EP0749577A1 - Covering layer for electrical conductors or semiconductors - Google Patents
Covering layer for electrical conductors or semiconductorsInfo
- Publication number
- EP0749577A1 EP0749577A1 EP95942208A EP95942208A EP0749577A1 EP 0749577 A1 EP0749577 A1 EP 0749577A1 EP 95942208 A EP95942208 A EP 95942208A EP 95942208 A EP95942208 A EP 95942208A EP 0749577 A1 EP0749577 A1 EP 0749577A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- protective layer
- weight
- parts
- porous
- tight
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/291—Oxides or nitrides or carbides, e.g. ceramics, glass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3157—Partial encapsulation or coating
- H01L23/3171—Partial encapsulation or coating the coating being directly applied to the semiconductor body, e.g. passivation layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
Definitions
- the present invention relates to a cover layer on at least one electrical conductor and / or semiconductor according to the preamble of the main claim.
- Cover layers for electrical conductors are known (DE-23 04 464 C2). They consist, for example, of barium aluminum silicates, which are applied using the methods customary in ceramic technology. Such layers are generally gas-tight cover layers.
- Porous cover layers are also known which e.g. from a metal, a metal alloy, an oxide or a mixed oxide such as e.g. Magnesium spinel, carbides, borides, nitrites of transition metals, from silicate minerals such as high-melting sintered glass or from refractory ceramic materials, which are also applied as raw materials or raw material mixtures such as kaolin or talcum, optionally with the addition of fluxes such as feldspar, nepheline syenite or ollastonite are then sintered.
- a metal e.g. from a metal, a metal alloy, an oxide or a mixed oxide such as e.g. Magnesium spinel, carbides, borides, nitrites of transition metals, from silicate minerals such as high-melting sintered glass or from refractory ceramic materials, which are also applied as raw materials or raw material mixtures such as kaolin or talcum, optionally with the addition of fluxe
- the gas-tight cover layer is applied to a solid electrolyte, while the porous first protective layer is located above the electrodes. It has been found that when electrical conductors are coated with gas-tight covering layers, ions such as calcium, sodium or oxygen ions migrate under the influence of the electrical voltages applied to the conductors, in particular at higher temperatures, and thus cause damage in the first protective layer and in consequently also lead on the ladders. Oxygen bubbles can also be released by discharging the oxygen ions.
- the object of the present invention is to provide cover layers in which ion migration is reduced under normal operating conditions.
- a porous first protective layer is arranged directly on the surface of the electrical conductor and / or semiconductor, and a gas-tight second protective layer is arranged at least in regions on the porous first protective layer.
- oxygen ion migration can be reduced by applying the porous first protective layer below the gas-tight second protective layer on the surface of the electrical conductor or semiconductor.
- the porous If the first protective layer is used to cover the electrodes and / or gas-sensitive layers of gas-measuring electrical sensors, open-pore porosity is mandatory.
- the porous first protective layer contains 20 to 60 parts by weight of silicon dioxide, 28 to 75 parts by weight of aluminum oxide and 1 to 27 parts by weight of barium oxide.
- the gas-tight second protective layer contains 20 to 56 parts by weight of silicon dioxide, 28 to 75 parts by weight of aluminum oxide and 2 to 55 parts by weight of barium oxide.
- the porous first protective layer preferably contains 28 to 50 parts by weight of silicon dioxide and 30 to 65 parts by weight of aluminum oxide.
- the addition of barium oxide is preferably on the order of 2 to 20 parts by weight.
- the gas-tight second protective layer preferably contains 28 to 50 parts by weight of silicon dioxide and 30 to 65 parts by weight of aluminum dioxide.
- the barium oxide content is on the order of 4 to 50 parts by weight of barium oxide.
- the porosity of the two protective layers can be regulated by the content of barium oxide.
- the gas-tight second protective layer has a barium oxide content which is generally 2 to 8.5 times greater than that of the porous first protective layer.
- the gas-tight second protective layer particularly preferably contains 30 to 45 parts by weight of silicon dioxide and in particular 35 to 40 parts by weight of silicon dioxide.
- the aluminum oxide content of the gas-tight second protective layer is advantageously in the range from 30.0 to 65.0 parts by weight, particularly preferably in the range from 40.0 to 60 parts by weight and in particular in the range from 47.0 to 53.0 parts by weight.
- the barium oxide content is preferably in the range from 4 to 50 parts by weight, particularly preferably in the range from 5 to 45 parts by weight, in particular in the range from 10 to 30 parts by weight and very particularly in the range from 12 to 25 Parts by weight.
- the gas-tight second protective layer advantageously contains a 3 to 7 times greater content of barium oxide than the porous first protective layer.
- the barium oxide content of the gas-tight second protective layer is very particularly preferably approximately 3.5 times greater.
- the entire surface of the electrical conductor or semiconductor can be covered by the porous first protective layer, the surfaces of conductors or sensitive layers such as.
- B. temperature-sensitive conductors, semiconductors, electrodes, for example measuring or reference electrodes can be covered by the porous first protective layer.
- the surfaces of the electrodes can also be left free from the porous first protective layer.
- These protective layers can be applied by all customary application methods, such as by screen printing, dipping, flame spraying or thin-film techniques such as vapor deposition or sputtering.
- the protective layers are applied with particular advantage by coating processes of thick-film technology, such as screen printing.
- the gas-tight second protective layer is arranged on the porous first protective layer and can cover it completely except for the electrode areas and the sensitive layers.
- FIG. 1 shows a conductor with cover layers, in a partially broken section
- FIG. 2 shows a section II-II according to FIG. 1.
- an electrical sensor 15 is shown in broken section.
- An electrical conductor 12 and 13 (FIG. 2) is applied to a substrate 10 and leads to an electrode 18.
- a porous first protective layer 14 is applied over the conductor 12, which also covers the electrode 18 and on the sides of the conductor 12, 13 extends to the substrate 10 (Fig. 2).
- a gas-tight second protective layer 16 which does not cover this electrode 18 is applied at the remaining locations on the porous first protective layer 14 and likewise borders on the substrate 10 (FIG. 2).
- the powder produced by calcining is homogenized by grinding in a planetary ball mill.
- the powder is placed in a 250 ml agate beaker, mixed with 30 ml of ethanol and ground for 8 hours after the addition of 8 agate balls. After grinding, the homogenized mixture is dried in a drying cabinet.
- the dried powder is placed in portions of 10 g in an 80 ml agate beaker, mixed with 6.5 g of a screen printing medium made of terpineol and ethyl cellulose and, after the addition of 7 agate balls, homogenized for 4 hours in a planetary ball mill.
- Example 1 The screen printing paste produced according to Example 1 is applied to an electrical conductor by screen printing. Then the following sintering profile is used:
- Example 1 a mixture of 13.6 g of kaolin, 1.8 g of silicon dioxide, 4.5 g of aluminum oxide and 4.9 g of barium carbonate is homogenized and further processed to a screen printing paste.
- the printing of a conductor and the sintering of the porous first protective layer is carried out analogously to Example 2, the sintering temperature being 1280 ° C.
- Example 4 and 5 are applied according to Example 2 by screen printing on a porous protective layer obtained according to Example 2 and sintered as described in Examples 2 and 3.
- Example 1 or 3 By combining the porous layers according to Example 1 or 3 and the gas-tight layers according to Example 4 or 5, a two-layer system is obtained which first has a porous first protective layer on the conductor and a gas-tight second protective layer above it.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19500235A DE19500235A1 (en) | 1995-01-05 | 1995-01-05 | Cover layer for electrical conductors or semiconductors |
DE19500235 | 1995-01-05 | ||
PCT/EP1995/005165 WO1996021149A1 (en) | 1995-01-05 | 1995-12-29 | Covering layer for electrical conductors or semiconductors |
Publications (1)
Publication Number | Publication Date |
---|---|
EP0749577A1 true EP0749577A1 (en) | 1996-12-27 |
Family
ID=7751053
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP95942208A Withdrawn EP0749577A1 (en) | 1995-01-05 | 1995-12-29 | Covering layer for electrical conductors or semiconductors |
Country Status (4)
Country | Link |
---|---|
US (1) | US5880406A (en) |
EP (1) | EP0749577A1 (en) |
DE (1) | DE19500235A1 (en) |
WO (1) | WO1996021149A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10275683A (en) * | 1997-03-28 | 1998-10-13 | Fuji Electric Co Ltd | Thin film layered conductor |
DE19732601C2 (en) * | 1997-07-29 | 1999-11-04 | Heraeus Electro Nite Int | Catalytic layer system |
JPH11248675A (en) * | 1997-12-24 | 1999-09-17 | Robert Bosch Gmbh | Electrochemical measuring sensor for measuring concentration of gas to be measured and its use |
JP3528037B2 (en) * | 1998-12-24 | 2004-05-17 | 株式会社村田製作所 | Manufacturing method of glass ceramic substrate |
US6846991B2 (en) * | 1999-01-13 | 2005-01-25 | Applied Kinetics, Inc. | Electrical component and a shuntable/shunted electrical component and method for shunting and deshunting |
WO2008038365A1 (en) * | 2006-09-28 | 2008-04-03 | Fujitsu Limited | Variable-resistance element |
JP5010891B2 (en) | 2006-10-16 | 2012-08-29 | 富士通株式会社 | Variable resistance element |
DE102010040867A1 (en) * | 2010-09-16 | 2012-03-22 | Robert Bosch Gmbh | Electronic component with improved line structure |
DE102014217552A1 (en) * | 2014-09-03 | 2016-03-03 | Conti Temic Microelectronic Gmbh | Control device for a motor vehicle and method for producing such |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3978006A (en) * | 1972-02-10 | 1976-08-31 | Robert Bosch G.M.B.H. | Methods for producing oxygen-sensing element, particularly for use with internal combustion engine exhaust emission analysis |
DE2304464C2 (en) * | 1973-01-31 | 1983-03-10 | Robert Bosch Gmbh, 7000 Stuttgart | Sensor for monitoring the functionality of catalytic converters in exhaust gas |
SE418433B (en) * | 1975-12-11 | 1981-05-25 | Gen Electric | SEMICONDUCTOR ELEMENT WITH A LAYER OF A POLYMERIC SILOXAN-CONTAINING MEMBRANE MEMBRANE MATERIAL WITH VARIABLE PERMEABILITY APPLIED ON SELECTED SURFACE OF THE ELEMENT |
DE2655803C2 (en) * | 1975-12-11 | 1986-04-17 | General Electric Co., Schenectady, N.Y. | Method for treating a selected surface area of a semiconductor element |
DE2852647C2 (en) * | 1978-12-06 | 1986-04-30 | Robert Bosch Gmbh, 7000 Stuttgart | Process for the production of a layer system on solid electrolytes for electrochemical applications |
JPS56158502A (en) * | 1980-05-12 | 1981-12-07 | Junkosha Co Ltd | Strip line |
DE3140971A1 (en) * | 1980-10-17 | 1982-06-16 | RCA Corp., 10020 New York, N.Y. | Crossover insulation paint |
JPS61214389A (en) * | 1985-03-19 | 1986-09-24 | タテホ化学工業株式会社 | Electric insulation filling material for sheathed heater |
EP0234338A1 (en) * | 1986-02-13 | 1987-09-02 | W.C. Heraeus GmbH | Thick-film multilayer dielectric composition for firing in air and nitrogen |
JPH0640094B2 (en) * | 1986-03-17 | 1994-05-25 | 日本碍子株式会社 | Electrochemical device |
JPH0618087B2 (en) * | 1986-11-19 | 1994-03-09 | 株式会社潤工社 | Extruded stretched insulated wire |
US5310575A (en) * | 1987-11-03 | 1994-05-10 | Robert Bosch Gmbh | Method of making a porous ceramic protective layer on an electrode of an electrochemical sensor for exposure to hot gas |
US4988835A (en) * | 1989-10-16 | 1991-01-29 | W. L. Gore & Associates, Inc. | Polyvinylidene fluoride electrical cable |
-
1995
- 1995-01-05 DE DE19500235A patent/DE19500235A1/en not_active Withdrawn
- 1995-12-29 EP EP95942208A patent/EP0749577A1/en not_active Withdrawn
- 1995-12-29 US US08/714,045 patent/US5880406A/en not_active Expired - Fee Related
- 1995-12-29 WO PCT/EP1995/005165 patent/WO1996021149A1/en not_active Application Discontinuation
Non-Patent Citations (1)
Title |
---|
See references of WO9621149A1 * |
Also Published As
Publication number | Publication date |
---|---|
US5880406A (en) | 1999-03-09 |
WO1996021149A1 (en) | 1996-07-11 |
DE19500235A1 (en) | 1996-07-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 19960905 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE FR GB IT |
|
RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: HERAEUS ELECTRO-NITE INTERNATIONAL N.V. |
|
17Q | First examination report despatched |
Effective date: 20000920 |
|
RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: EPIQ SENSOR-NITE N.V. |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20030205 |