EP1468586B1 - Diagnostic circuit for a tweeter in a loudspeaker combination - Google Patents

Diagnostic circuit for a tweeter in a loudspeaker combination Download PDF

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Publication number
EP1468586B1
EP1468586B1 EP03729411.3A EP03729411A EP1468586B1 EP 1468586 B1 EP1468586 B1 EP 1468586B1 EP 03729411 A EP03729411 A EP 03729411A EP 1468586 B1 EP1468586 B1 EP 1468586B1
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EP
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Prior art keywords
tweeter
voltage
measured voltage
loudspeaker
signal
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EP03729411.3A
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German (de)
French (fr)
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EP1468586A2 (en
Inventor
Wolfgang Heuer
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Robert Bosch GmbH
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Robert Bosch GmbH
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R29/00—Monitoring arrangements; Testing arrangements
    • H04R29/001—Monitoring arrangements; Testing arrangements for loudspeakers

Definitions

  • the invention relates to a diagnostic circuit for a high-frequency loudspeaker of a loudspeaker combination and to a method for testing a high-frequency loudspeaker of a loudspeaker combination.
  • a woofer and a mid-tone speaker or a mid-bass speaker is generally connected directly to the amplifiers of the low-frequency power amplifiers and a high-frequency speaker capacitively coupled.
  • the functionality of this speaker combination is checked in particular when installed in a vehicle and possibly in maintenance intervals or in case of malfunction. This can occur in particular interruptions or short circuits in the leads or in the speakers.
  • the bass, midrange, or midrange woofers can be tested directly resistively via an applied DC voltage.
  • An appropriate review of the capacitively connected tweeters is However, this is not possible. Accordingly, this check is usually performed by entering a high frequency signal and audible perception. However, such verification is time consuming and inaccurate in automated manufacturing.
  • circuit arrangements are known in which the current consumption of an output stage IC is measured when exposed to high NF frequency and high output level.
  • a measuring device must be provided accordingly in the power supply of the power output stages.
  • the DE 196 29 781 C1 describes a method for testing an impedance connected to a bridge output stage and an arrangement therefor.
  • the bridge diagonal is brought by changing the operating point of a half-bridge of the bridge output stage out of balance, so that there is a current flow through the impedance connected to the bridge output stage and the amount of this current flow can be upgraded as a measure of the connected impedance.
  • the DE 196 28 014 A1 describes a crossover for speakers and a corresponding speaker with such a frequency rich.
  • a crossover network is formed of passive electrical components, of which a part can be changed by an electrical control device in the electrical values. This variability can be done in particular by electronically controllable switching means.
  • inventive diagnostic circuit according to claim 1 and the inventive method according to claim 13, in contrast, have the particular advantage that with relatively little effort an accurate measurement of the functionality of a tweeter speaker of a speaker combination is possible.
  • the dependent claims describe preferred developments.
  • a review of the high-frequency speaker is made possible by a voltage divider circuit of a preferably purely ohmic resistance and the speaker combination formed and a voltage drop is measured and evaluated within this voltage divider circuit.
  • the voltage drop across the loudspeaker combination can be measured as a complex measuring voltage; In principle, however, a measurement of the voltage drop across the measuring resistor is possible.
  • the one or more woof, midrange or midrange speakers are connected in parallel with the coupling capacitor and the tweeter loudspeaker.
  • the functionality or the condition of the high-frequency loudspeaker has an effect on the complex total resistance of the loudspeaker combination at the RF frequency.
  • An interruption in the tweeter or its leads leads to an increase in the total resistance, a short circuit corresponding to a reduction in the total resistance to the total resistance with functional tweeter speaker. Since the loudspeakers designed for lower frequencies have a higher inductance than the high-frequency loudspeaker, they only have a small influence on the measuring signal.
  • the evaluation of the measured complex measurement voltage can e.g. by measuring the peak value phase-shifted with respect to the output signal or via a rectifier circuit.
  • a first output amplifier V1 of a low-frequency power amplifier is connected via a first terminal A1 to the positive terminal on the loudspeaker combination 4 and a second output amplifier V2 of the low-frequency power amplifier via a second terminal A2 to the negative terminal of the loudspeaker combination 4.
  • the loudspeaker combination 4 comprises a mid-bass speaker LS1 connected to the terminals A1, A2 and a high-frequency loudspeaker LS2 connected in parallel with LS1 via a capacitor C7.
  • the loudspeakers LS1 and LS2 are switched on and the amplifiers V1, V2 are switched off and thus high-impedance.
  • a processor 10 outputs an RF input signal s1, which is output via an impedance converter 3 as an RF voltage signal s2.
  • the processor 10 thus forms, together with the impedance converter 3, an HF voltage generating device 2.
  • the RF input signal s1 is applied via a resistor R2 and a capacitor C4 to the first terminal A1, ie the positive pole of the loudspeaker combination 4.
  • the second terminal A2 is grounded via a connection device 6.
  • the voltage dropping across the loudspeaker combination 4 and the connecting device 6 is tapped by a measuring device 11 as a complex measuring voltage UA1.
  • the processor 10 outputs the RF input signal s1 having a frequency of 20 kHz or more and a diagnostic signal d as a DC signal.
  • the diagnostic signal d sets a diagnostic mode.
  • the processor 10 switches in a manner not shown here by the diagnostic signal d and the output amplifier V1, V2 high impedance.
  • the RF voltage signal s is via a capacitor C2 supplied together with the diagnostic signal d an emitter follower transistor V3 of the impedance converter 3, wherein the operating point of the base of the emitter-follower transistor V3 via resistors R4, R6 is set.
  • Another transistor V4 and a resistor R3 form a constant current source connected to the emitter of V3, wherein V4 is turned on when the diagnostic signal d is present at its base.
  • the impedance converter 3 outputs an RF voltage signal S2, which drops to ground via the measuring resistor R2, the capacitor C4, the loudspeaker combination 4 and the connecting device 6.
  • the connecting device 6 has a transistor V5 which is controlled by the diagnostic signal d and applies a low voltage applied to the second terminal A2 AC voltage to ground. With a suitable dimensioning of the capacitors C4, C7, the RF voltage signal S2 thus essentially drops at a series circuit of R2 and the loudspeakers LS1 and LS2 connected in parallel.
  • the measuring voltage UA1 applied to A1 is picked up by a measuring device 11, which is formed by a resistor R1, a capacitor C8 and the processor 10 serving as the evaluation device.
  • the measuring voltage UA1 is phase-shifted relative to S1, in particular because of the impedances of LS1 and LS2.
  • the phase-shifted peak value is determined by the measuring device 11, and the impedance of the loudspeaker combination 4 is determined therefrom with known R2. Since LS1 has a high inductance, the voltage drop between A1 and A2 is essentially determined by LS2.
  • a short circuit is thus of the Measuring device 11 a low measuring voltage (or measuring voltage with a low amount), in the case of an interruption at LS2 a high measuring voltage and a functional state of LS2 a mean measuring voltage determined.
  • a measuring device 12 is used in which a resistor R1, the capacitor C7, a Schottky diode D1 and a grounded capacitor C1 for rectifying the recorded AC signal, so that the processor 10 receive a rectified voltage can.

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  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Otolaryngology (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Circuit For Audible Band Transducer (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

Die Erfindung betrifft einen Diagnoseschaltkreis für einen Hochton-Lautsprecher einer Lautsprecherkombination sowie ein Verfahren zum Überprüfen eines Hochton-Lautsprechers einer Lautsprecherkombination.The invention relates to a diagnostic circuit for a high-frequency loudspeaker of a loudspeaker combination and to a method for testing a high-frequency loudspeaker of a loudspeaker combination.

In Niederfrequenz-Endstufen von Lautsprecheranlagen, die z. B. in einem Kraftfahrzeug vorgesehen sind, ist im allgemeinen ein Tiefton- und ein Mittelton-Lautsprecher oder ein Mitteltiefton-Lautsprecher direkt mit den Verstärkern der Niederfrequenz-Endstufen verbunden und ein Hochton-Lautsprecher kapazitiv angekoppelt. Die Funktionsfähigkeit dieser Lautsprecherkombination wird insbesondere beim Einbau in ein Fahrzeug und ggf. in Wartungsintervallen oder bei Fehlfunktionen überprüft. Hierbei können insbesondere Unterbrechungen oder Kurzschlüsse in den Zuleitungen oder in den Lautsprechern auftreten. Die Überprüfung der Tiefton-, Mittelton-, oder Mitteltiefton-Lautsprecher kann direkt resistiv über eine angelegte Gleichspannung erfolgen. Eine entsprechende Überprüfung der kapazitiv angeschlossenen Hochton-Lautsprecher ist hierdurch jedoch nicht möglich. Dementsprechend wird diese Überprüfung in der Regel durch Eingabe eines Hochtonsignals und akustische Wahrnehmung durchgeführt. Eine derartige Überprüfung ist jedoch bei einer automatisierten Fertigung zeitaufwendig und ungenau.In low-frequency power amplifiers of public address systems, the z. As are provided in a motor vehicle, a woofer and a mid-tone speaker or a mid-bass speaker is generally connected directly to the amplifiers of the low-frequency power amplifiers and a high-frequency speaker capacitively coupled. The functionality of this speaker combination is checked in particular when installed in a vehicle and possibly in maintenance intervals or in case of malfunction. This can occur in particular interruptions or short circuits in the leads or in the speakers. The bass, midrange, or midrange woofers can be tested directly resistively via an applied DC voltage. An appropriate review of the capacitively connected tweeters is However, this is not possible. Accordingly, this check is usually performed by entering a high frequency signal and audible perception. However, such verification is time consuming and inaccurate in automated manufacturing.

Weiterhin sind Schaltungsanordnungen bekannt, bei denen die Stromaufnahme eines Endstufen-ICs bei Beaufschlagung mit hoher NF-Frequenz und hohem Ausgangspegel gemessen wird. Hierzu muß entsprechend eine Messeinrichtung in der Stromversorgung der Leistungsendstufen vorgesehen sein.Furthermore, circuit arrangements are known in which the current consumption of an output stage IC is measured when exposed to high NF frequency and high output level. For this purpose, a measuring device must be provided accordingly in the power supply of the power output stages.

Die DE 196 29 781 C1 beschreibt ein Verfahren zur Prüfung einer an eine Brückenendstufe angeschlossene Impedanz und einer Anordnung hierfür. Hierbei wird die Brückendiagonale durch Veränderung des Arbeitspunktes einer Halbbrücke der Brückenendstufe aus dem Gleichgewicht gebracht, so dass sich ein Stromfluss durch die an der Brückenendstufe angeschlossene Impedanz ergibt und die Höhe dieses Stromflusses als Maß für die angeschlossene Impedanz aufgewertet werden kann.The DE 196 29 781 C1 describes a method for testing an impedance connected to a bridge output stage and an arrangement therefor. Here, the bridge diagonal is brought by changing the operating point of a half-bridge of the bridge output stage out of balance, so that there is a current flow through the impedance connected to the bridge output stage and the amount of this current flow can be upgraded as a measure of the connected impedance.

Die DE 196 28 014 A1 beschreibt eine Frequenzweiche für Lautsprecherboxen und eine entsprechende Lautsprecherbox mit einer derartigen Frequenzreiche. Hierbei ist ein Frequenzweichen-Netzwerk aus passiven elektrischen Bauelementen gebildet, von denen ein Teil durch eine elektrische Steuereinrichtung in den elektrischen Werten veränderbar ist. Diese Veränderbarkeit kann insbesondere durch elektronisch ansteuerbare Schaltmittel erfolgen.The DE 196 28 014 A1 describes a crossover for speakers and a corresponding speaker with such a frequency rich. Here, a crossover network is formed of passive electrical components, of which a part can be changed by an electrical control device in the electrical values. This variability can be done in particular by electronically controllable switching means.

Der erfindungsgemässe Diagnoseschaltkreis nach Anspruch 1 sowie das erfindungsgemässe Verfahren nach Anspruch 13 weisen demgegenüber insbesondere den Vorteil auf, dass mit relativ geringem Aufwand eine genaue Messung der Funktionsfähigkeit eines Hochton-Lautsprechers einer Lautsprecherkombination möglich ist. Die Unteransprüche beschreiben bevorzugte Weiterbildungen.The inventive diagnostic circuit according to claim 1 and the inventive method according to claim 13, in contrast, have the particular advantage that with relatively little effort an accurate measurement of the functionality of a tweeter speaker of a speaker combination is possible. The dependent claims describe preferred developments.

Erfindungsgemäß wird somit eine Überprüfung des Hochton-Lautsprechers ermöglicht, indem eine Spannungsteilerschaltung aus einem vorzugsweise rein ohmschen Widerstand und der Lautsprecherkombination gebildet und ein Spannungsabfall innerhalb dieser Spannungsteilerschaltung gemessen und ausgewertet wird. Hierbei kann insbesondere der Spannungsabfall an der Lautsprecherkombination als komplexe Messspannung gemessen werden; grundsätzlich ist jedoch auch eine Messung des Spannungsabfalls an dem Messwiderstand möglich.According to the invention thus a review of the high-frequency speaker is made possible by a voltage divider circuit of a preferably purely ohmic resistance and the speaker combination formed and a voltage drop is measured and evaluated within this voltage divider circuit. In this case, in particular the voltage drop across the loudspeaker combination can be measured as a complex measuring voltage; In principle, however, a measurement of the voltage drop across the measuring resistor is possible.

In der Spannungsteilerschaltung sind der oder die Tiefton-, Mittelton- oder Mitteltieflautsprecher mit dem Koppelkondensator und dem Hochton-Lautsprecher parallel geschaltet. Die Funktionsfähigkeit bzw. der Zustand des Hochton-Lautsprechers wirkt sich hierbei auf den komplexen Gesamtwiderstand der Lautsprecher-Kombination bei der HF-Frequenz aus. Eine Unterbrechung am Hochton-Lautsprecher oder seinen Zuleitungen führt zu einer Erhöhung des Gesamtwiderstandes, ein Kurzschluß entsprechend zu einer Verringerung des Gesamtwiderstandes gegenüber dem Gesamtwiderstand bei funktionsfähigem Hochton-Lautsprecher. Da die für niedrigere Frequenzen ausgelegten Lautsprecher eine höhere Induktivität aufweisen als der Hochton-Lautsprecher, beeinflussen sie das Messsignal hierbei nur gering.In the voltage divider circuit, the one or more woof, midrange or midrange speakers are connected in parallel with the coupling capacitor and the tweeter loudspeaker. The functionality or the condition of the high-frequency loudspeaker has an effect on the complex total resistance of the loudspeaker combination at the RF frequency. An interruption in the tweeter or its leads leads to an increase in the total resistance, a short circuit corresponding to a reduction in the total resistance to the total resistance with functional tweeter speaker. Since the loudspeakers designed for lower frequencies have a higher inductance than the high-frequency loudspeaker, they only have a small influence on the measuring signal.

Die Auswertung der gemessenen komplexen Messspannung kann z.B. durch Messung des gegenüber dem Ausgangssignal phasenverschobenen Spitzenwertes oder über eine Gleichrichterschaltung erfolgen.The evaluation of the measured complex measurement voltage can e.g. by measuring the peak value phase-shifted with respect to the output signal or via a rectifier circuit.

Die Erfindung wird im folgenden anhand der beiliegenden Zeichnungen an einigen Ausführungsformen erläutert. Es zeigen:

Fig. 1
ein Blockschaltbild einer Leistungsendstufe mit einer Diagnoseschaltung gemäss einer ersten Ausführungsform der Erfindung;
Fig. 2
ein Blockschaltbild einer Leistungsendstufe mit einem Diagnoseschaltkreis gemäss einer zweiten Ausführungsform der Erfindung.
The invention will be explained below with reference to the accompanying drawings of some embodiments. Show it:
Fig. 1
a block diagram of a power amplifier with a diagnostic circuit according to a first embodiment of the invention;
Fig. 2
a block diagram of a power amplifier with a diagnostic circuit according to a second embodiment of the invention.

Gemäss Fig. 1 ist ein erster Ausgangsverstärker V1 einer Niederfrequenz-Endstufe über einen ersten Anschluss A1 mit dem Pluspol an der Lautsprecherkombination 4 und ein zweiter Ausgangsverstärker V2 der Niederfrequenz-Endstufe über einen zweiten Anschluss A2 mit dem Minuspol der Lautsprecherkombination 4 verbunden. Die Lautsprecherkombination 4 weist einen Mitteltiefton-Lautsprecher LS1, der an die Anschlüsse A1, A2 angeschlossen ist, und einen über einen Kondensator C7 parallel zu LS1 geschalteten Hochton-Lautsprecher LS2 auf. Zur Diagnose des Hochton-Lautsprechers LS2 sind die Lautsprecher LS1 und LS2 angeschaltet und die Verstärker V1, V2 ausgeschaltet und somit hochohmig. Ein Prozessor 10 gibt ein HF-Eingangssignal s1 aus, das über einen Impedanzwandler 3 als HF-Spannungssignal s2 ausgegeben wird. Der Prozessor 10 bildet somit mit dem Impedanzwandler 3 eine HF-Spannung erzeugende Einrichtung 2. Das HF-Eingangssignal s1 wird über einen Widerstand R2 und einen Kondensator C4 an den ersten Anschluss A1, d.h. den Pluspol der Lautsprecherkombination 4 gegeben. Der zweite Anschluss A2 ist über eine Verbindungseinrichtung 6 an Masse gelegt. An A1 wird von einer Messeinrichtung 11 die an der Lautsprecherkombination 4 sowie der Verbindungseinrichtung 6 abfallende Spannung als komplexe Messspannung UA1 abgegriffen.According to Fig. 1 a first output amplifier V1 of a low-frequency power amplifier is connected via a first terminal A1 to the positive terminal on the loudspeaker combination 4 and a second output amplifier V2 of the low-frequency power amplifier via a second terminal A2 to the negative terminal of the loudspeaker combination 4. The loudspeaker combination 4 comprises a mid-bass speaker LS1 connected to the terminals A1, A2 and a high-frequency loudspeaker LS2 connected in parallel with LS1 via a capacitor C7. For the diagnosis of the high-frequency loudspeaker LS2, the loudspeakers LS1 and LS2 are switched on and the amplifiers V1, V2 are switched off and thus high-impedance. A processor 10 outputs an RF input signal s1, which is output via an impedance converter 3 as an RF voltage signal s2. The processor 10 thus forms, together with the impedance converter 3, an HF voltage generating device 2. The RF input signal s1 is applied via a resistor R2 and a capacitor C4 to the first terminal A1, ie the positive pole of the loudspeaker combination 4. The second terminal A2 is grounded via a connection device 6. At A1, the voltage dropping across the loudspeaker combination 4 and the connecting device 6 is tapped by a measuring device 11 as a complex measuring voltage UA1.

In der HF-Spannungs-erzeugenden Einrichtung 2 wird von dem Prozessor 10 das HF-Eingangssignal s1 mit einer Frequenz von größer/gleich 20 KHz und ein Diagnosesignal d als Gleichspannungssignal ausgegeben. Durch das Diagnosesignal d wird ein Diagnosemodus gesetzt. Der Prozessor 10 schaltet hierbei in nicht gezeigter Weise durch das Diagnosesignal d auch die Ausgangsverstärker V1, V2 hochohmig. Das HF-Spannungssignal s wird über einen Kondensator C2 zusammen mit dem Diagnosesignal d einem Emitterfolge-Transistor V3 des Impedanzwandlers 3 zugeführt, wobei der Arbeitspunkt der Basis des Emitterfolger-Transistors V3 über Widerstände R4, R6 eingestellt ist. Ein weiterer Transistor V4 und ein Widerstand R3 bilden eine an den Emitter von V3 angeschlossene Konstantstromquelle, wobei V4 bei Anliegen des Diagnosesignals d an seiner Basis durchgesteuert wird. Der Impedanzwandler 3 gibt ein HF-Spannungssignal S2 aus, das über den Messwiderstand R2, den Kondensator C4, die Lautsprecherkombination 4 und die Verbindungseinrichtung 6 auf Masse abfällt.In the RF voltage generating device 2, the processor 10 outputs the RF input signal s1 having a frequency of 20 kHz or more and a diagnostic signal d as a DC signal. The diagnostic signal d sets a diagnostic mode. The processor 10 switches in a manner not shown here by the diagnostic signal d and the output amplifier V1, V2 high impedance. The RF voltage signal s is via a capacitor C2 supplied together with the diagnostic signal d an emitter follower transistor V3 of the impedance converter 3, wherein the operating point of the base of the emitter-follower transistor V3 via resistors R4, R6 is set. Another transistor V4 and a resistor R3 form a constant current source connected to the emitter of V3, wherein V4 is turned on when the diagnostic signal d is present at its base. The impedance converter 3 outputs an RF voltage signal S2, which drops to ground via the measuring resistor R2, the capacitor C4, the loudspeaker combination 4 and the connecting device 6.

Die Verbindungseinrichtung 6 weist einen Transistor V5 auf, der von dem Diagnosesignal d ausgesteuert wird und eine an dem zweiten Anschluss A2 anliegende Wechselspannung niederohmig an Masse anlegt. Bei geeigneter Dimensionierung der Kondensatoren C4, C7 fällt somit das HF-Spannungssignal S2 im wesentlichen an einer Reihenschaltung von R2 und den parallel geschalteten Lautsprechern LS1 und LS2 ab.The connecting device 6 has a transistor V5 which is controlled by the diagnostic signal d and applies a low voltage applied to the second terminal A2 AC voltage to ground. With a suitable dimensioning of the capacitors C4, C7, the RF voltage signal S2 thus essentially drops at a series circuit of R2 and the loudspeakers LS1 and LS2 connected in parallel.

Die an A1 anliegende Messspannung UA1 wird von einer Messeinrichtung 11 aufgenommen, die durch einen Widerstand R1, einen Kondensator C8 und den als Auswerteeinrichtung dienenden Prozessor 10 gebildet wird. Die Messspannung UA1 ist insbesondere wegen der Impedanzen von LS1 und LS2 gegenüber S1 phasenverschoben. Bei der in Fig. 1 gezeigten Ausführungsform wird von der Messeinrichtung 11 der phasenverschobene Spitzenwert bestimmt und hieraus bei bekanntem R2 die Impedanz der Lautsprecherkombination 4 ermittelt. Da LS1 eine hohe Induktivität aufweist, wird der Spannungsabfall zwischen A1 und A2 wesentlich durch LS2 bestimmt. Im Fall eines Kurzschlusses wird somit von der Messeinrichtung 11 eine niedrige Messspannung (bzw. Messspannung mit niedrigem Betrag), im Fall einer Unterbrechung bei LS2 eine hohe Messspannung und bei funktionsfähigem Zustand von LS2 eine mittlere Messspannung ermittelt.The measuring voltage UA1 applied to A1 is picked up by a measuring device 11, which is formed by a resistor R1, a capacitor C8 and the processor 10 serving as the evaluation device. The measuring voltage UA1 is phase-shifted relative to S1, in particular because of the impedances of LS1 and LS2. At the in Fig. 1 In the embodiment shown, the phase-shifted peak value is determined by the measuring device 11, and the impedance of the loudspeaker combination 4 is determined therefrom with known R2. Since LS1 has a high inductance, the voltage drop between A1 and A2 is essentially determined by LS2. In the case of a short circuit is thus of the Measuring device 11 a low measuring voltage (or measuring voltage with a low amount), in the case of an interruption at LS2 a high measuring voltage and a functional state of LS2 a mean measuring voltage determined.

Bei der in Fig. 2 gezeigten Ausführungsform wird gegenüber der ersten Ausführungsform eine Messeinrichtung 12 verwendet, bei der ein Widerstand R1, der Kondensator C7, eine Schottky-Diode D1 und ein auf Masse gelegter Kondensator C1 zur Gleichrichtung des aufgenommenen Wechselspannungssignals dienen, so dass der Prozessor 10 eine gleichgerichtete Spannung aufnehmen kann.At the in Fig. 2 In the embodiment shown, a measuring device 12 is used in which a resistor R1, the capacitor C7, a Schottky diode D1 and a grounded capacitor C1 for rectifying the recorded AC signal, so that the processor 10 receive a rectified voltage can.

Claims (17)

  1. Diagnostic circuit for a tweeter in a loudspeaker combination, wherein the diagnostic circuit has:
    a device (2) producing HF signal for outputting an HF voltage signal (s2),
    at least one connection (A1, A2) for a loudspeaker combination (4) that has a tweeter (LS2) and at least one further loudspeaker (SL1) designed for a lower frequency than the tweeter (LS2), wherein the tweeter (LS2) is connected in parallel with the further loudspeaker (LS1) via a capacitor (C7), and that has an amplifier device (V1, V2) connected upstream of it,
    a measuring shunt (R2) that, when a loudspeaker combination (4) is connected to the connection (A1), forms a voltage divider circuit (R2, R4) with said loudspeaker combination,
    a measuring device (10, 11, 12) for measuring a complex measured voltage (UA1), dropping in the voltage divider circuit (R2, 4), when the amplifier device (V1, V2) is switched off and/or at high impedance and ascertaining a state of the tweeter (LS2) of the loudspeaker combination (4) from the measured complex measured voltage (UA1).
  2. Diagnostic circuit according to Claim 1, characterized in that the measuring shunt (R2) is provided between the device (2) producing HF signal and the connection (A1), and the measuring device (11, 12) measures a measured voltage (UA1) dropping essentially across the loudspeaker combination (4).
  3. Diagnostic circuit according to Claim 2, characterized in that the measuring shunt (R2) and the connection (A1) have a capacitor (C4) provided between them.
  4. Diagnostic circuit according to one of the preceding claims, characterized in that the device (2) producing HF signal has an HF signal source (10) for outputting an HF input signal (s1) and a downstream impedance transformer (3) that can be switched on by a DC voltage diagnosis signal (d).
  5. Diagnostic circuit according to Claim 4, characterized in that the impedance transformer (3) has an emitter follower transistor (V3) that picks up the HF input signal (s1) and the diagnosis signal (d).
  6. Diagnostic circuit according to Claim 5, characterized in that the emitter resistor provided for the emitter follower transistor (3) is a current source that can be switched on by the diagnosis signal (d), preferably having a second transistor (V4), wherein the collector of the second transistor (V4) is connected to the emitter of the emitter follower (V3), the emitter of the second transistor (V4) is connected to earth via a resistor (R3), and the base of the second transistor (V4) is actuated by the diagnosis signal (d), preferably also the HF input signal (s1).
  7. Diagnostic circuit according to one of the preceding claims, characterized in that the measuring device (11) ascertains a peak value for the measured voltage.
  8. Diagnostic circuit according to Claim 7, characterized in that the measuring device (11) has a resistor (R1) connected to the connection device (A1), a capacitor (C8) connected to the resistor (R1) and an evaluation device (10).
  9. Diagnostic circuit according to one of Claims 1-7, characterized in that the measuring device (12) has a rectifier circuit (C7, D1, C1) for rectifying the picked-up measured voltage (UA1) and outputting a rectified measured voltage signal to an evaluation device (10).
  10. Diagnostic circuit according to Claim 9, characterized in that the rectifier circuit has a series circuit comprising a resistor (R1), a capacitor (C7) and a Schottky diode (D1), wherein the series circuit is connected to earth via a capacitor (C1).
  11. Diagnostic circuit according to one of the preceding claims, characterized in that the measuring device, when ascertaining a low measured voltage (UA1), infers a short in the tweeter (LS2), takes an average measured voltage (UA1) to infer a proper state of the tweeter (LS2) and takes a high measured voltage (UA1) to infer an interruption at the tweeter (LS2).
  12. Diagnostic circuit according to one of the preceding claims, characterized in that the measuring shunt (R2) is a purely nonreactive resistor.
  13. Method for checking a tweeter in a loudspeaker combination that has a tweeter (LS1) and at least one further loudspeaker (LS1) designed for a lower frequency than the tweeter (LS2), wherein the tweeter (LS2) is connected in parallel with the further loudspeaker (LS1) via a capacitor (C7), and that is operated via an upstream amplifier device (V1, V2), in which
    an HF voltage signal (s2) is output to a voltage divider circuit comprising a measuring shunt (R2) and the loudspeaker combination (4),
    wherein the amplifier device (V1, V2) connected upstream of the loudspeaker combination is switched off and/or at high impedance,
    a complex measured voltage (UA1) dropping in the voltage divider circuit (R2, 4) is measured, and the measured voltage (UA1) is taken to infer a state of the tweeter (LS2).
  14. Method according to Claim 13, characterized in that the measured voltage (UA1) is measured as a voltage drop across the loudspeaker combination.
  15. Method according to Claim 13 or 14, characterized in that ascertainment of a low measured voltage (UA1) across the loudspeaker combination (4) prompts inference of a short at the tweeter (LS2), ascertainment of an average measured voltage (UA1) across the loudspeaker combination (4) prompts inference of a proper state of the tweeter (LS2), and
    ascertainment of a high measured voltage (UA1) across the loudspeaker combination (4) prompts inference of an interruption at the tweeter (LS2).
  16. Method according to one of Claims 13 to 15, characterized in that the peak value of the complex measured voltage is measured and subsequently evaluated.
  17. Method according to one of Claims 13 to 15, characterized in that the complex measured voltage is rectified and subsequently evaluated.
EP03729411.3A 2002-01-17 2003-01-16 Diagnostic circuit for a tweeter in a loudspeaker combination Expired - Lifetime EP1468586B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10201517A DE10201517A1 (en) 2002-01-17 2002-01-17 Diagnostic circuit for a tweeter speaker of a speaker combination
DE10201517 2002-01-17
PCT/DE2003/000105 WO2003061333A2 (en) 2002-01-17 2003-01-16 Diagnostic circuit for a tweeter in a loudspeaker combination

Publications (2)

Publication Number Publication Date
EP1468586A2 EP1468586A2 (en) 2004-10-20
EP1468586B1 true EP1468586B1 (en) 2016-06-01

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Family Applications (1)

Application Number Title Priority Date Filing Date
EP03729411.3A Expired - Lifetime EP1468586B1 (en) 2002-01-17 2003-01-16 Diagnostic circuit for a tweeter in a loudspeaker combination

Country Status (4)

Country Link
US (1) US20050163326A1 (en)
EP (1) EP1468586B1 (en)
DE (1) DE10201517A1 (en)
WO (1) WO2003061333A2 (en)

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KR101434302B1 (en) 2007-07-25 2014-08-27 삼성전자주식회사 Method for detecting badness speaker and the sound apparatus using the same
EP2048896B1 (en) 2007-10-12 2011-12-21 STMicroelectronics Srl Method and circuit for testing an audio high-frequency loudspeaker being part of a loudspeaker system
EP2094030B1 (en) * 2008-02-21 2012-06-20 STMicroelectronics Srl Method for testing the operating conditions of an electric network and apparatus using said method
FR2950146B1 (en) * 2009-09-15 2011-12-09 Sierra Wireless Inc DIAGNOSTIC DEVICE FOR A CORRESPONDING OHIM DEVICE, EQUIPMENT AND ELECTRONIC CIRCUIT
DE102010005746A1 (en) * 2010-01-26 2011-07-28 Fresenius Medical Care Deutschland GmbH, 61352 Medical device
CN104717595B (en) * 2015-03-16 2018-01-26 高创(苏州)电子有限公司 A kind of detection method, the detection means of loudspeaker module function
FR3104115B1 (en) * 2019-12-10 2021-11-26 Psa Automobiles Sa Device for monitoring, on board a motor vehicle, the operation of a vehicle speaker and vehicle fitted with such a device

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Also Published As

Publication number Publication date
DE10201517A1 (en) 2003-08-07
WO2003061333A2 (en) 2003-07-24
WO2003061333A3 (en) 2004-04-15
US20050163326A1 (en) 2005-07-28
EP1468586A2 (en) 2004-10-20

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