EP1166359A1 - Image sensor device - Google Patents
Image sensor deviceInfo
- Publication number
- EP1166359A1 EP1166359A1 EP00909273A EP00909273A EP1166359A1 EP 1166359 A1 EP1166359 A1 EP 1166359A1 EP 00909273 A EP00909273 A EP 00909273A EP 00909273 A EP00909273 A EP 00909273A EP 1166359 A1 EP1166359 A1 EP 1166359A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- image sensor
- sensor device
- storage means
- image
- storage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000758 substrate Substances 0.000 claims abstract description 9
- 230000015654 memory Effects 0.000 claims description 36
- 239000003990 capacitor Substances 0.000 claims description 10
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 3
- 229910000756 V alloy Inorganic materials 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 claims description 2
- 229910021419 crystalline silicon Inorganic materials 0.000 claims description 2
- 210000004027 cell Anatomy 0.000 claims 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims 1
- 229920005591 polysilicon Polymers 0.000 claims 1
- 210000000352 storage cell Anatomy 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 6
- 230000010354 integration Effects 0.000 description 4
- 230000003213 activating effect Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000001454 recorded image Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
Definitions
- the invention relates to an image sensor device consisting of a semiconducting carrier (substrate), in particular in CMOS technology, on which an arrangement of image elements is formed, each image element (pixel) being a photosensitive detector means, means for photoelectrically converting a detected photo signal into an electrical one Signal and electrical storage means for storing the electrical signal are assigned, and wherein a memory control device is provided for pixel-related storage and controlled reading of the electrical signals.
- a device of the type mentioned is known from WO 98/19455, ie PCT / EP97 / 05978. It is an optical image sensor, for example for use in a camera, in which each pixel in each image sequence cycle can record the complete color information in accordance with the lighting incident on it and provide it in electronic form. Each pixel of the matrix-organized sensor structure has several information stores in order to be able to temporarily store the different color information at the same time. In addition, the sensor contains controllable detector elements, which can be changed in their spectral sensitivity.
- CCD image sensor devices in the form of CCD image sensors are known from the prior art, for example from “CCD-CMOS Image Sensor for Ultra-High Speed Image Capturing", from 1999 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, June 10 -12, 1999, Karuizawa, Nagano, Japan, pp. 99-102.
- photoelectric sensor devices which are designed in the form of three chips, an image sensor, a memory and the associated memory control device (controller). This solution therefore has three separate chips.
- Another variant of a sensor device for a digital camera provides for the memory arrangement with the corresponding memory controller to be arranged on the same chip outside the sensor area.
- the known devices require that the readings of the measured values recorded by the sensor and converted into electrical signals take place immediately after each recorded image - usually using known compression methods, such as JPEG - and a storage in an external storage device. Only after performing these steps is the sensor ready for the subsequent exposure.
- a conventional sensor thus has the disadvantage that ultra-fast image sequences are not possible due to the transmission times required by the readout process. If the memory and the image sensor are implemented within one chip, the memory takes up a considerable part of the total chip area.
- the object of the invention is to further develop an image sensor device of the type mentioned at the outset in such a way that on the one hand the use of the area of the chip becomes more effective and on the other hand it can be used in high-speed cameras.
- the memory control device is designed in such a way that photoelectrically converted signals recorded one after the other in the individual picture element can be stored in different storage means and can be read out from them at a predeterminable time.
- the invention is characterized in that the image sensor device in the manner of an "electronic film" enables the recording of several images in succession without the image information having to be read out in between. Rather, the multiple storage means assigned to each picture element (pixel), controlled by the storage control device, are used to store them one after the other following images in the respective storage medium. After the end of the recording of all the pictures in the "film", the corresponding storage values can then be read out and reproduced promptly, regardless of the recording process.
- the storage period is only limited by the physical volatility of the information. Otherwise the readout time can be freely selected by the user. For example, 36 black / white images or 24 color images can be stored - depending on the black / white or color detector used. This also enables the recording of ultra-fast image sequences with high-speed cameras.
- Another advantage of the solution according to the invention can be seen in the fact that the sensor surface is used more effectively, since no additional or separate space on the image sensor surface has to be made available for the memory. Rather, the arrangement of the storage means is integrated pixel by pixel in the detector, since the individual memory cells are arranged directly below or next to the detector or within it. As a result of the arrangement according to the invention, the detector and the memory matrix are now “pixel-by-pixel”.
- Photodetectors made of crystalline silicon or amorphous silicon can be used as detector means, but also those made of III-V alloys, II-VI alloys or organic or any other detector device for converting light into an electrical signal.
- the sensors used can be sensitive to visible light, UV light, IR light, X-rays or any other radiation that can be converted into an electrical signal.
- the storage means can store the electrical signals either in analog or digital representation, but also in a mixed form, such as multi-level digital technology, in which several digital bits are represented in an amplitude-discretized analog signal.
- each pixel contains a device for analog-to-digital conversion, such as a single slope, dual slope, cyclic pipeline or sigma-delta A / D converter.
- the storage means can be arranged laterally next to one another or integrated vertically one above the other or use both types of integration simultaneously.
- Vertical integration is also known as 3D integration and represents the use of the third spatial dimension to increase the number and density of electrical elements that can be achieved on a given surface.
- the storage means can be designed as capacities or as EPROM, EEPROM or DRAM cells, regardless of whether analog or digital signals are to be stored. Digital signals can also be stored in SRAM cells. Magnetic, optical, organic, biological or any other type of memory cell can also be used. If electrical capacitors are used, trench, trench or planar capacitors are known, advantageous designs.
- 1 shows a first embodiment of an image sensor device according to the invention
- 2 shows a second exemplary embodiment of an image sensor device according to the invention
- FIG. 3 shows a third exemplary embodiment of an image sensor device according to the invention
- Fig. 4 is a circuit diagram for explaining the operation of an image sensor device according to the invention.
- Fig. 1 shows an image sensor device as it is the subject of the first embodiment of the invention.
- the arrangement consists of a substrate 1 serving as a carrier, which is formed using conventional CMOS technology.
- An electronic circuit device 2 is integrated in the surface of the substrate 1 and is used to control the electronic memory arrangement described below.
- a storage level 5 is deposited on the surface of the substrate 1, on the surface of which there is in turn a detector layer 4.
- the underside of the detector layer 4 is connected to the electronic control device 2 via a via 6.
- a plurality of separate electrical storage means 3 are arranged within the storage level 5 and are likewise connected to the control device 2 via further plated-through holes 10.
- the multiple storage means C1, C2, CN are e.g. designed as plate capacitors.
- the image to be recorded falls from above onto the detector layer 4 and the image information corresponding to the pixel under consideration is photoelectrically converted and m is read into the first memory C1 as electrical information.
- the reading-in process is controlled by the pixel electronics 2 acting as a memory control device.
- the memory control device 2 operates in such a way that the image information then incident on the pixel - converted into an electrical signal - is read into the second memory means C2, etc., etc. until all the storage means C1 to CN are filled, the number of which corresponds to the maximum image recording quantity.
- the individual memory values C1, C2, CN are read out of the memory cells into an additional memory (not shown), from which the further processing of the image information, in particular the assembly of the overall image, takes place.
- the particular advantage is therefore that the image information is stored in a pixel-uniform manner, from which the individual images can then be reconstructed later. Due to the elimination of the respective readout processes directly after the individual recording, high-speed recordings that were previously impossible have been possible.
- the second exemplary embodiment of the invention shown in FIG. 2 differs from the representation according to FIG. 1 in that the detector 4 is located as a layer system directly above the substrate 1 and is connected via the via layer 6 to the pixel electronics 2 operating as a memory control unit.
- the plurality of memory elements 3, which in turn are assigned to the individual pixel delimited by the vertical lines, are arranged in the same horizontal plane as the pixel control device 2.
- the third exemplary embodiment shown in FIG. 3 is characterized in that the CMOS substrate 1 has both the memory control electronics 2 and the plurality of memory elements 3 and finally also the detector device 4 in a common horizontal plane.
- the detector device 4 is designed as a photodiode. With this arrangement, a via, as shown in FIGS. 1 and 2, can be omitted.
- the detector layer 4 can alternatively be designed both as a simple photodiode and as a photodiode with a color mosaic filter or as a multispectral diode, as is shown in more detail in the prior art of WO 98/19455.
- FIG. 4 shows an electronic circuit as it is exemplary for the control of the image sensor device shown in one of the exemplary embodiments 1 to 3.
- the photocurrent supplied by the detector is via the inverters M4, M5 / capacitor Ci Combination converted into a voltage proportional to the photocurrent (see WO 98/19455, ie PCT / EP97 / 05978).
- the inverter ensures a constant potential at the detector cathode K.
- the integration time After activating int and deactivating the reset signal, the integration time begins and the image information is saved as a voltage value in one of the memory elements selected by PicO..Pic3 and connected to CpO..Cp3.
- the image acquisition is ended by deactivating int. After a short reset phase, another image can be taken by selecting a different memory without first reading it out. After all the memories have been occupied (in the example, the four memory elements corresponding to the connections CpO..Cp3), by activating the read_int signal via the driver stage MIO, the stored images can be successively read out by activating the corresponding control signals PicO .. Pic3.
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- Physics & Mathematics (AREA)
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- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
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Abstract
The invention relates to an image sensor device consisting of a semiconducting carrier (substrate) (1) which is especially embodied by means of CMOS technique. An arrangement of image elements is embodied on the carrier. A photosensitive detecting means (4), means for converting a detected photo signal into an electrical signal in a photoelectrical manner and electrical storing means (3) for storing the electrical signal are allocated to each image element (pixel). A storage control device (2) is provided for image-specific storing and reading out the electrical signals in a controlled manner. The aim of the invention is to improve an image sensor in such a way that the area of the chip is used more efficiently and that high-speed cameras can be used. To this end, the storage control device (2) is designed in such a way that signals which are detected one after the other and which have been converted in a photoelectric manner can be stored in different storing means (3) in the pixel and that said signals can be read-out of said storing means (3) at predetermined time.
Description
BILDSENSOREINRICHTUNG IMAGE SENSOR DEVICE
Die Erfindung betrifft eine Bildsensoreinrichtung bestehend aus einem halbleitenden, insbesondere in CMOS- Technik ausgebildeten Träger (Substrat) , auf dem eine Anordnung von Bildelementen ausgebildet ist, wobei jedem Bildelement (Pixel) ein photosensitives Detektormittel, Mittel zur photoelektrischen Umwandlung eines detektierten Photosignals in ein elektrisches Signal und elektrische Speichermittel zur Speicherung des elektrischen Signals zugeordnet sind, und wobei eine Speichersteuereinrichtung vorgesehen ist zum bildelementbezogenen Abspeichern und gesteuerten Auslesen der elektrischen Signale.The invention relates to an image sensor device consisting of a semiconducting carrier (substrate), in particular in CMOS technology, on which an arrangement of image elements is formed, each image element (pixel) being a photosensitive detector means, means for photoelectrically converting a detected photo signal into an electrical one Signal and electrical storage means for storing the electrical signal are assigned, and wherein a memory control device is provided for pixel-related storage and controlled reading of the electrical signals.
Eine Vorrichtung der eingangs genannten Art ist aus der WO 98/19455, d.h. PCT/EP97/05978, bekannt. Es handelt sich dabei um einen optischen Bildsensor, z.B. für die Anwendung in einer Kamera, bei dem jeder Bildpunkt (Pixel) in jedem Bildfolgezyklus die komplette Farbinformation nach Maßgabe der auf ihn auftreffenden Beleuchtung aufzeichnen und in elektronischer Form bereitstellen kann. Dabei verfügt jeder Bildpunkt der matrixorganisierten Sensorstruktur über mehrere Informationsspeicher, um die verschiedenen Farbinformationen gleichzeitig Zwischenspeichern zu können. Darüber hinaus enthält der Sensor steuerbare Detektorelemente, welche sich in ihrer spektralen Empfindlichkeit verändern lassen.
Bildsensorvorrichtungen anderer Bauart sind in Form von CCD-Bildsensoren aus dem Stand der Technik bekannt, beispielsweise aus "CCD-CMOS Image Sensor for Ultra-High Speed Image Capturing", aus 1999 IEEE Workshop on Charge- Coupled Devices and Advanced Image Sensors, June 10-12, 1999, Karuizawa, Nagano, Japan, S. 99-102.A device of the type mentioned is known from WO 98/19455, ie PCT / EP97 / 05978. It is an optical image sensor, for example for use in a camera, in which each pixel in each image sequence cycle can record the complete color information in accordance with the lighting incident on it and provide it in electronic form. Each pixel of the matrix-organized sensor structure has several information stores in order to be able to temporarily store the different color information at the same time. In addition, the sensor contains controllable detector elements, which can be changed in their spectral sensitivity. Other types of image sensor devices in the form of CCD image sensors are known from the prior art, for example from "CCD-CMOS Image Sensor for Ultra-High Speed Image Capturing", from 1999 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, June 10 -12, 1999, Karuizawa, Nagano, Japan, pp. 99-102.
Aus "A Passive Photodiode Pixel with Memory" aus 1999 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, June 10-12, 1999, Karuizawa, Nagano, Japan, S. 84-87, ist eine andere Bildsensoranordnung bekannt, die einen herkömmlichen passiven Photosensor weiterentwickelt, indem ein Ladungsspeicher in Form eines separaten Kondensators vorgeschlagen wird.Another image sensor arrangement is known from "A Passive Photodiode Pixel with Memory" from 1999 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, June 10-12, 1999, Karuizawa, Nagano, Japan, pp. 84-87 Conventional passive photosensor developed by proposing a charge storage in the form of a separate capacitor.
In der Anwendung für digitale Kameras sind photoelektrische Sensoreinrichtungen bekannt, die in Form von drei Chips ausgebildet sind, ein Bildsensor, ein Speicher sowie die zugeordnete Speichersteuereinrichtung (Controller) . Diese Lösung weist somit drei separate Chips auf.In the application for digital cameras, photoelectric sensor devices are known which are designed in the form of three chips, an image sensor, a memory and the associated memory control device (controller). This solution therefore has three separate chips.
In einer anderen Variante einer Sensoreinrichtung für eine digitale Kamera ist vorgesehen, daß die Speicheranordnung mit der entsprechenden Speichersteuerung auf demselben Chip außerhalb der Sensorfläche angeordnet ist.Another variant of a sensor device for a digital camera provides for the memory arrangement with the corresponding memory controller to be arranged on the same chip outside the sensor area.
Die bekannten Vorrichtungen erfordern in ihrer Anwendung für digitale Kameras, daß unmittelbar nach jedem aufgenommenen Bild ein Auslesevorgang der vom Sensor aufgenommenen und in elektrische Signale umgewandelten Meßwerte erfolgt - üblicherweise unter Anwendung
bekannter Kompressionsverfahren, wie JPEG - sowie ein Ablegen in eine externe Speichervorrichtung. Erst nach Durchführen dieser Schritte ist der Sensor bereit für die nachfolgende Aufnahme.In their use for digital cameras, the known devices require that the readings of the measured values recorded by the sensor and converted into electrical signals take place immediately after each recorded image - usually using known compression methods, such as JPEG - and a storage in an external storage device. Only after performing these steps is the sensor ready for the subsequent exposure.
Ein herkömmlicher Sensor besitzt somit den Nachteil, daß ultraschnelle Bildfolgen aufgrund der durch den Auslesevorgang erforderlichen Übertragungszeiten nicht möglich sind. Falls Speicher und Bildsensor innerhalb eines Chips realisiert werden, nimmt der Speicher einen erheblichen Teil der Gesamtchipfläche in Anspruch.A conventional sensor thus has the disadvantage that ultra-fast image sequences are not possible due to the transmission times required by the readout process. If the memory and the image sensor are implemented within one chip, the memory takes up a considerable part of the total chip area.
Davon ausgehend liegt der Erfindung die Aufgabe zugrunde, eine Bildsensoreinrichtung der eingangs genannten Art dahingehend weiter zu entwickeln, daß zum einen die Flächennutzung des Chips effektiver wird und zum anderen eine Verwendung in Hochgeschwindigkeitskameras ermöglicht wird.Proceeding from this, the object of the invention is to further develop an image sensor device of the type mentioned at the outset in such a way that on the one hand the use of the area of the chip becomes more effective and on the other hand it can be used in high-speed cameras.
Diese Aufgabe wird erfindungsgemäß dadurch gelöst, daß die Speichersteuereinrichtung so gestaltet ist, daß im einzelnen Bildelement zeitlich nacheinander erfaßte photoelektrisch gewandelte Signale in unterschiedlichen Speichermitteln abspeicherbar und zu einer vorgebbaren Zeit aus ihnen auslesbar sind.This object is achieved according to the invention in that the memory control device is designed in such a way that photoelectrically converted signals recorded one after the other in the individual picture element can be stored in different storage means and can be read out from them at a predeterminable time.
Die Erfindung zeichnet sich dadurch aus, daß die Bildsensoreinrichtung in der Art eines "elektronischen Films" die Aufnahme mehrerer Bilder hintereinander ermöglicht, ohne daß die Bildinformationen zwischendurch ausgelesen werden müssen. Vielmehr erfolgt durch die jedem Bildelement (Pixel) zugeordneten mehreren Speichermittel - gesteuert mittels der Speichersteuereinrichtung - ein Ablegen der nacheinander
folgenden Bildaufnahmen im jeweiligen Speichermittel. Nach Ende der Aufnahme aller Bilder des "Films" können die entsprechenden Speicherwerte anschließend zeitnah aber grundsätzlich unabhängig vom Aufnahmevorgang ausgelesen und wiedergegeben werden. Die Speicherdauer ist dabei lediglich durch die physikalische Flüchtigkeit der Information nach oben hin begrenzt. Ansonsten kann der Auslesezeitpunkt vom Benutzer frei vorgewählt werden. Somit kann beispielsweise eine Speicherung von 36 Schwarz/weiß-Bildern oder von 24 Farbbildern - je nach verwendetem Schwarz/weiß- oder Farbdetektormittel - realisiert werden. Dies ermöglicht auch die Aufnahme von ultraschnellen Bildfolgen mit Hochgeschwindigkeitskameras .The invention is characterized in that the image sensor device in the manner of an "electronic film" enables the recording of several images in succession without the image information having to be read out in between. Rather, the multiple storage means assigned to each picture element (pixel), controlled by the storage control device, are used to store them one after the other following images in the respective storage medium. After the end of the recording of all the pictures in the "film", the corresponding storage values can then be read out and reproduced promptly, regardless of the recording process. The storage period is only limited by the physical volatility of the information. Otherwise the readout time can be freely selected by the user. For example, 36 black / white images or 24 color images can be stored - depending on the black / white or color detector used. This also enables the recording of ultra-fast image sequences with high-speed cameras.
Ein weiterer Vorteil der erfindungsgemäßen Lösung ist darin zu sehen, daß eine effektivere Ausnutzung der Sensorfläche erfolgt, da kein zusätzlicher bzw. separater Platz auf der Bildsensorfläche für den Speicher zur Verfügung gestellt werden muß. Vielmehr erfolgt die Anordnung der Speichermittel pixelweise integriert in den Detektor, da die einzelnen Speicherzellen unmittelbar unter oder neben dem Detektor oder innerhalb derselben angeordnet sind. Durch die erfindungsgemäße Anordnung sind also nunmehr der Detektor und die Speichermatrix "pixelweise vereint".Another advantage of the solution according to the invention can be seen in the fact that the sensor surface is used more effectively, since no additional or separate space on the image sensor surface has to be made available for the memory. Rather, the arrangement of the storage means is integrated pixel by pixel in the detector, since the individual memory cells are arranged directly below or next to the detector or within it. As a result of the arrangement according to the invention, the detector and the memory matrix are now “pixel-by-pixel”.
Bevorzugte Ausführungsformen der Erfindung ergeben sich aus den Unteransprüchen:Preferred embodiments of the invention result from the subclaims:
Als Detektormittel können Photodetektoren aus kristallinem Silizium oder amorphem Silizium verwendet werden, aber auch solche aus III-V-Legierungen,
II-VI-Legierungen oder organische oder jede andere Detektorvorrichtung zur Wandlung von Licht in ein elektrisches Signal. Die verwendeten Sensoren können für sichtbares Licht, UV-Licht, IR-Licht, Rötgenstrahlen oder jede andere Strahlung empfindlich sein, die in ein elektrisches Signal wandelbar ist.Photodetectors made of crystalline silicon or amorphous silicon can be used as detector means, but also those made of III-V alloys, II-VI alloys or organic or any other detector device for converting light into an electrical signal. The sensors used can be sensitive to visible light, UV light, IR light, X-rays or any other radiation that can be converted into an electrical signal.
Eine vorteilhafte Weiterbildung der Vorrichtung speichert mehrere farbige Bilder, beispielsweise durch Aufbringung von Farb-Mosaikfiltern, wie sie beispielsweise in der Farb-CCD-Technologie gängig sind oder durch Verwendung einer multispektralen Diode, wie sie im Stand der Technik der PCT/EP97/05978 beschrieben ist.An advantageous further development of the device stores several colored images, for example by applying color mosaic filters, as are common, for example, in color CCD technology, or by using a multispectral diode, as described in the prior art of PCT / EP97 / 05978 is.
Die Speichermittel können die elektrischen Signale entweder in analoger oder in digitaler Repräsentierung speichern, aber auch in einer Mischform, wie beispielsweise der Multilevel-Digitaltechnik, bei der in einem amplitudendiskretisierten Analogsignal mehrere digitale Bits repräsentiert werden. Zur Speicherung des Signals in digitaler Repräsentierung enthält jedes Pixel eine Vorrichtung zur Analog-Digitalwandlung, wie beispielsweise einen Single-Slope-, Dual-Slope-, Cyclic- Pipeline- oder Sigma-Delta-A/D-Wandler .The storage means can store the electrical signals either in analog or digital representation, but also in a mixed form, such as multi-level digital technology, in which several digital bits are represented in an amplitude-discretized analog signal. To store the signal in digital representation, each pixel contains a device for analog-to-digital conversion, such as a single slope, dual slope, cyclic pipeline or sigma-delta A / D converter.
Eine weitere vorteilhafte Weiterbildung der Vorrichtung verwendet einen reziproken A/D-Wandler, der nicht direkt die Intensität des elektrischen Signals digitalisiert, sondern die Zeit mißt, die das Signal benötigt, um eine bestimmte Wirkung zu erreichen, d.h. zum Beispiel die Zeit, die der beleuchtungsproportionale Photostrom braucht, um eine Kapazität um eine definierte Spannungsdifferenz umzuladen.
Die Speichermittel, ob analog oder digital, können lateral nebeneinander liegend angeordnet oder vertikal übereinander integriert werden oder beide Integrationsweisen gleichzeitig nutzen. Die vertikale Integration wird auch als 3D-Integration bezeichnet und stellt die Nutzung der dritten Raumdimension dar zur Erhöhung der errreichbaren Anzahl und Dichte elektrischer Elemente auf einer gegebenen Fläche.Another advantageous development of the device uses a reciprocal A / D converter, which does not directly digitize the intensity of the electrical signal, but measures the time it takes for the signal to achieve a certain effect, ie for example the time the Illumination-proportional photocurrent needs to recharge a capacity by a defined voltage difference. The storage means, whether analog or digital, can be arranged laterally next to one another or integrated vertically one above the other or use both types of integration simultaneously. Vertical integration is also known as 3D integration and represents the use of the third spatial dimension to increase the number and density of electrical elements that can be achieved on a given surface.
In einer weiteren vorteilhaften Weiterbildung, bei der die Speichermittel vertikal integriert werden, befinden sich neben jedem Speichermittel auf derselben vertikalen Ebene weitere elektrisch aktive Bauelemente, wie z.B. Transistoren, die entweder bei der Einspeicherung oder/und bei der Wiederauslese der Informationen aus dem Speichermittel benötigt werden.In a further advantageous further development, in which the storage means are integrated vertically, in addition to each storage means, further electrically active components are located on the same vertical level, e.g. Transistors that are required either when storing and / or when reading the information out of the storage means.
Die Speichermittel können als Kapazitäten ausgebildet sein oder als EPROM-, EEPROM- oder DRAM-Zellen, unabhängig davon, ob analoge oder digitale Signale zu speichern sind. Digitale Signale können auch in SRAM- Zellen gespeichert werden. Magnetische, optische, organische, biologische oder jede andere Art von Speicherzellen sind ebenfalls verwendbar. Finden elektrische Kondensatoren Verwendung, so sind Trench-, Graben- oder planare Kondensatoren bekannte, vorteilhafte Ausführungen.The storage means can be designed as capacities or as EPROM, EEPROM or DRAM cells, regardless of whether analog or digital signals are to be stored. Digital signals can also be stored in SRAM cells. Magnetic, optical, organic, biological or any other type of memory cell can also be used. If electrical capacitors are used, trench, trench or planar capacitors are known, advantageous designs.
Die Erfindung wird im folgenden anhand von Ausführungsbeispiele darstellenden Zeichnungen näher erläutert. Dabei zeigenThe invention is explained in more detail below with reference to drawings showing exemplary embodiments. Show
Fig. 1 ein erstes Ausführungsbeispiel einer erfindungsgemäßen Bildsensoreinrichtung,
Fig. 2 ein zweites Ausführungsbeispiel einer erfindungsgemäßen Bildsensoreinrichtung,1 shows a first embodiment of an image sensor device according to the invention, 2 shows a second exemplary embodiment of an image sensor device according to the invention,
Fig. 3 ein drittes Ausführungsbeispiel einer erfindungsgemäßen Bildsensoreinrichtung,3 shows a third exemplary embodiment of an image sensor device according to the invention,
Fig. 4 ein Schaltungsdiagramm zur Erläuterung der Wirkungsweise einer erfindungsgemäßen Bildsensoreinrichtung.Fig. 4 is a circuit diagram for explaining the operation of an image sensor device according to the invention.
Fig. 1 zeigt eine Bildsensoreinrichtung, wie sie Gegenstand des ersten Ausführungsbeispiels der Erfindung ist. Die Anordnung besteht aus einem als Träger dienenden Substrat 1, welches in herkömmlicher CMOS-Technik ausgebildet ist. In der Oberfläche des Substrats 1 ist eine elektronische Schaltungsvorrichtung 2 integriert, welche zur Steuerung der im folgenden beschriebenen elektronischen Speicheranordnung dient. Dazu ist auf der Oberfläche des Substrats 1 eine Speicherebene 5 abgeschieden, auf deren Oberfläche wiederum sich eine Detektorschicht 4 befindet. Die Unterseite der Detektorschicht 4 ist über eine Durchkontaktierung 6 mit der elektronischen Steuereinrichtung 2 verbunden. Innerhalb der Speicherebene 5 sind mehrere separate elektrische Speichermittel 3 angeordnet, welche über weitere Durchkontaktierungen 10 ebenfalls mit der Steuereinrichtung 2 verbunden sind. Die mehreren Speichermittel Cl, C2, CN sind z.B. als Plattenkondensatoren ausgebildet .Fig. 1 shows an image sensor device as it is the subject of the first embodiment of the invention. The arrangement consists of a substrate 1 serving as a carrier, which is formed using conventional CMOS technology. An electronic circuit device 2 is integrated in the surface of the substrate 1 and is used to control the electronic memory arrangement described below. For this purpose, a storage level 5 is deposited on the surface of the substrate 1, on the surface of which there is in turn a detector layer 4. The underside of the detector layer 4 is connected to the electronic control device 2 via a via 6. A plurality of separate electrical storage means 3 are arranged within the storage level 5 and are likewise connected to the control device 2 via further plated-through holes 10. The multiple storage means C1, C2, CN are e.g. designed as plate capacitors.
Die Darstellung nach Fig. 1 zeigt zwischen den vertikalen Linien die Begrenzung eines einzelnen Bildelementes, d.h. der hierdurch gebildete Abstand entspricht genau einem
Pixel. Die Wirkungsweise der erfindungsgemaßen Vorrichtung ist wie folgt: Das aufzunehmende Bild fallt von oben auf die Detektorschicht 4 und die dem betrachteten Pixel entsprechende Bildmformation wird photoelektrisch umgewandelt und m den ersten Speicher Cl als elektrische Information eingelesen. Der Einlesevorgang erfolgt gesteuert über die als Speichersteuereinrichtung wirkende Pixelelektronik 2. Wenn die nächste Aufnahme erfolgt, arbeitet die Speichersteuereinrichtung 2 derart, daß die dann auf den Bildpunkt einfallende Bildmformation - gewandelt in ein elektrisches Signal - n das zweite Speichermittel C2 eingelesen wird, usw., bis alle Speichermittel Cl bis CN aufgefüllt sind, wobei deren Anzahl der maximalen Bildaufnahmemenge entspricht.1 shows the delimitation of a single picture element between the vertical lines, that is to say the distance formed thereby corresponds exactly to one Pixel. The operation of the device according to the invention is as follows: the image to be recorded falls from above onto the detector layer 4 and the image information corresponding to the pixel under consideration is photoelectrically converted and m is read into the first memory C1 as electrical information. The reading-in process is controlled by the pixel electronics 2 acting as a memory control device. When the next picture is taken, the memory control device 2 operates in such a way that the image information then incident on the pixel - converted into an electrical signal - is read into the second memory means C2, etc., etc. until all the storage means C1 to CN are filled, the number of which corresponds to the maximum image recording quantity.
Im Anschluß an die Aufnahme der Bilder erfolgt das Auslesen der einzelnen Speicherwerte Cl, C2, CN aus den Speicherzellen in einen nicht dargestellten Zusatzspeicher, aus dem dann die weitere Verarbeitung der Bildinformation, insbesondere das Zusammensetzen des Gesamtbildes, erfolgt. Der besondere Vorteil besteht also darin, daß ein pixelweise vereinheitlichtes Abspeichern der Bildmformationen erfolgt, aus denen dann spater die einzelnen Aufnahmen rekonstruiert werden können. Aufgrund des Entfallens der jeweiligen Auslesevorgange direkt nach der einzelnen Aufnahme können bisher nicht mögliche Hochgeschwindigkeitsaufnahmen vorgenommen werden.Following the recording of the images, the individual memory values C1, C2, CN are read out of the memory cells into an additional memory (not shown), from which the further processing of the image information, in particular the assembly of the overall image, takes place. The particular advantage is therefore that the image information is stored in a pixel-uniform manner, from which the individual images can then be reconstructed later. Due to the elimination of the respective readout processes directly after the individual recording, high-speed recordings that were previously impossible have been possible.
Insgesamt ergibt sich also durch eine entsprechende Anordnung der Pixelelemente auf der Oberflache des Bildsensors und die Organisation der Speichersteueranordnung die Funktion eines "elektronischen Films".
Das in Fig. 2 dargestellte zweite Ausführungsbeispiel der Erfindung weist gegenüber der Darstellung nach Fig. 1 den Unterschied auf, daß sich der Detektor 4 als Schichtsystem direkt oberhalb des Substrates 1 befindet und über die Durchkontaktierungsschicht 6 mit der als Speichersteuereinheit arbeitenden Pixelelektronik 2 verbunden ist. Die mehreren Speicherelemente 3, die wiederum dem einzelnen, durch die senkrechten Linien begrenzten Pixel zugeordnet sind, sind in derselben Horizontalebene wie die Pixelsteuereinrichtung 2 angeordnet .Overall, a corresponding arrangement of the pixel elements on the surface of the image sensor and the organization of the memory control arrangement result in the function of an "electronic film". The second exemplary embodiment of the invention shown in FIG. 2 differs from the representation according to FIG. 1 in that the detector 4 is located as a layer system directly above the substrate 1 and is connected via the via layer 6 to the pixel electronics 2 operating as a memory control unit. The plurality of memory elements 3, which in turn are assigned to the individual pixel delimited by the vertical lines, are arranged in the same horizontal plane as the pixel control device 2.
Das in Fig. 3 dargestellte dritte Ausführungsbeispiel ist dadurch gekennzeichnet, daß das CMOS-Substrat 1 sowohl die Speichersteuerelektronik 2 als auch die mehreren Speicherelemente 3 und schließlich auch die Detektoreinrichtung 4 in einer gemeinsamen Horizontalebene aufweist. Dabei ist die Detektoreinrichtung 4 als Photodiode ausgebildet. Bei dieser Anordnung kann eine Durchkontaktierung, wie sie in den Fig. 1 und 2 dargestellt ist, entfallen.The third exemplary embodiment shown in FIG. 3 is characterized in that the CMOS substrate 1 has both the memory control electronics 2 and the plurality of memory elements 3 and finally also the detector device 4 in a common horizontal plane. The detector device 4 is designed as a photodiode. With this arrangement, a via, as shown in FIGS. 1 and 2, can be omitted.
Die Detektorschicht 4 kann alternativ sowohl als einfache Photodiode als auch als Photodiode mit Farbmosaikfilter oder aber als Multispektraldiode ausgebildet sein, wie sie im Stand der Technik der WO 98/19455 näher dargestellt ist.The detector layer 4 can alternatively be designed both as a simple photodiode and as a photodiode with a color mosaic filter or as a multispectral diode, as is shown in more detail in the prior art of WO 98/19455.
Fig. 4 zeigt eine elektronische Schaltung, wie sie beispielhaft ist für die Ansteuerung der in einem der Ausführungsbeispiele 1 bis 3 dargestellten Bildsensoreinrichtung. Der vom Detektor gelieferte Photostrom wird über die Inverter M4, M5 / Kondensator Ci
Kombination in eine dem Photostrom proportionale Spannung umgewandelt (s. WO 98/19455, d.h. PCT/EP97/05978) . Gleichzeitig gewährleistet der Inverter ein konstantes Potential an der Detektorkathode K.FIG. 4 shows an electronic circuit as it is exemplary for the control of the image sensor device shown in one of the exemplary embodiments 1 to 3. The photocurrent supplied by the detector is via the inverters M4, M5 / capacitor Ci Combination converted into a voltage proportional to the photocurrent (see WO 98/19455, ie PCT / EP97 / 05978). At the same time, the inverter ensures a constant potential at the detector cathode K.
Nach Aktivierung von int und Deaktivierung des Signales reset beginnt die Integrationszeit und die Bildinformation wird als Spannungswert in einer der durch PicO..Pic3 angewählten und an CpO..Cp3 angeschlossenen Speicherelemente gespeichert. Die Bildaufnahme wird durch Deaktivierung von int beendet. Nach einer kurzen Resetphase kann durch Auswahl eines anderen Speichers ohne vorherige Auslese ein weiteres Bild aufgenommen werden. Nach Belegung sämtlicher Speicher (im Beispiel die vier den Anschlüssen CpO..Cp3 entsprechenden Speicherelemente) können durch Aktivierung des Signals read_int über die Treiberstufe MIO die gespeicherten Bilder sukzessive durch Aktivierung der entsprechenden Steuersignale PicO .. Pic3 ausgelesen werden.
After activating int and deactivating the reset signal, the integration time begins and the image information is saved as a voltage value in one of the memory elements selected by PicO..Pic3 and connected to CpO..Cp3. The image acquisition is ended by deactivating int. After a short reset phase, another image can be taken by selecting a different memory without first reading it out. After all the memories have been occupied (in the example, the four memory elements corresponding to the connections CpO..Cp3), by activating the read_int signal via the driver stage MIO, the stored images can be successively read out by activating the corresponding control signals PicO .. Pic3.
Claims
1. Bildsensoreinrichtung bestehend aus einem halbleitenden, insbesondere in CMOS-Technik, ausgebildeten Träger (Substrat) (1), auf dem eine Anordnung von Bildelementen ausgebildet ist, wobei jedem Bildelement (Pixel) ein photosensitives Detektormittel1. Image sensor device consisting of a semiconducting carrier (substrate) (1), in particular in CMOS technology, on which an arrangement of image elements is formed, each image element (pixel) having a photosensitive detector means
(4) , Mittel zur photoelektrischen Umwandlung eines detektierten Photosignals in ein elektrisches Signal und elektrische Speichermittel (3) zur Speicherung des elektrischen Signals zugeordnet sind, und wobei eine Speichersteuereinrichtung (2) vorgesehen ist zum bildelementbezogenen Abspeichern und gesteuerten Auslesen der elektrischen Signale, d a d u r c h g e k e n n z e i c h n e t , d a ß die Speichersteuereinrichtung (2) so gestaltet ist, daß im einzelnen Bildelement zeitlich nacheinander erfaßte photoelektrisch gewandelte Signale in unterschiedlichen Speichermitteln (3) abspeicherbar und zu einer vorgebbaren Zeit aus ihnen auslesbar sind.(4), means for photoelectric conversion of a detected photo signal into an electrical signal and electrical storage means (3) for storing the electrical signal are assigned, and wherein a memory control device (2) is provided for pixel-related storage and controlled reading of the electrical signals, characterized in that da ß the memory control device (2) is designed so that in the individual picture element temporally sequentially detected photoelectrically converted signals in different storage means (3) can be stored and read out from them at a predetermined time.
2. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß die Bildsensoreinrichtung eine lineare Anordnung von Bildelementen aufweist.2. Image sensor device according to claim 1, d a d u r c h g e k e n n z e i c h n e t, that the ß ß the image sensor device has a linear arrangement of picture elements.
3. Bildsensoreinrichtung nach Anspruch 1, daß die Bildsensoreinrichtung eine flächige Anordnung von Bildelementen aufweist. 3. Image sensor device according to claim 1, that the image sensor device has a flat arrangement of picture elements.
4. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Detektormittel (4) eine Photodiode, insbesondere aus kristallinem Silizium oder amorphem Silizium ist.4. Image sensor device according to claim 1, d a d u r c h g e k e n n z e i c h n e t, that the detector means (4) is a photodiode, in particular made of crystalline silicon or amorphous silicon.
5. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Detektormittel (4) ein Photodetektor aus einer III-V-Legierung oder einer II-VI-Legierung ist.5. The image sensor device as claimed in claim 1, which means that the detector means (4) is a photodetector made from a III-V alloy or a II-VI alloy.
6. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Detektormittel (4) einen Farbmosaikfilter (Colour filter array) aufweist.6. Image sensor device according to claim 1, d a d u r c h g e k e n n z e i c h n e t, that the detector means (4) has a color mosaic filter (color filter array).
7. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Detektormittel (4) durch eine multispektrale Diode ausgebildet ist, die folgende Schichtenfolge hat:7. Image sensor device according to claim 1, d a d u r c h g e k e n n z e i c h n e t, that the detector means (4) is formed by a multispectral diode, which has the following layer sequence:
(a) eine p-leitende a-Si:H Schicht(a) a p-type a-Si: H layer
(b) eine eigenleitende a-Si:H Schicht, bestehend aus einer ersten Teilschicht mit höherem μ-Tau-Produkt, einer zweiten Teilschicht mit gegenüber der ersten Teilschicht niedrigerem μ-Tau-Produkt und einer dritten Teilschicht mit gegenüber der ersten und zweiten Teilschicht niedrigerem μ-Tau-Produkt(b) an intrinsically conductive a-Si: H layer, consisting of a first partial layer with a higher μ-tau product, a second partial layer with a lower μ-tau product than the first partial layer and a third partial layer with compared to the first and second partial layers lower μ-tau product
(c) eine n-leitende a-Si:H Schicht.(c) an n-type a-Si: H layer.
8. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Detektormittel (4) ein lichtempfindlicher MOS-Kondensator, insbesondere ein MOS-Varaktor ist. 8. Image sensor device according to claim 1, characterized in that the detector means (4) is a light-sensitive MOS capacitor, in particular a MOS varactor.
9. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel (3) ein analoges Speichermittel ist.9. The image sensor device as claimed in claim 1, wherein the storage means (3) is an analog storage means.
10. Bildsensoreinrichtung nach Anspruch 9, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel (3) ein Kondensator ist.10. Image sensor device according to claim 9, d a d u r c h g e k e n n z e i c h n e t d a ß the storage means (3) is a capacitor.
11. Bildsensoreinrichtung nach Anspruch 10, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel (3) eine MOS-Kapazität ist.11. Image sensor device according to claim 10, d a d u r c h g e k e n n z e i c h n e t, that the storage means (3) is a MOS capacitance.
12. Bildsensoreinrichtung nach Anspruch 11, d a d u r c h g e k e n n z e i c h n e t , d a ß die Kapazität durch einen Plattenkondensator gebildet ist, dessen Platten aus Polysilizium bestehen.12. The image sensor device according to claim 11, wherein the capacitance is formed by a plate capacitor, the plates of which are made of polysilicon.
13. Bildsensoreinrichtung nach Anspruch 11, d a d u r c h g e k e n n z e i c h n e t , d a ß der Kondensator als DRAM-Kondensator ausgebildet ist.13. The image sensor device as claimed in claim 11, d a d u r c h g e k e n n z e i c h n e t, that the capacitor is designed as a DRAM capacitor.
14. Bildsensoreinrichtung nach Anspruch 11, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel ein nicht-flüchtiges Speichermittel, insbesondere ein EPROM-, ein EEPROM-, ein FRAM-, d.h. ein ferroelektrischer RAM, oder ein Flash-Speicherelement ist .14.Image sensor device according to claim 11, d a d u r c h g e k e n e z e i c h n e t, that the storage means a non-volatile storage means, in particular an EPROM, an EEPROM, a FRAM, i.e. is a ferroelectric RAM, or a flash memory element.
15. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel ein digitales Speichermittel ist, dem ein Analog-Digitalwandler vorgeordnet ist. 15. Image sensor device according to claim 1, characterized in that ß the storage means is a digital storage means, which is preceded by an analog-digital converter.
16. Bildsensoreinrichtung nach einem der vorhergehenden Ansprüche, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel (3) in einer Multilevel-Digitaltechnik betrieben wird, bei der in einem amplitudendiskretisierten Analogsignal mehrere digitale Bits repräsentiert werden.16. Image sensor device according to one of the preceding claims, that the memory means (3) is operated in a multi-level digital technology, in which a plurality of digital bits are represented in an amplitude-discretized analog signal.
17. Bildsensoreinrichtung nach Anspruch 16, d a d u r c h g e k e n n z e i c h n e t , d a ß dem Speichermittel (3) ein reziproker Analog-Digitalwandler zugeordnet ist, welcher die Zeit mißt, die der der Beleuchtung proportionale Photostrom benötigt, um eine Speicherkapazität um eine definierte Spannungsdifferenz umzuladen.17. Image sensor device according to claim 16, d a d u r c h g e k e n e z e i c h n e t, ß ß ß ß ß is associated with a reciprocal analog-digital converter, which measures the time it takes for the lighting proportional photocurrent to reload a storage capacity by a defined voltage difference.
18. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß die mindestens zwei Speichermittel (3) lateral nebeneinander liegend angeordnet sind.18. Image sensor device according to claim 1, d a d u r c h g e k e n n z e i c h n e t, that the at least two storage means (3) are arranged laterally side by side.
19. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß die mindestens zwei Speichermittel (3) vertikal übereinander integriert angeordnet sind.19. Image sensor device according to claim 1, d a d u r c h g e k e n n z e i c h n e t, that the at least two storage means (3) are arranged vertically integrated one above the other.
20. Bildsensoreinrichtung nach Anspruch 16, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel (3) als SRAM-Zelle ausgebildet ist.20. The image sensor device as claimed in claim 16, which means that the memory means (3) is designed as an SRAM cell.
21. Bildsensoreinrichtung nach Anspruch 1, d a d u r c h g e k e n n z e i c h n e t , d a ß das Speichermittel (3) in Form einer magnetischen, optischen, organischen oder biologischen Speicherzelle ausgebildet ist. 21. Image sensor device according to claim 1, characterized in that the storage means (3) is designed in the form of a magnetic, optical, organic or biological storage cell.
22. Bildsensoreinrichtung nach einem der vorhergehenden Ansprüche, d a d u r c h g e k e n n z e i c h n e t , d a ß die Speichersteuereinrichtung (2) auf der Oberfläche des als CMOS-Substrat ausgebildeten Trägers (1) angeordnet ist.22. The image sensor device according to one of the preceding claims, that the memory control device (2) is arranged on the surface of the carrier (1) designed as a CMOS substrate.
23. Bildsensoreinrichtung nach Anspruch 23, d a d u r c h g e k e n n z e i c h n e t , d a ß die elektrischen Speichermittel (3) in einer zwischen dem Träger (1) und dem Detektormittel (4) liegenden Schichtebene angeordnet sind, wobei die Verbindung zwischen Speichermittel (3) und Speichersteuereinrichtung (2) über eine Durchkontaktierung (6) erfolgt. 23. Image sensor device according to claim 23, characterized in that the electrical storage means (3) are arranged in a layer plane lying between the carrier (1) and the detector means (4), the connection between the storage means (3) and the storage control device (2) a via (6) is made.
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DE19909550 | 1999-03-04 | ||
DE19909550 | 1999-03-04 | ||
PCT/EP2000/001705 WO2000052759A1 (en) | 1999-03-04 | 2000-03-01 | Image sensor device |
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JP (1) | JP2002538707A (en) |
CN (1) | CN1344427A (en) |
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US6985181B2 (en) * | 2000-05-09 | 2006-01-10 | Pixim, Inc. | CMOS sensor array with a memory interface |
DE10052863A1 (en) | 2000-10-24 | 2002-04-25 | Christian Pilgrim | Endoscopic instrument for use in cavities detects at least two channels for at least two image points, preferably at least two color channels, in single polychromatic horizontally structured pixel |
KR100775058B1 (en) * | 2005-09-29 | 2007-11-08 | 삼성전자주식회사 | Pixel Cell, Image Sensor Adopting The Pixel Cell, and Image Processing System Including The Image Sensor |
EP2665256B1 (en) | 2007-09-05 | 2015-11-18 | Tohoku University | Solid-state image sensor and drive method for the same |
JP5151507B2 (en) * | 2008-01-29 | 2013-02-27 | ソニー株式会社 | Solid-state imaging device, signal readout method of solid-state imaging device, and imaging apparatus |
CN104967763B (en) * | 2015-06-09 | 2019-04-26 | 联想(北京)有限公司 | A kind of image acquisition device, image-pickup method and electronic equipment |
CN106686324B (en) * | 2016-12-12 | 2019-06-07 | 西北核技术研究所 | Pixel structure, cmos image sensor and its imaging method of cmos image sensor |
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ATE224122T1 (en) * | 1996-10-31 | 2002-09-15 | Boehm Markus Prof Dr Ing | COLOR IMAGE SENSOR FOR SHORT-TERM EXPOSURE |
JP3695933B2 (en) * | 1997-03-18 | 2005-09-14 | 株式会社東芝 | Solid-state imaging device |
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- 2000-03-01 WO PCT/EP2000/001705 patent/WO2000052759A1/en not_active Application Discontinuation
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