EP1491879A3 - Verfahren zur adaptiven Fehlererkennung auf einer strukturierten Oberfläche - Google Patents

Verfahren zur adaptiven Fehlererkennung auf einer strukturierten Oberfläche Download PDF

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Publication number
EP1491879A3
EP1491879A3 EP04013428A EP04013428A EP1491879A3 EP 1491879 A3 EP1491879 A3 EP 1491879A3 EP 04013428 A EP04013428 A EP 04013428A EP 04013428 A EP04013428 A EP 04013428A EP 1491879 A3 EP1491879 A3 EP 1491879A3
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French (fr)
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EP1491879A2 (de
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Roman Dr.-Ing. Louban
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hema electronic GmbH
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hema electronic GmbH
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Publication of EP1491879A3 publication Critical patent/EP1491879A3/de
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G01N2021/177—Detector of the video camera type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896—Circuits specially adapted for system specific signal conditioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
    • G01N21/8986—Wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30161—Wood; Lumber

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Die Erfindung betrifft ein Verfahren zur adaptiven Erkennung eines Fehlers 8 auf einer strukturierten Oberfläche 2 , z.B. einer Holzoberfläche, der auf einem mit einem Kamerasensor aufgenommenen Licht-und-Schatten-Bild mit Hilfe konturverfolgungsbasierter Segmentierung (Blobanalyse) gesucht wird. Die dabei genutzte Schwellwerte ― die maximale Fehlerhelligkeit Ibot (bottom) und die minimale Oberflächenhelligkeit Itop (top), die dazu dienen den Startpunkt 9 und die weitere Kontur des gesuchten Fehlers 8 (Blob) zu detektieren, - werden angepasst zu lokalen Helligkeitsbedingungen dynamisch aus dem Histogramm des Testbereiches 4 zusammen mit dem Grauwertprofil entlang einer Suchlinie 5 im Testbereich 4 ermittelt, wobei das Histogramm und das Grauwertprofil als Gaußverteilungen behandelt werden.
EP04013428A 2003-06-10 2004-06-08 Verfahren zur adaptiven Fehlererkennung auf einer strukturierten Oberfläche Withdrawn EP1491879A3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2003126035 DE10326035B4 (de) 2003-06-10 2003-06-10 Verfahren zur adaptiven Fehlererkennung auf einer strukturierten Oberfläche
DE10326035 2003-06-10

Publications (2)

Publication Number Publication Date
EP1491879A2 EP1491879A2 (de) 2004-12-29
EP1491879A3 true EP1491879A3 (de) 2005-01-19

Family

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EP04013428A Withdrawn EP1491879A3 (de) 2003-06-10 2004-06-08 Verfahren zur adaptiven Fehlererkennung auf einer strukturierten Oberfläche

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EP (1) EP1491879A3 (de)
DE (1) DE10326035B4 (de)

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DE102006044307A1 (de) * 2006-09-17 2008-09-25 Massen Machine Vision Systems Gmbh Multisensorielle Inspektion von Naturholz-Oberflächen
CN107066962B (zh) * 2012-01-17 2020-08-07 超级触觉资讯处理有限公司 用于通过光学成像进行的对象检测和表征的增强对比度
US11493998B2 (en) 2012-01-17 2022-11-08 Ultrahaptics IP Two Limited Systems and methods for machine control
US9501152B2 (en) 2013-01-15 2016-11-22 Leap Motion, Inc. Free-space user interface and control using virtual constructs
US10691219B2 (en) 2012-01-17 2020-06-23 Ultrahaptics IP Two Limited Systems and methods for machine control
US8693731B2 (en) 2012-01-17 2014-04-08 Leap Motion, Inc. Enhanced contrast for object detection and characterization by optical imaging
US9679215B2 (en) 2012-01-17 2017-06-13 Leap Motion, Inc. Systems and methods for machine control
US9070019B2 (en) 2012-01-17 2015-06-30 Leap Motion, Inc. Systems and methods for capturing motion in three-dimensional space
US20150253428A1 (en) 2013-03-15 2015-09-10 Leap Motion, Inc. Determining positional information for an object in space
US8638989B2 (en) 2012-01-17 2014-01-28 Leap Motion, Inc. Systems and methods for capturing motion in three-dimensional space
US9459697B2 (en) 2013-01-15 2016-10-04 Leap Motion, Inc. Dynamic, free-space user interactions for machine control
US9916009B2 (en) 2013-04-26 2018-03-13 Leap Motion, Inc. Non-tactile interface systems and methods
US9721383B1 (en) 2013-08-29 2017-08-01 Leap Motion, Inc. Predictive information for free space gesture control and communication
US9632572B2 (en) 2013-10-03 2017-04-25 Leap Motion, Inc. Enhanced field of view to augment three-dimensional (3D) sensory space for free-space gesture interpretation
US9996638B1 (en) 2013-10-31 2018-06-12 Leap Motion, Inc. Predictive information for free space gesture control and communication
CN204480228U (zh) 2014-08-08 2015-07-15 厉动公司 运动感测和成像设备
CN106651831B (zh) * 2016-09-30 2020-02-11 广西师范大学 一种竹块缺陷检测方法和***
CN112304957A (zh) * 2020-11-20 2021-02-02 天津朗硕机器人科技有限公司 一种基于机器视觉的外观缺陷智能检测方法及***
CN113732265A (zh) * 2021-06-16 2021-12-03 浙江路飞镁业有限公司 一种高强度镁制轮毂生产工艺
CN114581362B (zh) * 2021-07-22 2023-11-07 正泰集团研发中心(上海)有限公司 光伏组件缺陷检测方法、装置、电子设备和可读存储介质
CN114486903B (zh) * 2021-12-06 2024-05-14 浙江大学台州研究院 一种灰度自适应的卷材检测***及装置、算法
CN113934190B (zh) * 2021-12-17 2022-03-22 武汉春田纸品包装有限公司 一种基于机器视觉的瓦楞纸板生产质量调控方法
CN115239714B (zh) * 2022-09-22 2022-12-06 山东汇智家具股份有限公司 一种用于地板生产的原木材料分级评价方法
CN115272321B (zh) * 2022-09-28 2023-01-10 山东军冠纺织有限公司 一种基于机器视觉的纺织品缺陷检测方法
CN115797361B (zh) * 2023-02-13 2023-06-27 山东淼泰建筑科技有限公司 一种铝模板表面缺陷检测方法
CN116152133B (zh) * 2023-04-20 2023-07-07 山东超越纺织有限公司 基于人工智能的混纺缺陷检测方法
CN116778520B (zh) * 2023-08-11 2023-11-10 山东省大数据中心 一种海量证照数据质量检验方法
CN116758067B (zh) * 2023-08-16 2023-12-01 梁山县成浩型钢有限公司 基于特征匹配的金属结构件检测方法
CN117745724B (zh) * 2024-02-20 2024-04-26 高唐县瑞景精密机械有限公司 基于视觉分析的石材打磨加工缺陷区域分割方法

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Publication number Publication date
EP1491879A2 (de) 2004-12-29
DE10326035B4 (de) 2005-12-22
DE10326035A1 (de) 2005-01-13

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