible light transmitted by the filter, in addition to the infrared, also includes the ultraviolet portion of the spectrum below about 390 nm. This will only contribute to the signal of the uppermost layer of the array because of the extremely short penetration depth of the ultraviolet light into the semiconductor of the array. The infra-red signal of the uppermost layer, upon blocking the visible portion of the spectrum (between about 390 and 700 nm), can be derived from the signal of the two underlying layers and with appropriate weight defined by the sensitivity and illumination spectra to correct the Signals of the first layer are used, so that the signal in the ultraviolet range can be obtained in addition to the fifth.
Die erfindungsgemäße Vorrichtung weist den Vorteil auf, dass sie mit vorhandener Technologie einfach und kostengünstig zu realisieren ist und wegen der Reduzierung von Bildfehlern, die beispielsweise durch Parallaxenfehler verursacht werden können, gute Prüfungsergebnisse liefert. Insbesondere die Herstellung der Filter wird stark vereinfacht; sie können zum Teil sogar als organische Kunststoff-Filter ausgebildet werden und z.B. durch so genanntes Spin-Coating direkt auf dem Substrat der Detektorarrays aufgebracht werden.The device according to the invention has the advantage that it can be implemented simply and inexpensively with existing technology and provides good test results because of the reduction of image aberrations, which can be caused for example by parallax errors. Especially the manufacture of the filter is greatly simplified; In some cases, they can even be formed as organic plastic filters and, for example, applied directly to the substrate of the detector arrays by so-called spin coating.
Die Funktion der Steuer- und Auswerteeinrichtung für die drei oben beschriebenen Fälle ergibt sich dann wie folgt.The function of the control and evaluation device for the three cases described above then arises as follows.
Im ersten Fall liefert das erste Array Signale aus dem gesamten Spektrum, das zweite nur aus dem nicht sichtbaren Bereich. Hier können die drei Signale des zweiten Arrays einfach summiert werden. Sie liefern dann das Abbild im nicht sichtbaren Bereich. Dieses wird mit geeigneten Gewichten zur Korrektur der Farbsignale im sichtbaren Bereich des Spektrums herangezogen.In the first case, the first array delivers signals from the entire spectrum, the second only from the invisible area. Here, the three signals of the second array can be simply summed. You then deliver the image in the invisible area. This is used with appropriate weights to correct the color signals in the visible region of the spectrum.
Im zweiten Fall liefert das erste Array Signale aus dem gesamten Spektrum, das zweite nur Signale aus dem sichtbaren Bereich. Diese können ohne weitere Korrektur direkt verwendet werden. Das Abbild im nicht sichtbaren Bereich wird aus den Signalen des ersten Arrays gewonnen, indem dessen Signale um die entsprechenden Signale des zweiten Arrays vermindert und dann summiert werden.In the second case, the first array delivers signals from the entire spectrum, the second only signals from the visible range. These can be used directly without further correction. The image in the invisible region is obtained from the signals of the first array by reducing its signals by the corresponding signals of the second array and then summed.
Im dritten Fall sind beide Arrays mit Filtern versehen, deren Durchlassbereiche sich gegenseitig ausschließen, so daß das erste Array das farbige, das zweite Array durch Summieren das nicht sichtbare Abbild liefert.In the third case, both arrays are provided with filters whose passbands are mutually exclusive, so that the first array delivers the colored image, the second array the summed image.
Die erfindungsgemäße Vorrichtung weist insbesondere den Vorteil auf, dass die geringere Empfindlichkeit von Halbleiter-Arrays im nicht sichtbaren Bereich durch das Summieren der Signale der drei Schichten verbessert wird, wodurch bessere Prüfergebnisse erzielt werden können.The device according to the invention has the particular advantage that the lower sensitivity of semiconductor arrays in the invisible range is improved by summing the signals of the three layers, whereby better test results can be achieved.
Weitere Vorteile der vorliegenden Erfindung werden nachfolgend anhand der beigefügten Figuren näher erläutert und beschrieben.Further advantages of the present invention will be explained and described in more detail below with reference to the attached figures.
Es zeigt:
- Figur 1
- eine schematische Ansicht einer Vorrichtung zur Prüfung von Banknoten, welche die zu prüfenden Banknoten mittels eines Halbleiter-
4,5 abtastet,Arrays Figur 2- eine weitere schematische Ansicht der Vorrichtung nach
Figur.1 , aus einem anderen Blickwinkel, und Figur 3- eine Darstellung der spektralen Empfindlichkeiten der drei Schich- ten eines Halbleiter-Arrays nach
Figur 1 , für Schichtdicken, die eine annähernd gleiche Empfindlichkeit für die drei Schichten ergeben.
- FIG. 1
- 1 a schematic view of a device for checking bank notes, which scans the bank notes to be checked by means of a
4, 5semiconductor array - FIG. 2
- a further schematic view of the device according to
Figur.1 , from a different angle, and - FIG. 3
- a representation of the spectral sensitivities of the three layers of a semiconductor array according to
FIG. 1 , for layer thicknesses that give approximately the same sensitivity for the three layers.
Die in
Die Empfindlichkeit der Schichten b, g, r ist in
Eine Lichtquelle 2 beleuchtet die zu prüfende Banknote BN. Mittels einer Blende 3 oder einer geeigneten Optik wird ein beleuchteter Bereich auf der Banknote BN erzeugt, der etwa dem Bild des CMOS-Arrays 4, 5 entspricht. Dabei umfaßt das Licht der Lichtquelle 2 Wellenlängenbereiche, die für die Prüfung der Banknote BN benötigt werden, insbesondere also den Bereich des sichtbaren Lichts sowie den Bereich des infraroten bzw. ultravioletten Lichts. Bevorzugt ist die Intensität der Lichtquelle 2 über den gesamten relevanten Wellenlängenbereich gleich oder der spektrale Verlauf der Intensität der Lichtquelle 2 ist an den Verlauf der Gesamt-Empfindlichkeit des CMOS-Arrays angepaßt, wie dies z. B. in der nicht vorveröffentlichten deutschen Patentanmeldung
Mit den zeilenförmigen CMOS-Arrays 4, 5 wird die Banknote BN über ihre gesamte Breite, wie in
Mittels der Signale des ersten zeilenförmigen CMOS-Arrays 4 wird in der bevorzugten Anordnung das farbige Abbild der Banknote BN von einer Steuer- und Auswerteeinrichtung 7 erzeugt. Dazu liegen an der Steuer- und Auswerteeinrichtung 7 die Signale der blauen Schicht b, der grünen Schicht g und der roten Schicht r der jeweiligen Bildpunkte des CMOS-Arrays 4 an, um ein Komponentenfarbbild zu erzeugen (z. B. RGB). Vor dem Array 4 kann ein Filter angebracht sein, welches das Licht längerer (infraroter) Wellenlängen blockiert. Dann ist keine Korrektur mit den Signalen des Arrays 2 erforderlich. Diese muss nur vorgenommen werden, wenn das Filter fehlt und das Array 4 auch im nicht sichtbaren Bereich empfindlich ist.By means of the signals of the first line-shaped
Mittels der Signale des zweiten zeilenförmigen CMOS-Arrays 5 wird das infrarote Abbild der Banknote BN von der Steuer- und Auswerteeinrichtung 7 erzeugt. Dazu ist ein Filter 6 vor dem CMOS-Array 5 vorgesehen, welches nur den infraroten Bereich des Lichts, z. B. mit einer Wellenlänge größer 850 nm, passieren läßt. Die Signale der blauen Schicht b, der grünen Schicht g und der roten Schicht r der jeweiligen Bildpunkte des CMOS-Arrays 5 liegen an der Steuer- und Auswerteeinrichtung 7, welche die Signale auswertet und zu dem infraroten Abbild zusammensetzt. Besonders vorteilhaft ist es, wenn dazu die Signale der blauen, grünen und roten Schichten b, g, und r des CMOS-Arrays 5 von der Steuer- und Auswerteeinrichtung 7 summiert werden. Diese Vorgehensweise bieten den Vorteil, dass die geringere Empfindlichkeit von CMOS-Arrays im infraroten Bereich (siehe
Neben der oben anhand des in den Figuren dargestellten Ausführungsbeispiels sind vielfältige Variationen und Abwandlungen des Beschriebenen möglich.In addition to the above with reference to the embodiment shown in the figures many variations and modifications of the described are possible.
Beispielsweise kann es vorgesehen sein, dass der Abstand zwischen den beiden CMOS-Arrays 4 und 5 möglichst gering gewählt wird. Dadurch kann erreicht werden, dass das vom CMOS-Array 4 stammende farbige Abbild und das vom CMOS-Array 5 stammende infrarote Abbild nahezu ohne Parallaxenfehler erzeugt werden können. Das in der Vorrichtung 1 verwendete CMOS-Array kann dazu aus einzelen zeilenförmigen CMOS-Arrays aufgebaut sein, es kann aber auch ein CMOS-Array verwendet werden, das die benötigten Zeilen auf einem gemeinsamen Substrat zur Verfügung stellt.For example, it may be provided that the distance between the two
Ebenso kann es vorgesehen sein, dass eine Blende oder Optik auch vor dem CMOS-Array 4, 5 vorgesehen wird, um bestimmte Abbildungseigenschaften zu realisieren.Likewise, it can be provided that a diaphragm or optics is also provided in front of the
Als weitere Variante ist es möglich, andere nicht sichtbare Bereiche des Lichts mit der Vorrichtung 1 zu überprüfen. Dazu kann es vorgesehen sein, dass das Filter 6 z. B. durch ein Filter ersetzt wird, das nur oder zusätzlich kurzwelliges Licht, z. B. UV-Licht, passieren läßt. Ebenso kann zusätzlich zu den beiden CMOS-Arrays 4 und 5 ein weiteres, mit einem entsprechenden Filter versehenes, drittes CMOS-Array verwendet werden.As a further variant, it is possible to check other non-visible regions of the light with the device 1. For this purpose, it may be provided that the filter 6 z. B. is replaced by a filter that only or additionally short-wave light, z. B. UV light, happen. Likewise, in addition to the two
Es ist offensichtlich, dass statt der beschriebenen Überprüfung der Banknoten BN durch die Vorrichtung 1 mit durch die Banknoten BN transmittiertem Licht die Vorrichtung 1 auch so ausgestaltet werden kann, dass statt dessen oder zusätzlich von den Banknoten BN reflektiertes Licht ausgewertet wird, wozu das CMOS-Array 4, 5 und die Lichtquelle 2 auf einer Seite der Banknote BN angeordnet sind.It is obvious that instead of the described checking of the banknotes BN by the device 1 with light transmitted by the banknotes BN, the device 1 can also be designed such that instead of this or additionally light reflected from the banknotes BN is evaluated, for which purpose the
Ebenso ist es offensichtlich, dass statt des in den Figuren dargestellten Transports der Banknoten BN entlang ihrer Längsseiten, auch ein Transport entlang der kurzen Seiten der Banknoten BN erfolgen kann. In diesem Fall ist die Abmessung des CMOS-Arrays 4,5 und der Lichtquelle 2 bzw. deren Blende 3 oder eventuell vorhandener Optiken entsprechend anzupassen.It is also obvious that instead of the transport of the banknotes BN shown in the figures along their longitudinal sides, they can also be transported along the short sides of the banknotes BN. In this case, the dimension of the
Claims (9)
- An apparatus (1) for checking bank notes (BN) which scans the bank notes (BN) to be checked by means of a semiconductor array (4, 5), the semiconductor array (4, 5) being formed by at least two parallel spaced, linear semiconductor arrays (4, 5), and the bank notes (BN) being moved for the check past the semiconductor array (4, 5) and illuminated by a light source (2),
characterized in that
the linear semiconductor arrays (4, 5) are formed by at least three layers (b, g, r) which are maximally sensitive to light of different wavelengths, a first linear semiconductor array (4) scanning the bank notes (BN) in a defined range of sensitivity of the semiconductor, and a second linear semiconductor array (5) scanning the bank notes (BN) in a sensitivity spectrum range different therefrom, for which purpose at least the second linear semiconductor array (5) has a filter (6) which passes only a part of the spectrum, a control and evaluation device (7) processes and evaluates signals from the two semiconductor arrays (4, 5) and produces a three-color image and at least one image in the range of invisible light from the signals of the layers (b, g, r) of the two linear semiconductor arrays (4, 5) by a combination of the signals for each bank note (BN) to be checked. - The apparatus according to claim 1, characterized in that the first semiconductor array (4) is sensitive to the total spectrum, and the second semiconductor array (5) is provided with a filter which passes only the invisible component of the spectrum.
- The apparatus according to claim 1, characterized in that the first semiconductor array (4) is sensitive to the total spectrum, and the second semiconductor array (5) is provided with a filter which passes only the visible part of the spectrum but blocks the invisible part.
- The apparatus according to claim 1, characterized in that the first semiconductor array (4) is provided with a filter which passes only the visible part of the spectrum, and the second semiconductor array (5) is provided with a filter which passes only an invisible part of the spectrum.
- The apparatus according to any of claims 1 to 4, characterized in that the invisible light is in the infrared range of the spectrum.
- The apparatus according to any of claims 1 to 5, characterized in that the invisible light is in the ultraviolet range of the spectrum.
- The apparatus according to any of claims 1 to 6, characterized in that the semiconductor array (4, 5) and the light source (2) are disposed on the same side and/or on different sides of the bank note (BN).
- The apparatus according to any of claims 1 to 7, characterized in that the two linear semiconductor arrays (4, 5) are located on a single substrate.
- The apparatus according to any of claims 1 to 8, characterized in that the two semiconductor arrays (4, 5) are made of silicon.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10323410A DE10323410A1 (en) | 2003-05-23 | 2003-05-23 | Device for checking banknotes |
PCT/EP2004/005515 WO2004104947A2 (en) | 2003-05-23 | 2004-05-21 | Device for checking banknotes |
Publications (2)
Publication Number | Publication Date |
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EP1629440A2 EP1629440A2 (en) | 2006-03-01 |
EP1629440B1 true EP1629440B1 (en) | 2008-12-24 |
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Application Number | Title | Priority Date | Filing Date |
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EP04734246A Expired - Lifetime EP1629440B1 (en) | 2003-05-23 | 2004-05-21 | Device for checking banknotes |
Country Status (6)
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US (1) | US7504632B2 (en) |
EP (1) | EP1629440B1 (en) |
AT (1) | ATE418771T1 (en) |
DE (2) | DE10323410A1 (en) |
RU (1) | RU2318240C2 (en) |
WO (1) | WO2004104947A2 (en) |
Families Citing this family (13)
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US8118217B1 (en) * | 2007-11-19 | 2012-02-21 | Diebold Self-Service Systems Division Of Diebold, Incorporated | Automated banking machine that operates responsive to data bearing records |
US7909244B2 (en) * | 2007-12-20 | 2011-03-22 | Ncr Corporation | Methods of operating an image-based self-service check depositing terminal to provide enhanced check images and an apparatus therefor |
US8265346B2 (en) | 2008-11-25 | 2012-09-11 | De La Rue North America Inc. | Determining document fitness using sequenced illumination |
US8780206B2 (en) | 2008-11-25 | 2014-07-15 | De La Rue North America Inc. | Sequenced illumination |
US8749767B2 (en) | 2009-09-02 | 2014-06-10 | De La Rue North America Inc. | Systems and methods for detecting tape on a document |
US8194237B2 (en) | 2009-10-15 | 2012-06-05 | Authentix, Inc. | Document sensor |
BR112012030640A2 (en) * | 2010-06-03 | 2016-11-16 | Spectra Systems Corp | coin suitability and wear detection using temperature modulated infrared detection |
US9335254B2 (en) | 2011-08-25 | 2016-05-10 | Glory Ltd. | Paper sheet recognition apparatus, light guide and light guide casing for use in spectrometric measurement of paper sheet |
US9053596B2 (en) | 2012-07-31 | 2015-06-09 | De La Rue North America Inc. | Systems and methods for spectral authentication of a feature of a document |
US20140374600A1 (en) * | 2013-06-19 | 2014-12-25 | Silicon Laboratories Inc. | Ultraviolet Sensor |
US9978887B2 (en) | 2014-10-28 | 2018-05-22 | Silicon Laboratories Inc. | Light detector using an on-die interference filter |
US9627424B2 (en) | 2014-11-19 | 2017-04-18 | Silicon Laboratories Inc. | Photodiodes for ambient light sensing and proximity sensing |
GB2577735B (en) * | 2018-10-05 | 2021-09-22 | Innovative Tech Ltd | Banknote imaging |
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CH689523A5 (en) | 1989-05-01 | 1999-05-31 | Mars Inc | Testing device for a blattfoermiges Good. |
CA2108813C (en) | 1992-10-23 | 2002-08-06 | Shinobu Arimoto | Photo-sensor and image processing apparatus |
US5453611A (en) * | 1993-01-01 | 1995-09-26 | Canon Kabushiki Kaisha | Solid-state image pickup device with a plurality of photoelectric conversion elements on a common semiconductor chip |
EP0606654B1 (en) * | 1993-01-01 | 2000-08-09 | Canon Kabushiki Kaisha | Image reading device |
DE19517194A1 (en) * | 1995-05-11 | 1996-11-14 | Giesecke & Devrient Gmbh | Device and method for checking sheet material, e.g. Banknotes or securities |
US5965875A (en) * | 1998-04-24 | 1999-10-12 | Foveon, Inc. | Color separation in an active pixel cell imaging array using a triple-well structure |
US6252220B1 (en) * | 1999-04-26 | 2001-06-26 | Xerox Corporation | Sensor cover glass with infrared filter |
DE10127836A1 (en) | 2001-06-08 | 2003-01-30 | Giesecke & Devrient Gmbh | Device for examining documents |
DE10127837A1 (en) * | 2001-06-08 | 2003-01-23 | Giesecke & Devrient Gmbh | Device and method for examining documents |
US7154157B2 (en) * | 2002-12-30 | 2006-12-26 | Intel Corporation | Stacked semiconductor radiation sensors having color component and infrared sensing capability |
-
2003
- 2003-05-23 DE DE10323410A patent/DE10323410A1/en not_active Withdrawn
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2004
- 2004-05-21 EP EP04734246A patent/EP1629440B1/en not_active Expired - Lifetime
- 2004-05-21 RU RU2005140061/09A patent/RU2318240C2/en not_active IP Right Cessation
- 2004-05-21 DE DE502004008733T patent/DE502004008733D1/en not_active Expired - Lifetime
- 2004-05-21 US US10/557,825 patent/US7504632B2/en not_active Expired - Fee Related
- 2004-05-21 AT AT04734246T patent/ATE418771T1/en active
- 2004-05-21 WO PCT/EP2004/005515 patent/WO2004104947A2/en active Application Filing
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US20070187579A1 (en) | 2007-08-16 |
DE10323410A1 (en) | 2004-12-09 |
US7504632B2 (en) | 2009-03-17 |
DE502004008733D1 (en) | 2009-02-05 |
RU2318240C2 (en) | 2008-02-27 |
WO2004104947A3 (en) | 2005-01-06 |
RU2005140061A (en) | 2007-06-27 |
WO2004104947A2 (en) | 2004-12-02 |
ATE418771T1 (en) | 2009-01-15 |
EP1629440A2 (en) | 2006-03-01 |
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