EP1110078A4 - Adaptive lighting system and method for machine vision apparatus - Google Patents

Adaptive lighting system and method for machine vision apparatus

Info

Publication number
EP1110078A4
EP1110078A4 EP99945459A EP99945459A EP1110078A4 EP 1110078 A4 EP1110078 A4 EP 1110078A4 EP 99945459 A EP99945459 A EP 99945459A EP 99945459 A EP99945459 A EP 99945459A EP 1110078 A4 EP1110078 A4 EP 1110078A4
Authority
EP
European Patent Office
Prior art keywords
lighting system
machine vision
vision apparatus
adaptive lighting
adaptive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP99945459A
Other languages
German (de)
French (fr)
Other versions
EP1110078A1 (en
EP1110078B1 (en
Inventor
Ashedah Binti Jusoh
Tan Seow Hoon
Sreenivas Rao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASTI Holdings Ltd
Original Assignee
Semiconductor Tech and Instruments Pte Ltd
Semiconductor Technologies and Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26844061&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP1110078(A4) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Semiconductor Tech and Instruments Pte Ltd, Semiconductor Technologies and Instruments Inc filed Critical Semiconductor Tech and Instruments Pte Ltd
Publication of EP1110078A1 publication Critical patent/EP1110078A1/en
Publication of EP1110078A4 publication Critical patent/EP1110078A4/en
Application granted granted Critical
Publication of EP1110078B1 publication Critical patent/EP1110078B1/en
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
EP99945459A 1998-09-03 1999-09-02 Adaptive lighting system and method for machine vision apparatus Revoked EP1110078B1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US360656 1989-06-02
US14656598A 1998-09-03 1998-09-03
US09/360,656 US6207946B1 (en) 1998-09-03 1999-07-26 Adaptive lighting system and method for machine vision apparatus
PCT/US1999/020206 WO2000014517A1 (en) 1998-09-03 1999-09-02 Adaptive lighting system and method for machine vision apparatus
US146565 2002-05-14

Publications (3)

Publication Number Publication Date
EP1110078A1 EP1110078A1 (en) 2001-06-27
EP1110078A4 true EP1110078A4 (en) 2007-07-04
EP1110078B1 EP1110078B1 (en) 2010-04-21

Family

ID=26844061

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99945459A Revoked EP1110078B1 (en) 1998-09-03 1999-09-02 Adaptive lighting system and method for machine vision apparatus

Country Status (5)

Country Link
US (1) US6207946B1 (en)
EP (1) EP1110078B1 (en)
AU (1) AU5805599A (en)
TW (1) TW564308B (en)
WO (1) WO2000014517A1 (en)

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US7171037B2 (en) * 2003-03-20 2007-01-30 Agilent Technologies, Inc. Optical inspection system and method for displaying imaged objects in greater than two dimensions
US7019826B2 (en) * 2003-03-20 2006-03-28 Agilent Technologies, Inc. Optical inspection system, apparatus and method for reconstructing three-dimensional images for printed circuit board and electronics manufacturing inspection
US20050046739A1 (en) * 2003-08-29 2005-03-03 Voss James S. System and method using light emitting diodes with an image capture device
WO2005048169A2 (en) * 2003-11-14 2005-05-26 Sick Auto Ident Inc. Scanning imaging system and method for imaging articles using same
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WO2005119227A1 (en) * 2004-06-04 2005-12-15 Tokyo Seimitsu Co., Ltd. Semiconductor appearance inspecting device and illuminating method
US7127159B2 (en) * 2004-07-29 2006-10-24 Mitutoyo Corporation Strobe illumination
RU2007126795A (en) * 2004-12-14 2009-01-27 Акцо Нобель Коатингс Интернэшнл Б.В. (Nl) METHOD AND DEVICE FOR ANALYSIS OF VISUAL SURFACE PROPERTIES
US7336197B2 (en) * 2005-03-30 2008-02-26 Delta Design, Inc. LED lighting system for line scan camera based multiple data matrix scanners
CN101218500B (en) 2005-07-08 2010-12-08 伊雷克托科学工业股份有限公司 Optimizing use and performance of optical systems implemented with telecentric on-axis dark field illumination
DE102005046583A1 (en) * 2005-09-28 2007-03-29 Eppendorf Ag Real-time polymerase chain reaction device, has monitoring device with electrical device for examining electrical function of light emitting diodes, where monitoring device generates signals when determining malfunction of diodes
US7339660B1 (en) * 2006-11-29 2008-03-04 Satake Usa, Inc. Illumination device for product examination
CN100559159C (en) * 2006-12-26 2009-11-11 武汉理工大学 The self-compensating method and apparatus of fiber gas sensor light path
EP2126552A4 (en) * 2007-02-16 2016-04-20 3M Innovative Properties Co Method and apparatus for illuminating material for automated inspection
US7869021B2 (en) * 2007-04-05 2011-01-11 Asti Holdings Limited Multiple surface inspection system and method
KR101456873B1 (en) * 2007-07-10 2014-10-31 베링거 인겔하임 인터내셔날 게엠베하 Optical filling control of pharmaceutical capsules in capsule filling machines
US7915570B2 (en) 2007-08-03 2011-03-29 National Instruments Corporation Smart camera with an integrated lighting controller
US20100295939A1 (en) * 2008-01-28 2010-11-25 Innovative Imaging, Inc Table gauge
DE102008013525B4 (en) * 2008-03-08 2010-07-29 Nordischer Maschinenbau Rud. Baader Gmbh + Co Kg Apparatus and method for contactless identification of characteristics of continuously conveyed, translucent products
JP5077149B2 (en) * 2008-08-26 2012-11-21 富士ゼロックス株式会社 Image reading apparatus and program
CN101726247B (en) * 2008-10-31 2012-10-10 鸿富锦精密工业(深圳)有限公司 Light irradiation regulating method and computer system thereof
US8135325B2 (en) * 2009-02-04 2012-03-13 Palo Alto Research Center Incorporated Image-drivable flash lamp
US20110205049A1 (en) * 2010-02-22 2011-08-25 Koninklijke Philips Electronics N.V. Adaptive lighting system with iii-nitride light emitting devices
US9476842B2 (en) 2010-05-03 2016-10-25 United Technologies Corporation On-the-fly dimensional imaging inspection
JP2012063269A (en) * 2010-09-16 2012-03-29 Sony Corp Measuring apparatus and measuring method
TWI452285B (en) * 2010-10-22 2014-09-11 Chroma Ate Inc Detecting light bar machine and method for detecting
US8717194B2 (en) 2010-12-21 2014-05-06 GE Lighting Solutions, LLC LED traffic signal compensation and protection methods
KR101284268B1 (en) * 2011-10-28 2013-07-08 한국생산기술연구원 Color lighting control method for improving image quality of vision system
KR101748622B1 (en) * 2012-03-21 2017-06-20 한화테크윈 주식회사 Side light apparatus and light apparatus using that of chip mounter
AU2014202744B2 (en) 2014-05-20 2016-10-20 Canon Kabushiki Kaisha System and method for re-configuring a lighting arrangement
JP6280451B2 (en) * 2014-06-09 2018-02-14 株式会社キーエンス Inspection device
US10339666B2 (en) * 2015-03-06 2019-07-02 Fuji Corporation Recognition device and recognition method
WO2017025775A1 (en) 2015-08-11 2017-02-16 Latvijas Universitate Device for adaptive photoplethysmography imaging
JP2017067632A (en) * 2015-09-30 2017-04-06 キヤノン株式会社 Checkup apparatus, and manufacturing method
KR102656197B1 (en) * 2015-11-18 2024-04-09 삼성전자주식회사 A movable apparatus, a robot cleaner, a device for determining a condition of a surface of floor, a method for controlling the movable apparatus and a method for controlling the robot cleaner
KR101739696B1 (en) * 2016-07-13 2017-05-25 서장일 Lighting system of recognizing material of an object and method of recognizing material of an object using the same
EP3567425B1 (en) * 2017-01-06 2024-05-01 Fuji Corporation Illumination device for image capturing
JP7010057B2 (en) * 2018-02-26 2022-01-26 オムロン株式会社 Image processing system and setting method
US10520424B2 (en) 2018-04-03 2019-12-31 Hiwin Technologies Corp. Adaptive method for a light source for inspecting an article
KR102049172B1 (en) * 2018-04-30 2019-11-26 하이윈 테크놀로지스 코포레이션 Adaptive method for a light source
EP3837534B1 (en) 2018-08-13 2023-09-06 Alcon Inc. Method for optically inspecting a mold for manufacturing ophthalmic lenses for possible mold defects
US10796426B2 (en) * 2018-11-15 2020-10-06 The Gillette Company Llc Optimizing a computer vision inspection station
IT201900005536A1 (en) * 2019-04-10 2020-10-10 Doss Visual Solution S R L IMAGE ACQUISITION METHOD FOR AN OPTICAL INSPECTION MACHINE
FI129663B (en) * 2019-11-20 2022-06-15 Procemex Oy Ltd An LED matrix lighting device
US11026313B1 (en) * 2020-08-17 2021-06-01 Deediim Sensor Inc. Illumination system
CN113155845A (en) * 2021-04-09 2021-07-23 武汉精测电子集团股份有限公司 Light source, setting method thereof, optical detection method and system
IT202100020195A1 (en) * 2021-07-28 2023-01-28 Spea Spa DEVICE AND METHOD FOR OPTICAL ANALYSIS OF AN ELECTRONIC CARD
JP7291766B2 (en) * 2021-11-22 2023-06-15 Towa株式会社 Inspection system, control method, electronic component manufacturing method and cutting device

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EP0443289A2 (en) * 1990-02-23 1991-08-28 Cimflex Teknowledge Corporation Apparatus for inspecting printed circuit boards

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US4654629A (en) * 1985-07-02 1987-03-31 Pulse Electronics, Inc. Vehicle marker light
US4882498A (en) * 1987-10-09 1989-11-21 Pressco, Inc. Pulsed-array video inspection lighting system
EP0443289A2 (en) * 1990-02-23 1991-08-28 Cimflex Teknowledge Corporation Apparatus for inspecting printed circuit boards

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Title
See also references of WO0014517A1 *

Also Published As

Publication number Publication date
WO2000014517A9 (en) 2000-08-10
US6207946B1 (en) 2001-03-27
AU5805599A (en) 2000-03-27
WO2000014517A1 (en) 2000-03-16
TW564308B (en) 2003-12-01
EP1110078A1 (en) 2001-06-27
EP1110078B1 (en) 2010-04-21

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