EP0511117A3 - Object profile measuring method and apparatus - Google Patents

Object profile measuring method and apparatus Download PDF

Info

Publication number
EP0511117A3
EP0511117A3 EP19920401186 EP92401186A EP0511117A3 EP 0511117 A3 EP0511117 A3 EP 0511117A3 EP 19920401186 EP19920401186 EP 19920401186 EP 92401186 A EP92401186 A EP 92401186A EP 0511117 A3 EP0511117 A3 EP 0511117A3
Authority
EP
European Patent Office
Prior art keywords
measuring method
profile measuring
object profile
profile
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP19920401186
Other versions
EP0511117B1 (en
EP0511117A2 (en
Inventor
Akira Ishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP3123026A external-priority patent/JP3051199B2/en
Priority claimed from JP03349426A external-priority patent/JP3098830B2/en
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Publication of EP0511117A2 publication Critical patent/EP0511117A2/en
Publication of EP0511117A3 publication Critical patent/EP0511117A3/en
Application granted granted Critical
Publication of EP0511117B1 publication Critical patent/EP0511117B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP19920401186 1991-04-26 1992-04-24 Object profile measuring method and apparatus Expired - Lifetime EP0511117B1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP3123026A JP3051199B2 (en) 1991-04-26 1991-04-26 Object shape measuring device
JP123026/91 1991-04-26
JP349426/91 1991-12-09
JP03349426A JP3098830B2 (en) 1991-12-09 1991-12-09 Object shape measuring device

Publications (3)

Publication Number Publication Date
EP0511117A2 EP0511117A2 (en) 1992-10-28
EP0511117A3 true EP0511117A3 (en) 1993-04-21
EP0511117B1 EP0511117B1 (en) 1997-12-17

Family

ID=26460045

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19920401186 Expired - Lifetime EP0511117B1 (en) 1991-04-26 1992-04-24 Object profile measuring method and apparatus

Country Status (2)

Country Link
EP (1) EP0511117B1 (en)
DE (1) DE69223544T2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3186876B2 (en) * 1993-01-12 2001-07-11 株式会社東芝 Surface profile measuring device
DE19950331C2 (en) * 1999-10-19 2001-09-06 Blum Novotest Gmbh Method and device for checking a cutting edge geometry of a tool which can be driven in rotation
US6635894B1 (en) 1999-11-22 2003-10-21 Renishaw Plc Optical measuring apparatus for measuring objects on machines
US7990542B2 (en) 2007-10-25 2011-08-02 Mitsubishi Electric Research Laboratories, Inc. Memory-based high-speed interferometer
FR2923295B1 (en) * 2007-11-06 2009-12-11 Areva Np METHOD AND DEVICE FOR VISUALIZING AND CONTROLLING THE PROFILE OF A WELDING CORD WITHIN A CHAMFER MADE BETWEEN TWO METAL PIECES
DE102009040990A1 (en) * 2009-09-10 2011-03-17 Carl Zeiss Ag Device for measuring upper surface, comprises light control unit, which is arranged on upper surface to control optical signal in ray fan, where optical signal comprises cycle of light pulses with repetition rate
DE102019204606B4 (en) * 2019-04-01 2020-10-29 Carl Zeiss Industrielle Messtechnik Gmbh Method for operating a sensor for generating surface measurement data of a workpiece and arrangement with such a sensor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0147501A2 (en) * 1983-12-15 1985-07-10 Ntt Gijutsu Iten Kabushiki Kaisha Measurement head for welding machines
WO1991010111A1 (en) * 1989-12-28 1991-07-11 Kabushiki Kaisha Toyota Chuo Kenkyusho Apparatus for measuring three-dimensional coordinate

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59137805A (en) * 1983-01-28 1984-08-08 Shin Meiwa Ind Co Ltd Optical distance meter for profiling work
JPS59212703A (en) * 1983-05-19 1984-12-01 Matsushita Electric Ind Co Ltd Detector for position of spot light

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0147501A2 (en) * 1983-12-15 1985-07-10 Ntt Gijutsu Iten Kabushiki Kaisha Measurement head for welding machines
WO1991010111A1 (en) * 1989-12-28 1991-07-11 Kabushiki Kaisha Toyota Chuo Kenkyusho Apparatus for measuring three-dimensional coordinate

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
OPTICAL ENGINEERING. vol. 24, no. 6, November 1985, BELLINGHAM US pages 975 - 977 G.BICKEL E.A. 'TRIANGULATION WITH EXPANDED RANGE OF DEPTH' *
PATENT ABSTRACTS OF JAPAN vol. 8, no. 269 (P-319)(1706) 8 December 1984 & JP-A-59 137 805 ( SHINMEIWA KOGYO ) 8 August 1984 *
PATENT ABSTRACTS OF JAPAN vol. 9, no. 83 (P-348)(1806) 12 April 1985 & JP-A-59 212 703 ( MATSUSHITA DENKI SANGYO ) 1 December 1984 *
TECHNISCHES MESSEN TM vol. 51, no. 7/8, July 1984, MUNCHEN DE pages 270 - 275 P.DREWS E.A. 'OPTISCH-ELEKTRONISCHER NAHTFUHRUNGSSENSOR ZUR SCHWEISSNAHTVERFOLGUNG' *

Also Published As

Publication number Publication date
DE69223544T2 (en) 1998-07-09
EP0511117B1 (en) 1997-12-17
EP0511117A2 (en) 1992-10-28
DE69223544D1 (en) 1998-01-29

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