EP0615132A1 - Elektrisches Testverfahren für Äquipotentialleitungen - Google Patents

Elektrisches Testverfahren für Äquipotentialleitungen Download PDF

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Publication number
EP0615132A1
EP0615132A1 EP94400495A EP94400495A EP0615132A1 EP 0615132 A1 EP0615132 A1 EP 0615132A1 EP 94400495 A EP94400495 A EP 94400495A EP 94400495 A EP94400495 A EP 94400495A EP 0615132 A1 EP0615132 A1 EP 0615132A1
Authority
EP
European Patent Office
Prior art keywords
test
points
line
test points
connector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
EP94400495A
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English (en)
French (fr)
Inventor
Gilles Charmoille
Didier Desprin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Publication of EP0615132A1 publication Critical patent/EP0615132A1/de
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors

Definitions

  • the invention relates to a method for electrical testing of equipotential lines.
  • the invention applies in particular to the continuity or electrical insulation test of wiring drawers, card baskets, electrical boxes or printed circuits for example. More generally, it applies to the testing of all equipment for which the continuity or the electrical insulation of the equipotential lines must be checked.
  • Electrical, electronic or computer equipment such as computers for example, includes an increasing number of circuits. printed, but also complex components with an increasing number of inputs / outputs. The result is an increasing number of equipotential lines connecting these inputs / outputs.
  • the components or the cards being in relation to other components or cards, these equipotentials pass through connectors connecting, for example, the cards to one another via a backplane or boxes.
  • the latter therefore comprise numerous bonding equipotentials.
  • a necessary condition for the proper functioning of the equipment is the electrical continuity of the equipotentials in play as well as the galvanic isolation between them;
  • test points There are devices to test this continuity and this insulation. These are connected to test points generally located at the connectors. Via these links, they successively test sections of equipotentials located between test points.
  • the object of the invention is to avoid this drawback, in particular by making it possible to take into account with current testers, a large number of test points, for example greater than the aforementioned order of magnitude, therefore without making them more complex.
  • the invention relates to a process electrical test of equipotential lines, each line being traversed by at least two test points, characterized in that at least one cut line separating the test points, the test points on a first side of the cut line being grouped in a first set and the test points on the other side being grouped in a second set, the test points of the cut-off line belonging to the two sets, the electrical test is carried out in a first step between the points of test of the first set and in a second step between the test points of the second set, test points of the first set being grouped in the second set, while remaining in the first set, to ensure continuity of the electrical test between the points of the first set and the test points of the second set.
  • the main advantages of the invention are that it adapts to the continuity and electrical insulation test of all types of electrical, electronic or computer equipment, that it adapts to all types of testers, that it is simple to implement and that it is economical.
  • FIG. 1 presents an illustrative example of a set of equipotential electric lines L1, L2, L3, L4, L5, L6, L7. These lines pass through connectors J1, J2, J3, J4, J5 ordered according to a relation depending for example on their relative positions.
  • the lines are each traversed by test points. These correspond, for example, to the terminals of the connectors through which they pass, the electrical tests being in particular easier in these places.
  • each test point is identified for example by the serial number of its connector and by the serial number of its corresponding terminal in the connector.
  • a connector of rank i being denoted Ji
  • a test point on a terminal of rank j inside this connector is for example denoted Ji / j.
  • a first equipotential line connects the first terminal J1 / 1 of a first connector J1, to the first terminal J3 / 1 of a third connector J3 passing through the first terminal D2 / 1 of a second connector J2.
  • a second line L2 connects the second terminal J1 / 2 of the first connector J1 to the second terminal J4 / 2 of a fourth connector J4 passing through the second terminal J2 / 2 of the second connector J2 then through the second terminal J3 / 2 of the third connector J3.
  • a third line L3 connects the third terminal J2 / 3 of the second connector J2 to the third terminal J4 / 3 of the fourth connector J4 through the third terminal J3 / 3 of the third connector J3.
  • a fourth line L4 connects the fourth terminal J3 / 4 of the third connector J3 to the fourth terminal J5 / 4 of a fifth connector J5 passing through the fourth terminal J4 / 4 of a fourth connector J4.
  • a fifth line L5 connects the fifth terminal J1 / 5 of the first connector J1 to the fifth terminal J2 / 5 of the second. connector J2.
  • a sixth line L6 connects the sixth terminal J1 / 6 of the first connector J1 to the sixth terminal J5 / 6 of the fifth connector J5.
  • a seventh line L7 connects the fifth terminal J4 / 5 of the fourth connector J4 to the fifth terminal J5 / 5 of the fifth connector J5.
  • a cut-off line Lc passes for example through the terminals of the third connector J3.
  • the test points located on a first side 1 of the cut-off line Lc, comprising for example points of the first connector J1, are grouped in a first set E1.
  • the test points located on the other side 2 of the cutoff line Lc are grouped in a second set E2, the test points J3 / 1, J3 / 2, J3 / 3 of the cutoff line belonging to the two sets E1 , E2.
  • a test point J1 / 6 isolated in the first side 1 but connected to an equipotential L6 straddling the line is grouped only in the second set E2.
  • the cut-off line may not pass through test points and may simply separate the test points by crossing equipotential lines as illustrated by a cut-off line L'c in FIG. 2 which crosses the first L1, second L2, third L3 and sixth L6 equipotential lines without meeting test points.
  • FIG. 3 shows another cut-off line L''c passing through a single test point, the first terminal J3 / 1 of the third connector J3, and crossing the second L2, third L3, fourth L4 and sixth L6 equipotential lines.
  • the electrical test is for example carried out between the test points of the first set E1.
  • This test can be a test of electrical continuity between successive test points of each of the equipotentials traversed by the test points of the first set E1, the test being limited to the test points of the latter.
  • This test can also be that of the galvanic isolation of the points. belonging to different equipotential lines.
  • the first step could just as easily be carried out on the second set E2.
  • the electrical test can be performed by all types of testers.
  • the cut-off line Lc illustrated in FIG. 1, is for example positioned so that the first set E1 has a number of test points close to the maximum capacity of the tester used, this number being at most equal to this maximum .
  • test points of the remaining set E2 for example.
  • Test points of the first set E1 are also included in the second set E2, in particular to ensure the continuity of the electrical test between the test points of the first set E1 and the test points of the second set E2.
  • the first, second and sixth terminals J1 / 1, J1 / 2, J1 / 6 of the first connector J1 are added to the second set E2, because the first terminal J1 / 1 belongs to the first equipotential line L1 connected to the first terminal J3 / 1 of the third connector which belongs to the second set E2, the second terminal J1 / 2 belongs to the second equipotential line L2 which is connected to the second terminals J3 / 2, J4 / 2 of the third and fourth connectors J3, J4, which belong to the second set E2, and finally the sixth terminal J1 / 6 belongs to the sixth equipotential line L6 connected to the sixth terminal J5 / 6 of the fifth connector, which belongs to the second set.
  • the contents of the sets E1 and E2 consist at least of the terminals or test point: J1 / 1, J1 / 2, J1 / 5, J1 / 6, J2 / 1, J2 / 2, J2 / 3, J2 / 5, J3 / 1, J3 / 2, J3 / 3
  • J1 / 1, J3 / 2, J3 / 3, J3 / 4, J4 / 2, J4 / 3, J4 / 4, J4 / 5, J5 / 4, J5 / 5, J5 / 6, J1 / 1, J1 / 2, J1 / 6 for the second set E2.
  • the electrical continuity tests are for example carried out successively between test points of the same equipotential line.
  • the points on the first side 1 of the cut-off line and therefore belonging to the first set E1 are also grouped in the second set E2 if they are in direct connection with a test point on the second side, that is to say belonging to the second set E2, a direct link meaning that there is no test point on the equipotential line between the two points in connection.
  • the electrical test can be carried out between connectors for example, in particular for greater ease of carrying out the tests, that is to say that for a given connector, its points are successively tested with the points of the other connectors, the latter being taken separately.
  • the addition of points from the first set E1 to the second set E2 is for example carried out differently.
  • the fifth line L5 for example in the case of FIG. 1, one of its test points is added to this second set and is tested as a point not connected to an equipotential line therefore tested in isolation from the other points of the. second set E2.
  • this added test point is for example the fifth terminal J1 / 5 of the first connector belonging to the fifth equipotential line L5.
  • This terminal J1 / 5 is tested as a point not connected to an equipotential line, therefore tested in isolation with respect to the other points of the second set E2, in particular at points J4 / 5 and J5 / 5 of the seventh equipotential line L7, which used to test the insulation of the latter with the fifth equipotential line L5. All the test points of each set, not connected to equipotential lines are for example tested in isolation with respect to all the other test points of the set to which it belongs.
  • the second set E2 can be constituted so as to ensure both an electrical continuity test and an electrical insulation test. However in such a case it has more points than if it were intended only for one or the other of these tests.
  • the different possible constitutions are therefore defined in particular as a function of the capacities of the test means.
  • the sides 1, 2 associated with these can again be each cut by a cut line according to the method described above. , to generate two new sets, which can again be cut to generate two other new sets, and so on, in particular until the sets have a compatible number of test points of available test means.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
EP94400495A 1993-03-12 1994-03-08 Elektrisches Testverfahren für Äquipotentialleitungen Ceased EP0615132A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9302866 1993-03-12
FR9302866A FR2702568B1 (fr) 1993-03-12 1993-03-12 Procédé de test électrique de lignes équipotentielles.

Publications (1)

Publication Number Publication Date
EP0615132A1 true EP0615132A1 (de) 1994-09-14

Family

ID=9444898

Family Applications (1)

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EP94400495A Ceased EP0615132A1 (de) 1993-03-12 1994-03-08 Elektrisches Testverfahren für Äquipotentialleitungen

Country Status (5)

Country Link
US (1) US5414363A (de)
EP (1) EP0615132A1 (de)
JP (1) JPH06300805A (de)
CA (1) CA2117161A1 (de)
FR (1) FR2702568B1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1001269A1 (de) * 1998-11-10 2000-05-17 Lucent Technologies Inc. Testen der Isolierung zwischen elektrische Leitern
US20080078552A1 (en) * 2006-09-29 2008-04-03 Osum Oil Sands Corp. Method of heating hydrocarbons
CN107271854B (zh) * 2017-07-28 2023-08-29 北京航天光华电子技术有限公司 一种双冗余等电位电缆网混线测试装置及测试方法
CN114646837B (zh) * 2022-05-13 2022-09-27 湖南恩智测控技术有限公司 等电势体信号测量电路、装置及测量仪表

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1947569A1 (de) * 1968-09-20 1970-04-30 Nord Aviat Soc Nat De Const Ae Verfahren und Vorrichtung zum Pruefen einer elektrischen Verdrahtung
EP0008954A1 (de) * 1978-09-11 1980-03-19 Lockheed Corporation Rechnergesteuertes Testsystem für einen elektrischen Kabelbaum und ein Verfahren zum Prüfen eines elektrischen Kabelbaumes
EP0147245A2 (de) * 1983-12-28 1985-07-03 Crouzet Vorrichtung und Verfahren zur Durchgangsprüfung gedruckter Schaltungen
WO1989000296A1 (fr) * 1987-07-08 1989-01-12 Centre National De La Recherche Scientifique (Cnrs Appareil de test de circuit imprime
EP0490728A1 (de) * 1990-12-10 1992-06-17 Eurocopter France Einrichtung zum Testen des elektrischen Durchgangs und der Isolierung elektrischer Leiter einer Verkabelung
US5124633A (en) * 1991-01-10 1992-06-23 Electronic Packaging Co. Dual sided printed circuit board test system

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR490728A (fr) * 1917-07-04 1919-05-06 Frederic Conrad Beck Dispositif pour mouvoir des membres artificiels
US3763430A (en) * 1972-01-14 1973-10-02 Burroughs Corp Circuit testing method and apparatus
US4091325A (en) * 1977-02-08 1978-05-23 The United States Of America As Represented By The Secretary Of The Army Verification technique for checking wrapped wire electronic boards
EP0402499A1 (de) * 1989-06-13 1990-12-19 Siemens Aktiengesellschaft Verfahren zur Prüfung einer Leiterplatte mit einer Teilchensonde

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1947569A1 (de) * 1968-09-20 1970-04-30 Nord Aviat Soc Nat De Const Ae Verfahren und Vorrichtung zum Pruefen einer elektrischen Verdrahtung
EP0008954A1 (de) * 1978-09-11 1980-03-19 Lockheed Corporation Rechnergesteuertes Testsystem für einen elektrischen Kabelbaum und ein Verfahren zum Prüfen eines elektrischen Kabelbaumes
EP0147245A2 (de) * 1983-12-28 1985-07-03 Crouzet Vorrichtung und Verfahren zur Durchgangsprüfung gedruckter Schaltungen
WO1989000296A1 (fr) * 1987-07-08 1989-01-12 Centre National De La Recherche Scientifique (Cnrs Appareil de test de circuit imprime
EP0490728A1 (de) * 1990-12-10 1992-06-17 Eurocopter France Einrichtung zum Testen des elektrischen Durchgangs und der Isolierung elektrischer Leiter einer Verkabelung
US5124633A (en) * 1991-01-10 1992-06-23 Electronic Packaging Co. Dual sided printed circuit board test system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
"Testing Bare Board Printed Circuit Product using a Stepping Head Technique, ...", IBM TECHNICAL DISCLOSURE BULLETIN, vol. 32, no. 6A, November 1989 (1989-11-01), NEW YORK US, pages 301 - 309 *

Also Published As

Publication number Publication date
JPH06300805A (ja) 1994-10-28
US5414363A (en) 1995-05-09
FR2702568A1 (fr) 1994-09-16
CA2117161A1 (fr) 1994-09-13
FR2702568B1 (fr) 1995-04-21

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