EP1042944B1 - Verfahren und vorrichtung zur vermessung, kalibrierung und verwendung von laser-pinzetten - Google Patents
Verfahren und vorrichtung zur vermessung, kalibrierung und verwendung von laser-pinzetten Download PDFInfo
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- EP1042944B1 EP1042944B1 EP98966384A EP98966384A EP1042944B1 EP 1042944 B1 EP1042944 B1 EP 1042944B1 EP 98966384 A EP98966384 A EP 98966384A EP 98966384 A EP98966384 A EP 98966384A EP 1042944 B1 EP1042944 B1 EP 1042944B1
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- particle
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H3/00—Production or acceleration of neutral particle beams, e.g. molecular or atomic beams
- H05H3/04—Acceleration by electromagnetic wave pressure
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/006—Manipulation of neutral particles by using radiation pressure, e.g. optical levitation
Definitions
- the invention relates to methods and devices for measurement and calibration of optical field traps and determination of optically induced forces in all three spatial directions, applied to micrometer-sized particles and for use optical field traps.
- Optical field traps also "optical tweezers”, “laser tweezers” or “optical traps” have been around for about two Decades in the fields of biotechnology, medicine and Molecular biology and other technical fields for Positioning and manipulation of micrometer and submicron size Particles used [G. Weber et al. in “Int. Rev. Cytol. "Vol. 131, 1992, p. 1; S.M. Block in” Noninvasive Techniques in Cell Biology “, Wiley-Liss., New York 1990, P. 375]. The development of laser tweezers is particularly successful A. Ashkin back [A. Ashkin in "Phys. Rev. Lett.”, Vol. 24, 1970, p. 156].
- the principle of particle capture through optical induced forces is based on the fact that in addition to the light pressure, the always pushes a particle away from the light source, gradient forces occur that lead a particle into a Focus arrives or is held steadily in it or with it is moved.
- the prerequisite is that the absorption and Reflection of the particle is low, while the difference in Refractive index to the surrounding solution should be as large as possible.
- Electromagnetic field cages go to W. Paul [W. Paul et al. in "Research reports from the Ministry of Economic Affairs of North Rhine-Westphalia", Nos. 415 and 450; W. Paul in “Phys. smooth", 46, 1990, p. 227]. They are used primarily in elementary particle physics for trapping and measuring atomic particles used at low gas pressure. 1993 were the first liquid-filled, three-dimensional microfield cages under Use of dielectrophoretic forces presented [T. speed et al. in "Biochim. Biophys. Acta", Vol. 1157, 1993, p. 127].
- Variant II [CP Dennis in "Faraday Discuss. Chem. Soc.”, Vol. 90, 1990, p. 209]: The mean deflection of a particle in the laser focus is measured on the basis of Brownian collisions. In principle, measurement in all spatial directions is possible here, but it requires a very precise measurement of the particle movement with submicron accuracy and cannot be used for most Mie particles, since these are too large for a noticeable deflection. In addition, the measurements become more difficult and inaccurate with increasing laser power and that only in the very narrow focal area of the laser can work.
- Variant III [CP Dennies et al. in "Applied Optics", 1993, p. 1629]: A tearing off of a particle is examined by means of laser tweezers, which is attached to a base in a defined manner. The scattering of an evanescent surface wave with total reflection is used to determine the movement of the object in the z direction (perpendicular to the surface) with an accuracy in the nm range. This method, too, cannot be applied in all spatial directions and, above all, cannot be used quickly, but rather requires a lot of calibration and equipment. In addition, the optical radiation field near the surface does not correspond to the conditions in free solution.
- a method for setting predetermined adhesion phenomena between individual suspended microscopic particles or to determine the binding forces that occur is not yet available.
- the invention has for its object improved methods for handling particles with laser tweezers, with which in particular the determination of optically induced Forces or binding forces and the exercise of predetermined ones Forces is made possible.
- a method according to the invention is intended especially the determination of forces with an increased measuring speed and better reproducibility and accuracy guarantee. Determining forces on microscopic particles are said to work via an electrical Signal in a quickly repeatable and automatable form, the forces with an accuracy in the pN range and below it in any spatial direction should.
- the object of the invention is also devices to specify the implementation of the procedures.
- At least one microscopic particle in the focus of an optical cage in a microelectrode assembly and with respect to to position an electrical capture area (or capture point), by electrical field gradients in the microelectrode arrangement is formed.
- the focus of the optical cage with the particle is initially separated from the capture area, i.e. at a distance from the electrical field minimum of the capture area, which represents an electrical field cage.
- the field forces in the optical cage and / or in the electrical capture area and / or the distance between the optical cage and the electrical capture range varies until a transition movement of the particle from the focus to the capture area or vice versa.
- the electric, the catch area has forming field gradients on the particle or particles acting forces, whose fields each have a minimum have.
- the minimum corresponds to the electric field forces the catch area.
- the minimum of optical induced forces is the focus of the optical cage. Is between two minima a field barrier exists, which depends on the amplitudes of the effective electric fields, the light output of the optical cage and the distance between the minima.
- the particle or particles within the Microelectrode arrangement positioned in a predetermined manner or (in the case of several particles).
- a particle in the focus of an optical cage to determine acting, optically induced forces.
- only one particle is in focus or temporarily present in the capture area of the microelectrode arrangement.
- the field properties i.e. the amplitude of the electrical Field, the light output and / or the distance of the minima, is varied until the transition movement of the particle between the minima, i.e. between the focus and the capture area or vice versa.
- the transition movement is very accurate and can be determined reproducibly. From the to trigger the transition movement required amplitude of the electric fields in the microelectrode arrangement, the optically induced Determine forces in the optical cage.
- the binding forces between several particles e.g. two particles.
- this embodiment is a particle in the focus of the optical cage and a Particles arranged in the electrical capture area.
- the field properties in the microelectrode arrangement vary to determine those field characteristics at which the transition movement of the particle from focus to particle in the catch area or vice versa. This principle is accordingly also with particle groups in the focus or in the capture area realizable.
- a third important aspect of the invention provided microscopic particles in a microelectrode arrangement with the mentioned, simultaneously available at least two field minima relative to the setting of predetermined field forces to each other at least temporarily in groups or aggregates to position or merge or such groups or disassemble units into parts.
- This invention Aggregate manipulation is again preferred with the Combined above aspects of the invention can but also regardless of the setting of predetermined (if also unknown) electrical and / or optical field forces be implemented.
- the invention also relates to a microsystem which is used for Training of an opto-electric double cage set up is by the simultaneous generation of at least two Field minima of an electrical capture area and an optical one Cage is generated.
- a microsystem which is used for Training of an opto-electric double cage set up is by the simultaneous generation of at least two Field minima of an electrical capture area and an optical one Cage is generated.
- it has a fluidic microsystem a microelectrode arrangement for generating the electrical capture area and one for the training of the optical Transparent cage within the microelectrode assembly Structure.
- the microsystem is preferably a fluid one Microsystem that is one-sided towards a light source Generation of the optical cage can be open.
- “Laser trapping” can be a particle in a local Balance is maintained by an optical trap or an optical cage in the focus of at least one laser beam is formed.
- a high-frequency microfield cage can a particle be kept in a local equilibrium, that by an electric catch area of the respective realized field distribution is formed.
- the catch area can, depending on the field distribution, by a point, a line or a room area can be formed.
- the invention can implemented accordingly with arbitrarily formed catch areas become.
- the invention is based on the above first point of view in particular, the optically induced Forces in the optical trap (optical cage) the electrical forces on the particle at the transition between the equilibrium states, d. H.
- the task becomes special solved in that the "laser trapping" in one electrical high-frequency microfield cage, its field forces and electrical field distribution are known and for Coupling the necessary to form the optical cage Laser light is set up.
- the im Lasertrap (focus) caught particles from the capture point of the Field cage with low electrical catch power in a defined Position at a distance from the snap point can be determined by the following Increase in the amplitude of the electrical control signals the threshold of the field cage can be determined exactly where the electric field forces the particle from the optical Move focus back to the snap point, or vice versa.
- the coupling of what is required to form the optical cage Laser light is made through various structural measures achieved on the micro field cage. These include in particular the Attaching at least a subset of the electrodes of the microfield cage on a substrate that is transparent and so thin is that a laser light source is sufficiently close to the microfield cage can be performed so that the focus is formed in this becomes.
- laser tweezers includes the laser light source u. a. a coupling lens numerical aperture as high as possible. This is the Focal length usually in the range of a few hundred micrometers.
- the transparent substrate thus preferably has one Thickness less than the focal length of the laser light source.
- the invention allows the qualitative and / or quantitative parameters of the optically induced forces on a particle.
- the quantitative determination the optically induced forces can come from a few sizes, the z. B. the locations of focus and capture point that Field distribution between the electrodes, the electrical Properties of the particle and its environmental solutions as also the shape, phase position, frequency and amplitude of all electrode signals include. All of these sizes can be independent from the actual measurement or in advance to a purely electrical one Ways or via a unique numerical simulation of the Determine the field distribution in the high-frequency cage.
- the optically induced Forces that act on the particle can be released the amplitude of the electrical control signals of the electrical Field cage at the transition between equilibria Determine (transitional movement).
- An advantage of the invention is that the force gradient of the optically induced forces is relatively steep, so that Transition between equilibrium thresholds or by leaps and bounds, making it particularly easy and precise can be registered.
- this procedure can be automated and for calibration of the laser beam can be used. Let the measurements can be repeated as often as required in a few seconds execute and can also on one and the same particle performed in the environment that will be used later become.
- absolute values of the optically induced forces can deviations in symmetry of the optical radiation and their Intensity profiles near and in the focal area, i.e. also relative Values to be determined.
- the invention is with any particles such as synthetic Particles or biological cells or their components implementable.
- the particle size is in the entire size range of particles that can be manipulated with laser tweezers, preferably with a size smaller than 200 microns.
- FIG. 1 shows a section of a microsystem according to the invention schematically shown enlarged.
- the representation shows only a microelectrode arrangement consisting of the microelectrodes 11 to 18 (without control lines) and a between the microelectrodes in a suspension liquid suspended microscopic particle 113.
- the microelectrodes are in planar form on opposite walls of the Microsystem structure arranged, for example the x-y plane spans a substrate plane.
- the microelectrodes 11 to 18 are set up with such electrical potentials to be charged that field gradients with a field minimum be formed.
- the technology of electrode control for Generation of a predetermined minimum is known per se and is therefore not described in detail here.
- the location of the Field minimum is of the phases and amplitudes of the control potentials dependent on the microelectrodes 11 to 18 and can in be set in a predetermined manner.
- the catch area or the electric field cage is also called a high-frequency cage, since the microelectrodes preferably with high frequency Control potentials (frequency range see below) for manipulation of microscopic particles based on negative Dielectrophoresis can be applied.
- optically induced field forces according to the invention on particle 113 takes place in such a way that particle 113 caught in the focus of the laser beam and by a focus shift in the designated position (e.g. at location 114) by the coordinates (x1, y1, z1)) becomes.
- the focus is shifted by a mechanical change the relative positions of the microsystem and the source of the laser beam 19 by adjusting devices known per se and / or deflection devices of the laser beam.
- Over a Increasing the amplitude of the high-frequency signals applied to the electrodes become the electrical polarizing forces of the field cage until the particle 113 from the Laser focus is pulled out and into the capture point 110b moved (transition movement between local equilibria in the field minima).
- the transition between the local equilibria can alternatively can also be done by increasing the laser power and the particle from the catch area of the field cage in the focus is moved and / or by the locations of the snap points or shift the focus and determine the path or distance of the field minima at which the transition movement takes place takes place.
- the electrical polarizing forces on the particle and the field distribution between the electrodes 11 to 18 are known, there is a direct proportionality between the measurable laser power in the focal area, the Amplitude of the electrical signals and those on the particle acting optically induced forces.
- the Procedure and displacement of particle 113 in any spatial direction can the ones acting on the concrete particle Determine optically induced forces quantitatively. It deals consequently an electrical calibration of the optically induced opposing forces with little effort is to be provided and allows forces in the range of fN up to a few hundred pN.
- the optically induced forces are thus in at least one Case from the field or location properties of the particle 113 determined during a transition movement, the electrical Polarizing forces on the particle 113 from the itself computable field distribution between the microelectrodes 11 to 18 and the given when executing the transitional movement
- Locations of focus 110a and capture point 110b are determined. These locations can be measured with an observation microscope. In all other cases can be based on the above Proportionality a relative determination of the optical induced forces occur.
- Figure 2 shows an expanded representation of a system to measure the optically induced forces on an im Focus on captured particles.
- the microfield cage will formed by microelectrodes that face each other Surfaces of the substrates 27, 29 are attached.
- the substrates 27, 29 are separated by a spacer 28 which forms a suspension room in which to be examined Particle is exposed to the field of the microfield cage.
- This in Figure 2 upper substrate is thin enough so that the focus of the optical cage is adjustable in the suspension room.
- Cells or other microparticles suspended in a solution are flushed into the channel 22 via an opening 21 and then enter the field cage 23, the output electrodes 24a-d of which have a high-frequency field (kHz or MHz range, any signal shape (e.g. rectangle -, sine, triangle or other signal forms), amplitude a few mV up to some 10 V)) can be applied.
- This initially one-sided application of electrical potentials to the microelectrodes only forms an electrical field barrier for flushed-in microparticles in the channel 22. If there is a particle in the cage 23, the input electrodes 25a-d are also switched on and / or the flow is stopped.
- phase shifts of the electrode signals typical of electrical trapping for two possible alternating field and two rotation field control types (2 * AC field or 2 * red field) are summarized in Table 1.
- Phase controls of the electrode signals of an octopole Field type El. 25b El. 24b El. 24d El. 25d El. 25a El. 24a El. 24c El.
- the red field is a torque exerted on the particle to form a rotation (last line of Tab. 1) leads to the determination of the force can be used.
- the values of the penultimate Row of table 1 is torque compensation.
- the electrodes are in planar form on two glass substrates 27, 29 with semiconductor technology Methods have been processed overhead using a spacer 28 are mounted liquid-tight so that they are in the sewer liquid 22 immerse. For high laser focusing it is necessary to use one of the glass substrates (here (27)) if possible run thin.
- the substrate is 27 150 to 200 microns thick, and the substrate 29 consists of 0.5 to 1 mm thick glass or plastic.
- a particular advantage of the invention is that the method quick and easy especially in the one to be used later Surrounding medium with those to be examined or manipulated Particles applied under comparable conditions can be. Furthermore, this method is not specific Particle and surface shapes limited, but with any Particle geometries can be realized. Even it can Forces on connected groups of particles (e.g. aggregates or the like.) Can be determined in any shape.
- FIG. 6 shows a microelectrode arrangement in octopole form with the microelectrodes 61 to 68 analogous to FIG. 1.
- the microelectrodes 61 to 64 or 65 to 68 are in one for implementation of the method according to the invention Microsystem in two spaced apart levels for training of an electric field cage with a capture area arranged or point forming field minimum.
- the electric one Field cage is inside the microelectrode assembly formed by the cuboid shown in Figure 6 is outlined schematically.
- Reference numeral 69 denotes one focused in the interior of the microelectrode arrangement Beam of light (preferably laser beam). A first particle in The focus is on the shape of a biological cell 611 of the light beam 69.
- a second particle which is shown in the Example is also a biological cell 612, is located at the catch point of the electrical field cage. Analogous for the determination of the optically induced forces explained above by observing the transition movement of a particle from The focus in the capture area can now be a determination of the binding forces be carried out between the particles, such as this is explained below.
- two cells 611, 612 are brought into the interior in succession introduced the microelectrode arrangement 61 to 81.
- the first cell 611 is flushed into the microelectrode arrangement and after complete control of the octopole field kept in the electric catch area.
- the first cell 611 with the optical cage through the laser beam 69 is formed, taken over and spaced from the catch area positioned.
- the second is then rinsed in Cell 612 and its positioning in the capture area, e.g. in the Center of the microelectrode arrangement 61 to 68.
- biological particles are the same or different Kind or biological cells or cell components on the one hand and / or synthetic particles with predetermined active substances on the other hand.
- the cells 611, 612 are brought into contact, with an adhesive bond between the two cells is trained.
- the adhesive bond is, for example brought about by one of the following techniques. First is it is possible to turn off the first cell 611 by turning off the laser beam 69 release and thereby under the effect of electrical Field forces towards the catch area of the electrical field cage to move where the touch of the second cell 612 and the formation of the adhesive bond takes place. Second, it is possible, the focus of the laser beam 69 with respect to the capture area to adjust so that the first cell 611 with the second cell 612 or even in contact with one predetermined force is pressed against this.
- the mutual The force of pressing the cells together can be derived from the electrical field forces in the catch area and the example optical forces determined according to the technique explained above derive in the focus of the laser beam 69.
- For quantitative Comparability of the determination of binding forces is the adhesive bonding for a predetermined time range (e.g. approx. 0.1 to 10 seconds). But there are also longer ones Times of e.g. up to 1000 seconds possible.
- the binding forces (interaction forces, adhesive strength) determined between the cells as follows.
- the determination of forces is carried out analogously to the determination of the optically induced forces on a single particle Variation of field characteristics and identification of those Field strengths in the electrical capture area and optical cage, in which there is a tear-off movement between the cells. For example, given electrical potential amplitudes repeats the one focused on the first cell 611 Laser beam 69 adjusted so that the focus is from the capture area removed, and if the first cell 611 is not aligned has moved the focus, deferred and with a gradual increased light output.
- a particular advantage of this procedure is its Repeatability with a given pair of particles and in the Possibility of accurate contact times between cells pretend.
- the surface receptors of the first cell become then with a test or active substance from a molecular Library in contact with the suspension solution in the microsystem brought. Then a second cell (or a synthetic particles with well binding surface molecules) brought up to the first cell.
- the binding forces provide e.g. one of the following results. Are the binding sites of the first cell already saturated by the active substance, there is no or one weak binding of the test cell. Otherwise there is a strong one Binding the test cell. This allows biological cells evaluate and in relation to the response to certain active substances sort by.
- FIG. 7 shows a microelectrode arrangement analogous to Figures 1 and 6 with the microelectrodes 71 to 78 and one in the interior of the microelectrode arrangement focused light beam 79.
- a first cell 712 in the electrical capture area of the Microelectrode assembly 71 to 78 captured and positioned.
- a second cell 711 or a synthetic particle with an active substance is captured with the light beam 79 and along a predetermined path 713 on the first cell 712 passed or with for a predetermined contact time brought this into contact.
- the individual cells can also be cell groups or aggregates for mutual stimulation for a predetermined time Effect of predetermined forces brought together and separated again become.
- FIG. 8 again shows a microelectrode arrangement with the Microelectrodes 81 to 88 and one in the interior of the microelectrode arrangement focused light beam 89.
- FIG 811 to 814 shown in the electrical capture range, to which a fifth cell 815 in a predetermined position (corresponding the direction of the arrow) is added.
- the fifth cell 815 for a predetermined time with a predetermined force pressed against the already formed cell group 811 to 814, to the formation of binding forces in this predetermined To enable relative position.
- any cell aggregates can be predetermined Build aggregate shapes.
- This procedure is also implementable with synthetic microparticles that are let it polarize negatively and in the electrical capture range are repelled by the microelectrodes (negative Dielectrophoresis).
- a device consists of an arrangement a fluidic microsystem 91, an illumination device 92 for producing an optical cage in a microelectrode arrangement of the microsystem 91, where the microsystem 91 and the lighting device 92 with an adjustment device 93 are adjustable relative to each other, and one Observation and / or sensor device 94 (e.g. microscope), as shown schematically in Fig. 9.
- the microsystem is provided with fluidic and potential control device 95, as is known in itself.
- the lighting device 92 is, for example, laser tweezers known per se, the light source, for example, a diode laser or a semiconductor laser and one for focusing Includes microscope assembly.
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Description
Auf ein im Laserfokus gefangenes Teilchen wirkt eine kalibrierbare Strömung. Gesucht wird die Strömungsgeschwindigkeit, bei der das Teilchen gerade aus dem Laserfokus gerissen wird oder gerade noch in diesem verbleibt. Aus dieser Strömungsgeschwindigkeit kann über die Stokes'sche Reibung eine Fangkraft berechnet werden. Nachteilig an diesem Verfahren ist vor allem, daß es schwer fällt, mit ein und demselben Teilchen wiederholt Messungen auszuführen, und daß nur sehr komplizierte Kanalaufbauten eine Vermessung in verschiedene Raumrichtungen erlauben. Eine wirklich räumliche (x-, y-, z-) Kraftvermessung ist nicht möglich. Dieses Verfahren ist ferner auf bestimmte Teilchenformen (Kugel, Ellipsoid) mit glatter Oberfläche beschränkt.
Es erfolgt eine Messung der mittleren Auslenkung eines Teilchens im Laserfokus aufgrund der Brown'schen Stöße. Hier ist zwar prinzipiell eine Vermessung in alle Raumrichtungen möglich, sie erfordert jedoch eine sehr präzise Messung der Partikelbewegung mit Submikrometergenauigkeit und kann für die meisten Mie-Teilchen nicht verwendet werden, da diese zu groß für eine merkliche Auslenkung sind. Hinzu kommt, daß die Messungen mit steigender Laserleistung immer schwieriger und ungenauer werden und daß nur im sehr engen Fokalbereich des Lasers gearbeitet werden kann.
Es wird ein Abreißen eines Teilchens mittels einer Laser-Pinzette untersucht, das in definierter Weise an einer Unterlage befestigt ist. Dabei wird die Streuung einer evaneszenten Oberflächenwelle bei Totalreflexion benutzt, um die Bewegung des Objektes in z-Richtung (senkrecht zur Oberfläche) mit einer Genauigkeit im nm-Bereich zu bestimmen. Auch dieses Verfahren kann nicht in alle Raumrichtungen und vor allem nicht rasch angewendet werden, sondern erfordert einen hohen Kalibrier- und Geräteaufwand. Außerdem entspricht das optische Strahlungsfeld in Oberflächennähe nicht den Verhaltnissen in freier Lösung.
- Fig. 1:
- eine Prinzipdarstellung der Anordnung von Feldkäfigelektroden und eines optischen Käfigs gemäß einer ersten Ausführungsform der Erfindung;
- Fig. 2:
- eine weitere Prinzipdarstellung der Anordnung von Feldkäfigelektroden und eines optischen Käfigs;
- Fig. 3:
- eine Kurvendarstellung zur Illustration experimenteller Ergebnisse;
- Fig. 4:
- beispielhafte Darstellungen der Feldverteilungen eines Oktopol-Feldkäfigs;
- Fig. 5:
- eine Kurvendarstellung zur Illustration der Fangkräfte des in Figur 4 gezeigten Feldkäfigs in z-Richtung;
- Fig. 6:
- eine Prinzipdarstellung der Anordnung von Zellen in einem optischen Käfig und einem Fangbereich gemäß einer zweiten Ausführungsform der Erfindung;
- Fig. 7:
- eine Prinzipdarstellung der Anordnung von Zellen in einer Mikroelektrodenanordnung gemäß einer dritten Ausführungsform der Erfindung;
- Fig. 8:
- eine Prinzipdarstellung der Anordnung von Zellen in einer Mikroelektrodenanordnung gemäß einer vierten Ausführungsform der Erfindung; und
- Fig. 9:
- eine schematische Darstellung einer erfindungsgemäßen Vorrichtung.
Phasenansteuerungen der Elektrodensignale eines Oktopols | ||||||||
Feldart | El. 25b | El. 24b | El. 24d | El. 25d | El. 25a | El. 24a | El. 24c | El. 25c |
AC-Feld | 0° | 180° | 0° | 180° | 0° | 180° | 0° | 180° |
AC-Feld | 0° | 180° | 0° | 180° | 180° | 0° | 180° | 0° |
Rot-Feld | 0° | 90° | 180° | 270° | 180° | 270° | 0° | 90° |
Rot-Feld | 0° | 90° | 180° | 270° | 90° | 180° | 270° | 0° |
Claims (27)
- Verfahren zur Bestimmung oder Ausübung optisch induzierter Kräfte auf mindestens ein Teilchen im Fokus eines optischen Käfigs mit den Schritten:a) Positionieren des Fokus in einer Mikroelektrodenanordnung mit einem elektrischen Feld, das einen dreidimensionalen elektrischen Fangbereich bildende Feldgradienten aufweist, mit Abstand vom Fangbereich, undb) Variation der Amplitude des elektrischen Feldes, der Lichtleistung der den optischen Käfig bildenden Lichtstrahlung und/oder des Abstands des Fangbereiches vom Fokus, um zu erfassen, unter welchen dieser variierten Feldeigenschaften eine Übergangsbewegung des Teilchens.vom Fokus zum Fangbereich oder umgekehrt erfolgt oder um eine zumindest zeitweilige Anordnung des Teilchens im Fangbereich bereitzustellen.
- Verfahren gemäß Anspruch 1, bei dem zur Bestimmung optisch induzierter Kräfte ein Teilchen entweder im Fokus oder im Fangbereich angeordnet wird und die optisch induzierten Kräfte aus der Amplitude des elektrischen Feldes und dem Abstand des Fangbereiches vom Fokus bestimmt wird, bei denen die Übergangsbewegung des Teilchens vom Fokus zum Fangbereich bzw. umgekehrt erfolgt.
- Verfahren gemäß Anspruch 2, bei dem die Bestimmung der optisch induzierten Kräfte für alle interessierenden Raumrichtungen entsprechend der gegenseitigen Ausrichtung der Position des Fokus zum Fangbereich wiederholt wird.
- Verfahren gemäß Anspruch 2 oder 3, bei dem eine Kalibrierung des optischen Käfigs durch Ermittlung des Zusammenhangs zwischen der Lichtleistung zur Erzeugung des optischen Käfigs und den jeweils an einem Teilchen im optischen Käfig induzierten Kräften erfolgt.
- Verfahren gemäß einem der Ansprüche 2 bis 4, bei dem der Abstand zwischen dem Fokus und dem Fangbereich mindestens ein Zehntel des Teilchendurchmessers beträgt.
- Verfahren gemäß einem der vorhergehenden Ansprüche, bei dem der Fangbereich ein Fangpunkt ist, der innerhalb des Strahlungsfeldes des optischen Käfigs liegt, so daß das Teilchen bei Erniedrigung oder Erhöhung der Amplitude der Elektrodensignale bzw. der Lichtleistung zwischen dem Fangpunkt und dem Fokus hin- und herspringt und der zugehörige Wert der Amplituden zur Bestimmung der optisch induzierten Kräfte verwendet wird.
- Verfahren gemäß Anspruch 1, bei dem aufeinanderfolgend im Fangbereich eine Vielzahl von Teilchen angeordnet werden, die jeweils mit dem optischen Käfig in den Fangbereich und in diesem in vorbestimmter Position relativ zu gegebenenfalls im Fangbereich bereits vorhandenen Teilchen positioniert werden.
- Verfahren gemäß einem der Ansprüche 1 bis 6, bei dem eine Justierung der Lichtstrahlung des optischen Käfigs und/oder eine Bestimmung der Fanggüte, Symmetrie oder weitere Kalibrierungseigenschaften des optischen Käfigs erfolgt.
- Verfahren gemäß einem der Ansprüche 1 bis 6, bei dem auf der Grundlage der bestimmten optisch induzierten Kräfte eine Charakterisierung der Teilchen erfolgt.
- Verfahren zur Bestimmung von Bindungskräften zwischen mikroskopischen Teilchen, bei dem mindestens ein erstes Teilchen im Fokus eines optischen Kafigs und mindestens ein zweites Teilchen im dreidimensionalen Fangbereich einer Mikroelektrodenanordnung angeordnet werden, wobei für eine vorbestimmte Kontaktzeit die ersten und zweiten Teilchen in Kontakt gebracht und anschließend eine Variation der Amplitude des elektrischen Feldes, der Lichtleistung und/oder des Abstandes des Fangbereiches vom Fokus erfolgt, bis als Übergangsbewegung festgestellt wird, daß das erste Teilchen mit dem Fokus vom Fangbereich und dem zweiten Teilchen entfernt werden kann, wobei die Bindungskräfte zwischen den Teilchen aus der Amplitude des elektrischen Feldes und der Lichtleistung bei der Übergangsbewegung ermittelt werden.
- Verfahren gemäß einem der vorhergehenden Ansprüche, bei dem die Elektroden der Mikroelektrodenanordnung alternierend mit um 180° phasenverschobenen Signalen und/oder mit rotationserzeugenden Signalen vorbestimmter Phasenaufspaltung beaufschlagt werden.
- Verfahren gemäß einem der vorhergehenden Ansprüche, bei dem der Fangbereich durch mindestens eine Feldbarriere vom optischen Käfig getrennt ist.
- Verfahren gemäß einem der vorhergehenden Ansprüche, bei dem die Teilchenbewegungen optisch und/oder elektrisch detektiert werden.
- Verfahren gemäß einem der vorhergehenden Ansprüche, bei dem die Teilchen synthetische oder natürliche Teilchen mit einer Größe unterhalb von 200 µm sind.
- Verfahren gemäß einem der vorhergehenden Ansprüche, bei dem die Teilchen biologische Zellen oder deren Bestandteile sind.
- Verfahren gemäß einem der vorhergehenden Ansprüche, bei dem die Übergangsbewegung des Teilchens vom Fangbereich zum Fokus bzw. umgekehrt zur Justage des optischen Käfigs verwendet wird.
- Vorrichtung zur Bestimmung oder Ausübung optisch induzierter Kräfte auf mindestens ein Teilchen im Fokus eines optischen Käfigs, die umfaßt:ein fluidisches Mikrosystem mit einer Mikroelektrodenanordnung, die zur Ausbildung eines elektrischen Feldes mit einem dreidimensionalen elektrischen Fangbereich eingerichtet ist,eine Beleuchtungseinrichtung, die zur Ausbildung eines optischen Kafigs innerhalb der Mikroelektrodenanordnung des Mikrosystems eingerichtet ist, undeine Beobachtungs- und/oder Detektionseinrichtung zur Erfassung der Bewegung von Teilchen innerhalb der Mikroelektrodenanordnung.
- Vorrichtung gemaß Anspruch 17, bei der die Mikroelektrodenanordnung planare Elektroden umfaßt, die in Gruppen auf zwei voneinander beabstandeten Substraten angebracht sind, von denen mindestens ein Substrat transparent ist.
- Vorrichtung gemäß Anspruch 18, bei der das transparente Substrat eine Dicke von weniger als 500 µm besitzt.
- Vorrichtung gemäß Anspruch 18, bei der die Elektroden an aufeinanderzuweisenden Oberflächen der Substrate angebracht und die Substrate voneinander durch einen Abstandshalter getrennt sind, der einen Suspensionsraum bildet, in dem der Fokus des optischen Käfigs von der Beleuchtungseinrichtung durch eines oder beide Substrate eingekoppelt werden kann.
- Vorrichtung gemäß Anspruch 20, bei der der Suspensionsraum Teil einer Kanalstruktur ist, durch die die Teilchen mittels einer Lösungsströmung in das Feld der Mikroelektrodenanordnung führbar sind.
- Vorrichtung gemäß einem der Ansprüche 17 bis 21, bei der die Mikroelektrodenanordnung eine Vielzahl von Elektroden umfaßt, die zur Erzeugung eines Multipolfeldes mit einer in x-, y- und/oder z-Richtung symmetrischen elektrischen Feldverteilung eingerichtet ist.
- Vorrichtung gemäß einem der Ansprüche 17 bis 22, bei der die Elektroden mit einer isolierenden, dielektrischen Schicht überzogen sind oder aus gegenüber der Suspensionsflüssigkeit im Mikrosystem im wesentlichen inerten Metallen bestehen.
- Vorrichtung gemäß Anspruch 23, bei der die Elektroden aus Platin, Titan, Tantal oder Gold bestehen.
- Vorrichtung gemäß einem der Ansprüche 17 bis 24, bei der die Elektroden mit halbleitertechnologischen Methoden in dreidimensionaler Form oder in Hybridtechnik ausgebildet sind.
- Verwendung eines Verfahrens oder einer Vorrichtung gemäß einem der vorhergehenden Ansprüche zur Kalibrierung einer Laser-Pinzette.
- Verwendung eines Verfahrens oder einer Vorrichtung gemäß einem der vorhergehenden Ansprüche zur selektiven Stimulation biologischer Zellen.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19757785A DE19757785B4 (de) | 1997-12-28 | 1997-12-28 | Verfahren zur Bestimmung optisch induzierter Kräfte |
DE19757785 | 1997-12-28 | ||
PCT/EP1998/008370 WO1999034653A1 (de) | 1997-12-28 | 1998-12-21 | Verfahren und vorrichtung zur vermessung, kalibrierung und verwendung von laser-pinzetten |
Publications (2)
Publication Number | Publication Date |
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EP1042944A1 EP1042944A1 (de) | 2000-10-11 |
EP1042944B1 true EP1042944B1 (de) | 2002-07-24 |
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EP98966384A Expired - Lifetime EP1042944B1 (de) | 1997-12-28 | 1998-12-21 | Verfahren und vorrichtung zur vermessung, kalibrierung und verwendung von laser-pinzetten |
Country Status (6)
Country | Link |
---|---|
US (1) | US6991906B1 (de) |
EP (1) | EP1042944B1 (de) |
JP (1) | JP2002500110A (de) |
AT (1) | ATE221305T1 (de) |
DE (2) | DE19757785B4 (de) |
WO (1) | WO1999034653A1 (de) |
Cited By (1)
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CN112880912A (zh) * | 2021-01-08 | 2021-06-01 | 浙江大学 | 基于真空全息光镊的空间分辨压强测量***及方法 |
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DE19939574B4 (de) * | 1999-08-20 | 2010-08-05 | Europäisches Laboratorium für Molekularbiologie (EMBL) | Verfahren zur dreidimensionalen Objektabtastung |
DE10130004C2 (de) * | 2001-06-25 | 2003-04-30 | Europ Lab Molekularbiolog | Verfahren zur Bestimmung der Position eines Teilchens in einem fokussierten Laserstrahl |
ATE285590T1 (de) | 2002-10-25 | 2005-01-15 | Evotec Technologies Gmbh | Methode und vorrichtung zur aufnahme dreidimensionaler abbildungen von schwebend gehaltenen mikroobjekten unter verwendung hochauflösender mikroskopie |
US7586684B2 (en) * | 2005-01-21 | 2009-09-08 | New York University | Solute characterization by optoelectronkinetic potentiometry in an inclined array of optical traps |
WO2007038259A2 (en) * | 2005-09-23 | 2007-04-05 | Massachusetts Institute Of Technology | Optical trapping with a semiconductor |
WO2008034102A2 (en) * | 2006-09-15 | 2008-03-20 | Haemonetics Corporation | Surface mapping by optical manipulation of particles in relation to a functionalized surface |
DE102007046516A1 (de) * | 2007-09-28 | 2009-04-02 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung und Verfahren zur Konditionierung biologischer Zellen |
CN101430942B (zh) * | 2007-11-06 | 2011-11-16 | 瑞鼎科技股份有限公司 | 一种具有微粒抬升装置的光钳装置 |
DE102007055598A1 (de) * | 2007-11-20 | 2009-05-28 | Universität Bielefeld | Verfahren zur Messung der Kraft, die auf ein in einer optischen Pinzette/Falle gefangenes Objekt wirkt und optische Pinzette/Falle |
DE102008034089A1 (de) * | 2008-07-21 | 2010-01-28 | Universität Bielefeld | Verfahren und Vorrichtung zur Messung der Kraft, die auf ein in einer optischen Fallenanordnung gefangenes Objekt wirkt |
JP6551149B2 (ja) * | 2015-10-22 | 2019-07-31 | 株式会社ジェイテクト | 微粒子捕捉方法及び光ピンセット装置 |
JP6582867B2 (ja) | 2015-10-22 | 2019-10-02 | 株式会社ジェイテクト | 光ピンセット装置 |
JP6606975B2 (ja) * | 2015-10-28 | 2019-11-20 | 株式会社ジェイテクト | 光ピンセット装置 |
CN110366451B (zh) * | 2017-04-23 | 2021-07-30 | 惠普发展公司,有限责任合伙企业 | 颗粒分离 |
WO2020263234A1 (en) | 2019-06-25 | 2020-12-30 | Hewlett-Packard Development Company, L.P. | Molded structures with channels |
CN112466506B (zh) * | 2021-01-29 | 2021-04-27 | 之江实验室 | 一种真空光阱起支方法及装置与应用 |
CN113238075B (zh) * | 2021-04-22 | 2023-02-14 | 哈尔滨工程大学 | 一种基于光纤光镊技术的流速计 |
CN112863728B (zh) * | 2021-04-26 | 2021-07-02 | 之江实验室 | 一种基于电场量标定的多维度光镊校准装置及方法 |
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US5198369A (en) * | 1990-04-25 | 1993-03-30 | Canon Kabushiki Kaisha | Sample measuring method using agglomeration reaction of microcarriers |
JP3244764B2 (ja) | 1992-04-03 | 2002-01-07 | 科学技術振興事業団 | 微粒子反応とその計測方法 |
US5620857A (en) * | 1995-06-07 | 1997-04-15 | United States Of America, As Represented By The Secretary Of Commerce | Optical trap for detection and quantitation of subzeptomolar quantities of analytes |
-
1997
- 1997-12-28 DE DE19757785A patent/DE19757785B4/de not_active Expired - Fee Related
-
1998
- 1998-12-21 WO PCT/EP1998/008370 patent/WO1999034653A1/de active IP Right Grant
- 1998-12-21 EP EP98966384A patent/EP1042944B1/de not_active Expired - Lifetime
- 1998-12-21 AT AT98966384T patent/ATE221305T1/de not_active IP Right Cessation
- 1998-12-21 JP JP2000527131A patent/JP2002500110A/ja active Pending
- 1998-12-21 US US09/582,609 patent/US6991906B1/en not_active Expired - Fee Related
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CN112880912A (zh) * | 2021-01-08 | 2021-06-01 | 浙江大学 | 基于真空全息光镊的空间分辨压强测量***及方法 |
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Publication number | Publication date |
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DE59804934D1 (de) | 2002-08-29 |
ATE221305T1 (de) | 2002-08-15 |
WO1999034653A1 (de) | 1999-07-08 |
US6991906B1 (en) | 2006-01-31 |
JP2002500110A (ja) | 2002-01-08 |
DE19757785B4 (de) | 2005-09-01 |
EP1042944A1 (de) | 2000-10-11 |
DE19757785A1 (de) | 1999-07-15 |
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